JPS59632Y2 - Circuit element holding device - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a holding device used for measuring circuit elements.

For example, in order to maintain the electrical characteristics of circuit elements used at high frequencies (100 to 500 Mn2), the external dimensions and dimensions of the leads should be made as short as possible, and the shape of the leads should also be made as small as possible. It is configured.

In order to measure the parameters of this type of circuit element with high precision, it is necessary to similarly shorten the connection path to the utmost in the connection between the element and the measurement terminal of the measuring instrument.

FIG. 1 is a perspective view of a chip capacitor that is a circuit element.

FIG. 2 shows the chip shown in FIG. 1 is a schematic cross-sectional view of a conventional clamping device used for measuring capacitors.

In the figure, a center conductor 12 and an outer conductor 14, which are coaxially formed with an insulator 10 in between, serve as measurement terminals of a measuring device (not shown).

In the test chip capacitor 16, the terminals 1 and 3 are in contact with the conductive contact 18 and the center conductor 12, respectively, which slide on the shoulder of the L-shaped outer conductor by contact pressure applied in the direction of arrow a. be held [to be held] as if

In order to ensure electrical contact between the capacitor 16 and the side conductor 12.14 over the shortest distance, sufficient contact pressure in the direction of the arrow is required, so the contactor 18 must be screwed or soldered. It was fixed by etc.

Therefore, there was a drawback that it was extremely inefficient to continuously measure a large number of capacitors.

The present invention has been made in order to eliminate the above-mentioned drawbacks, and it is an object of the present invention to provide a circuit element holding device that is easy to operate, allows efficient measurement, and has a simple configuration.

FIG. 3 is a perspective view of a circuit element holding device according to an embodiment of the present invention, and FIGS. 4 and 5 are schematic side views, respectively, before and after a test chip capacitor is mounted on the device shown in FIG. 3. It is.

Please refer to FIGS. 3-5.

A guide groove 24 is formed on the side surface of the base 22 that is integrally formed with the outer conductor 14.

A lever 2B is provided on a center rod 27 that passes through a hole in a support section 26 attached to the other side of the base 22.

Further, the center rod 27 passes through the seat 30 and the vertical piece 32a of the conductive L-shaped contact 32, and a stopper 34 is fixed to the tip thereof.

A spring 36, which is wound around the center rod 27 between the support portion 26 and the contact 30, is compressed.

The pin 38 provided at the corner of the L-shaped contact 32 is connected to the guide groove 2.
4, and the horizontal piece 32b of the contactor 32 extends so as to face the outer conductor 14.

First, when the lever 28 is pulled in the direction of arrow C against the elastic force of the spring 36, the pin 3B is guided by the guide groove 24, so the contact 32 moves linearly and the spring 36 is further compressed.

During this movement, the vertical piece 32a of the contactor 32 moves against the stopper 34.
, the horizontal piece 32 b of the contact 32 is pressed against the base 2
It is kept parallel to the plane of 2.

The positions of the guide groove and pin 38 are determined so that the distance t between the contactor 32 and the outer conductor 14 is slightly generated.

Therefore, since the contactor 32 does not come into contact with the outer conductor 14 during movement, both will not be worn out.

After placing the test chip capacitor 16 between the center conductor 12 and the contact 32 with the lever 2B pulled, the lever 2B is pulled.
When B is returned to its original position, the container 16 is held between the two.

Each of the terminals 1.3 of the capacitor 16 and the contact 32.
Electrical contact with the center conductor 12 is ensured by the pressing force of the spring 36.

Note that since the contact 32 is further pressed by the spring 36 via the protrusion 52 of the seat 30, a couple is generated around the pin 38, and the tip of the contact 32 is pushed downward in the figure.

Therefore, the tip of the contactor 32 is connected to the outer conductor 1 which is the measurement terminal.
4 at the shortest distance.

Here, if the distance from the point where the protrusion 52 of the seat 30 presses the contact 32 to the pin 38 is approximately equal to the distance from the pin 38 to the tip of the contact 32, then the distance between the tip and the sample chip container 16 is approximately equal. The contact pressure between the tip and the outer conductor 14 is approximately the same as the contact pressure between the lower part of the tip and the outer conductor 14.

In this way, the sample chip capacitor 16 can be clamped and mounted in one operation for measurement, and the capacitor can also be easily removed.

Therefore, measurements can be carried out extremely efficiently.

FIG. 6 is a schematic side view showing another embodiment of the present invention, in which a test chip capacitor 16 is sandwiched.

In this figure, the difference from FIG. 5 is that the guide groove 24 and pin 38 are not used, and the length of the seat 10 is
The vertical piece 32a is made slightly larger than the vertical piece 32a, and covers the cover 62.

Further, the seat 30 is made of a material with a low coefficient of friction and good wear resistance (for example, polyacetal).

In a normal state, the lever 2B, the money seat 30, and the contact 32 are fitted together so that the lower part of the seat 30 contacts the base 22, but the contact 32 does not.

When operating the lever 28 when attaching or detaching the test chip container 16, the seat 30 is pulled up using the contact point between the support portion 26 and the center rod 27 as a fulcrum, so that the upper part of the money seat 30 is pulled up along the bottom surface of the cover 62. Move.

When clamping, the upper part of the seat 30 that is in contact with the lower surface of the cover 62 serves as a fulcrum, and the tip of the contact 32 is pushed down by the restoring force of the spring 36 and comes into contact with the outer conductor 14.

As is clear from the above explanation, according to the present invention, the contact between both terminals of the circuit element, the center conductor of the measuring terminal, and the contact can be made sufficiently by the restoring force of the spring, without having to screw or solder the contact. The electrical contact between both terminals of the circuit element and the surface measurement terminal is ensured through the shortest route.

[Brief explanation of the drawing]

Fig. 1 is a perspective view of a test chip container, Fig. 2 is a conventional holding device, Fig. 3 is a perspective view of a holding device according to an embodiment of the present invention, and Figs. 4 and 5 are as shown in Fig. 3. FIG. 6 is a schematic side view showing another embodiment of the present invention, in which 12, 14: conductor of measurement terminal, 16: test chip capacitor, 18, 32: contactor, 22: Base, 2
8 Nilever, 36: Spring.

Claims (1)

[Scope of utility model registration request] A contact whose respective contact surfaces are orthogonal and whose distance from one of two measurement terminals arranged at a distance is variable, and both terminals of the device under test are brought into contact with the one measurement terminal and the contact. means for applying pressure to the contactor so that the test element is clamped, and means for applying the pressurizing force perpendicularly to the respective contact surfaces of the two measurement terminals when the test element is clamped; A circuit element clamping device in which the contactor contacts the other of the measurement terminals when clamping the circuit element.