JPS5963435U

JPS5963435U - Automatic sorting equipment for semiconductor devices

Info

Publication number: JPS5963435U
Application number: JP15793782U
Authority: JP
Inventors: 手嶋　實
Original assignee: NEC Corp
Current assignee: NEC Corp
Priority date: 1982-10-19
Filing date: 1982-10-19
Publication date: 1984-04-26
Also published as: JPS6328603Y2

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

[Brief explanation of the drawing]

第１図は本考案より選別しようとする半導体素子、第２
図は従来の選別装置の全体図、第３図ａ〜ｇは本考案の
一実施例による半導体素子の自動選別装置であり、第３
図ａは全体図、第３図すは゛−供給部部分図、第３図Ｃ
は回転ドラム部分図、第３図ｄ−は駆動部部分図、第３
図ｅは測定接触子部部分図、第３図ｆは取出し機構部部
分図、第３図　ｇは分類ボックス部部分図である。１・・・ガラス封止形ダイオード（ダイオード）、２・
・・ガラス封止部、３ａ、ｂ・・・引き出し端子（リー
ド）、４・・・シュート、５・・・個別化機構、６・・
・測定ドラム、７・・・測定接触子、８・・・投入シュ
ート、９・・・可動シュート、１０・・・分類室、１１
・・・モータ、１２・・・分類シュート、１３・・・分
類収容箱、１４ｂ。ｂ・・・マグネット、１５・・・マグネットボックス、
１６ａ、ｂ・・・マグネット、１７・・・凹部、１８・
・・回転テーブル、１９・・・モータ、２０・・・イン
デックスカムボヅクス、−２１・・・減速機、２２・・
・駆動機構部、２３・・・支持軸、２４・・・電極先端
、２５・・・ばね、２６・・・板状電極、２７・・・自
動特性測定装置、２８・・・測定接触子、２９・・・測
定端子部、３０・・・測定器、３１・・・レジスター、
３２・・・取出し金具、３３・・・支　。特休、３．４・・・摺動片、３５・・・ソレノイド作動
器、３６・・・ばね、３７・・・投入シュート（受取り
パイ□プ）、３８・・・取出し機構、３９・・・分類取
出し機構部、４０・・・整列収納部、４１・・・導電性
ホース、４２・・・マグネット、４３・・・収納箱、４
４・・・台車。゛　　　蒸　３図（Ｃ）− ５〃Ｚ　　　３　　１ｍ　　ｒｙノFigure 1 shows the semiconductor elements to be selected according to the present invention,
The figure is an overall view of a conventional sorting device, and FIGS. 3a to 3g are automatic sorting devices for semiconductor devices according to an embodiment of the present invention.
Figure a is an overall view, Figure 3 is a partial view of the supply section, Figure 3C
is a partial view of the rotating drum, Figure 3d- is a partial view of the drive section, and Figure 3
FIG. 3e is a partial view of the measuring contact portion, FIG. 3f is a partial view of the take-out mechanism portion, and FIG. 3g is a partial view of the classification box portion. 1...Glass sealed diode (diode), 2...
...Glass sealing part, 3a, b...Output terminal (lead), 4...Chute, 5...Individualization mechanism, 6...
・Measuring drum, 7... Measuring contact, 8... Input chute, 9... Movable chute, 10... Sorting room, 11
...Motor, 12...Classification chute, 13...Classification storage box, 14b. b... Magnet, 15... Magnet box,
16a, b... magnet, 17... recess, 18.
...Rotary table, 19...Motor, 20...Index cam box, -21...Reducer, 22...
- Drive mechanism section, 23... Support shaft, 24... Electrode tip, 25... Spring, 26... Plate electrode, 27... Automatic characteristic measuring device, 28... Measurement contact, 29... Measuring terminal section, 30... Measuring device, 31... Register,
32... Takeout metal fitting, 33... Support. Special holiday, 3.4... Sliding piece, 35... Solenoid actuator, 36... Spring, 37... Input chute (receiving pipe □ pipe), 38... Taking out mechanism, 39... - Classification and extraction mechanism section, 40... Alignment storage section, 41... Conductive hose, 42... Magnet, 43... Storage box, 4
4...Dolly.゛ Steaming Figure 3 (C) - 5〃 Z 3 1m ryノ

Claims

[Scope of utility model registration request]

In an automatic sorting device for semiconductor devices having elongated leads at both ends, a magnetic box is used in which magnets are aligned in parallel so that the lead direction of the semiconductor devices and the main magnetic flux direction match, the semiconductor devices are suspended by magnetic force, and the semiconductor devices are stored in an aligned state. , a rotary table that has a semiconductor element holding member made of magnets arranged at regular intervals on the periphery and that individually transfers semiconductor elements stored in a magnetic box; It has a drive mechanism part that performs intermittent rotational movement, and measurement contacts that are pressed against the side surface of the peripheral edge of the rotary table and come into contact with the leads of the semiconductor devices at a plurality of locations. A measurement terminal section that performs measurement simultaneously, an automatic characteristic measuring device that is connected to the measurement terminal section and measures various electrical characteristics of the semiconductor element and sends out a classification signal, and an extraction fitting that takes out the measured semiconductor element from the holding member of the rotary table; a sliding piece to which a take-out metal fitting is attached;
The take-out mechanism consists of a solenoid actuator that is excited by the classification signal sent from the automatic characteristic measuring device and causes the sliding piece to reciprocate, and a loading chute that receives the semiconductor device taken out from the rotary table using the take-out fitting. Externally, there is a retrieval and sorting mechanism section that simultaneously performs multiple retrieval and sorting operations, a conductive hose that guides the semiconductor devices to the storage section, and a conductive hose that holds the semiconductor devices in a floating state in the same way as the magnetic box described above. 1. An automatic sorting device for semiconductor devices, comprising a plurality of sorting storage sections for aligning.