JPS5965324A - Temperature control circuit - Google Patents
Temperature control circuitInfo
- Publication number
- JPS5965324A JPS5965324A JP17595282A JP17595282A JPS5965324A JP S5965324 A JPS5965324 A JP S5965324A JP 17595282 A JP17595282 A JP 17595282A JP 17595282 A JP17595282 A JP 17595282A JP S5965324 A JPS5965324 A JP S5965324A
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- transistors
- voltage
- temperature
- temperature control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims abstract description 16
- 230000003287 optical effect Effects 0.000 claims abstract description 11
- 238000010438 heat treatment Methods 0.000 claims abstract description 4
- 238000010521 absorption reaction Methods 0.000 claims description 2
- 238000001816 cooling Methods 0.000 abstract description 8
- 238000010586 diagram Methods 0.000 description 7
- 239000000835 fiber Substances 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000000087 stabilizing effect Effects 0.000 description 2
- 241000270666 Testudines Species 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 239000010985 leather Substances 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/1919—Control of temperature characterised by the use of electric means characterised by the type of controller
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B2321/00—Details of machines, plants or systems, using electric or magnetic effects
- F25B2321/02—Details of machines, plants or systems, using electric or magnetic effects using Peltier effects; using Nernst-Ettinghausen effects
- F25B2321/021—Control thereof
- F25B2321/0212—Control thereof of electric power, current or voltage
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Control Of Temperature (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、温度制御素子の制御回路に関し、特に光通信
システムにおける元素子の温度を一定に保つ温度制御素
子の加熱冷却制御に使用する制御回路に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a control circuit for a temperature control element, and more particularly to a control circuit used for heating and cooling control of a temperature control element to keep the temperature of an element constant in an optical communication system.
従来、光通信システムにおける元素子の温度制御VC,
は、その形状が小さく回路に組込み易い電子冷却素子が
用いられており、主にレーザダイオードの特性(光出力
1発振波量等)安定化のために1史川されている。#:
fVc%長波長?iヶ(1,3μm〜1.6μm)のレ
ーザダイオードの場合にその素子自体の実用実績が少f
x (s閾値電流の劣化が早いことや、その温度係数が
太きhことから特性の安だ化には冷却が磨潰の条件であ
った。 、最近、長距離かつ人容愈の元通イgシステム
の一発が進められ導入されるに促い、伝送帯域の広いシ
ングルモードファイバが1史用される塊になり、仄のし
な問題が生じて米てhる。すなわち、シングルモードフ
ァイバケ用いた元朋信システムでは、造Vc商い精度が
要求される。 ゛ シングルモードファ
イバのコア径は約10μmでマルチモードファイバの1
15程度であるため、レーザ元を入射ざぜる場合、温度
による機械的1位置のずれや、レーザダイオードの発振
横モードの温度変動に対して、非富に不安定となるから
である。また、レーザダイオードVCに、波長の温度依
存性(例えば、1.3μm帝のレーザダイオードでは4
〜5A/”Oの波長変動がある。)があり、伝送路の持
つ損失の波長特性(波長によって、ファイバの損失が異
る)や帯域の波長特性(波長によってファイバの伝送帯
域が異る)Kより、伝送特性が温度で大きく変る。特に
、長距離大容愈伝送方式では、その損失変動や帯域変動
が問題となるため、レーザダイオードの波長の安定化も
N要な要素となっている。Conventionally, temperature control VC of elements in optical communication systems,
In this case, a thermoelectric cooling element is used, which is small in size and easy to incorporate into a circuit, and is mainly used for stabilizing the characteristics of the laser diode (the amount of light output per oscillation wave, etc.). #:
fVc% long wavelength? In the case of i (1.3 μm to 1.6 μm) laser diodes, there is little practical experience of the element itself.
x (s) Due to the rapid deterioration of the threshold current and the large temperature coefficient, cooling has been a necessary condition for reducing the characteristics. As the IG system progresses and is introduced, single-mode fibers with a wide transmission band are used for a long time, and a strange problem arises. The Mototomonobu system using fiber optics requires high Vc precision. ゛ The core diameter of single mode fiber is about 10 μm, which is about 10 μm compared to that of multimode fiber.
This is because when the laser source is incident on the order of 15 degrees, it becomes extremely unstable due to mechanical deviations in one position due to temperature and temperature fluctuations in the oscillation transverse mode of the laser diode. In addition, the laser diode VC has wavelength temperature dependence (for example, a laser diode with a diameter of 1.3 μm has a
There is a wavelength fluctuation of ~5A/"O), and the wavelength characteristics of the loss of the transmission line (the fiber loss differs depending on the wavelength) and the wavelength characteristics of the band (the fiber transmission band differs depending on the wavelength). Transmission characteristics change significantly with temperature than K. In particular, in long-distance, large-capacity optical transmission systems, loss fluctuations and band fluctuations become a problem, so stabilizing the wavelength of the laser diode is also an important element. .
従って、最近では、レーザダイオードの低温化による恒
温化のための温度制御が要求されている。Therefore, recently there has been a demand for temperature control to keep the temperature constant by lowering the temperature of the laser diode.
レーザダイオードのような元素子の温度制御に使われる
電子冷却素子は、通常ベルチェ効果を利用した所請ベル
チェ素子である。この素子は吸熱と発熱の川遊の性質を
有しており、素子に流す電流の向きを変えることにより
、冷却と加熱の両方の作用を行なう事が出来る。The electronic cooling device used to control the temperature of elements such as laser diodes is usually a custom-made Beltier device that utilizes the Beltier effect. This element has the property of absorbing heat and generating heat, and by changing the direction of the current flowing through the element, it can perform both cooling and heating effects.
上記電子冷却素子を制御する(口)路としては第1図(
a) 、 (b)に示すような回路が1更用されている
。同図(a)は正負の電源電圧(±v)?11−用いた
例で、半導体レーザ装置から検出する温度制御のための
検出電圧VDおよび比較電圧vrを入力信号とする直流
増幅器6の非反転および反転側出方端子にそれぞれトラ
ンジスタ1.2全接続し、可逆性′α電子冷却素子ベル
チェ素子)5に流す電流の同“きおよび大小全変化させ
る回路である。この回路は、制御回路を比較的簡単に構
成でき、経済的と考えられるが、ベルチェ素子を用いた
温度制御回路では服大消5R電流がIA程度必要であり
、2釉類の大出力電源を用意す′る万がかえって不経済
となる◎同図(b)は、単電源電圧(+v)i用いた例
で、2つの差動型トランジスタ回路と定電圧ダイオード
8.9を含み、ベルチェ素子5の電流の向きおよび大小
を変化させる回路である。この場合、トランジスタ2.
4から成る差動型回路のため、電源から流れる電流はベ
ルチェ素子に流す電流の有無(検出電圧VDの大小)に
かかわらず常に一足量(ベルチェ素子の最大必要電流)
であり、省エネルギーという観点から見れば、最新の光
通信システムに用いるのけ不適当である〇
以上のように従来の温度制御回路は正負2a類の電源を
必要としたり、また単一電源でもその消費電流が大きい
という欠点があった。The path for controlling the electronic cooling element is shown in Figure 1 (
One circuit as shown in a) and (b) is used. Figure (a) shows the positive and negative power supply voltages (±v)? 11- In the example used, transistors 1 and 2 are fully connected to the non-inverting and inverting side output terminals of the DC amplifier 6, which uses the detection voltage VD and comparison voltage vr for temperature control detected from the semiconductor laser device as input signals, respectively. This is a circuit that completely changes the current flowing through the reversible thermoelectric cooling element (Bertier element) 5 at the same level and in magnitude.This circuit allows the control circuit to be constructed relatively easily and is considered to be economical. A temperature control circuit using a Beltier element requires a 5R current of about IA, which makes it uneconomical to prepare two high-output power supplies. Figure (b) shows a single power supply. In this example, the voltage (+v)i is used, and the circuit includes two differential transistor circuits and a constant voltage diode 8.9, and changes the direction and magnitude of the current of the Bertier element 5. In this case, the transistor 2.
4, the current flowing from the power supply is always a certain amount (the maximum required current of the Beltier element) regardless of whether there is a current flowing through the Beltier element (the magnitude of the detection voltage VD).
Therefore, from the point of view of energy saving, it is unsuitable for use in the latest optical communication systems.As mentioned above, conventional temperature control circuits require positive and negative class 2A power supplies, and even with a single power supply, it is not suitable for use in the latest optical communication systems. The drawback was that the current consumption was large.
本発明の目的は、上記欠点ケ補う温度制御回路ケ提供す
ることにある。SUMMARY OF THE INVENTION An object of the present invention is to provide a temperature control circuit that overcomes the above-mentioned drawbacks.
本発明&CLれば一端が結合して電源VC接続され、差
動型増幅回路を形成する第1および第2のトランジスタ
と、前iL[G1.第2のトランジスタの他端VC接続
され、吸熱1発熱作用葡行う素子と、一端が結合してア
ースされ、差動型増幅回路を形成する第3.第4のトラ
ンジスタとを含み、第3、第4のトランジスタeユ他端
會前記第1および第2のトランジスタの他端にそれぞれ
接続し、上記トランジスタのエミ、りに制御信悸ヲ印刀
口して光学系子分所定の温度を制御する温度制御回路に
おいて元学累子の温度に対応した検出信号とその九学累
子の温度特性全十分考慮して得た第1の比較電圧と全比
較検出する第1の直流増幅器と、検出信号と第1の比較
電圧よりも小さく元学累子の温肛特性を十分考慮して得
た第2の比較電圧とを比較検出する第2の直流増幅器と
を含み、上記2つの直流増幅器の出力により、第1、第
4のトランジスフが導通し第2.、第3のトランジスタ
が非導通になる第1の状態、第1〜第4のすべてのトラ
ンジスタが非導通になる第2の状態および第1、第4の
トランジスタが非導通で巣2、第3のトランジスタが導
通になる第3の状態のいずれかに制御することを特徴と
する温度制御回路が得られる。According to the present invention &CL, the first and second transistors whose one ends are connected to the power supply VC and form a differential amplifier circuit, and the front iL[G1 . The other end of the second transistor is connected to VC, and one end of the second transistor is connected to an element that performs heat absorption and heat generation, and is grounded to form a differential amplifier circuit. a fourth transistor; third and fourth transistors are connected to the other ends of the first and second transistors, respectively, and control signals are applied to the emitters of the transistors; In the temperature control circuit that controls the predetermined temperature of the optical system element, the detection signal corresponding to the temperature of Motogaku Yuiko and the first comparison voltage obtained by fully considering the temperature characteristics of Kuyuko A first DC amplifier that detects the detection signal and a second DC amplifier that compares and detects the detection signal with a second comparison voltage that is smaller than the first comparison voltage and is obtained by fully considering the anal characteristics of Yuiko Motogaku. The outputs of the two DC amplifiers cause the first and fourth transistors to conduct, and the second and fourth transistors to conduct. , a first state in which the third transistor is non-conductive, a second state in which all the first to fourth transistors are non-conductive, and a second state in which the first and fourth transistors are non-conductive and the second and third transistors are non-conductive. There is obtained a temperature control circuit characterized in that the temperature control circuit is controlled to one of the third states in which the transistor becomes conductive.
以下、図面全紗照して本発明の実施例をさらに詳しく説
明する。Hereinafter, embodiments of the present invention will be described in more detail with reference to the drawings.
第2図(a)〜(d)は本発明の温度制御回路の実施例
を示す回路図、第3図(a)〜(c)は第2図の回路中
のトランジスタ回路部の動作状態を説明するための図、
第4図は入力検出寛EEvDVc対する各トランジスタ
のスイッチング動作を説明するための図である。FIGS. 2(a) to 2(d) are circuit diagrams showing embodiments of the temperature control circuit of the present invention, and FIGS. 3(a) to (c) show operating states of the transistor circuit section in the circuit of FIG. Diagram for explanation,
FIG. 4 is a diagram for explaining the switching operation of each transistor for input detection width EEvDVc.
第2図(a) ICおいて、この実施例はレーザ元の温
度依存性分十分考慮して決定された比較電圧vr1゜V
rz s (Vr、 )Vr2)および半導体レーザx
wから入力する検出電圧vDと比較検出し、かつ出力極
性が互に逆になっている2つの直流増幅器6と、その出
力によって制御され、ベルチェ素子5に流f電流の同き
および大小全制御するNPN型トランジスタ1〜4と、
トランジスタ2.4のペース側[接続される像幅mIJ
限用定電圧ダイオード8゜9とから構成されている。FIG. 2(a) In this example, the comparison voltage vr1°V, which is determined by fully considering the temperature dependence of the laser source, is used in the IC.
rz s (Vr, )Vr2) and semiconductor laser x
Two DC amplifiers 6 whose output polarities are opposite to each other are compared and detected with the detection voltage vD input from w, and are controlled by their outputs to completely control the magnitude and magnitude of the current f flowing through the Bertier element 5. NPN transistors 1 to 4,
Pace side of transistor 2.4 [connected image width mIJ
It consists of a limited voltage regulating diode 8°9.
上記温度制御回路において検出電圧VDが比軟電圧Vr
工(>Vr2 )エリ大きい場合、直流増幅器6の出力
は低レベル、直流増幅器7の出力は高レベルになる0こ
のときトランジスタ1,4はONトランジスタ2.3は
OFFとなり、ベルチェ索子5Vc流nる′亀流工は第
3図(a)でボす方向に流れる。もちろんこの電流工の
大小は、トランジスタ1.4のベース電圧、すなわち検
出電圧vDの大きさによって制御される。検出電圧VD
が比較電圧vr、(<Vr、 )より小さA場合、直流
増幅器6゜7の出力レベルは上記の場合と逆となジ、ト
ランジスタ1.4はOFF’、 )ランジスフ2.3は
ONとなる。したがってベルチェ素子5に流れる電流工
は第3図(b)で示す方向に流れる。検出l圧vDが比
較電圧vr1とvrlの間のレベルである場合、直流増
幅6,7の出力は共に低レベルとなり、トランジスタ1
〜4はすべてUFi=″になる口したがって第3図(c
)にボすごとく回路[は全く電流が流れない。In the above temperature control circuit, the detection voltage VD is the specific soft voltage Vr.
When the voltage (>Vr2) is large, the output of DC amplifier 6 is at a low level, and the output of DC amplifier 7 is at a high level.At this time, transistors 1 and 4 are turned on, transistors 2 and 3 are turned off, and the Beltier wire 5Vc current is turned on. In Figure 3 (a), the flow of the nru' turtle flow is in the direction of the bow. Of course, the magnitude of this current is controlled by the base voltage of the transistor 1.4, that is, the magnitude of the detection voltage vD. Detection voltage VD
When A is smaller than the comparison voltage vr, (<Vr, . Therefore, the electric current flowing through the Bertier element 5 flows in the direction shown in FIG. 3(b). When the detected l voltage vD is at a level between the comparison voltages vr1 and vrl, the outputs of the DC amplifiers 6 and 7 are both low level, and the transistor 1
~4 are all UFi='' Therefore, Fig. 3 (c
), no current flows through the circuit.
以上述べた3つの場合について検出電圧Vuの大きさに
対するトランジスタ1〜4の動作をまとめると第4図の
工うになり、検出電圧VDが比較電圧vr1とVr2
の間の大きさのときはすべてのトランジスタがOFFと
なるため、ベルチェ索子511?−は電流が流れず電源
からの゛を流の供給がなくなる。したがって、むだなエ
ネルギー葡費やさない。The operation of transistors 1 to 4 with respect to the magnitude of detection voltage Vu in the three cases described above is summarized as shown in FIG.
Since all transistors are OFF when the size is between 511? −, no current flows and no current is supplied from the power supply. Therefore, do not waste energy.
第2図(b)は同図(a)VCおける直流増幅器の出力
極性、足電圧ダイオードの向きを逆にし、トランジスタ
1〜4をすべてPNP型のものに置き換えた回路であり
、検出電圧vD1C対するトランジスタ1〜4の動作お
よびペルチェ系子5に流れる電流は第2図(a)の回路
と全く同じであることに明らかである。Figure 2(b) is a circuit in which the output polarity of the DC amplifier and the direction of the foot voltage diodes in Figure 2(a) of the VC are reversed, and transistors 1 to 4 are all replaced with PNP type ones, and the detection voltage vD1C is It is clear that the operations of transistors 1 to 4 and the current flowing through Peltier element 5 are exactly the same as in the circuit of FIG. 2(a).
第2図(C)に直流増(陥器6.7にそれぞれ極性の異
なる2つの出力端子?有する回路7用い、トランジスタ
1.3kPNP型トランジスタ2.4をNPN型とした
回路で、検出電圧VDの大きさに対するトランジスタ1
〜4の動作はMiJ述した第2図(a) 、 (b)の
場合と全く同じである。Fig. 2(C) shows a circuit using a circuit 7 having two output terminals with different polarities in the DC booster 6.7, a transistor 1.3kPNP type, and an NPN type transistor 2.4, and detects a voltage VD. Transistor 1 for the size of
The operations in steps 4 to 4 are exactly the same as those shown in FIGS. 2(a) and 2(b) described in MiJ.
第2図(d)は同図(c)[おけるトランジスタ1,3
をNPN型、トランジスタ2.4ケPNP型にしそれぞ
れのトランジスタのベース電圧の極性が逆になるように
した回路で、検出電圧VDK対するトランジスタ1〜4
の動作は同図(C)の場合と全く同じである。Figure 2(d) shows transistors 1 and 3 in Figure 2(c).
In this circuit, transistors 1 to 4 are NPN type and 2.4 transistors are PNP type, and the polarity of the base voltage of each transistor is reversed.
The operation is exactly the same as in the case shown in FIG.
以上説明したように本発明による温度制御(ロ)路は、
レーザ元の温度依存性全十分考慮した大きさの異なる2
つの比較電圧を用いて入力検出電圧のレベルが2つの比
較電圧の間にあるときはベルチェ素子への電流′ft制
御するトランジスタをすべてOFFに単一の電源から電
流を流さないためエフ経済的な光通信システムが実現で
きる。As explained above, the temperature control (b) path according to the present invention is
The temperature dependence of the laser source is fully taken into account with two different sizes.
Using two comparison voltages, when the level of the input detection voltage is between the two comparison voltages, all the transistors that control the current to the Bertier element are turned off, making it economical because no current flows from a single power supply. An optical communication system can be realized.
第1図(a) 、 (b)は従来の温度制御回路例葡ボ
す回略図、第2図(a)〜(d)は本発明の温度制御回
路の実施例を示す回路図、第3図(a)〜(C)は第2
図中のトランジスタ回路の動作を説明するための図、第
4図は同トランジスタの検出電圧に対するスイッチング
動作を説明するための図である。
1.2.3.4・・団・トランジスタ、5・・・・・・
ベルチェi子、6.7・・・・・・直流増幅器、7,8
・・国定電圧ダイオード。
(aン
<b)
革I 囚
(d)
第一21i
(C)
θF
Vr2旨七ヶ’VQ1(a) and 1(b) are schematic diagrams showing examples of conventional temperature control circuits, FIGS. 2(a) to 2(d) are circuit diagrams showing embodiments of the temperature control circuit of the present invention, and FIG. Figures (a) to (C) are the second
FIG. 4 is a diagram for explaining the operation of the transistor circuit in the figure, and FIG. 4 is a diagram for explaining the switching operation of the transistor with respect to the detected voltage. 1.2.3.4... Group transistor, 5...
Beltier I-ko, 6.7...DC amplifier, 7,8
・National voltage diode. (aan<b) leather I prisoner (d) 1st 21i (C) θF Vr2jishichiga'VQ
Claims (1)
成する蘂lおよび第2のトランジスタと、iJ記第1.
第2のトランジスタのそれぞれ他端に接続され吸熱・発
熱作用を行う素子と、一端が結合してアースされ、差動
型増幅回路を形成する第3、第4のトランジスタとを含
み@記第3.第4のトランジスタの他端全前記第1およ
び第2のトランジスタの他端にそれぞ7′1.接続し、
前記各トランジスタのエミ、りに制御信号を印加して光
学素子全所定の温度に制御する温度制御回路において前
記光学素子の温dに対応した検出信号と前記光学素子の
温度特注を士分考慮して設定したMlの比較電圧と全比
較検出する第1の直流増幅器と、前記検出信号と前記第
1の比較電圧よりも小さく前記光学素子の温度特性を十
G考慮して設定した第2の比較電圧とを比較検出する第
2の直流増幅器と全台み、前記2つの直流増幅器の出力
により、前d己第1、第4のトランジスタが4通し前記
第2゜第3のトランジスタが非導通にな、6第1の状態
、すべての@記トランジスフが非導通vcなる第2の状
態および前記第1.第4のトランジスタか非導通で前d
ピ第2.第3のトランジスタが4通になる第3の状態の
いず九かに制御すること全特徴とする温度制御回路。The first and second transistors, whose one ends are connected to the power supply VC and form a differential amplifier circuit, and the first transistor in iJ.
It includes an element that is connected to the other end of the second transistor and performs a heat absorption/heating action, and a third and fourth transistor whose one end is coupled and grounded to form a differential amplifier circuit. .. The other ends of the fourth transistor are all connected to the other ends of the first and second transistors 7'1. connection,
In a temperature control circuit that applies a control signal to the emitter of each transistor to control the temperature of all optical elements to a predetermined temperature, a detection signal corresponding to the temperature d of the optical element and a custom temperature of the optical element are taken into consideration. a first DC amplifier that performs total comparison detection with a comparison voltage of Ml set by The output of the two DC amplifiers causes the first and fourth transistors to pass through four times, and the second and third transistors to become non-conductive. 6. The first state, the second state in which all transistors are non-conducting VC, and the first state. The fourth transistor is non-conducting and the front d
Pi 2nd. A temperature control circuit characterized in that the third transistor controls any one of four third states.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17595282A JPS5965324A (en) | 1982-10-06 | 1982-10-06 | Temperature control circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17595282A JPS5965324A (en) | 1982-10-06 | 1982-10-06 | Temperature control circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5965324A true JPS5965324A (en) | 1984-04-13 |
Family
ID=16005115
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17595282A Pending JPS5965324A (en) | 1982-10-06 | 1982-10-06 | Temperature control circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5965324A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63163611A (en) * | 1986-12-26 | 1988-07-07 | Marantz Japan Inc | Pelltier element control circuit |
| JPS6417109A (en) * | 1987-07-10 | 1989-01-20 | Nec Corp | Temperature compensating circuit for optical module |
| JPH01302088A (en) * | 1988-05-30 | 1989-12-06 | Toshiba Corp | Article stocking device |
| JPH0412011U (en) * | 1990-05-18 | 1992-01-31 | ||
| JP2012009487A (en) * | 2010-06-22 | 2012-01-12 | Nitto Kogyo Co Ltd | Peltier type air conditioner for board |
| JP2016072509A (en) * | 2014-09-30 | 2016-05-09 | ブラザー工業株式会社 | Temperature control device, semiconductor module and laser processing device |
-
1982
- 1982-10-06 JP JP17595282A patent/JPS5965324A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63163611A (en) * | 1986-12-26 | 1988-07-07 | Marantz Japan Inc | Pelltier element control circuit |
| JPS6417109A (en) * | 1987-07-10 | 1989-01-20 | Nec Corp | Temperature compensating circuit for optical module |
| JPH01302088A (en) * | 1988-05-30 | 1989-12-06 | Toshiba Corp | Article stocking device |
| JPH0412011U (en) * | 1990-05-18 | 1992-01-31 | ||
| JP2012009487A (en) * | 2010-06-22 | 2012-01-12 | Nitto Kogyo Co Ltd | Peltier type air conditioner for board |
| JP2016072509A (en) * | 2014-09-30 | 2016-05-09 | ブラザー工業株式会社 | Temperature control device, semiconductor module and laser processing device |
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