JPS59663A - Waveform testing method - Google Patents

Abstract

PURPOSE:To improve production capability and reliability, by fetching picture data from a testing device, judging it through the pattern recognition of a microcomputer, etc., and automating waveform testing operation. CONSTITUTION:An IC3 is sent to a contact part 13 by an automatic IC loading part 11 and a conveyance part 12. The testing device 6 projects an AC test waveform on a cathode-ray tube 7. The picture is taken by a camera 14 and picture data on it is fetched in the microcomputer 16, which performs pattern recognition. Then, data inputted from an interface 15 and a nondefective article pattern, etc., in the microcomputer 16 are compared to send a nondefective/ detective decision signal to an interface 17 and a nondefective/detective selection part 18 is operated to make nondefective/defective selection. Thus, the waveform test is automated, so the production capacity and reliability are improved.

Description

[Detailed description of the invention] [Technical field of invention] The present invention relates to an IC (integrated circuit) and a transistor.

The present invention relates to a waveform test method suitable for determining the acceptability or failure of an AC waveform (voltage and current values change over time) obtained from a semiconductor device such as a diode.

[Technical background of the invention and its problems]

In this type of conventional method, as shown in Figure 1, a person looks at an AC waveform (a waveform in which the voltage and current values change continuously over time, i.e., an alternating current waveform) reflected on a cathode ray tube. /I was deciding whether or not to do so.

IC3 contained in IC supply box 2 is removed by department worker 1.
into the IC socket box 4, and press the test start switch 5.
Turn on. Then, an AC test waveform is applied to the cathode ray tube 1 by the test device 6. The worker 1 judges whether the ICs are acceptable or not, and sorts the ICs into a good product box 8 or a defective product box 9.

However, in the method shown in Figure 1, human judgment is required to determine whether the test results are acceptable or not, so there is a limit to the test production capacity and there is a risk of errors in judgment.

[Purpose of the invention]

The present invention has been made in view of the above circumstances.

Second, we aim to provide a waveform test method that can improve production capacity and reliability by automating waveform tests.

[Summary of the invention]

In order to achieve the above object of the invention, 1. AC using human vision.
To judge whether the test waveform is good or bad, the camera of the imaging device such as I'l''V (industrial television) or C0D (coupled device) captures uniform data from the cathode ray tube of the test equipment. Intake, microcomputer, etc. (judgment based on pattern recognition (= replaced).

[Embodiments of the invention]

An embodiment of the present invention will be described below with reference to the drawings. , as shown in FIG.
The ICE that is in contact with the probe No. 3 is projected onto the test device 6 (from the second ACC soot cathode ray tube 7).

t (Difil camera (ITV', ccI), etc.) 14, the image data is taken into the microcomputer 16 through the interface 15, and the microcomputer 16 performs pattern recognition of the data.

It goes without saying that the microcontroller 16 stores some data such as a pattern of non-defective products and a limit value for non-defective products. Then, the data taken in from the interface 15 is compared with the non-defective pattern in the microcomputer 16, and the resulting pass/fail judgment signal is sent to the interface 17, the pass/fail selector 18 is operated, and the IC3 It distinguishes between good and bad.

According to the embodiments described above, the production capacity can be improved by at least two to three times due to automation.

Also, by using a device, the criteria for judgment become clearer, eliminating the variations that occur when humans do it. In addition, it is only necessary to prepare a camera 11, a microcomputer 16 for pattern recognition, etc., and the configuration is such that images are captured from the CRT of the conventional test equipment via the imaging device 14 and image comparison is performed, so the signal processing format is very simple. It is simple and therefore very easy to implement.

[Effectiveness of invention,]

As explained above, according to the present invention, automation C:
With increased production capacity, increased mechanization (and improved reliability), and the addition of a few common devices to replace humans, traditional test configurations can be easily modified. Because it can be used, it is extremely easy to implement.

[Brief explanation of drawings]

Figure 1 is a schematic diagram showing the conventional waveform test method, @2
The figure is a configuration diagram showing an embodiment of the present invention. 3...IC16...Test device, 7...Cathode ray tube. 13...Contact part, 14...Camera, 15°17...Interface, 16...Microcomputer. 18...IC sorting section.

Claims (5)

[Claims] (1) A waveform test method characterized in that an alternating current waveform obtained from an object to be measured is transferred to a cathode ray tube, the waveform image is captured by an imaging device, and the pass/fail of the waveform is determined by pattern recognition. . (2) The scope of the present invention is characterized in that the pattern recognition is performed by comparing the waveform obtained from the object to be measured and a reference good waveform pattern! J1 Section 1: Waveform test method described. (3) The waveform test method according to claim 1, wherein the object to be measured is a semiconductor device such as an integrated circuit, a transistor, or a diode. (4) The imaging device is an industrial television or a CO
The waveform test method according to claim 1, wherein the waveform test method is a D camera. (5) The AC waveform is one hour and two voltages co-caged. 42. The waveform test method according to claim 1, wherein the current value changes continuously.