JPS5974366U - test point circuit - Google Patents

test point circuit

Info

Publication number
JPS5974366U
JPS5974366U JP17010182U JP17010182U JPS5974366U JP S5974366 U JPS5974366 U JP S5974366U JP 17010182 U JP17010182 U JP 17010182U JP 17010182 U JP17010182 U JP 17010182U JP S5974366 U JPS5974366 U JP S5974366U
Authority
JP
Japan
Prior art keywords
test point
point
test
point circuit
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17010182U
Other languages
Japanese (ja)
Other versions
JPS6217730Y2 (en
Inventor
村方　義昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP17010182U priority Critical patent/JPS5974366U/en
Publication of JPS5974366U publication Critical patent/JPS5974366U/en
Application granted granted Critical
Publication of JPS6217730Y2 publication Critical patent/JPS6217730Y2/ja
Granted legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は従来のテストポイント回路の回路図であり、第
２図はその説明波形図である。第１図は本考案を実施し
たテストポイント回路の回路図である。 イ・・・・・・所定点、９・・・・・・テストポイント
端子、１１・・・・・・導電路、１３・・・・・・スイ
ッチングダイオード、１４・・・・・・抵抗。FIG. 1 is a circuit diagram of a conventional test point circuit, and FIG. 2 is an explanatory waveform diagram thereof. FIG. 1 is a circuit diagram of a test point circuit implementing the present invention. A: Predetermined point, 9: Test point terminal, 11: Conductive path, 13: Switching diode, 14: Resistor.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 信号路の所定点をテストポイント端子に接続する導電路
を有し、テスト時に前記テストポイント端子に与えられ
る直流電圧によって前記所定点を一定電位にするテスト
ポイント回路において、前記テストポイント端子に与え
られる直流電圧により導通する極性で前記導電路にスイ
ッチングダイオードを挿入すると共に前記スイッチング
ダイオードとテストポイント端子の接続点を抵抗を介し
て基準電位点に接続したことを特徴とするテストポイン
ト回路。In a test point circuit having a conductive path connecting a predetermined point of a signal path to a test point terminal, the predetermined point is made to have a constant potential by a DC voltage applied to the test point terminal during a test. A test point circuit characterized in that a switching diode is inserted in the conductive path with a polarity that is conductive by a DC voltage, and a connection point between the switching diode and the test point terminal is connected to a reference potential point via a resistor.
JP17010182U 1982-11-09 1982-11-09 test point circuit Granted JPS5974366U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17010182U JPS5974366U (en) 1982-11-09 1982-11-09 test point circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17010182U JPS5974366U (en) 1982-11-09 1982-11-09 test point circuit

Publications (2)

Publication Number Publication Date
JPS5974366U true JPS5974366U (en) 1984-05-19
JPS6217730Y2 JPS6217730Y2 (en) 1987-05-07

Family

ID=30371428

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17010182U Granted JPS5974366U (en) 1982-11-09 1982-11-09 test point circuit

Country Status (1)

Country Link
JP (1) JPS5974366U (en)

Also Published As

Publication number Publication date
JPS6217730Y2 (en) 1987-05-07

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