JPS60220802A - Method and device for detecting position in width direction of metal lump - Google Patents

Method and device for detecting position in width direction of metal lump

Info

Publication number
JPS60220802A
JPS60220802A JP59077214A JP7721484A JPS60220802A JP S60220802 A JPS60220802 A JP S60220802A JP 59077214 A JP59077214 A JP 59077214A JP 7721484 A JP7721484 A JP 7721484A JP S60220802 A JPS60220802 A JP S60220802A
Authority
JP
Japan
Prior art keywords
voltage
light
metal lump
receiving element
address
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59077214A
Other languages
Japanese (ja)
Other versions
JPH0423721B2 (en
Inventor
Heiji Kato
平二 加藤
Hiroaki Kuwano
博明 桑野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IHI Corp
Original Assignee
Ishikawajima Harima Heavy Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ishikawajima Harima Heavy Industries Co Ltd filed Critical Ishikawajima Harima Heavy Industries Co Ltd
Priority to JP59077214A priority Critical patent/JPS60220802A/en
Publication of JPS60220802A publication Critical patent/JPS60220802A/en
Publication of JPH0423721B2 publication Critical patent/JPH0423721B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/046Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring width

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Geophysics And Detection Of Objects (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、熱間圧延設備や連鋳設備等における金属塊の
幅方向位置検出方法及びその装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method and apparatus for detecting the position in the width direction of a metal ingot in hot rolling equipment, continuous casting equipment, etc.

〔従来の技術〕[Conventional technology]

圧延又は連鋳加工では、製品歩留りを向上するうえで精
密な板幅管理が望まれる。特に熱間圧延の場合は、圧延
機で水平圧下するだめに圧延材に幅広がりが生じるが、
これを放置したまま圧延を繰返すと、製品板幅が設定値
よりも極めて大きいものとなり、後工程のサイドトリミ
ング等で切捨てる部分が増大し、歩留りの低下を招来す
る。
In rolling or continuous casting processing, precise sheet width control is desired in order to improve product yield. Particularly in the case of hot rolling, the width of the rolled material expands due to the horizontal reduction in the rolling mill.
If rolling is repeated with this condition left as is, the width of the product sheet will be much larger than the set value, and the portion to be cut off during side trimming or the like in the subsequent process will increase, leading to a decrease in yield.

一方、ジングルスタンドにおけるリバース圧延、連続ス
タンドにおける先後端部通過時等の無張力圧延において
は、蛇行が生じ易いだめ、圧延材の蛇行量を検出して、
左右のロールギャップの調整を行う必要がある。ところ
が、従来の圧延荷重差に基づいて蛇行を検出して制御す
る方式では、圧延材の端折れによる端部2枚噛みゃ先後
端の不規則形状部の圧延時に発生する圧延荷重差等を蛇
行現象と判断し、圧下レベル調整を狂わし、かえって圧
延作業を中断させる、等の致命的な欠陥があった。
On the other hand, meandering is likely to occur during reverse rolling in a jingle stand and in tensionless rolling when passing the leading and trailing ends in a continuous stand, so the amount of meandering of the rolled material is detected.
It is necessary to adjust the left and right roll gaps. However, with the conventional method of detecting and controlling meandering based on the rolling load difference, the difference in rolling load that occurs during rolling of irregularly shaped parts at the leading and trailing ends of the rolled material due to the bending of the two ends is detected and controlled. There was a fatal flaw in that the rolling process was judged to be a phenomenon, disrupted the rolling reduction level adjustment, and even caused the rolling operation to be interrupted.

そこで、最近では、熱間圧延材、連鋳材等の加熱金属塊
の板幅或いは蛇行等を高精度で制御することが望まれ、
その基になる板幅或いは蛇行等の検出手段として光学的
幅方向位置検出器が開発されている。この装置は第1図
に示す原理に基づいている。
Therefore, it has recently become desirable to control the plate width or meandering of heated metal ingots such as hot-rolled materials and continuously cast materials with high precision.
An optical width direction position detector has been developed as a means for detecting the board width or meandering, etc., which is the basis for this. This device is based on the principle shown in FIG.

すなわち、圧延材(1)の下方から投光器(2)により
圧延材(1)を投光し、上方、つまり圧延材(1)の表
面方向部位に設けた受光器(3)によって圧延材(1)
に遮蔽されない部分の受光量を測定し、板幅を検出する
ものである。受光器(3)には、光電素子(フォトダイ
オード)を利用したもの、テレビカメラ式撮像管を利用
したもの等があるが、以下、光電素子を利用したものに
ついて説明する。テレビカメラ式撮像管を用いた場合も
原理的には変らない。光電素子(5)は投光器(2)と
平行に、複数個、直線状に配列しく個数単位として一般
に1ビツト」を用いる)、レンズ(6)を通して集光し
た像の受光量に比例した電気信号(7)を発する。この
受光量を所定の変換器により一部レベルでスレッシュホ
ールドすることにより、電気信号をオン、オフ2種類の
同期信号(8)に変換する。1ビット当りの集光距離は
レンズ(6)の集光角度2α(又は集光範囲L)及び被
測定物としての圧延材(1)とレンズ(6)との間の距
離Hによって定まるので、全光電素子数をNピットとす
ると、板幅Wは次式でめることができる。
That is, the rolled material (1) is illuminated by the light projector (2) from below the rolled material (1), and the light receiver (3) provided above, that is, in the surface direction of the rolled material (1), illuminates the rolled material (1). )
The width of the plate is detected by measuring the amount of light received in the areas that are not shielded. The light receiver (3) includes one using a photoelectric element (photodiode), one using a television camera type image pickup tube, etc., and the one using a photoelectric element will be explained below. The principle remains the same even when a television camera type image pickup tube is used. A plurality of photoelectric elements (5) are arranged in a straight line in parallel with the light projector (2) (the unit of number is generally 1 bit), and an electric signal proportional to the amount of light received from the image focused through the lens (6). (7) is emitted. By thresholding the amount of received light at a partial level using a predetermined converter, the electrical signal is converted into two types of synchronization signals (8): on and off. The focusing distance per bit is determined by the focusing angle 2α (or focusing range L) of the lens (6) and the distance H between the rolled material (1) as the object to be measured and the lens (6). If the total number of photoelectric elements is N pits, the plate width W can be determined by the following formula.

W = LX (N −(N1+ N2) )/N= 
2)(1anαx (N −(NI+N2) )/N 
−−(i)而して、このような板幅検出手段を圧延材等
の蛇行検出に適用することも考えられ、既に一部では実
施されているが、特に熱間圧延では圧延材自体が800
℃前後の高温であるだめ、第1図に示す投光器(2)を
廃して圧延材自体の光を検知する方式が有効である。こ
の場合の原理を第2図により説明すると、圧延材(1)
の左右両側、すなわち、ワークサイドとドライブサイド
の夫夫に受光器(9)αQを設け、該受光器(9) 0
1により圧延材(1)の光を検知するようにする。検知
時には、受光素子αυ(イ)の各ピットごとに集光が行
われ、各ピットごとに集光された光の強さに比例する電
圧が発生する。例えば、受光素子αpで検出された電圧
と受光素子Qυの各ピットとの関係を図示すると第3図
に示すようになり、電圧差が発生し始めた位置が圧延材
(1)のワークサイド側端部として検知される。なお、
第3図を映像信号と称する。第3図において、t8は夫
々の受光素子Ql)(2)の全ビットの走査に要する走
査周期、■は圧延材幅端光量差を表わす電圧である。
W = LX (N - (N1+ N2) )/N=
2) (1anαx (N − (NI+N2) )/N
--(i) Therefore, it is possible to apply such a strip width detection means to detect meandering of rolled materials, etc., and this has already been done in some cases, but especially in hot rolling, when the rolled material itself 800
Unless the temperature is high, around .degree. C., it is effective to eliminate the floodlight (2) shown in FIG. 1 and detect the light from the rolled material itself. To explain the principle in this case using Fig. 2, the rolled material (1)
A light receiver (9) αQ is provided on both the left and right sides, that is, the work side and the drive side, and the light receiver (9)
1 to detect the light from the rolled material (1). At the time of detection, light is focused on each pit of the light receiving element αυ (a), and a voltage proportional to the intensity of the focused light is generated for each pit. For example, the relationship between the voltage detected by the light receiving element αp and each pit of the light receiving element Qυ is shown in Figure 3, and the position where the voltage difference starts is on the work side of the rolled material (1). Detected as an edge. In addition,
FIG. 3 is called a video signal. In FIG. 3, t8 is the scanning period required to scan all the bits of each light receiving element Ql)(2), and ■ is a voltage representing the difference in light amount at the width end of the rolled material.

ところで、一般的には圧延材の種類によって温度が異な
るため、第2図に示す受光器(9)αQへ入る光量に温
度による差が生じる。すなわち、温度の高い圧延材で走
査周期t8を大きくすると、受光素子(ロ)(2)への
入光時間が長くなり、圧延材から発せられるローラーテ
ーブル等に反射した弱い光も多量に受光素子αυ(2)
に受光される結果、第4図のイに示すように、電圧Vが
圧延材(1)から離れた位置で急激に立上り、幅端部の
検出精度が悪化する。文通に走査周期t8が短かすぎる
と、受光素子(11)(イ)の各ビットへの入光時間が
短くなり、光が十分に受光素子(ロ)(2)に受光され
ない結果、第4図の口に示すように電圧Vのレベルが低
下し、板幅端部検出の信号が板端位置を判定するだめの
基準となるスレッシュレベル電圧VLに達せず、検出が
不可能となる虞れがある。
By the way, since the temperature generally varies depending on the type of rolled material, the amount of light entering the light receiver (9) αQ shown in FIG. 2 varies depending on the temperature. In other words, when the scanning period t8 is increased for a hot rolled material, the time for light to enter the light receiving element (b) (2) becomes longer, and a large amount of weak light emitted from the rolled material and reflected on the roller table etc. is also transmitted to the light receiving element. αυ(2)
As a result, as shown in FIG. 4A, the voltage V suddenly rises at a position away from the rolled material (1), and the detection accuracy at the width end portion deteriorates. If the scanning period t8 is too short, the time for light to enter each bit of the light receiving element (11) (a) will be shortened, and as a result, the light will not be sufficiently received by the light receiving element (b) (2). As shown at the top of the figure, the level of the voltage V decreases, and the signal for detecting the edge of the plate width does not reach the threshold voltage VL, which is the reference for determining the position of the edge of the plate, and there is a risk that detection will become impossible. There is.

従って、走査周期t8を自動的にコントロールし、受光
素子αυ(2)に受光される光量を常に一定に保持し、
電圧■を第4図のハに示すように調節することが必要と
なる。
Therefore, the scanning period t8 is automatically controlled, and the amount of light received by the light receiving element αυ (2) is always kept constant.
It is necessary to adjust the voltage (2) as shown in FIG. 4 (C).

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

本発明は、高温の金属塊の幅方向位置を検出する際に、
走査周期を金属塊の温度に対応した最適な時間になるよ
うにし、金属塊の幅方向位置を正確に検出することによ
り上述の問題点を解決すべくなしだものである。
In the present invention, when detecting the widthwise position of a hot metal lump,
This method aims to solve the above-mentioned problems by setting the scanning period to an optimum time corresponding to the temperature of the metal lump and accurately detecting the widthwise position of the metal lump.

〔問題点を解決するだめの手段〕[Failure to solve the problem]

本発明においては、加熱された金属塊の発する光を受光
する受光素子群とレンズとを備え、該受光素子を金属塊
中央側より幅端方向へ走査し得るようにした検出器と、
該検出器で検出された金属塊の映像信号電圧と予め設定
されたレベルの電圧とを比較し、映像信号の電圧が設定
されたレベルの電圧以上になったら信号を出力する比較
器と、該比較器よりの信号を受けたらそのときの前記検
出器の受光素子の番地を記憶する記憶回路と、該記憶回
路より送られて来た番地と前記設定されたレベルの電圧
の発生する受光素子の番地の近傍の番地との差をめる減
算回路と、該減算回路でめられた受光素子の番地の差と
走査開始によりカウントされるクロックパルスのカウン
ト数を比較してクロックパルスのカウント数が減算回路
から送られて来た受光素子の番地の差より大きくなった
ら所定のスイッチを閉じる指令を与える比較器と、スイ
ッチが閉じたら金属塊の映像信号電圧をホールドするサ
ンプルホールド回路を設けている。
In the present invention, a detector is provided with a lens and a light receiving element group that receives light emitted from a heated metal lump, and is configured to scan the light receiving element from the center side of the metal lump in the width direction;
a comparator that compares the video signal voltage of the metal lump detected by the detector with a voltage at a preset level and outputs a signal when the voltage of the video signal exceeds the voltage at the set level; A memory circuit that stores the address of the light receiving element of the detector at that time when a signal from the comparator is received, and a memory circuit that stores the address sent from the memory circuit and the light receiving element that generates the voltage at the set level. A subtraction circuit calculates the difference between an address and a neighboring address, and the difference between the address of the light receiving element determined by the subtraction circuit is compared with the number of clock pulses counted at the start of scanning, and the number of clock pulses is calculated. There is a comparator that issues a command to close a predetermined switch when the difference is greater than the difference between the addresses of the light receiving elements sent from the subtraction circuit, and a sample hold circuit that holds the video signal voltage of the metal lump when the switch is closed. .

従って前記検出器により金属塊を中央側より幅端方向へ
走査し、該走査により得られた映像信号の略中間レベル
の電圧を発生する受光素子近傍の受光素子が受けている
光量から走査周期を決定し、前記検出器により金属塊を
中央側より幅端方向へ、前記走査により決定された走査
周期により走査を行ない、略中間レベルの電圧を発生す
る受光素子の番地をめて金属塊の幅端位置を検出するこ
とができる。
Therefore, the detector scans the metal lump from the center toward the width edges, and the scanning period is determined from the amount of light received by the light receiving element near the light receiving element, which generates a voltage approximately at the intermediate level of the video signal obtained by the scanning. The width of the metal lump is determined by scanning the metal lump using the detector from the center side toward the width end at the scanning period determined by the scanning, and determining the address of the light receiving element that generates a voltage at an approximately intermediate level. The end position can be detected.

〔実 施 例〕〔Example〕

以下、本発明の実施例を図面を参照しつつ説明する。 Embodiments of the present invention will be described below with reference to the drawings.

□先ず、走査時間(走査周期)の決め方について第5図
(イ)(ロ)、第6図(イ)(ロ)により説明すると、
素子数Nビットの検出器で所定の走査時間により圧延材
の中央側より幅端側へ向けて走査を行い、圧延材の幅方
向位置を検出した場合に、スレッシュレベル電圧VLの
信号が得られた素子の番地をNc番地とすると、それよ
りもNT番地手前の電圧vTを検出し、この電圧vTの
大きさから走査時間を決定する。例えば、第5図(イ)
のような光量の少ない映像信号の場合板端での信号は減
衰し、第5図(ロ)に示すようにNT番地手前の電圧v
Tは低くなるので、走査時間を長くシ、第6図(イ)の
ような光量の多い映像信号の場合、板端での信号の立ち
上がりは急峻で、第6図(ロ)に示すようにNT番地手
前の電圧vTは高くなるので走査時間を短くする。
□ First, how to determine the scanning time (scanning period) will be explained using Figures 5 (a) (b) and 6 (a) (b).
When a detector with N-bit elements scans from the center of the rolled material toward the width ends for a predetermined scanning time and detects the widthwise position of the rolled material, a signal of the threshold level voltage VL is obtained. Assuming that the address of the element is the Nc address, a voltage vT at an NT address before the Nc address is detected, and the scanning time is determined from the magnitude of this voltage vT. For example, Figure 5 (a)
In the case of a video signal with a small amount of light such as , the signal at the edge of the board is attenuated, and as shown in Figure 5 (b), the voltage v before the NT address decreases.
Since T is low, the scanning time is longer, and in the case of a video signal with a large amount of light as shown in Figure 6 (a), the rise of the signal at the edge of the plate is steep, as shown in Figure 6 (b). Since the voltage vT before the NT address is high, the scanning time is shortened.

次に、圧延材の幅方向位置の演算タイミングを第7図に
より説明すると、検出開始点AからR初の1走査周期目
においては、スレッシュレベル電圧vLの得られたNc
番地の検出を行ない、2走査周期目においては、1走査
周期目のNc番地よりNT番地手前の電圧vTをサンプ
ルホールドすると共に2走査周期目のスレッシュレベル
電圧vLの得られたNc番地を再記憶し、3走査周期目
は2走査周期目で得られたNT番地の電圧vTに対応す
るよう検出器がコントロールされ、圧延材の幅端位置が
演算されてその結果Bが出力され、4走査周期目は、2
走査周期目のNc番地よりNT番地手前の電圧VTをサ
ンプルホールドすると共に4走査周期目のスレッシュレ
ベル電圧VLの得られたNC番地を再記憶し、5走査周
期目は4走査周期目で得られたNT番地の電圧VTに対
応するよう検出器がコントロールされ、圧延材の幅端位
置が演算されてその結果Bが出力され、以下同様に偶数
番地目では、その前の走査周期目のNC番地よりNT番
地手前の電圧vTをサンプルホールドすると共に当該走
査周期目のスレッシュレベル電圧VLの得られだNc番
地を再記憶し、奇数走査周期目では前の走査周期目で得
られたNT番地の電圧VTに対応するよう検出器がコン
トロールされ、圧延材の幅端位置が演算されてその結果
が出力される。而して、このように走査周期を適正にコ
ントロールしたうえで、スレッシュレベル電圧■Lの位
置を圧延材の幅端部と判断する。
Next, to explain the calculation timing of the width direction position of the rolled material with reference to FIG. 7, in the first scanning period from the detection starting point A to R, the threshold level voltage vL
The address is detected, and in the second scanning cycle, the voltage vT at the NT address before the Nc address in the first scanning cycle is sampled and held, and the Nc address from which the threshold level voltage vL in the second scanning cycle was obtained is re-stored. However, in the third scanning period, the detector is controlled so as to correspond to the voltage vT at the NT address obtained in the second scanning period, and the width end position of the rolled material is calculated, and the result B is output. Eyes are 2
The voltage VT at the NT address before the Nc address in the scanning period is sampled and held, and the NC address from which the threshold level voltage VL in the fourth scanning period was obtained is stored again, and the fifth scanning period is obtained in the fourth scanning period. The detector is controlled so as to correspond to the voltage VT at the NT address, the width end position of the rolled material is calculated, and the result B is output.Similarly, for even-numbered addresses, the NC address of the previous scanning cycle is The voltage vT before the NT address is sampled and held, and the Nc address at which the threshold level voltage VL of the scanning cycle is obtained is stored again, and in the odd scanning cycle, the voltage at the NT address obtained at the previous scanning cycle is stored. The detector is controlled to correspond to the VT, the width end position of the rolled material is calculated, and the result is output. After appropriately controlling the scanning period in this way, the position of the threshold voltage ■L is determined to be the width end of the rolled material.

なお、上記のような走査を行う際、走査方向は圧延材の
中心側から幅端方向であるがこれは次の理由による。す
なわち、第8図(ロ)に示すような圧延材(1)の走査
を行うと、映像信号は例えば第8図(イ)のようになる
が、水滴等の外光を反射させてその入光によって第8図
(イ)のX、Yのようなレベル変化が生じた場合、圧延
材(1)の幅端側から中央側へ走査すると、最初のレベ
ル変化Xを板端部と判断してしまう虞れがある。しかし
、中央側から幅端側へ走査すると、上述のような外乱の
影響を除去できる。
Note that when performing the above scanning, the scanning direction is from the center side to the width end direction of the rolled material for the following reason. That is, when the rolled material (1) is scanned as shown in Figure 8 (b), the video signal will be as shown in Figure 8 (a), for example, but the external light such as water droplets is reflected and the incoming light is reflected. When a level change occurs due to light as shown in X and Y in Figure 8 (a), when scanning from the width edge of the rolled material (1) to the center, the first level change X is determined to be the edge of the plate. There is a risk that it will happen. However, by scanning from the center side to the width end side, the influence of the above-mentioned disturbance can be removed.

次に、本発明の具体例を第9図により説明する。Next, a specific example of the present invention will be explained with reference to FIG.

図中Qηは図示してない検出器で検出された圧延材映像
信妥電圧Vと設定されたスレッシュレベル電圧vLとを
比較し、■≧■Lの場合に信号を出力する比較器、(イ
)は比較器Qυからの信号によりその時のクロックパル
スのカウント数Nc(Nc番地)を記憶する記憶回路、
翰は検出器からのイネーブル信号v■により記憶回路翰
に記憶されているクロックパルスのカウント数Ncが移
行され記憶される記憶回路、(ハ)は記憶回路いからの
クロックパルスのカウント数Ncと設定器(ハ)で設定
されたカウント数NTを減算する減算回路、(ハ)は減
算回路(ハ)から送られて来たNC番地よりNT番地手
前のカウント数NC−NTとカウンタ(イ)から送られ
て来たカウント数とを比較しカウンタ(イ)でのカウン
ト数がカウント数NC−NTより大きくなったときに信
号を出力し得るようにした比較器、(ハ)は比較器(ホ
)よりの指令信号により閉じるスイッチ、翰はスイッチ
(ハ)が閉じたらそのときの圧延材映像信号の電圧vT
をホールドするサンプルホールド回路、(至)はゲイン
、0])は電圧信号をそれに対応する周波数のパルスに
変換するり変換回路、に)は0υの出力パルスをカウン
トするカウンタ、(ト)はスタートパルス発生回路であ
る。
In the figure, Qη is a comparator (I ) is a memory circuit that stores the clock pulse count number Nc (Nc address) at that time based on the signal from the comparator Qυ;
翰 is a memory circuit in which the count number Nc of clock pulses stored in the memory circuit 翺 is transferred and stored by the enable signal v■ from the detector, and (c) is the count number Nc of clock pulses from the memory circuit A subtraction circuit that subtracts the count number NT set by the setting device (C), (C) is the count number NC-NT sent from the subtraction circuit (C) at the NT address before the NC address, and the counter (A). A comparator that compares the count number sent from the counter (A) and outputs a signal when the count number at the counter (A) becomes larger than the count number NC-NT; (C) is the comparator ( The switch (e) is closed by a command signal from the switch (c), and when the switch (c) is closed, the voltage vT of the video signal of the rolled material at that time
(To) is the gain, (0) is the conversion circuit that converts the voltage signal into a pulse of the corresponding frequency, (2) is the counter that counts the output pulses of 0υ, (G) is the start This is a pulse generation circuit.

スタートパルスにより全てのカウンタ@c3′4はクリ
アされ、同時に初期電圧Voに対応する周波数のクロッ
クパルスのカウントがカウンタに)により開始される。
All counters @c3'4 are cleared by the start pulse, and at the same time, counting of clock pulses with a frequency corresponding to the initial voltage Vo is started by the counters.

又、圧延利の発する光によって検出器の受光素子に生ず
る映像信号電圧Vを各ビットごとに比較器Qυに出力し
、該比較器でv−VLが比較、演算される。而して、V
≧VLとなった時に、比較器Qυから記憶回路(ハ)に
信号が出力され、そのときのクロックパルスのカウント
数Ncが記憶回路(イ)に記憶される。
Further, the video signal voltage V generated in the light receiving element of the detector by the light emitted by the rolling margin is outputted bit by bit to the comparator Qυ, and the comparator compares and calculates v-VL. Therefore, V
When ≧VL, a signal is output from the comparator Qυ to the storage circuit (c), and the count number Nc of clock pulses at that time is stored in the storage circuit (a).

検出器からイネーブル信号が発生すると、カウント数N
cは記憶回路(ト)に移行されると共に減算回路(財)
でNC−NTが演算され、サンプルボールド回路−が待
機の状態になる。
When the enable signal is generated from the detector, the count number N
c is transferred to the memory circuit (G) and is also transferred to the subtraction circuit (G).
NC-NT is calculated and the sample bold circuit enters a standby state.

クロックパルスが検出器の受光素子の数だけ数え終った
ら再度スタートパルスが発生し、クロックパルスのカウ
ント数が比較器(ホ)でNC−NTと比較され、クロッ
クパルスのカウント数がNc−NTより大きくなると、
比較器(ホ)からの出力信号がスイッチ(財)を閉じ、
そのときの映像信号の電圧VTがスレッシュレベル電圧
VLに対応する受光素子のNc番地よりNT番地手前の
映像信号としてサンプルホールド回路(イ)に保持され
る。又同時にこの走査周期におけるスレッシュレベル電
圧vLに対応するカウント数Ncが前述と同様にしてめ
られ、記憶回路(イ)に記憶される。
When the clock pulse has finished counting the number of light receiving elements of the detector, a start pulse is generated again, and the count number of clock pulses is compared with NC-NT by the comparator (E), and the count number of clock pulses is compared with NC-NT. When it gets bigger,
The output signal from the comparator (e) closes the switch (goods),
The voltage VT of the video signal at that time is held in the sample and hold circuit (a) as a video signal at an address NT before the address Nc of the light receiving element corresponding to the threshold level voltage VL. At the same time, the count number Nc corresponding to the threshold level voltage vL in this scanning period is determined in the same manner as described above and stored in the storage circuit (a).

更に、検出器からイネーブル信号VXが発生し、再度ス
タートパルスが発生し、切り替えスイッチ(ハ)が切り
替わって電圧VTに対応する周波数のクロックパルスの
カウントが開始される。
Further, an enable signal VX is generated from the detector, a start pulse is generated again, the changeover switch (c) is switched, and counting of clock pulses with a frequency corresponding to the voltage VT is started.

以下、上記のシーケンスが繰り返されるが、電圧VLの
位置が圧延材幅端部と判断される。との■Lの値は調整
によって適宜変更できることは言うまでもない。
Thereafter, the above sequence is repeated, but the position of voltage VL is determined to be the width end of the rolled material. It goes without saying that the value of ■L can be changed as appropriate by adjustment.

なお、本発明の実施例においては圧延材の幅端部の位置
を検出する場合について説明しだが、圧延材に限らず高
温の金属塊ならいかなる金属塊に対しても適用可能なこ
と、その他、本発明の要旨を逸脱しない範囲内で種々変
更を加え得ること、等は勿論である。
In the embodiments of the present invention, a case has been described in which the position of the width end of a rolled material is detected, but the present invention is applicable not only to rolled materials but also to any high-temperature metal lump. It goes without saying that various changes may be made without departing from the spirit of the invention.

〔発明の効果〕〔Effect of the invention〕

本発明の金属塊の幅方向位置検出方法及びその装置によ
れば、圧延材板端の適正な映像信号を得るととが可能に
なるので金属塊の幅端部位置を正確に検出することがで
きる。
According to the method and device for detecting the position in the width direction of a metal lump of the present invention, it is possible to obtain an appropriate video signal of the edge of the rolled material plate, so it is possible to accurately detect the position of the width end of the metal lump. can.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は金属塊等の材料の幅方向位置を検出する原理の
説明図、第2図は加熱された金属塊の幅方向位置を検出
する原理の説明図、第3図は第2図で示す幅方向位置検
出の場合に幅端部に生じる光量差を表わす信号と走査時
間との関係を示すグラフ、第4図は加熱された金属塊の
幅端部を検出する場合に走査時間の変更による出力信号
の変化を示す説明図、第5図(イ)は光量が少ない場合
の本発明における映像信号の説明図、第5図(ロ)は第
5図(イ)の映像信号の場合にサンプルホールドされた
所定の番地の信号電圧の説明図、第6図(イ)は光量が
多い場合の本発明における映像信号の説明図、第6図(
ロ)は第6図(イ)の映像信号の場合にサンプルホール
ドされた所定の番地の信号電圧の説明図、第7図は本発
明において金属塊の走査を行う場合の演算タイミングの
説明図、第8図(イ)(ロ)d本発明において検出器の
走査方向を圧延材中央側から幅端方向とする理由の説明
図、第9図は本発明を具体化した一実施例の説明図であ
る。 図中QOは比較器、(イ)(イ)は記憶回路、(ハ)は
減算回路、(イ)は比較器、(財)はカウンタ、(ハ)
はスイッチ、(2)はザンブルホールド回路、0υはV
/F変換回路、(儲はカウンタ、(イ)はスタートパル
ス発生回路を示す。 特許出願人 石川島播磨重工業株式会社 第2図 @5図 (イ) Nα 第6図 第7図 第8図 (イ)
Figure 1 is an explanatory diagram of the principle of detecting the widthwise position of a material such as a metal lump, Figure 2 is an explanatory diagram of the principle of detecting the widthwise position of a heated metal mass, and Figure 3 is the same as Figure 2. Graph showing the relationship between the signal representing the difference in light intensity occurring at the width edge and the scanning time in the case of width direction position detection shown in Fig. 4. FIG. 5(A) is an explanatory diagram showing the change in the output signal according to the present invention. FIG. 5(B) is an explanatory diagram of the video signal in the present invention when the amount of light is small. FIG. An explanatory diagram of the signal voltage at a predetermined address sampled and held, FIG. 6 (a) is an explanatory diagram of the video signal in the present invention when the amount of light is large,
B) is an explanatory diagram of the signal voltage at a predetermined address sampled and held in the case of the video signal of FIG. 6(A), and FIG. 7 is an explanatory diagram of the calculation timing when scanning a metal lump in the present invention. Fig. 8 (a) (b) d An explanatory diagram of the reason why the scanning direction of the detector is set from the center side of the rolled material to the width end direction in the present invention. Fig. 9 is an explanatory diagram of an embodiment embodying the present invention. It is. In the figure, QO is a comparator, (A) (A) is a memory circuit, (C) is a subtraction circuit, (A) is a comparator, (A) is a counter, (C)
is a switch, (2) is a Zumble hold circuit, 0υ is V
/F conversion circuit, (mark is a counter, (a) is a start pulse generation circuit. Patent applicant Ishikawajima-Harima Heavy Industries Co., Ltd. Fig. 2 @ Fig. 5 (a) Nα Fig. 6 Fig. 7 Fig. 8 (i) )

Claims (1)

【特許請求の範囲】 旬 加熱された金属塊の発する光を受光する受光素子群
とレンズとより構成された検出器により金属塊幅端位置
を検出する際に、受光素子を金属塊の中央側より幅端方
向へ走査し、該走査により得られた映像信号中、予め設
定されたレベルの電圧を発生する受光素子近傍の受光素
子が受けている光量から走査周期を決定し、前記検出器
の受光素子を金属塊の中央側より幅方向へ、決定された
走査周期により走査を行ない、予め設定されたレベルの
電圧を発生する受光素子の番地をめて金属塊の幅端位置
を検出することを特徴とする金属塊の幅方向位置検出方
法。 2)加熱された金属塊の発する光を受光する受光素子群
とレンズとにより構成され金属塊中央側より幅端方向へ
走査し得るようにした検出手段と、該検出手段で検出さ
れた金属塊の映像信号電圧と予め設定されたレベルの電
圧とを比較し、映像信号電圧が設定されたレベルの電圧
以上に々つたら信号を出力する比較手段と、該比較手段
からの信号を受けたときの前記検出手段の受光素子の番
地を記憶する記憶手段と、該記憶゛手段から送られて来
た番地と前記設定されたレベルの電圧の発生する受光素
子の番地の近傍の番地との差をめる減算手段と、該減算
手段でめられた値と走査開始によりカウントされるクロ
ックパルスのカウント数とを比較して、クロックパルス
のカウント数が減算手段から送られて来だ値以上になっ
たら所定のスイッチに閉じる指令を与える比較手段と、
スイッチが閉じたら金属塊の映像信号電圧をホールドす
るサンプルホールド手段と、そのホールドされた電圧を
もとに走査周期を変更する手段とを設けたことを特徴と
する金属塊の幅方向位置検出装置。
[Scope of Claims] Shun: When detecting the width end position of a metal lump using a detector composed of a light receiving element group and a lens that receive light emitted from a heated metal lump, the light receiving element is placed on the center side of the metal lump. The scanning period is determined from the amount of light received by a light-receiving element near the light-receiving element that generates a voltage at a preset level in the video signal obtained by scanning, and The width end position of the metal lump is detected by scanning the light receiving element from the center side of the metal lump in the width direction at a determined scanning period, and determining the address of the light receiving element that generates a voltage at a preset level. A method for detecting the position in the width direction of a metal lump. 2) A detection means configured by a light-receiving element group and a lens that receive light emitted from a heated metal lump and capable of scanning from the center side of the metal lump toward the width end, and a metal lump detected by the detection means. Comparing means for comparing the video signal voltage and a voltage at a preset level and outputting a signal when the video signal voltage exceeds the voltage at the set level, and when receiving a signal from the comparing means. storage means for storing the address of the light-receiving element of the detection means, and a difference between the address sent from the storage means and an address near the address of the light-receiving element where the voltage of the set level is generated. A subtraction means compares the value determined by the subtraction means with the count number of clock pulses counted at the start of scanning, and determines whether the count number of clock pulses is greater than or equal to the value sent from the subtraction means. comparison means for giving a command to close a predetermined switch when the
A width direction position detection device for a metal lump, characterized in that it is provided with a sample hold means for holding the video signal voltage of the metal lump when a switch is closed, and a means for changing the scanning period based on the held voltage. .
JP59077214A 1984-04-17 1984-04-17 Method and device for detecting position in width direction of metal lump Granted JPS60220802A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59077214A JPS60220802A (en) 1984-04-17 1984-04-17 Method and device for detecting position in width direction of metal lump

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59077214A JPS60220802A (en) 1984-04-17 1984-04-17 Method and device for detecting position in width direction of metal lump

Publications (2)

Publication Number Publication Date
JPS60220802A true JPS60220802A (en) 1985-11-05
JPH0423721B2 JPH0423721B2 (en) 1992-04-23

Family

ID=13627582

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59077214A Granted JPS60220802A (en) 1984-04-17 1984-04-17 Method and device for detecting position in width direction of metal lump

Country Status (1)

Country Link
JP (1) JPS60220802A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013096879A (en) * 2011-11-02 2013-05-20 Meidensha Corp Rotary machine gap measurement device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013096879A (en) * 2011-11-02 2013-05-20 Meidensha Corp Rotary machine gap measurement device

Also Published As

Publication number Publication date
JPH0423721B2 (en) 1992-04-23

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