JPS60247157A - Flaw detecting method and apparatus thereof - Google Patents
Flaw detecting method and apparatus thereofInfo
- Publication number
- JPS60247157A JPS60247157A JP10404784A JP10404784A JPS60247157A JP S60247157 A JPS60247157 A JP S60247157A JP 10404784 A JP10404784 A JP 10404784A JP 10404784 A JP10404784 A JP 10404784A JP S60247157 A JPS60247157 A JP S60247157A
- Authority
- JP
- Japan
- Prior art keywords
- inspected
- flaw
- magnetic field
- static magnetic
- slab
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
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- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は磁性体の被検査材の表面及び表皮下に存する疵
を検出する探傷方法及び装置に関し、更に詳述すれば被
検査材の表面にこれに沿う静磁場を形成せしめ、該表面
に疵が存する場合の静磁場の変化1こより移動する様に
なしである検査コイルの移動距離を測定することにより
疵検出を行う全く新しい探傷方法及びその実施に使用す
る装置を提案するものである。 。Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a flaw detection method and apparatus for detecting flaws existing on the surface and under the skin of a magnetic material to be inspected. A completely new flaw detection method in which flaws are detected by forming a static magnetic field along this surface, and measuring the distance traveled by an inspection coil so that the static magnetic field changes when a flaw exists on the surface. This paper proposes a device to be used for its implementation. .
スラブ、鋼管等の被検査材の表面及び表皮下に存在する
疵を探傷する方法としては、従来より渦流探傷方法、漏
洩磁束探傷方法等積々の方法が実施されているが、これ
らの従来方法にあっては、何れも被検査材の表面及び表
皮下に疵が存在する場合の渦電流、磁場の変動を磁気セ
ンサにて検出することにより疵検出を行うものであった
。A number of methods have been used to detect flaws on the surface and under the skin of inspected materials such as slabs and steel pipes, including the eddy current flaw detection method and the leakage magnetic flux flaw detection method. In all of these methods, flaws are detected by using a magnetic sensor to detect eddy currents and fluctuations in magnetic fields when flaws exist on the surface or under the skin of a material to be inspected.
この様な従来方法にあっては、磁気センサの検出感度の
向上を図るためには磁気センサを可及的に被検査材に近
接せしめる必要がある。しかしながら、被検査材は搬送
中に振動するため、該振動が大きい場合は被検査材が磁
気セン号に衝突し、これを破損する虞れがある。このた
め磁気センサを被検査材に近接せしめるには限界があり
、探傷感度を向上する上での制約となっていた。In such conventional methods, in order to improve the detection sensitivity of the magnetic sensor, it is necessary to place the magnetic sensor as close to the material to be inspected as possible. However, since the material to be inspected vibrates during transportation, if the vibration is large, there is a risk that the material to be inspected will collide with the magnetic sensor and damage it. For this reason, there is a limit to how close the magnetic sensor can be to the material to be inspected, which has been a constraint on improving flaw detection sensitivity.
そこで、磁気セン号の破損を防止し、また、該磁気セン
サの検出感度の向上を図る方法として、例えば、磁気セ
ンサと被検査材との空隙距離(以下リフトオフという)
を大きくし、そのときの磁気センサの検出感度の低下を
補うべく磁気センサに連なる信号処理系に感度補償のた
めの回路を設ける方法がある。Therefore, as a method to prevent damage to the magnetic sensor and improve the detection sensitivity of the magnetic sensor, for example, the air gap distance (hereinafter referred to as lift-off) between the magnetic sensor and the material to be inspected is
There is a method in which a circuit for sensitivity compensation is provided in the signal processing system connected to the magnetic sensor in order to increase the detection sensitivity of the magnetic sensor and compensate for the decrease in detection sensitivity of the magnetic sensor.
しかしながら、このような方法による場合は信号処理系
が複雑になる等の理由により磁気センサの検出感度の低
下を補う上での制約があり、結局リフトオフを大きくす
るには限界があった。However, when using such a method, there are restrictions in compensating for the decrease in detection sensitivity of the magnetic sensor due to reasons such as the complexity of the signal processing system, and there is a limit to increasing the lift-off.
〔目的〕
本発明は斯かる事情に鑑みてなされたものであり、検査
コイルを被検査材の表面に対して接離移動可能に設げ、
また、該被検査材の表面に臨設しである磁化手段にて被
検査材の表面の検査コイルと対向する部分に該表面に沿
う静磁場を形成せしめ、被検査材の表面及び表皮下に疵
が存在する場合の静磁場の乱れに起因する検査コイルの
移動距離を測定することにより疵検出を行うこととして
、複雑な信号処理系を要さずに従来方法よりもリフトオ
フを大きくし得、事故の虞れがない探傷方法及びその実
施に使用する装置を提供することを目的とする。[Purpose] The present invention has been made in view of the above circumstances, and includes an inspection coil that is movable towards and away from the surface of a material to be inspected,
In addition, a magnetizing means installed on the surface of the material to be inspected forms a static magnetic field along the surface of the material to be inspected at a portion of the surface facing the inspection coil, thereby causing defects on the surface and under the skin of the material to be inspected. This method detects defects by measuring the travel distance of the inspection coil caused by disturbances in the static magnetic field when a The purpose of the present invention is to provide a flaw detection method that is free from the risk of damage and equipment used to carry out the method.
本発明に係る探傷方法は、検査コイルを被検査材の表面
に対して接離移動可能に設け、また、被検査材の表面の
前記検査コイルと対向する部分に該表面に沿う静磁場を
形成すべき磁化手段を設け、被検査材の表面に疵が存在
する場合の前記静磁場の乱れに起因する前記検査コイル
の移動の距離を測定することにより疵を検出することを
特徴とする。In the flaw detection method according to the present invention, an inspection coil is provided so as to be movable toward and away from the surface of a material to be inspected, and a static magnetic field is formed along the surface of the surface of the material to be inspected at a portion facing the inspection coil. The present invention is characterized in that a flaw is detected by providing a magnetizing means to detect a flaw on the surface of a material to be inspected, and measuring the distance of movement of the inspection coil caused by disturbance of the static magnetic field when a flaw exists on the surface of a material to be inspected.
以下本発明をその実施例を示す図面に基づいて詳述する
。DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described in detail below based on drawings showing embodiments thereof.
第1図は本発明に係る探傷方法の実施に使用する装置の
略示正面図である。FIG. 1 is a schematic front view of an apparatus used to carry out the flaw detection method according to the present invention.
図中1はスラブであって、図示しない搬送装置により図
面の表裏方向に移送される。スラブ1の移送域の所定の
位置には磁極N極、S極をスラブ1の板幅方向に対向し
、その間にスラブ1を通過させるようにして電磁石2を
設けである。電磁石2は直流電源11に接続されており
、該直流電源11から直流を通流されると、その直下に
位置するスラブ1の表層部にその板幅方法に向かう静磁
場を形成する。なお、電磁石2の代わりに永久磁石を設
けることとしてもよい。In the drawing, numeral 1 indicates a slab, which is transported in the front and back directions of the drawing by a transport device (not shown). At a predetermined position in the transfer area of the slab 1, an electromagnet 2 is provided with a magnetic north pole and a south pole facing each other in the width direction of the slab 1, with the slab 1 passing between them. The electromagnet 2 is connected to a DC power supply 11, and when a DC current is passed from the DC power supply 11, a static magnetic field is formed in the surface layer of the slab 1 located directly below the electromagnet 2 in the direction of the width of the slab. Note that a permanent magnet may be provided instead of the electromagnet 2.
電磁石2の上方には支持部材5を設けである。A support member 5 is provided above the electromagnet 2.
支持部材5は板幅方向の走査のために図示しない駆動手
段によりスラブ1の板幅方向に移動されるようになって
いる。支持部材5には検査コイル3をその軸心をスラブ
1の表面に垂直にして、その表面から適長だけ離してコ
イルバネ6.6を介して上下方向への移動可能に吊支し
である。The support member 5 is moved in the width direction of the slab 1 by a drive means (not shown) for scanning in the width direction of the slab 1. The test coil 3 is suspended from the support member 5 so as to be vertically movable via a coil spring 6.6 with its axis perpendicular to the surface of the slab 1 and separated from the surface by an appropriate length.
支持部材5の検査コイル3の真上に相当する下面には検
査コイル3との距離を測定する距離センサ4、例えば光
学センサ、マイクロ波センサ、超音波センサを設けであ
る。距離センサ4の測定結果は後述する比較器13に入
力される。A distance sensor 4 for measuring the distance to the test coil 3, such as an optical sensor, a microwave sensor, or an ultrasonic sensor, is provided on the lower surface of the support member 5 directly above the test coil 3. The measurement result of the distance sensor 4 is input to a comparator 13, which will be described later.
さて、この様な構成においてスラブ1の表面に疵14が
存在する場合は該疵14部から図中破線で示す如く磁束
が漏洩し、疵14が検査コイル3直下を通過する前後に
はこの漏洩磁束により静磁場が変化する。そして、この
静磁場の水平方向成分の変化により検査コイル3には誘
導電流が流れ、従ってフレミングの左手の法則により上
下方向の電磁力が作用する。この結果、その前後におい
て検査コイル3は第2図に示す様に上下方向に振動する
。Now, in such a configuration, if a flaw 14 exists on the surface of the slab 1, magnetic flux leaks from the flaw 14 as shown by the broken line in the figure, and this leakage occurs before and after the flaw 14 passes directly under the inspection coil 3. The static magnetic field changes due to magnetic flux. An induced current flows in the test coil 3 due to the change in the horizontal component of the static magnetic field, and therefore, an electromagnetic force acts in the vertical direction according to Fleming's left hand rule. As a result, the test coil 3 vibrates in the vertical direction before and after that, as shown in FIG.
而して、この振動の振幅ΔL(疵14が存在しない場合
の距離センサ4〜検査コイル3間の空隙距離LQと疵1
4が存在する場合の距離センサ4〜検査コイル3間の空
隙距離L1との差に相当する)は距離センサ4にて測定
され比較器13に入力される。Therefore, the amplitude ΔL of this vibration (the gap distance LQ between the distance sensor 4 and the inspection coil 3 when there is no flaw 14 and the flaw 1
4) is measured by the distance sensor 4 and input to the comparator 13.
比較器13には疵14の存否の判定基準となる閾値ΔL
口が設定されており、ΔL〉ΔLoなる場合は疵14が
存在するとし警報器15を作動させ、また、図示しない
マーキング装置に所定信号を発する。The comparator 13 has a threshold value ΔL that serves as a criterion for determining the presence or absence of a flaw 14.
If the opening is set and ΔL>ΔLo, it is assumed that a flaw 14 exists, and the alarm 15 is activated, and a predetermined signal is issued to a marking device (not shown).
叙上の如き本発明による場合はスラブ1の表面〜検査コ
イル3間距離がリフトオフとなり、電磁石2への通電電
流を高めることにより検出感度の上昇を図ることができ
るので、リフトオフを大きくすることができる。また、
その構成により感度補償のための回路構成を要せず簡潔
な構成にて疵検出が行なえる。更にスラブ1の搬送中の
上下変動を何等かの手段にて検出し、この変動分を補正
量として距離センサ4の測定結果に加味する場合は疵の
存否のみならず、その深さも検出することができる。In the case of the present invention as described above, the distance between the surface of the slab 1 and the inspection coil 3 becomes a lift-off, and the detection sensitivity can be increased by increasing the current flowing to the electromagnet 2, so it is possible to increase the lift-off. can. Also,
With this configuration, flaw detection can be performed with a simple configuration without requiring a circuit configuration for sensitivity compensation. Furthermore, if the vertical fluctuation of the slab 1 during transportation is detected by some means and this fluctuation is added to the measurement result of the distance sensor 4 as a correction amount, not only the presence or absence of a flaw but also its depth must be detected. I can do it.
なお、上述の実施例では本発明方法をスラブの探傷に適
用する場合について述べたが、鋼管等の他の磁性体の探
傷についても適用できることは勿論である。In the above-described embodiments, the method of the present invention is applied to flaw detection of slabs, but it is of course applicable to flaw detection of other magnetic materials such as steel pipes.
以上詳述した如く本発明に係る探傷方法は、検査コイル
を被検査材の表面に対して接離移動可能に設け、また、
該被検査材の表面に臨設しである磁化手段にて被検査材
の表面の検査コイルと対向する部分に該表面に沿う静磁
場を形成せしめ、被検査材の表面及び表皮下に疵が存在
する場合の静磁場の乱れに起因する検査コイルの移動距
離を測定することにより疵検出を行うものであるので、
静磁場の大きさを高めることにより検出感度の上昇を図
り得、これによりリフトオフを大きくすることができ、
事故の虞れのない安定した疵検出が行え、また、複雑な
信号処理系を要しない等、本発明は優れた効果を奏する
。As described in detail above, the flaw detection method according to the present invention includes a test coil that is movable toward and away from the surface of the material to be inspected, and
A magnetizing means installed on the surface of the material to be inspected forms a static magnetic field along the surface of the material to be inspected at a portion facing the inspection coil, and detects the presence of flaws on the surface and under the skin of the material to be inspected. Since flaws are detected by measuring the distance traveled by the inspection coil due to disturbances in the static magnetic field when
By increasing the magnitude of the static magnetic field, detection sensitivity can be increased, which can increase lift-off.
The present invention has excellent effects such as stable flaw detection without the risk of accidents and no need for a complicated signal processing system.
図面は本発明の実施例を示すものであり、第1図は本発
明方法の実施に使用する装置の略示正面図、第2図は検
査コイルの振動波形図である。
■・・・スラブ 2・・・電磁石 3・・・検査コイル
4・・・距離センサ 6,6・・・コイルバネ特 許
出願人 住友金属工業株式会社代理人 弁理士 河 野
登 夫
$1図
第 2 図The drawings show an embodiment of the present invention, and FIG. 1 is a schematic front view of an apparatus used to carry out the method of the present invention, and FIG. 2 is a vibration waveform diagram of a test coil. ■... Slab 2... Electromagnet 3... Inspection coil 4... Distance sensor 6, 6... Coil spring patent
Applicant Sumitomo Metal Industries Co., Ltd. Agent Patent Attorney Noboru Kono $1 Figure 2
Claims (1)
能に設け、また、被検査材の表面の前記検査コイルと対
向する部分に該表面に沿う静磁場を形成すべき磁化手段
を設け、 被検査材の表面及び表皮下に疵が存在する場合の前記静
磁場の乱れに起因する前記検査コイルの移動の距離を測
定することにより疵を検出することを特徴とする探傷方
法。 2、被検査材の表面に対して接離移動可能に設けである
検査コイルと、 被検査材の表面に沿う静磁場を形成する磁化手段と、 前記検査コイルに対設してあって、それとの離隔寸法を
測定する距離計と を具備することを特徴とする探傷装置。[Claims] 1. An inspection coil is provided so as to be movable toward and away from the surface of the material to be inspected, and a static magnetic field is formed along the surface of the surface of the material to be inspected at a portion facing the inspection coil. and detects a flaw by measuring the distance of movement of the inspection coil caused by disturbance of the static magnetic field when a flaw exists on the surface or under the skin of the material to be inspected. flaw detection method. 2. An inspection coil that is movable toward and away from the surface of the material to be inspected; a magnetizing means that forms a static magnetic field along the surface of the material to be inspected; A flaw detection device comprising: a distance meter for measuring the separation dimension of the flaw detection device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10404784A JPS60247157A (en) | 1984-05-22 | 1984-05-22 | Flaw detecting method and apparatus thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10404784A JPS60247157A (en) | 1984-05-22 | 1984-05-22 | Flaw detecting method and apparatus thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS60247157A true JPS60247157A (en) | 1985-12-06 |
Family
ID=14370300
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10404784A Pending JPS60247157A (en) | 1984-05-22 | 1984-05-22 | Flaw detecting method and apparatus thereof |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60247157A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4789880A (en) * | 1986-07-16 | 1988-12-06 | Minolta Camera Kabushiki Kaisha | Focusing device for use in optical apparatuses |
| CN107144628A (en) * | 2017-05-18 | 2017-09-08 | 华中科技大学 | A kind of electromechanical detection method based on defect and magnetic leakage field source Yu active probe magnetic source |
-
1984
- 1984-05-22 JP JP10404784A patent/JPS60247157A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4789880A (en) * | 1986-07-16 | 1988-12-06 | Minolta Camera Kabushiki Kaisha | Focusing device for use in optical apparatuses |
| CN107144628A (en) * | 2017-05-18 | 2017-09-08 | 华中科技大学 | A kind of electromechanical detection method based on defect and magnetic leakage field source Yu active probe magnetic source |
| CN107144628B (en) * | 2017-05-18 | 2020-07-10 | 华中科技大学 | Electromagnetic detection method based on defect leakage magnetic field source and active detection magnetic source |
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