JPS6025439A - Measuring device of material tester - Google Patents
Measuring device of material testerInfo
- Publication number
- JPS6025439A JPS6025439A JP13495683A JP13495683A JPS6025439A JP S6025439 A JPS6025439 A JP S6025439A JP 13495683 A JP13495683 A JP 13495683A JP 13495683 A JP13495683 A JP 13495683A JP S6025439 A JPS6025439 A JP S6025439A
- Authority
- JP
- Japan
- Prior art keywords
- load
- test material
- test
- measuring device
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】 （イ）産業上の利用分野 本発明は材料試験機の計測装置に関する。[Detailed description of the invention] (b) Industrial application fields The present invention relates to a measuring device for a material testing machine.
（ロ）従来技術
従来、第１図に示す材料試験機の計測装置において、試
験前にキャリブレーションを行う場合、特に、零調整と
フルスケールのスパン調整を行う時は、上記計測装置に
付属する目盛を手動操作によって調節し、かつ、アナロ
グ回路の定数も合せ込む必要があり、調整に手数がかか
る欠点があった。また、零調整においては、荷重０（ｔ
ｏｎ）の時電圧０（■）、フルスケール調整時にあって
は、荷重ＩＱ（ｔｏｎ）の時５（ｖ）等、それぞれ絶対
値が得られるよう調整しておかなければならないという
欠点があった。(B) Prior Art Conventionally, when calibrating the measuring device of the material testing machine shown in Fig. 1 before testing, especially when performing zero adjustment and full-scale span adjustment, the measuring device attached to the measuring device is It was necessary to adjust the scale manually and also to match the constants of the analog circuit, which had the disadvantage that adjustment was time-consuming. In addition, in zero adjustment, the load is 0 (t
There was a drawback that the voltage had to be adjusted to obtain the absolute value, such as 0 (■) when the load was on) and 5 (v) when the load was IQ (ton) when adjusting the full scale. .
（ハ）発明の目的
本発明は、上記従−来の欠点に鑑みてなされたもので、
計測装置の零調整とフルスケール調整に手動操作が不要
で、試験毎の絶対値調整も必要としない、迅速かつ、高
精度の計測装置を提供することを目的としている。(c) Purpose of the invention The present invention has been made in view of the above-mentioned conventional drawbacks.
The purpose of this invention is to provide a quick and highly accurate measuring device that does not require manual operations for zero adjustment and full-scale adjustment of the measuring device, and does not require absolute value adjustment for each test.
（二）発明の構成
本発明は、被試験材に所定の荷電を負荷して試験を行う
際に生じる試験材の状態変化を、ロードセル、アンプ及
びＡ／Ｄ変換器を介してデジタル変換値とし、ＣＰＵに
入力することによって計測値を得るよう構成された計測
装置において、上記ロードセルが無負荷状態にある荷重
０の電圧ＣＯと、上記計測装置に荷重検定器をセットし
、順次荷重を負荷した際におけるフルスケール荷載時の
フルスケール電圧ｅｆ及びフルスケール荷重値Ｌｆのそ
れぞれを、上記ＣＰＵにあらかじめ入力しておき、試験
材の計測時に、上記ロードセルからＣＰｔＪに導入され
る試験時の電圧ｅｔを入力として、試験材の真の入力値
Ｌｔをめる変換式に基づいて試験材の計測値を演算処理
することりこより、試験材に作用している真の荷重値を
得るよう構成したことを特徴としている。(2) Structure of the Invention The present invention converts changes in the state of a test material that occur when a test is performed by loading a predetermined charge onto the test material into digital converted values via a load cell, an amplifier, and an A/D converter. In a measuring device configured to obtain measured values by inputting them to a CPU, the load cell was set to the voltage CO at a zero load with no load, and a load verifier was set to the measuring device, and loads were sequentially applied. The full-scale voltage ef and full-scale load value Lf at the time of full-scale loading are input into the CPU in advance, and the test voltage et introduced from the load cell to the CPtJ is inputted into the CPU when measuring the test material. As an input, the true load value acting on the test material is obtained by calculating the measured value of the test material based on the conversion formula that calculates the true input value Lt of the test material. It is a feature.
（ボ）実施例 ｋｌ下、図面に基づいて本発明の詳細な説明する。(B) Example The present invention will be described in detail below with reference to the drawings.
第１図において、上部架台１に固着されたロードセル２
に、一方のつかみ具が取り付けられ、この架台１に相対
向する下部架台４に設置された負荷装置５には、他方の
つかみ具６が取り付けられている。このつかみ具３，６
には、試験材７がはさまれ、上記負荷装置５を介して外
部出力源（図示せず）から所定の試験圧が、この試験材
７に負荷されることによって、試験がなされる。この計
測値は上記ロードセル２で検出された後、第２図に示ず
アンプ８およびＡ／Ｄ変換器９を介してｃｐｕｉｏに入
力される。また、上記試験材７に代え゛Ｃ，ｔｊ重検定
器１１がセットされ、この出力が上記第２図に示す回路
を経て、ｃｐｕｔｔに入力される。In FIG. 1, a load cell 2 fixed to an upper frame 1
One grip is attached to the load device 5 installed on the lower pedestal 4 facing the pedestal 1, and the other grip 6 is attached to the load device 5. This grip 3, 6
A test material 7 is sandwiched between the test material 7 and the test material 7, and a predetermined test pressure is applied to the test material 7 from an external output source (not shown) via the load device 5, thereby conducting the test. After this measured value is detected by the load cell 2, it is input to the cpuio via an amplifier 8 and an A/D converter 9 (not shown in FIG. 2). In addition, a C, tj double calibrator 11 is set in place of the test material 7, and its output is input to cputt via the circuit shown in FIG. 2 above.
第３図は、第２図に示すプロ・ツク図に基づく荷重測定
時のグラフを示し、縦軸は電圧ｅ（Ｖ）。FIG. 3 shows a graph during load measurement based on the diagram shown in FIG. 2, and the vertical axis represents voltage e (V).
横軸は荷重Ｌ（ｔｏｎ）を示す。The horizontal axis indicates load L (ton).
まず、第１図に示すつかみ具３，６に試験材７をはさま
ない状態、ずなわち、荷重Ｑ（ｔｏｎ）におけるロード
セル２の出力電圧ｅ （Ｖ）を、第２図に示ずＣＰＵＩ
Ｏに入力する。このとき、第１図に示すアンプ８の検出
出力は、第３図に示すように、電圧ｅｏ （ｖ）として
示される。つぎに、」二起つかみ具３，６に第２図に示
す荷重検定ａｉｉをセットし、徐々に負荷してフルスケ
ール荷重１，ｆ（ｔｏｎ）になった時のフルスケール電
圧ｅｆ（Ｖ）を、上記ＣＰＵＩＯに入力する。この時、
荷重検定器１１からの設定出力は第３図に示すように、
電圧ｅｏ （Ｖ）を通る直線Ａで示される。First, the output voltage e (V) of the load cell 2 when the test material 7 is not held between the grips 3 and 6 shown in FIG.
Enter O. At this time, the detection output of the amplifier 8 shown in FIG. 1 is shown as a voltage eo (v), as shown in FIG. Next, set the load verification aii shown in FIG. is input to the above CPUIO. At this time,
The setting output from the load verification device 11 is as shown in Fig. 3.
It is indicated by a straight line A passing through the voltage eo (V).
いま、試験材７を第１図に示すつかみ具３．６にはさん
で試験し、第２図に示すロードセル２。Now, the test material 7 is placed between the grips 3.6 shown in FIG. 1 and tested, and the load cell 2 shown in FIG. 2 is tested.
アンプ８およびＡ／Ｄ変換器９を介してＣＰＵＩＯに入
力する場合、上記試験材７に所定の試験圧を負荷すると
、この時の出力電圧ｅ （Ｖ）は第３図において、ｅｔ
（Ｖ）として示される。そして、この出力電圧ｅｔ（Ｖ
）における試験材７の真の荷重値Ｌｔ （ｔｏｎ）は、
この材料試験機の計測装置の特性を示す第３図の直線と
対比するよう、下式を用いてめることができ、ｃｐｕｉ
ｏによってｆｉ算される。When inputting to the CPUIO via the amplifier 8 and the A/D converter 9, when a predetermined test pressure is applied to the test material 7, the output voltage e (V) at this time is shown as et
(V). Then, this output voltage et(V
) The true load value Lt (ton) of the test material 7 is
In contrast to the straight line in Figure 3, which shows the characteristics of the measuring device of this material testing machine, it can be determined using the following formula, and cpu
fi is calculated by o.
ｅｔ−ｅｔ３
Ｌｔ＝ＬｆＸ □
ｅｆ−ｅ□
ここに、Ｌｔ：試験材の真の荷重値
Ｌｆ；定数（フルスケール荷重値）
ｅｆ：フルスケール電圧
ｅｏ；荷重０の電圧
ｅｔ：試験時の電圧
従って、試験荷重値を任意に変化させて、適時、出力電
圧をＣＰＵＩＯに入力し、かつ、上式に基づいて演算処
理することにより、試験材７の補正された真の荷重値を
知ることができる。et-et3 Lt=LfX □ ef-e □ Where, Lt: True load value of the test material Lf; Constant (full-scale load value) ef: Full-scale voltage eo; Voltage at zero load et: Voltage during test By arbitrarily changing the test load value, inputting the output voltage to the CPUIO at the appropriate time, and performing calculation processing based on the above formula, it is possible to know the corrected true load value of the test material 7. .
なお、上記第１図，第２図では、試験材７に荷電を負荷
する荷重試験について説明したが、この計測装置を変位
，ひずみ試験に用いても、同様の作用・効果を得ること
ができる。In addition, in FIGS. 1 and 2 above, a load test in which a charge is applied to the test material 7 is explained, but the same action and effect can be obtained even if this measuring device is used for a displacement or strain test. .
（へ）発明の詳細
な説明したように、本発明によれば、材料試験機の計測
装置における零調整と、フルスケールのスパン調整が容
易であり、試験毎の絶対値調整も不用となる。従って、
迅速で高精度の計測が可能である。また、試験材つかみ
具や他の構成部品の交換によって、零位が変化したり、
１１１調の状態に設定されていても、常に、適正な計測
値を（Ｍることができる。さらに、経年変化等によって
試験機自体に種々の変動が生じても、即、適正値に補正
されるので、計測には何ら悪影響を与えず、當時、適正
値が確保される等の効果がある。(F) As described in detail, according to the present invention, zero adjustment and full scale span adjustment in the measuring device of a material testing machine are easy, and absolute value adjustment for each test is also unnecessary. Therefore,
Rapid and highly accurate measurements are possible. In addition, the zero position may change due to replacement of the test material grips or other component parts.
Even if the tester is set to the 111th tone, it is possible to always obtain an appropriate measured value.Furthermore, even if the tester itself undergoes various fluctuations due to aging, etc., it will be immediately corrected to the appropriate value. Therefore, it does not have any adverse effect on the measurement and has the effect of ensuring appropriate values at all times.
第１図は材料試験機の主要部を示す正面図、第２図は本
発明の一実施例を示すブロック図、第３図は本発明の作
用説明図である。
５−負荷装置 ７−試験材
８−アンプ ９−Ａ／Ｄ変換器
１０−ＣＰ Ｕ １１−荷重検定器FIG. 1 is a front view showing the main parts of the material testing machine, FIG. 2 is a block diagram showing an embodiment of the present invention, and FIG. 3 is an explanatory diagram of the operation of the present invention. 5-Load device 7-Test material 8-Amplifier 9-A/D converter 10-CP U 11-Load tester
Claims (1)
試験材の状態変化を、ロードセル、アンプ及びＡ／Ｄ変
換器を介してデジタル変換値とし、ＣＰＵに入力するこ
とによって計測値を得るよう構成された材料試験機の計
測装置において、上記ロードセルが無負荷状態にある荷
重０の電圧ｅＱと、上記計測装置に荷重検出器をセット
し、順次荷重を負荷した際におりるフルスケール荷重時
のフルスケール電圧ｅｆ及びフルスケール荷重時値Ｌｆ
のそれぞれを、上記ＣＰＵにあらかじめ入力しておき、
試験材の計測時に、上記ロードセルからＣＰＵに導入さ
れる試験時の電圧ｅｔを入力として、試験材の真の荷重
値Ｌｔをめる変換式に基づいて試験材の計測値を演算処
理することにより、試験材に作用している真の荷重値を
得るよう構成したことを特徴とする材料試験機の計測装
置。Changes in the state of the test material that occur when performing a test by applying a predetermined load to the test material are converted into digital values via a load cell, amplifier, and A/D converter, and the measured values are input to the CPU. In the measuring device of the material testing machine configured to obtain the voltage eQ at zero load when the load cell is in an unloaded state, and the full scale when a load detector is set in the measuring device and loads are sequentially applied. Full-scale voltage ef under load and value Lf under full-scale load
Input each of the above into the CPU in advance,
When measuring the test material, the voltage et during the test introduced from the load cell to the CPU is input, and the measured value of the test material is calculated based on a conversion formula that calculates the true load value Lt of the test material. A measuring device for a material testing machine, characterized in that it is configured to obtain a true load value acting on a test material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13495683A JPS6025439A (en) | 1983-07-22 | 1983-07-22 | Measuring device of material tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13495683A JPS6025439A (en) | 1983-07-22 | 1983-07-22 | Measuring device of material tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6025439A true JPS6025439A (en) | 1985-02-08 |
| JPH0439613B2 JPH0439613B2 (en) | 1992-06-30 |
Family
ID=15140499
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13495683A Granted JPS6025439A (en) | 1983-07-22 | 1983-07-22 | Measuring device of material tester |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6025439A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000180321A (en) * | 1998-12-11 | 2000-06-30 | Japan Tobacco Inc | Material testing machine |
| JP2008267936A (en) * | 2007-04-19 | 2008-11-06 | Shimadzu Corp | Material testing machine and data correction method |
-
1983
- 1983-07-22 JP JP13495683A patent/JPS6025439A/en active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000180321A (en) * | 1998-12-11 | 2000-06-30 | Japan Tobacco Inc | Material testing machine |
| JP2008267936A (en) * | 2007-04-19 | 2008-11-06 | Shimadzu Corp | Material testing machine and data correction method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0439613B2 (en) | 1992-06-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US3847017A (en) | Strain measuring system | |
| US3955086A (en) | Radiation thickness gauge | |
| US5309377A (en) | Calibration apparatus and method for improving the accuracy of tire uniformity measurements and tire testing method using same | |
| US4127813A (en) | Method for balancing the sensitivity of two channels in a differential detection apparatus | |
| JPS6025439A (en) | Measuring device of material tester | |
| US4134292A (en) | Tire testing apparatus | |
| CN86108566A (en) | The bearing calibration of measured value | |
| US4464937A (en) | Extensometer readout circuit | |
| JP2612261B2 (en) | Material testing machine | |
| Hiti | Comparison of two 1 kN force transducers at continuous calibration | |
| JPS59231448A (en) | Calibrating device of eddy current flaw detection apparatus | |
| US3132509A (en) | Method for determination of mechanical tangent loss and dynamic modulus in the direct reading manner | |
| US2916701A (en) | Method and device for measuring electrical voltages | |
| Hiti | Validation of combinatorial evaluation of strain-gauge amplifier linearity | |
| US8903687B1 (en) | Dielectric absorption compensation for a measurement instrument | |
| JPH063238A (en) | Calculation method of tensile modulus in extensometer | |
| JPH0425637Y2 (en) | ||
| JP3621519B2 (en) | Device pass / fail judgment method | |
| SU1051396A1 (en) | Strain-measuring station for dynamic testing | |
| JPH05141944A (en) | Radiation thickness gauge | |
| SU885929A1 (en) | Direct reading device for automatic measuring four terminal network noise factor | |
| JPS60228911A (en) | Automatic hardness correction device for thickness gauge | |
| JPS5814047A (en) | Detection of cracks in test pieces | |
| SU1071982A1 (en) | Method of determination of measuring device graduation characteristics | |
| SU1580245A1 (en) | Method of adjusting calibration and checking measuring channel of electromagnetic device for nondestructive inspection |