JPS603458U - Fluorescent X-ray intensity measurement system holder for EXAFS measurement - Google Patents

Fluorescent X-ray intensity measurement system holder for EXAFS measurement

Info

Publication number
JPS603458U
JPS603458U JP9563883U JP9563883U JPS603458U JP S603458 U JPS603458 U JP S603458U JP 9563883 U JP9563883 U JP 9563883U JP 9563883 U JP9563883 U JP 9563883U JP S603458 U JPS603458 U JP S603458U
Authority
JP
Japan
Prior art keywords
rays
fluorescent
ray intensity
measurement
exafs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9563883U
Other languages
Japanese (ja)
Inventor
北野　友久
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP9563883U priority Critical patent/JPS603458U/en
Publication of JPS603458U publication Critical patent/JPS603458U/en
Pending legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は従来の蛍光ＥＸＡＦＳ測定装置の模式図、第２
図ａは本考案の一実施例を用いた蛍光Ｘ線強度計測系の
底面図、本図すはこの計測系の正面図である。 １・・・・・・Ｘ線源、２・・・・・・発散スリット、
３・・曲モノクロメータ−１４・・・・・・受光スリッ
ト、５・曲・試料、６・・・・・・フィルタ、７・・曲
ソーラスリット、８・・・・・・シンチレーションカウ
ンタ、９・・・・・・蛍光Ｘ線強度計測系保持具、１０
・・・・・・受光スリット固定台、５１・・・・・・試
料、５２・・・・・・試料ホルダ挿入口、６１・・・・
・・フィルタ挿入口。Figure 1 is a schematic diagram of a conventional fluorescence EXAFS measurement device, Figure 2
Figure a is a bottom view of a fluorescent X-ray intensity measurement system using an embodiment of the present invention, and this figure is a front view of this measurement system. 1...X-ray source, 2...Divergent slit,
3...Song monochromator-14...Light receiving slit, 5...Song/sample, 6...Filter, 7...Song solar slit, 8...Scintillation counter, 9 ...Fluorescent X-ray intensity measurement system holder, 10
...... Light receiving slit fixing base, 51... Sample, 52... Sample holder insertion port, 61...
...Filter insertion port.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 入射Ｘ線を絞るスリットと、前記Ｘ線が照射される資料
を保持する手段と、前記資料で生ずる蛍光Ｘ線を透過さ
せるとともに散乱Ｘ線を吸収するフィルタと、このフィ
ルタの出射Ｘ線のうちの所定方向進行成分を通過させる
ソーラースリットと、このソーラースリットの出力Ｘ線
の強度を測定するシンチレーションカウンタとが予め定
めた位置に取付く型のＥＸＡＦＳ測定用蛍光Ｘ線強度計
測系保持具。a slit for narrowing down incident X-rays; a means for holding the material to which the X-rays are irradiated; a filter for transmitting fluorescent X-rays generated by the material and absorbing scattered X-rays; A holder for a fluorescence X-ray intensity measurement system for EXAFS measurement, in which a solar slit that allows a component traveling in a predetermined direction to pass through, and a scintillation counter that measures the intensity of output X-rays from the solar slit are attached at a predetermined position.
JP9563883U 1983-06-21 1983-06-21 Fluorescent X-ray intensity measurement system holder for EXAFS measurement Pending JPS603458U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9563883U JPS603458U (en) 1983-06-21 1983-06-21 Fluorescent X-ray intensity measurement system holder for EXAFS measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9563883U JPS603458U (en) 1983-06-21 1983-06-21 Fluorescent X-ray intensity measurement system holder for EXAFS measurement

Publications (1)

Publication Number Publication Date
JPS603458U true JPS603458U (en) 1985-01-11

Family

ID=30228304

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9563883U Pending JPS603458U (en) 1983-06-21 1983-06-21 Fluorescent X-ray intensity measurement system holder for EXAFS measurement

Country Status (1)

Country Link
JP (1) JPS603458U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5459193A (en) * 1977-10-19 1979-05-12 Mitsubishi Electric Corp Fluorescent x-ray sulfur analytical apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5459193A (en) * 1977-10-19 1979-05-12 Mitsubishi Electric Corp Fluorescent x-ray sulfur analytical apparatus

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