JPS5459193A - Fluorescent x-ray sulfur analytical apparatus - Google Patents

Fluorescent x-ray sulfur analytical apparatus

Info

Publication number
JPS5459193A
JPS5459193A JP12608277A JP12608277A JPS5459193A JP S5459193 A JPS5459193 A JP S5459193A JP 12608277 A JP12608277 A JP 12608277A JP 12608277 A JP12608277 A JP 12608277A JP S5459193 A JPS5459193 A JP S5459193A
Authority
JP
Japan
Prior art keywords
rays
ray
sample
characteristic
radiation source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12608277A
Other languages
Japanese (ja)
Other versions
JPS6233545B2 (en
Inventor
Shinji Umadono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP12608277A priority Critical patent/JPS5459193A/en
Publication of JPS5459193A publication Critical patent/JPS5459193A/en
Publication of JPS6233545B2 publication Critical patent/JPS6233545B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To enable the effect of Cl contained in petroleum to be virtually removed without using means such as filters, etc. by forming a radiation source added with a specific target in addition to a primary radiation source. CONSTITUTION:The primary excitation rays being generated from a primary radiation source 1 which generates X-rays or gamma-rays are radiated to a target 5 which comprises applying a surface film by ordinary techniques for prevention of deliquescence on, preferably NaCl composed of Cl and an element smaller in atom number than Cl. Then, as a result of interaction, scattered rays and characteristic X-rays are grnerated. When the characteristic monochromatic X-ray of this Cl is radiated as a secondary X-ray source to the sample part 2 containing sample such as petroleum, etc., then the S being the measuring material in the sample is efficiently excited and on the other hand the Cl being the disturbing element in the sample is not excited by this excitation energy. The characteristic X-ray of the S having been excited is detected by an X-ray detector 3.
JP12608277A 1977-10-19 1977-10-19 Fluorescent x-ray sulfur analytical apparatus Granted JPS5459193A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12608277A JPS5459193A (en) 1977-10-19 1977-10-19 Fluorescent x-ray sulfur analytical apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12608277A JPS5459193A (en) 1977-10-19 1977-10-19 Fluorescent x-ray sulfur analytical apparatus

Publications (2)

Publication Number Publication Date
JPS5459193A true JPS5459193A (en) 1979-05-12
JPS6233545B2 JPS6233545B2 (en) 1987-07-21

Family

ID=14926150

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12608277A Granted JPS5459193A (en) 1977-10-19 1977-10-19 Fluorescent x-ray sulfur analytical apparatus

Country Status (1)

Country Link
JP (1) JPS5459193A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS603458U (en) * 1983-06-21 1985-01-11 日本電気株式会社 Fluorescent X-ray intensity measurement system holder for EXAFS measurement
US4577338A (en) * 1982-11-01 1986-03-18 Xertex Corporation X-Ray fluorescence spectrometer and method of calibrating the same
JPH1038825A (en) * 1996-07-18 1998-02-13 Rigaku Ind Co Fluorescent x-ray specromerer
WO2011027613A1 (en) * 2009-09-07 2011-03-10 株式会社リガク Fluorescent x-ray analysis method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4577338A (en) * 1982-11-01 1986-03-18 Xertex Corporation X-Ray fluorescence spectrometer and method of calibrating the same
JPS603458U (en) * 1983-06-21 1985-01-11 日本電気株式会社 Fluorescent X-ray intensity measurement system holder for EXAFS measurement
JPH1038825A (en) * 1996-07-18 1998-02-13 Rigaku Ind Co Fluorescent x-ray specromerer
WO2011027613A1 (en) * 2009-09-07 2011-03-10 株式会社リガク Fluorescent x-ray analysis method
JP2011075542A (en) * 2009-09-07 2011-04-14 Rigaku Corp Fluorescent x-ray analysis method
US8433035B2 (en) 2009-09-07 2013-04-30 Rigaku Corporation X-ray fluorescence analyzing method

Also Published As

Publication number Publication date
JPS6233545B2 (en) 1987-07-21

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