JPS60357A - Measuring device of acoustic emission - Google Patents
Measuring device of acoustic emissionInfo
- Publication number
- JPS60357A JPS60357A JP58108135A JP10813583A JPS60357A JP S60357 A JPS60357 A JP S60357A JP 58108135 A JP58108135 A JP 58108135A JP 10813583 A JP10813583 A JP 10813583A JP S60357 A JPS60357 A JP S60357A
- Authority
- JP
- Japan
- Prior art keywords
- noise
- detecting
- detection
- output
- gate circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims abstract description 44
- 238000005259 measurement Methods 0.000 claims abstract description 12
- 230000005540 biological transmission Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000006378 damage Effects 0.000 description 2
- 241000257465 Echinoidea Species 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 210000003323 beak Anatomy 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/14—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object using acoustic emission techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/26—Scanned objects
- G01N2291/269—Various geometry objects
- G01N2291/2696—Wheels, Gears, Bearings
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
Description
【発明の詳細な説明】
AE (Acoustic Emission )は材
料の破壊によって発生する一種の音響で、このAEの発
生を検出して材料の破壊の検知や試験をすることが行な
われている。DETAILED DESCRIPTION OF THE INVENTION AE (Acoustic Emission) is a type of sound generated by the destruction of a material, and the occurrence of this AE is detected to detect and test material destruction.
従来一般に行なわれているAE検出を利用覆る材料検査
装置においては、被測定物と△]三伝播関係にある位置
にΔF検出センサ(八[変換子)を取付け、そのAE検
出センサで被測定物からのAEを検出し、かつこれを電
気信号に変換して出力している。In conventional materials inspection equipment that uses AE detection, a ΔF detection sensor (transducer) is installed at a position that has a propagation relationship with the object to be measured, and the AE detection sensor detects the object to be measured. It detects the AE from the sensor, converts it into an electrical signal, and outputs it.
しかるにこの様なA[測定においては、八Eの測定中、
八Eの性質に類似した環境雑音であるノイズが測定系外
から侵入して測定されるため、杓ようとする八[情報が
ノイズに埋61′シてしま−うことがしばしばあり、特
に工場などの電気的若しくは機械的ノイズの多い場所に
おC)る△[測定では、その傾向が顕著であって、必要
て゛正確な△]三測測定困りにである。However, such A [in the measurement, during the measurement of 8E,
Because noise, which is environmental noise similar to the properties of 8E, enters from outside the measurement system and is measured, information that is trying to be measured is often buried in the noise, especially in factories. When measuring △ in places with a lot of electrical or mechanical noise, such as C), this tendency is noticeable, and accurate △ measurements are difficult.
そこでこのノイズを除去する技術として、従来はA[信
号とノイズとを周波数によって弁別りるフィルタ法、信
号の発生位置によってΔlE信号とノイズとを弁別する
位置標定法、あるいは(、?号の時間差や形状によって
AE信号とノイズとを弁別する空間フィルタ法等が開発
されているが、ノイズだけを弁別して除去づることが困
難であったり、弁別のための装置が複雑であったり、あ
るいは特別の構造をもつ被測定対象物に対してのみ有効
であったりして、必ずしも満足すべきものを得るに至っ
ていない。Therefore, conventional techniques for removing this noise include the filter method that distinguishes the A signal from the noise based on the frequency, the position location method that distinguishes the ΔlE signal from the noise based on the signal generation position, or the time difference Spatial filter methods have been developed to distinguish between AE signals and noise based on their shapes and shapes, but it is difficult to distinguish and remove just the noise, the equipment for discrimination is complicated, or special This method is effective only for objects to be measured that have a structure, and has not always been satisfactory.
この発明は上記のごとき事情に鑑みてなされたものであ
って、ノイズを確実に除去することができ、構造が簡単
で実施が容易であり、特に正確なAE測測定可能にする
AE測定装置を提供することを目的とするものである。The present invention was made in view of the above circumstances, and provides an AE measurement device that can reliably remove noise, has a simple structure, is easy to implement, and particularly enables accurate AE measurements. The purpose is to provide
この目的に対応して、この発明のAE測定装置は、特性
の等しいAE検出系を2系統備え、前記2系統のAE検
出系のうちの一方のAE検出系のAE検出センリ−を被
測定物からAEが伝播する位置に配設し、他方のAE検
出系のAE検出センサを前記一方のAE検出系のAE検
出センザの近傍であって前記被測定物からAEが伝播し
ない位置に配設し、前記他方のAE検出系でノイズが検
出された時だけ前記一方のへE検出系の出力を停止づる
ように構成したことを特徴としている。In order to achieve this purpose, the AE measurement device of the present invention includes two AE detection systems having the same characteristics, and connects the AE detection sensor of one of the two AE detection systems to the object to be measured. The AE detection sensor of the other AE detection system is arranged at a position near the AE detection sensor of the one AE detection system and where AE does not propagate from the object to be measured. The present invention is characterized in that the output of the one E detection system is stopped only when noise is detected in the other AE detection system.
以下この発明の詳細を、転がり軸受の異常検出のための
AE測定装置に適用した実施例について説明覆る。The details of the present invention will be described below with reference to an embodiment in which the invention is applied to an AE measuring device for detecting abnormalities in rolling bearings.
第1図におい−U、1はAE測定装置であり、試し
験軸受3で発生し軸受箱2を通して伝播春巷〔りるAE
を測定しようと覆るものである。In FIG.
It is something that is covered when trying to measure.
AE測定装置1はΔE検出部4、ノイズ除去装置5、出
力装置6を備えている。The AE measurement device 1 includes a ΔE detection section 4, a noise removal device 5, and an output device 6.
AE検出部4はAE検出センサ9 (AE変換子)、前
置増幅器7、フィルタ主増幅器8、及び弁別器11を備
えている。The AE detection section 4 includes an AE detection sensor 9 (AE converter), a preamplifier 7, a filter main amplifier 8, and a discriminator 11.
ノイズ除去装置5はノイズ検出部12、ゲート回路13
とを備えている。The noise removal device 5 includes a noise detection section 12 and a gate circuit 13.
It is equipped with
ノイズ検出部12はへE検出しン4ノ10(ΔF−変換
子)、前置増幅器14、フィルタ主増幅器15、及び弁
別器16を備えている。The noise detection unit 12 includes an E-detector 4/10 (ΔF-converter), a preamplifier 14, a filter main amplifier 15, and a discriminator 16.
AE検出センサ9とAE検出センサー 0はほぼ同じ特
性のものとする。前置増幅器7と前同増幅器14はそれ
ぞれAE検出セン+19.10の出力を増幅するもので
、はぼ同じ特性のものと1′る。It is assumed that the AE detection sensor 9 and the AE detection sensor 0 have almost the same characteristics. The preamplifier 7 and the preamplifier 14 each amplify the output of the AE detection sensor +19.10, and are assumed to have approximately the same characteristics.
フィルタ主増幅器8とフィルタ主増幅器15とはそれぞ
れ前置増幅器7.14の出力をフィルタリングしたのち
増幅づるもので、はぼ同じ特性のものとする。また、弁
別器11と弁別器1Gとはそれぞれフィルタ主増幅器ε
3.15の出力からΔFをしきい値によって弁別するも
ので、はぼ同じ特性のものどづる。かつ、AE検出部4
とノイズ検出部12とは全体としてほぼ同じ特性のA[
検出系となるJ:うに4f11成づ−る。The filter main amplifier 8 and the filter main amplifier 15 each filter and amplify the output of the preamplifier 7.14, and have almost the same characteristics. Further, the discriminator 11 and the discriminator 1G are each a filter main amplifier ε
3.15 is used to discriminate ΔF from the output using a threshold value, and they have almost the same characteristics. And, the AE detection section 4
and the noise detection unit 12 have almost the same characteristics as A[
Detection system J: Urchin 4f11 is formed.
AE検出部4のAE検出センサ9は軸受箱2に取付りて
試験軸受3からのAEを検出できるにうに配設する。し
かいノイズ検出部12のΔ[検出レン1す10はΔE検
出レしサ9の近傍であって試験軸受3からAEが伝播し
ない位置に配設する。The AE detection sensor 9 of the AE detection section 4 is attached to the bearing box 2 and arranged so as to be able to detect AE from the test bearing 3. The Δ[detection lens 1 and 10 of the noise detector 12 are arranged in the vicinity of the ΔE detection resistor 9 and at a position where AE is not propagated from the test bearing 3.
AE検出部4はゲート回路13を介して出力装[iI6
に接続する。出力装@6は例えばカウンタ18、記録計
21、波形記憶装置22、オシロスコープ23等で構成
する。AE検出部4の弁別器11はゲート回路13を介
してカウンタ18に接続し、また、フィルタ主増幅器8
Iよゲート回路13を介し【波形記憶装置22に接続す
る。そしてグー1〜回路′13が閉成し°(いる時には
弁別器11、〕Cルタ主増幅器8はそれぞれカウンタ1
ε3、波形記憶装置22に出力りるが、グー1−回路1
3が開成している詩はその様な出力Iよ遮断される。The AE detector 4 connects to the output device [iI6] via the gate circuit 13.
Connect to. The output device @6 includes, for example, a counter 18, a recorder 21, a waveform storage device 22, an oscilloscope 23, and the like. The discriminator 11 of the AE detector 4 is connected to the counter 18 via the gate circuit 13, and also connected to the filter main amplifier 8.
I is connected to the waveform storage device 22 via the gate circuit 13. Then, circuits 1 to 13 are closed (discriminator 11 when present), and C filter main amplifier 8 is connected to counter 1.
ε3, output to waveform storage device 22, but goo 1 - circuit 1
Poetry 3 is developed is blocked from such output I.
グー1〜回路13の開閉はノイズ検出部12の弁別器1
GにJ、って制御され、ノイズ検出部12がノイズを検
出した時(よグー1〜回路13を開成さける。The opening/closing of the circuits 1 to 13 is performed by the discriminator 1 of the noise detection unit 12.
G is controlled by J, and when the noise detection section 12 detects noise (the circuits 1 to 13 are opened).
ゲート回路13は第2図に示ジようにj7す1−Iグゲ
ート24、ゲート・時間設定回路25、遅延回路26、
パルスゲ−1−27から4111成されしおり、グー1
〜時間並びに遅延時間を必要に応じて適宜選11くする
ことがでさるようにりる。そのグー1−回路13の動作
タイミングは第3図に示1通りである。As shown in FIG. 2, the gate circuit 13 includes a j7s1-I gate 24, a gate/time setting circuit 25, a delay circuit 26,
Pulse game 1-27 to 4111 bookmark, goo 1
~The time and the delay time can be appropriately selected as needed. The operation timing of the goo 1-circuit 13 is as shown in FIG.
次にこのJ:うに構成された八【三測定装置Nの作用を
試験測定結果について説明する。Next, the operation of this measuring device N configured as shown in FIG.
第4図は試験装置として、出力装置÷4にカウンタ18
a 、18b 、18c 1記録計218121b、2
1cを図示のごとく接続して備えたものを使用した。Figure 4 shows a test device consisting of an output device ÷ 4 and a counter 18.
a, 18b, 18c 1 recorder 218121b, 2
1c connected as shown in the figure was used.
AEアナログ信号についてみると、ノイズ除去装置が作
動していないときは第5図aで示ずように、ノイズ検出
部の出力(ロ)に含まれるノイズがノイズ除去装置通過
後のAEE出部の出力(イ)にも含まれている。しかる
にノイズ除去装置が作動しているときは、第5図すて示
すように、前と同じノイズ検出部の出力(ロ)に対して
、ノイズ除去装置通過後のAEE出部の出力(イ)はノ
イズ部分がカッ1−され、AEだけとなっている。Looking at the AE analog signal, when the noise removal device is not operating, as shown in Figure 5a, the noise contained in the output (b) of the noise detection section is output from the AEE output section after passing through the noise removal device. It is also included in the output (a). However, when the noise removal device is operating, as shown in Figure 5, the output from the AEE output section (A) after passing through the noise removal device is the same as before (B), while the output from the noise detection section (B) is the same as before. The noise part is cut out and only the AE is left.
次に、AEパルス信号についてみると、第6図はノイズ
除去装置が作動している場合のAEパルス信号の情況を
示している。この第6図で記録計210の出力(ロ)が
示すように、ノイズ除去装置ではノイズを検出している
にもかかわらず、ノイズ除去装置通過後のAEE出部か
らの記録計218の出力(イ)にはノイズ部分がjyラ
ットれ、AEだけとなっている。Next, regarding the AE pulse signal, FIG. 6 shows the situation of the AE pulse signal when the noise removal device is operating. As shown in the output (b) of the recorder 210 in FIG. 6, although the noise removal device detects noise, the output of the recorder 218 from the AEE output section after passing through the noise removal device ( In a), the noise part is reduced and only AE is left.
以上の説明から明らかな通り、この発明にJ:れば、ノ
イズを確実に除去することができ、構造が簡単で実施が
容易であり、特に正確なAE測測定可能にするAEE定
装置を得ることができる。As is clear from the above description, the present invention provides an AEE determination device that can reliably remove noise, has a simple structure, is easy to implement, and enables particularly accurate AE measurements. be able to.
第1図はこの発明の一実施例に係わるAEE定装置の構
成を示すブロック図、第2図はグー1〜回路を示すブロ
ック図、第3図はAE測定装買の動作タイミングを示す
タイミング図、第4図は試験に使用したAEE定装置の
構成を承りブロック図、755図はAEのアナログ出力
を示づグラノ、及び第6図はAEのパルス出力を示タグ
ラフである。
1・・・AE測定装@ 4・・・AEE出部 5・・・
ノイズ除去装置 9.10・・・AE検検出シン1ノ1
2・・ノイズ検出部 13・・・ゲート回路7.14・
・・前置増幅器 8,15・・・フィルタ主増幅器 1
1.16・・・弁別器
41F
iI!iQ
耶、、、F: 第
Y 嘴 旧 マ 長Fig. 1 is a block diagram showing the configuration of an AEE measuring device according to an embodiment of the present invention, Fig. 2 is a block diagram showing circuits from 1 to 1, and Fig. 3 is a timing diagram showing the operation timing of the AE measuring device. , FIG. 4 is a block diagram showing the configuration of the AEE constant device used in the test, FIG. 755 is a graph showing the analog output of the AE, and FIG. 6 is a graph showing the pulse output of the AE. 1... AE measurement device @ 4... AEE output section 5...
Noise removal device 9.10...AE test detection Shin 1 no 1
2. Noise detection section 13. Gate circuit 7.14.
...Preamplifier 8,15...Filter main amplifier 1
1.16...Discriminator 41F iI! iQ 耶,,,F: No. Y beak former ma length
Claims (1)
E検出系のうちの一方のAE検出系のAE検出センサを
被測定物からΔFが伝播J−る位置に配設し、他方のA
E検出系のAE検出センサを前記一方のAE検出系のA
E検出センリの近傍であって前記被測定物からAEが伝
播しない位置に配設し、前記他方のAE検出系でノイズ
が検出された時だけ前記一方のAE検出系の出力を停止
するように構成したことを特徴とするAE測定装置Two AE detection systems with the same characteristics are provided, and the AE detection sensor of one of the two AE detection systems is disposed at a position where ΔF propagates from the object to be measured, and the A
The AE detection sensor of the E detection system is connected to the A of the one AE detection system.
It is arranged near the E detection sensor at a position where AE does not propagate from the object to be measured, and the output of the one AE detection system is stopped only when noise is detected in the other AE detection system. An AE measurement device characterized by the following configuration:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58108135A JPS60357A (en) | 1983-06-16 | 1983-06-16 | Measuring device of acoustic emission |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58108135A JPS60357A (en) | 1983-06-16 | 1983-06-16 | Measuring device of acoustic emission |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60357A true JPS60357A (en) | 1985-01-05 |
| JPH0254504B2 JPH0254504B2 (en) | 1990-11-21 |
Family
ID=14476815
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58108135A Granted JPS60357A (en) | 1983-06-16 | 1983-06-16 | Measuring device of acoustic emission |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60357A (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51114980A (en) * | 1975-04-02 | 1976-10-09 | Babcock Hitachi Kk | Noise removal circuit of ae measurement system |
-
1983
- 1983-06-16 JP JP58108135A patent/JPS60357A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51114980A (en) * | 1975-04-02 | 1976-10-09 | Babcock Hitachi Kk | Noise removal circuit of ae measurement system |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0254504B2 (en) | 1990-11-21 |
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