JPS6038794A - Sense amplifying circuit - Google Patents

Sense amplifying circuit

Info

Publication number
JPS6038794A
JPS6038794A JP58145371A JP14537183A JPS6038794A JP S6038794 A JPS6038794 A JP S6038794A JP 58145371 A JP58145371 A JP 58145371A JP 14537183 A JP14537183 A JP 14537183A JP S6038794 A JPS6038794 A JP S6038794A
Authority
JP
Japan
Prior art keywords
potential
node
gate
amplification
amplifying circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58145371A
Other languages
Japanese (ja)
Inventor
Katsushi Hoshi
克司 星
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP58145371A priority Critical patent/JPS6038794A/en
Publication of JPS6038794A publication Critical patent/JPS6038794A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)

Abstract

PURPOSE:To operate a sense amplifying circuit stably in a high speed by detecting a potential change of the common source of a flip flop of the sence amplifying circuit to control the start of main amplification. CONSTITUTION:The sense amplifying circuit consists essentially of the FF constituted with FETs T11 and T12 which amplify minute storage information read onto a bit line. When a potential at the time when initial amplification of a node N13 of the common source of this FF is completed is detected, a detecting circuit CH impresses the second activating signal phiB to the second gate G2. Then, the potential of a node 11 which is precharged to the high level through the gate G2 is held as it is, and a node 12 precharged to the low level has an earth potential, and main amplification is started. Consequently, the start of main amplification is controlled at intervals of an optimum time without delay in distinction from a circuit where the gate G2 is controlled by a fixed timing, and the sense amplifying circuit is operated stably in a high speed.

Description

【発明の詳細な説明】 本発明はセンスアンプ回路、特に、ビットライン上に読
み出さhた微小記憶情報を増幅するフリップフロップを
主構成要素とするセンスアンプ回路に関する。以下の説
明はすべて絶縁ゲート型電界効果トランジスタのうち代
表的なMOS)ランジスタ(以下MO8Tと称す)を用
いかつNチャンネルMOf’!Tで行う。しかし、回路
的にはPチャンネルMO8T、さらにはバイポーラトラ
ンジスタでも本質的に同様、である。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a sense amplifier circuit, and more particularly to a sense amplifier circuit whose main component is a flip-flop that amplifies minute storage information read onto a bit line. The following explanation uses an N-channel MOf'! Do it with T. However, in circuit terms, the P-channel MO8T and even bipolar transistors are essentially the same.

従来のこの種のセンスアンプ回路は外部から供給される
第1の制御信号に応答して微小記憶情報の初期増幅を行
うだめの第1ゲートと前記第1の制御信号の供給後に外
部から供給される第2の制611+信号に応答して前記
微小記憶情報の主増幅を行うための第2ゲートとを備え
、回路の安定かつ高速動作を期している。
A conventional sense amplifier circuit of this type has a first gate for performing initial amplification of minute storage information in response to a first control signal supplied from the outside, and a first gate for performing initial amplification of minute storage information in response to a first control signal supplied from the outside. and a second gate for performing main amplification of the minute storage information in response to the second control signal 611+, which is intended to ensure stable and high-speed operation of the circuit.

第1図は、5v単一電源のICであるMO8ダイナミッ
クRAMにおいて用いられている従来のセンスアンプ回
路の一例全一部のメモリセルおよびリファレンスセルと
ともに示している。第1図においてエンハンスメントg
MO8T(以下EMO8Tと記す)TsとコンデンサC
1とが1ビツトのメモリセルを、またEMO8T Ta
とコンデンサC2とがリファレンスセルをそれぞれ槽成
する。
FIG. 1 shows an example of a conventional sense amplifier circuit used in an MO8 dynamic RAM, which is a 5V single power supply IC, along with all and some memory cells and reference cells. In Figure 1, enhancement g
MO8T (hereinafter referred to as EMO8T) Ts and capacitor C
1 is a 1-bit memory cell, and EMO8T Ta
and capacitor C2 respectively form a reference cell.

h:MOT Tl、Tl、Tl、T4.T7およびTa
が、節点NuとN2との間に現われるメモリセルからの
微小な記憶情報を増幅する。
h: MOT Tl, Tl, Tl, T4. T7 and Ta
amplifies minute storage information from the memory cell appearing between nodes Nu and N2.

増幅は、先ず第1の活性化信号−人を外部からEMO8
T Taのゲートに印加して、初期増幅を行い、その後
に第2の活性化信号ct3mをやはシ外部からh;MO
8T T4のゲートに印加して1増+[C行うという2
ステップ方式を採っている。
Amplification begins with the first activation signal - EMO8 from the outside.
The second activation signal ct3m is applied to the gate of TTa for initial amplification, and then the second activation signal ct3m is applied to the gate of TTa.
8T Apply to the gate of T4 and increase by 1 + [C to perform 2
It uses a step method.

こねは、いきなシ主増幅を行ったのでは、EMO8T 
T i 、 T 2および+rsの特性のバラツキや変
動によって動作が不安化するのを口近するためである。
Kone has performed Ikinashi main amplification, EMO8T
This is to prevent the operation from becoming unstable due to variations and fluctuations in the characteristics of T i , T 2 and +rs.

このような従来4jq成においては、第1の活性化f計
号φ人から第2の活性化イぎ号−Bまでの時間+dl隔
は、外部回路によシ同定化されており、一方、フリップ
フロップkm成するEMO8T TiとTlおよび初期
増幅に対するゲートとして機能するEMO8T Tsの
トランジスタ特性のバラツキと変動によシ初期増幅速度
は変化するため、第1の活性化信号flJAから第2の
活性化信号511Bまでの最適時間間隔が得られないこ
とが多くなシ、以下に示すような欠点がある。すなわち
、センスアンプ回路内OEMO8Tのトランジスタ特性
のバラツキや変動によシ、初期増幅速度が低下した場合
に、メモリセルの微小記憶情報が出力されている節点N
lおよびN2の微小差信号の初期増幅全完了しない時点
で、EMO8T T4が活性化され、主増幅を行うため
、増幅時に節点NlおよびN2の情報が反転したシ、一
方に保持されている高レベルが低下するなどの動作不良
が生じる。
In such a conventional 4jq configuration, the time + dl interval from the first activation signal φ to the second activation signal -B is identified by an external circuit; Since the initial amplification speed changes due to variations in the transistor characteristics of the EMO8T Ti and Tl that form the flip-flop km and the EMO8T Ts that functions as a gate for initial amplification, the initial amplification speed changes from the first activation signal flJA to the second activation signal In many cases, the optimal time interval to signal 511B cannot be obtained, and there are drawbacks as shown below. In other words, when the initial amplification speed decreases due to variations in the transistor characteristics of the OEMO8T in the sense amplifier circuit, the node N where the minute memory information of the memory cell is output.
EMO8T T4 is activated and main amplification is performed before the initial amplification of the minute difference signal between L and N2 is completed. Malfunctions such as decreased performance may occur.

また、同様な理由で、初期増幅速度が増加した場合に、
節点N1およびN2の微小差信号の初期増幅の完了後か
ら必要以上の遅延時間を経て、主増幅t−開始すること
になって、増幅動作が低速化する。
Also, for the same reason, when the initial amplification rate increases,
After completion of the initial amplification of the minute difference signals at the nodes N1 and N2, the main amplification t- starts after a delay time longer than necessary, which slows down the amplification operation.

本発明の目的は、センスアンプ回路のうちのフリップフ
ロップのコモンノースの電位変化音検出し、該電位変化
を主増幅起動のために用いることで、安定かつ高速動作
が可能なセンスアンプ回路t−提供することにある。
An object of the present invention is to detect the potential change sound of the common north of the flip-flop in the sense amplifier circuit and use the potential change to start the main amplification, thereby enabling stable and high-speed operation of the sense amplifier circuit t- It is about providing.

本発明の回路は、ピットライン上に読み出された微小記
憶情報を増幅するフリップ70ツブを主構成要素とする
センスアンプ回路において、外部から供給さ力る第1の
制御ta号に応答して前記微小記憶情報の初期増幅全行
なうための第1ゲートと、該初期増幅開始段に前記ノリ
ツブフロップのコモンノース接点の電位を検出し該電位
が予め定めた値になると第2の制御信号を出力する電位
検出回路と、該第2の制御信号に応答して前記微小記憶
情報の主増幅を行なうためのさ■2ゲートとを設けたこ
とを%徴とする。
The circuit of the present invention is a sense amplifier circuit whose main component is a flip 70 tube that amplifies minute memory information read out on a pit line, in response to a first control signal ta supplied from the outside. A first gate for performing all the initial amplification of the minute storage information, and a potential of the common north contact of the Noritub flop at the initial amplification start stage are detected, and when the potential reaches a predetermined value, a second control signal is sent. The feature is that a potential detection circuit for outputting the output voltage and a two-gate gate for main amplifying the minute storage information in response to the second control signal are provided.

次に本発明について図面を参照して詳細に銃明する。Next, the present invention will be explained in detail with reference to the drawings.

第2図f1:G照すると1本突施例は、外部から供給さ
iするδ41の活性化信号(lJcおよびフリップ70
ツブのコモンノースである節点N13の電位を入力とす
る第1ゲートGlと、第1の活性化信号lc、プリチャ
ージ信号121Pおよび節点N13の電位を人力としか
つ第2の活性化信号ioを出力する検出回路CI(と、
第2の活性化信号g6oおよび節点Nxnの電1位を入
力とする第2ゲー)G2とを含んでいる。第1ゲー) 
Q 1と第2ゲー)G2とh、−ttlソf′1+i、
1 図にオケルEMU 8 T T sとT4と同構成
である。
Referring to FIG. 2 f1:
The first gate Gl inputs the potential of the node N13, which is the common north of the knob, the first activation signal lc, the precharge signal 121P, and the potential of the node N13, and outputs the second activation signal io. detection circuit CI (and
It includes a second activation signal g6o and a second gate (G2) whose input is the potential 1 of the node Nxn. 1st game)
Q 1 and 2nd game) G2 and h, -ttl sof'1+i,
Figure 1 shows Okel EMU 8 T T s and the same configuration as T4.

第2図の基本動作ヲナ明すると、先ず、プリチャージ信
号−Pが低レベルから高レベルになり、プリチャージ信
号gapをゲート入力とするE M (JS 1’ T
 16およびTXTは活性比され互いのソース節点Nl
l及びN1ceプリチヤージし、またプリチャージ信号
(lipをゲート入力とするEM08T Tl5は、ド
レイン節点N15iGNL)にし、また検出回路をリセ
ットする。本説明では第1図の従来回路と同様にコンデ
ンサC1lはコンデンサCxxの2倍の容畝、および節
点N14は高レベルを保持していると仮定する。
To explain the basic operation in FIG. 2, first, the precharge signal -P changes from low level to high level, and E M (JS 1' T
16 and TXT are active ratioed and each other's source node Nl
1 and N1ce are precharged, and the precharge signal (EM08T T15 with lip as the gate input is the drain node N15iGNL), and the detection circuit is reset. In this description, it is assumed that the capacitor C1l has a capacitance twice that of the capacitor Cxx, and that the node N14 maintains a high level, as in the conventional circuit shown in FIG.

前期初期動作が完了した後に、プリチャージ信号−Pは
低レベルになシ、続いてワード信号121WLが低レベ
ルから高レベルとなシ、ワード信号lWLをゲート入力
とするEMO8T T13およびT14が活性化され、
E〜I 08 T T 13のドレイン節点Nllとソ
ース節点N14およびEMO8T T14のドレイン節
点Nxzとソース節点Nl11とが各々導通される。
After the initial operation is completed, the precharge signal -P remains at a low level, then the word signal 121WL changes from a low level to a high level, and EMO8T T13 and T14 whose gate input is the word signal 1WL are activated. is,
The drain node Nll of E~I 08 T T 13 and the source node N14 and the drain node Nxz of EMO8T T14 and the source node Nl11 are respectively electrically connected.

プリチャージ信号−Pによシ高レベルにプリチャージさ
hた節点Nllの電位は、節点N14が高レベルのため
、高レベルを保持し、プリチャージ信号gjpにより高
レベルにプリチャージさhた節点Nxxの電位は、節点
NzsがGNDのためや\引き下げられて節点Nilの
電位よシわずかに低い高レベルとなることによシ、メモ
リセルの微小記憶情報がピット線である節点N l 1
とN12との間に出力される。
The potential of the node Nll, which was precharged to a high level by the precharge signal -P, remains at a high level because the node N14 is at a high level, and the potential of the node Nll, which is precharged to a high level by the precharge signal gjp, remains at a high level. The potential of Nxx is set to a high level, which is slightly lower than the potential of the node Nil because the node Nzs is connected to GND or is pulled down to a high level that is slightly lower than the potential of the node Nil.
and N12.

続いて外部から供給される第1の活性化信号12Icが
低レベルから高レベルになシ、第1の活性化信号−Cを
入力とする第1グー)Glが動作し、フリップフロップ
を構成するEMO8T TllおよびTxxのコモンソ
ースである節点N13の電位を徐々に低下させて、セン
スアンプ回路の初期増幅を行う。節点N13の電位低下
に伴い、節点N1tおよびN12の電位差は増加し、こ
のとき増怖経過の目安となる節点N13の電位t−検出
回路CI(が検出する。
Subsequently, the first activation signal 12Ic supplied from the outside changes from a low level to a high level, and the first activation signal 12Ic, which receives the first activation signal -C as an input, operates and forms a flip-flop. Initial amplification of the sense amplifier circuit is performed by gradually lowering the potential of node N13, which is the common source of EMO8T Tll and Txx. As the potential at the node N13 decreases, the potential difference between the nodes N1t and N12 increases, and at this time, the potential t at the node N13, which is a measure of the progress of the increase, is detected by the detection circuit CI.

検出回路CHが、初期増幅が完了する節点N13の電位
(予め定めておく)を検出すると、第2の活性化信号−
りを第2ゲー)G2に出力して主増幅動作を開始する。
When the detection circuit CH detects the potential (predetermined) at the node N13 where initial amplification is completed, the second activation signal -
The signal is output to the second gate (G2) to start the main amplification operation.

第2ゲー)G2の活性化により、節点N1mの電位(高
しベ榎と節点Nxxの電位(節点N11O亀位より低い
高レベル)とねさらに電位差を拡げ、節点Nilの電位
は高レベル金保持し、節点N12の電位はGNDとなり
、メモリセルの記憶情報の増幅を完了する。
2nd game) By activating G2, the potential difference between the potential of node N1m (high level) and the potential of node Nxx (high level lower than node N11O) is further expanded, and the potential of node Nil maintains a high level gold. However, the potential of the node N12 becomes GND, and the amplification of the information stored in the memory cell is completed.

第2図の実施例と第1図の従来回路とは、ノリツブフロ
ップのコモンノースの電位を、第1グー)Glと第2ゲ
ートGzとを用いて低下させて増幅動作を行うという手
段は共通であるが、本実節レリにおいては、第2グー)
G2へ第2の活性化信号930 t−センスアンプ回蕗
内部の7リツプフロツプのコモンソースの電位を検出し
、その検出出力をイq用することで初期増幅開始から主
増幅開始までの最適時間間隔t?発生させるという、従
来回路にない機能金有している。
The embodiment shown in FIG. 2 and the conventional circuit shown in FIG. 1 are different from each other in that the common north potential of the Noritub flop is lowered using the first gate Gl and the second gate Gz to perform the amplification operation. Although it is common, in this Jibushi Reri, the second goo)
Second activation signal 930 to G2 By detecting the common source potential of the 7 lip-flops inside the t-sense amplifier circuit and using the detected output as an equalizer, the optimum time interval from the start of initial amplification to the start of main amplification can be determined. T? It has a function that conventional circuits do not have, which is to generate electricity.

第3図は第2図に示した実施例のうちの第1グー )G
 1.検出回路CHおよび第2ゲー)G2の回路例を示
す。EMO8T T2(lとTxeとがそわぞれ第1グ
ー)Glと第2ゲートG2とを4゛1q成し、その他の
部分が検出回路Cut−構成している。
Figure 3 is the first example of the embodiment shown in Figure 2.)G
1. A circuit example of the detection circuit CH and the second gate (G2) is shown. EMO8T T2 (l and Txe are respectively the first gate) Gl and the second gate G2 constitute 4゛1q, and the other parts constitute the detection circuit Cut.

先ず、プリチャージ信号−Pが印加されると、E M 
L) 8 T T x sが導通して節点N16の電位
を放?(iさせる。枕いて第1の活性化信号−Cが低レ
ベルから高レベルにな勺、第1の活性化信号tijct
ゲート入力とするE M OS T T 20が活性化
され、フリップフロップを構成するEMO8TTllと
Txzとのコモンソースである節点N13の電位金徐々
に低下させて、初期増幅を行う。
First, when the precharge signal -P is applied, E M
L) 8 T T x s conducts and releases the potential at node N16? When the first activation signal -C changes from low level to high level, the first activation signal tijct changes from low level to high level.
The EMOS T T 20 serving as the gate input is activated, and the potential of the node N13, which is the common source of the EMO8TTll and Txz forming the flip-flop, is gradually lowered to perform initial amplification.

このときFdMO8T T21.T211.Tzs。At this time, FdMO8T T21. T211. Tzs.

T24.Tz s、Tz a、Tz tおよびT2gと
、コンデンサC2Xとから構成さhる検出回路CIは、
第1の活性化信号φCをゲート入力とするEMO8T 
T24とT2Sとが活性化スルタメ、動作t−開始する
。第1の活性化信号φCが低レベルから高レベルになる
初期の時点では、節点N15)ia位分割を行うEMO
S T T 21 、 T 22 。
T24. The detection circuit CI is composed of Tz s, Tz a, Tz t and T2g, and a capacitor C2X.
EMO8T with first activation signal φC as gate input
When T24 and T2S are activated, the operation starts. At the initial point in time when the first activation signal φC changes from low level to high level, node N15) EMO which performs ia division
S T T 21 , T 22 .

T23および’fxaの各々の電位分割節点N18゜N
 19 オヨヒN 20 ハEMOS ’ro閾値v 
T 全越えるような高レベルであり、節点N20の市6
位をゲート入力とするE M 08 T T z sは
活性化される。この結果によ砂s h M 08 T 
T 28のドレイ/節点N17iGNDに保持する。
Each potential division node N18°N of T23 and 'fxa
19 Oyohi N 20 Ha EMOS 'ro threshold v
T It is a high level that exceeds all, and city 6 of node N20
E M 08 T T z s, which uses the signal as the gate input, is activated. As a result, S h M 08 T
T28 drain/node N17iGND.

第1の活性化信号IzlCt−ゲート入力とするEM0
8T T2には節点N t a (t−高レベルにプリ
チャージし、節点Nusの電位をゲート入力とするEM
O8T Tzyは活性化されるが、節点NlTをドレイ
ンに接続するEMO8T T28が活性化しているため
節点N 17はGND=i保持する。
First activation signal IzlCt - EM0 as gate input
8T T2 has an EM which is precharged to the node N ta (t-high level and whose gate input is the potential of the node Nus).
O8T Tzy is activated, but since EMO8T T28, which connects node NIT to the drain, is activated, node N17 maintains GND=i.

E M 08 T T x oの活性化によシ節点N1
3の電位が低下し、初期増幅が完了すると、節点N20
の電位は閾値VT以下の低レベルとなる。このため節点
Nzoの電位をゲート入力とするEM08’K” Tz
sldmMさt’l、FIMO8T T0nのドレイン
節点N17は高レベルとなり、節点N17の電位をゲー
ト入力とするEMO8T Tj19が活性化さhること
で主増幅が開始される。活性化さ力たE M O8T 
T 29によシ節点N13の電位はGNDになシ、節点
Nxxの電位は高レベルを保持し、節点N12の電位は
GNDとなり、メモリセルの記憶情報の増幅を完了する
Due to the activation of E M 08 T T x o, the node N1
When the potential at node N20 decreases and the initial amplification is completed, the potential at node N20
The potential becomes a low level below the threshold value VT. Therefore, EM08'K" Tz with the potential of node Nzo as the gate input
sldmM, the drain node N17 of FIMO8T T0n becomes high level, and main amplification is started by activating EMO8T Tj19 which uses the potential of node N17 as a gate input. Activated power EM O8T
By T29, the potential at the node N13 becomes GND, the potential at the node Nxx remains at a high level, and the potential at the node N12 becomes GND, completing the amplification of the information stored in the memory cell.

本発明によりは、以上のような講成の採用によシ、主増
幅に対する活性化信号tセンスアンプ回路内B)−で発
生させるため、トランジスタ特性のバラツキや変動に伴
う初期増幅と主増幅との間の時間間隔の最適値からのズ
レを自動的に補償できるようになシ、従来回路では不可
能であったような安定かつ高速動作が行うことができ、
かつ従来回路では必要であった主増幅に対する外部から
の活性化信号上不要化できるため、周辺回路の簡略化
According to the present invention, by adopting the above-mentioned method, the activation signal for the main amplification is generated in the sense amplifier circuit (B)-, so that the initial amplification and the main amplification due to variations and fluctuations in transistor characteristics are generated. By automatically compensating for deviations from the optimal value of the time interval between
Additionally, the external activation signal for the main amplification, which was required in conventional circuits, is no longer required, simplifying the peripheral circuitry.

【図面の簡単な説明】[Brief explanation of the drawing]

第゛1図は従来例、第2図は本発明の一実施例および第
3図は該実施例の詳細図tそわぞれ示す。 Tl 〜To、Tz x〜Tx t、Tz o〜TII
 e・・・・・・工ンハ/スメント型MO8T(EMO
8T)、Ch、Ch、Csx、Cx!、C21・・・・
・・コンデンサ、N1〜Nll、Nu 1−vNl t
−−−−−8節点、G1・・・・・・第1ゲート、Gx
・・・・・・第2グー)、Ctl・・・・・・検出回路
、−P・・・・・・プリチャージ信号、φWL・・・・
・・ワード信号、!21A、sc・・・・・・第1の活
性化信号、φB、121D・・・・・・第2の活性化信
号。 隼 1 図 ψ2 ネ 2 図 N、J *3目
FIG. 1 shows a conventional example, FIG. 2 shows an embodiment of the present invention, and FIG. 3 shows a detailed view of the embodiment. Tl~To, Tz x~Tx t, Tz o~TII
e...Engineering/sment type MO8T (EMO
8T), Ch, Ch, Csx, Cx! , C21...
・・Capacitor, N1~Nll, Nu 1-vNl t
----8 nodes, G1...1st gate, Gx
...Second goo), Ctl...Detection circuit, -P...Precharge signal, φWL...
...Word signal! 21A, sc...first activation signal, φB, 121D...second activation signal. Hayabusa 1 Figure ψ2 Ne 2 Figure N, J *3 eyes

Claims (1)

【特許請求の範囲】[Claims] ビットライン上に読み出された微小記憶情報を増幅する
フリップフロップを主構成要素とするセンスアンプ回路
において、外部から供給される第1の制御信号に応答し
て前記微小記憶情報の初期増幅を行なうための第1ゲー
トと、前記フリップフロップのコモンソース接点の電位
を検出し該電位が予め定めた値になると第2の制御信号
を出力する電位検出回路と、該第2の制御信号に応答し
て前記微小記憶情報の主増幅を行なうための第2ゲート
と會設けたことを特徴とするセンスアンプ回路。
In a sense amplifier circuit whose main component is a flip-flop that amplifies minute memory information read out onto a bit line, initial amplification of the minute memory information is performed in response to a first control signal supplied from the outside. a potential detection circuit that detects the potential of the common source contact of the flip-flop and outputs a second control signal when the potential reaches a predetermined value; A sense amplifier circuit, characterized in that the sense amplifier circuit is provided with a second gate for performing main amplification of the minute storage information.
JP58145371A 1983-08-09 1983-08-09 Sense amplifying circuit Pending JPS6038794A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58145371A JPS6038794A (en) 1983-08-09 1983-08-09 Sense amplifying circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58145371A JPS6038794A (en) 1983-08-09 1983-08-09 Sense amplifying circuit

Publications (1)

Publication Number Publication Date
JPS6038794A true JPS6038794A (en) 1985-02-28

Family

ID=15383671

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58145371A Pending JPS6038794A (en) 1983-08-09 1983-08-09 Sense amplifying circuit

Country Status (1)

Country Link
JP (1) JPS6038794A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4694205A (en) * 1985-06-03 1987-09-15 Advanced Micro Devices, Inc. Midpoint sense amplification scheme for a CMOS DRAM
JPH0194193A (en) * 1987-10-01 1989-04-12 Taisei Corp Two stage type shielding device
JPH0271494A (en) * 1988-03-17 1990-03-12 Samsung Electron Co Ltd Sensing detector for memory cell

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4694205A (en) * 1985-06-03 1987-09-15 Advanced Micro Devices, Inc. Midpoint sense amplification scheme for a CMOS DRAM
JPH0194193A (en) * 1987-10-01 1989-04-12 Taisei Corp Two stage type shielding device
JPH0271494A (en) * 1988-03-17 1990-03-12 Samsung Electron Co Ltd Sensing detector for memory cell

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