JPS604110Y2 - Light detection unit for infrared gas analyzer - Google Patents

Light detection unit for infrared gas analyzer

Info

Publication number
JPS604110Y2
JPS604110Y2 JP1977038864U JP3886477U JPS604110Y2 JP S604110 Y2 JPS604110 Y2 JP S604110Y2 JP 1977038864 U JP1977038864 U JP 1977038864U JP 3886477 U JP3886477 U JP 3886477U JP S604110 Y2 JPS604110 Y2 JP S604110Y2
Authority
JP
Japan
Prior art keywords
light
introduction hole
metal block
light introduction
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1977038864U
Other languages
Japanese (ja)
Other versions
JPS53133783U (en
Inventor
海介 村木
民三 松浦
良 高橋
光雄 小鷹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP1977038864U priority Critical patent/JPS604110Y2/en
Priority to GB8508/78A priority patent/GB1553182A/en
Priority to NL7802541A priority patent/NL7802541A/en
Priority to US05/888,408 priority patent/US4194118A/en
Priority to DE2813239A priority patent/DE2813239C2/en
Priority to CA299,889A priority patent/CA1080000A/en
Priority to BR7804065A priority patent/BR7804065A/en
Publication of JPS53133783U publication Critical patent/JPS53133783U/ja
Application granted granted Critical
Publication of JPS604110Y2 publication Critical patent/JPS604110Y2/en
Expired legal-status Critical Current

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  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Description

【考案の詳細な説明】 本考案は、ガス中に含まれる成分を赤外線の吸収を利用
して分析する赤外線ガス分析計の光検出部に関するもの
である。
[Detailed Description of the Invention] The present invention relates to a light detection section of an infrared gas analyzer that analyzes components contained in gas using absorption of infrared rays.

基準セルを透過した基準光と測定セルを透過した測定光
を、半導体光センサで受けるような赤外線ガス分析計に
おいては、基準セルの測定セルにほぼ接するようにして
赤外線干渉フィルタが配置されている。
In an infrared gas analyzer in which a semiconductor optical sensor receives the reference light transmitted through a reference cell and the measurement light transmitted through a measurement cell, an infrared interference filter is placed so that it is almost in contact with the measurement cell of the reference cell. .

このため、光センサを一定温度に保持しているのにかか
わらず、干渉フィルタの温度が外部温度変化に応じて変
化し、光センサからは外部温度の影響を受けた信号が出
力されている。
Therefore, even though the optical sensor is maintained at a constant temperature, the temperature of the interference filter changes according to changes in the external temperature, and the optical sensor outputs a signal influenced by the external temperature.

特にフィルタを2以上用いているものは、フィルタ間の
温度特性の相違から外部温度変化によって。
Especially when using two or more filters, the difference in temperature characteristics between the filters causes changes in external temperature.

大きな影響を受けることになる。It will have a big impact.

本考案の目的は、光センサや干渉フィルタの温度特性の
影響を受けないように、光センサおよび干渉フィルタを
組み合わせた光検出部を提供することにある。
An object of the present invention is to provide a photodetector that combines an optical sensor and an interference filter so as not to be affected by the temperature characteristics of the optical sensor and the interference filter.

以下図面により本考案を詳細に説明する。The present invention will be explained in detail below with reference to the drawings.

第1図は本考案に係る光検出部の一実施例を示す外形図
、第2図は第1図の断面図である。
FIG. 1 is an outline view showing an embodiment of a photodetector according to the present invention, and FIG. 2 is a sectional view of FIG. 1.

これら第1および第2図において、1は金属ブロックで
、この金属ブロック1には、基準光や測定光を導く基準
光側光導入孔11、測定光側光導入孔12が形成されて
いる。
In FIGS. 1 and 2, 1 is a metal block, and this metal block 1 is formed with a reference light side light introduction hole 11 and a measurement light side light introduction hole 12 for guiding reference light and measurement light.

さらに、この金属ブロック1の光導入孔11,12の交
差部には光センサ取付穴13が形成され、周面にはリン
グ状の溝14、温度センサ取付穴15が形成されている
。
Further, an optical sensor mounting hole 13 is formed at the intersection of the light introduction holes 11 and 12 of the metal block 1, and a ring-shaped groove 14 and a temperature sensor mounting hole 15 are formed on the peripheral surface.

2は金属ブロック1の取付穴13内に挿入固定された光
センサで、サーミスタ・ボロメータ等の光感応素子21
と基板22からできている。
Reference numeral 2 denotes an optical sensor inserted and fixed into the mounting hole 13 of the metal block 1, and a photosensitive element 21 such as a thermistor or bolometer.
and a substrate 22.

3は基準光側光導入孔11をふさぐようにして金属ブロ
ック1に取り付けられた赤外線干渉フィルタ、4は測定
光側光導入孔12をふさぐようにして金属ブロック1に
取り付けられた赤外線干渉フィルタである。
3 is an infrared interference filter attached to the metal block 1 so as to block the reference light side light introduction hole 11, and 4 is an infrared interference filter attached to the metal block 1 so as to block the measurement light side light introduction hole 12. be.

5は溝14に取り付けられ金属ブロック1を加熱又は冷
却するヒータ又はクーラ(以下吸発熱素子と記す)、6
は金属ブロック1の温度を検出するために取付穴15内
に配置された温度センサである。
5 is a heater or cooler (hereinafter referred to as heat/absorbing element) that is attached to the groove 14 and heats or cools the metal block 1;
is a temperature sensor placed in the mounting hole 15 to detect the temperature of the metal block 1.

7は温度センサ6の出力が一定となるように吸発熱素子
5を制御する制御回路である。
7 is a control circuit that controls the heat-absorbing element 5 so that the output of the temperature sensor 6 is constant.

この制御回路7と吸発熱素子5および温度センサ6が、
金属ブロック1の温度を一定に保つような温度調節手段
を構成している。
The control circuit 7, the heat/absorbing element 5, and the temperature sensor 6 are
It constitutes a temperature control means that keeps the temperature of the metal block 1 constant.

このように構成された本考案光検出部においては、基準
光がフィルタ3、基準光側光導入孔11を経て光センサ
2に達し、測定光がフィルタ4、測定光側光導入孔を経
て光センサ2に達する。
In the light detection unit of the present invention configured in this way, the reference light passes through the filter 3 and the light introduction hole 11 on the reference light side and reaches the optical sensor 2, and the measurement light passes through the filter 4 and the light introduction hole on the measurement light side and reaches the optical sensor 2. reaches sensor 2.

実際には、セクタ(図示せず)の働きによって、基準光
と測定光が交互に光センサ2に与えられることになる。
In reality, the reference light and measurement light are alternately applied to the optical sensor 2 due to the function of sectors (not shown).

この本考案装置においては、干渉フィルタ3゜4が集光
部である光センサ2付近に配置されることになり、その
面積をきわめて小さくでき、光検出部として熱容量の小
さいものを得ることができる。
In this device of the present invention, the interference filter 3゜4 is placed near the light sensor 2, which is the light condensing part, so its area can be made extremely small, and a light detection part with a small heat capacity can be obtained. .

したがって、吸収熱素子5として小形のものを用いて金
属ブロック1の温度を一定に制約すれば、光センサ2お
よび干渉フィルタ3,4を一定温度に保つことができる
。
Therefore, by restricting the temperature of the metal block 1 to a constant value by using a small-sized heat absorption element 5, the optical sensor 2 and the interference filters 3 and 4 can be kept at a constant temperature.

なお、上記の説明においては、基準光側光導入11孔と
測定光側光導入孔12の2種類の光導入孔を有するもの
について述べたが、1種類の光導入孔を有するものに本
考案を通用できることはもちろんである。
In addition, in the above description, a device having two types of light introduction holes, the reference light side light introduction hole 11 and a measurement light side light introduction hole 12, was described, but the present invention is applicable to a device having one type of light introduction hole. Of course, it can be used.

また、特願昭50−82620号の発明のように光感応
素子21を温度検出素子としても用いるようにすれば、
温度センサ6が不要になる。
Furthermore, if the photosensitive element 21 is also used as a temperature detection element as in the invention of Japanese Patent Application No. 50-82620,
Temperature sensor 6 becomes unnecessary.

以上説明したように、本考案によれば、光センサおよび
赤外線干渉フィルタを一定温度に保つことができるので
、これらの温度特性による影響を受けない光検出部を実
現できる。
As explained above, according to the present invention, since the optical sensor and the infrared interference filter can be kept at a constant temperature, it is possible to realize a photodetecting section that is not affected by these temperature characteristics.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案に係る光検出部の一実施例を示す外形図
、第2図は第1図の光検出部の断面図である。 1・・・・・・金属ブロック、11・・・・・・基準光
側光導入孔、12・・・・・・測定光側光導入孔、2・
・・・・・光センサ、3,4・・・・・・赤外線干渉フ
ィルタ、5・・・・・・吸発熱素子、6・・・・・・温
度センサ、7・・・・・・制御回路。
FIG. 1 is an outline view showing an embodiment of the photodetection section according to the present invention, and FIG. 2 is a sectional view of the photodetection section shown in FIG. 1. 1...Metal block, 11...Reference light side light introduction hole, 12...Measurement light side light introduction hole, 2.
..... Optical sensor, 3, 4 ..... Infrared interference filter, 5 ..... Heat absorption and heat absorption element, 6 ..... Temperature sensor, 7 ..... Control circuit.

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] (1)光導入孔が形成された金属ブロックと、この金属
ブロックの前記光導入孔内に取り付けられた光センサと
、前記光導入孔をふさぐように前記金属ブロックに取り
付けられた赤外線干渉フィルタと、前記金属ブロックを
一定温度に保つ温度調節手段とを具備した赤外線ガス分
析計用光検出部。
(1) A metal block in which a light introduction hole is formed, an optical sensor attached to the light introduction hole of this metal block, and an infrared interference filter attached to the metal block so as to block the light introduction hole. , and temperature control means for keeping the metal block at a constant temperature.
(2) 光導入孔として基準光側光導入孔と測定光側
光導入孔とを有した実用新案登録請求の範囲第1項記載
の光検出部。
(2) The light detection unit according to claim 1, which has a reference light side light introduction hole and a measurement light side light introduction hole as the light introduction holes.
JP1977038864U 1977-03-30 1977-03-30 Light detection unit for infrared gas analyzer Expired JPS604110Y2 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP1977038864U JPS604110Y2 (en) 1977-03-30 1977-03-30 Light detection unit for infrared gas analyzer
GB8508/78A GB1553182A (en) 1977-03-30 1978-03-03 Detector fur use in infrared gas analyzer
NL7802541A NL7802541A (en) 1977-03-30 1978-03-08 DETECTOR FOR USE IN AN INFRARED RADIATION GAS ANALYZER.
US05/888,408 US4194118A (en) 1977-03-30 1978-03-20 Detector for use in infrared gas analyzer
DE2813239A DE2813239C2 (en) 1977-03-30 1978-03-28 Detector for a two-beam infrared gas analyzer
CA299,889A CA1080000A (en) 1977-03-30 1978-03-29 Detector for use in infrared gas analyzer
BR7804065A BR7804065A (en) 1977-03-30 1978-06-26 DETECTOR FOR USE IN AN INFRARED GAS ANALYZER

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1977038864U JPS604110Y2 (en) 1977-03-30 1977-03-30 Light detection unit for infrared gas analyzer

Publications (2)

Publication Number Publication Date
JPS53133783U JPS53133783U (en) 1978-10-23
JPS604110Y2 true JPS604110Y2 (en) 1985-02-05

Family

ID=28904622

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1977038864U Expired JPS604110Y2 (en) 1977-03-30 1977-03-30 Light detection unit for infrared gas analyzer

Country Status (1)

Country Link
JP (1) JPS604110Y2 (en)

Also Published As

Publication number Publication date
JPS53133783U (en) 1978-10-23

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