JPS604202A - Zinc oxide type arrester element - Google Patents
Zinc oxide type arrester elementInfo
- Publication number
- JPS604202A JPS604202A JP58113163A JP11316383A JPS604202A JP S604202 A JPS604202 A JP S604202A JP 58113163 A JP58113163 A JP 58113163A JP 11316383 A JP11316383 A JP 11316383A JP S604202 A JPS604202 A JP S604202A
- Authority
- JP
- Japan
- Prior art keywords
- reheating
- phase
- zinc oxide
- voltage
- leakage current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Compositions Of Oxide Ceramics (AREA)
- Thermistors And Varistors (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
この発明は改良された1゛?化亜鉛形避雷器素子に門す
る。[Detailed Description of the Invention] Is this invention improved? Introduction to zinc oxide type lightning arrester elements.
従来の「l?化1i1i鉛形所11器素子の7;L圧′
!IL流特注はイ11念的に2(r、 7図のように示
される。この素子の特rc′にはfグれた電圧゛礪流非
ii’i P’! f士にある。従来、常規対1110
電圧印加時のもれfFL流■aを小さく、且つ71 ’
jj’+3fi、rc通電時の素子”・匡研間1:I−
圧(以下、制限・:攬圧吉よぶ)を小さくするように、
主に素子の&Jl成を工夫することによって慎良がなさ
れてきた。Conventional "L pressure"
! The custom-made IL flow is shown as shown in Figure 7.The special feature of this element is rc', which has a voltage that is different from current ii'i P'! , Regular vs. 1110
Reduce leakage fFL flow ■a when voltage is applied, and 71'
jj'+3fi, element when rc energized"・Makenma 1: I-
In order to reduce the pressure (hereinafter referred to as “limitation”),
Improvements have been made mainly by devising the &Jl configuration of the elements.
また上記素子を用いたアレスタ(避雷器)では、型の避
雷器で使用されていたギャップを取り除いて使用される
ことがある。この場合には、第1図における電流■aが
常時素子を流れることになる。In addition, arresters using the above-mentioned elements are sometimes used by removing the gap used in conventional lightning arresters. In this case, the current ■a in FIG. 1 always flows through the element.
電流が常時印加された場合の素子を流れるもれ電流の経
時変化を概念的に第2図に示す。もれ電流が増加してつ
いには素子が破壊するパターンをCに、一方、課電に対
してもれ電流の増えない安定なパターンをDに示す。従
来主に再加熱処理によって安定なパターンDが得られる
ような工夫を行ってきた。−再加熱処理によって素子の
内部溝造、特lこ酸化ビスマス結晶相に変化が生じる吉
考えられている(例えば特開昭Sθ−/、370941
号公報、l待開昭左λ−33ユ9s号公報、特開昭Sλ
−g’)A9!r号公報、ただし直接それを示すデータ
は記載されていない)。FIG. 2 conceptually shows the change over time in the leakage current flowing through the element when a current is constantly applied. C shows a pattern in which the leakage current increases and eventually destroys the element, while D shows a stable pattern in which the leakage current does not increase in response to voltage application. Conventionally, efforts have been made to obtain a stable pattern D mainly through reheating treatment. - It is believed that the reheating treatment causes changes in the internal groove structure of the device, especially in the bismuth oxide crystal phase (for example, JP-A-Sho Sθ-/, 370941
No. 1 Publication, 1Machikai Showa λ-33 Yu9s Publication, JP-A Showa Sλ
-g') A9! Publication No. R, but no data directly indicating this is stated).
酸化ビスマスは素子の微?1IlC’?造上酸化111
.鉛グレイン間を埋める粒界層を形成し、素子の電圧i
nn流面直線性特性重要な役割を演じている構成相と見
なすことができる。それ故酸化ビスマスをとのよ・うに
製作・制御するかは素子の緒特性に極めて重この酸化ビ
スマスの結晶相がガンマ(γ)相であるときは、他の結
晶相であるときよりも上記課電特性や雷’fi尤流通−
17.後の素子特性は安定している。しかし、cB ’
図に示すもれ電流Iaは、γ相の成長とともに大きくな
り、また制限「1尤圧に対する始動電圧の比(以下、制
限電圧比とよぶ)が大きくなり、保設特性が悪化すると
いう欠点があった。Is bismuth oxide a microscopic element? 1IlC'? Shojo oxidation 111
.. A grain boundary layer is formed between the lead grains, and the voltage i of the device is
nn can be considered as a constituent phase that plays an important role in flow surface linearity characteristics. Therefore, how to manufacture and control bismuth oxide is extremely important to the characteristics of the device.When the crystal phase of bismuth oxide is gamma (γ) phase, the above Charging characteristics and lightning distribution
17. The subsequent device characteristics are stable. However, cB'
The leakage current Ia shown in the figure increases with the growth of the γ phase, and also has the drawback that the ratio of the starting voltage to the limiting 1-likelihood voltage (hereinafter referred to as the limiting voltage ratio) increases, deteriorating the maintenance characteristics. there were.
この発明は上記のような従来のものの欠点を解消するた
めになされたもので、酸化亜鉛形避雷器素子中の酸化ビ
スマスの結晶相がγ相を含み、かつその叶が酸化ビスマ
スが全部γ相になったときの、2o−go %であるよ
うに制御することによって、制限r1尤圧比、もれ電流
が小さく、重責務な条件の下での課電特性の安定した酸
化亜鉛形避雷器素子を提供することを目的としている。This invention was made in order to eliminate the drawbacks of the conventional ones as described above, and the crystal phase of bismuth oxide in the zinc oxide type lightning arrester element contains the γ phase, and the entire bismuth oxide is in the γ phase. By controlling the current to be 2o-go % when It is intended to.
この発明は、添加物として少くとも酸化ビスマスを含む
酸化亜鉛形避雷器素子において、該酸化ビスマスの結晶
相のコθ〜go%がガンマ酸化ビスマスである酸化亜鉛
形避雷器素子である。The present invention is a zinc oxide type lightning arrester element containing at least bismuth oxide as an additive, in which θ~go% of the crystal phase of the bismuth oxide is gamma bismuth oxide.
γB :L20.、を得るには添加物、焼成およびその
雰囲気条件、再加熱などが因子となり得るが、本発明の
実施例では再加熱を因子に選んで説明す、る。2以下こ
の発明を実施例に基づいて説明する。γB :L20. Although additives, firing and its atmospheric conditions, reheating, etc. may be factors in obtaining , reheating will be selected as a factor in the explanation of the embodiments of the present invention. 2 The present invention will be described below based on examples.
実施例
酸化亜鉛(ZnO)を主成分とし、添加物としてそれぞ
れo、i〜λモルモル酸化ビスマス(B12o3)、酸
化T7−f−モ’、/ (5t)203) 、酸化コバ
ルト(CoO)、酸化マンガン(MnO)、酸化クロム
(cr20s)、酸化珪素(Si02)、およびそれぞ
れ0.0θ/〜θ、0/モルチのほう酸(H2BO3)
、硝酸アルミニラ1(A4 (NO3)73゜qH20
)を選び、これらを粉砕、混合、造粒、成形した後/2
00℃で焼成した。Examples Zinc oxide (ZnO) is the main component, and additives include o, i~λ mol bismuth oxide (B12o3), T7-f-mo', / (5t)203) oxide, cobalt oxide (CoO), and oxide. Manganese (MnO), chromium oxide (cr20s), silicon oxide (Si02), and boric acid (H2BO3) of 0.0θ/~θ, 0/molti, respectively.
, Aluminum Nitrate 1 (A4 (NO3) 73゜qH20
), and after pulverizing, mixing, granulating, and molding them/2
It was fired at 00°C.
これらの試料(大きさSθφ×25)をllj (、−
700℃保持時間λ時間で再加熱して電極を伺け、制限
電圧比、もれ電流、課電特性を調べた。These samples (size Sθφ×25) are llj (, −
The electrodes were reheated at 700° C. for a holding time of λ hours, and the limiting voltage ratio, leakage current, and charging characteristics were examined.
第3図は再加熱による制限電圧比の変化を示す。FIG. 3 shows the change in limiting voltage ratio due to reheating.
ll!rθ〜SOO℃の再加熱処理のとき制限電圧比は
最小となり、7θO℃では非常に大きな値となる。ll! The limiting voltage ratio becomes the minimum during the reheating treatment at rθ to SOO°C, and becomes a very large value at 7θO°C.
第グ図は再加熱によるもれ電流の変化を示す。Figure 3 shows the change in leakage current due to reheating.
測定条件は素子周囲温度ケθ℃、印加電圧きして素子に
/mAを通電したときの素子電極間に発生する電圧(以
下、始動電圧という)の70係を選んだ。再加熱温度が
ダ5o−soo℃のとき、もれ電流は最小で、70θ℃
では非常に大きな値上なる。As the measurement conditions, the ambient temperature of the device was set to θ° C., and the voltage generated between the device electrodes (hereinafter referred to as starting voltage) when a current of /mA was passed through the device with an applied voltage of 70 was selected. When the reheating temperature is 5o-soo℃, the leakage current is minimum, 70θ℃
That would be a huge price increase.
第S図は再加熱による課電特性の変化を示す。Figure S shows the change in charging characteristics due to reheating.
ここで課電特性とは、素子周囲温度を73θ℃に保ち、
始動電圧の3左係(曲線E)、SS係(曲線F)、およ
びgoチ(曲線G)の印加電圧を課電したときの素子の
もれ電流特性をいう。第5図I40の比I40/I+(
以下、もれ電流比という)の値を示している。この値が
八〇より小さいかi、oに近い値ならばもれ電流が増え
ないことを意味し、課電特性は安定しているといえる。Here, the charging characteristics mean that the ambient temperature of the element is maintained at 73θ℃,
It refers to the leakage current characteristics of an element when three applied voltages are applied: left (curve E), SS (curve F), and go (curve G) of the starting voltage. FIG. 5 Ratio of I40 I40/I+(
(hereinafter referred to as leakage current ratio). If this value is smaller than 80 or close to i and o, it means that the leakage current does not increase, and it can be said that the charging characteristics are stable.
課電電圧の小さいときは第5図中曲線Eにみられるよう
に、再加熱処理に関係なく安定している。When the applied voltage is small, as shown by curve E in FIG. 5, it is stable regardless of the reheating process.
しかし、課電電圧を大きくす名と(曲線’ r G)、
再加熱処理をしなければ、もれ電流比を/、0に近い値
に保つことができない。課電電圧が始動電圧のg0%と
いう素子にとって重責務な条件のもとでは、曲線Gにみ
られるように、再加熱処理力≦Sθ0−AOO℃の範囲
にあるときのみもれ電Mf、比(ま/、θに近く、この
とき素子課電特性は安定であるといえる。However, if the applied voltage is increased (curve 'rG),
Without reheating, the leakage current ratio cannot be maintained at a value close to 0. Under the condition that the applied voltage is g0% of the starting voltage, which is important for the device, as shown in curve G, when the reheating treatment force is in the range of Sθ0−AOO℃, the leakage current Mf, the ratio (ma/, is close to θ, and in this case it can be said that the element charging characteristics are stable.
上記電気試験を終えた試料について、素子中央部を切り
出し1.j00メツシュのふるG)を通iMするまで粉
砕して得た粉末についてX線回折1flll定を行なっ
た。After completing the above electrical test, the central part of the element was cut out.1. X-ray diffraction measurements were carried out on the powder obtained by pulverizing it through a j00 mesh screen G) until it reached iM.
第6図は、再加熱前の素子の粉末X線回折ノ櫂ターンを
、第7図は’/ 00℃で再加熱処理を行なった素子の
粉末X線回折パターンをそれぞれ示す。FIG. 6 shows the powder X-ray diffraction paddle turn of the device before reheating, and FIG. 7 shows the powder X-ray diffraction pattern of the device after the reheating treatment at 00°C.
第6図および第7図に出現した回折ピーク(ま、ZnO
、Zn7Sb20,2. Zn、5i04およびBi、
O,の物質によるものと同定できる。また注目すべき
は、第6図と第7図とを比較するとBi2O,のみが再
加熱Jこよって相変態を生じていることである。即ち、
再カロ熱前のB i 2.0 、の結晶相はβ相であっ
たものが、700℃の再加熱後はγ相に相変態したこと
が認められる。The diffraction peaks that appeared in Figures 6 and 7 (well, ZnO
, Zn7Sb20,2. Zn, 5i04 and Bi,
It can be identified that it is caused by the substance O. What should also be noted is that when comparing FIG. 6 and FIG. 7, only Bi2O undergoes phase transformation due to reheating. That is,
It is observed that the crystal phase of B i 2.0 before reheating was β phase, but after reheating at 700° C., the crystal phase was transformed to γ phase.
第6図および第7図にみられるようにβ−Bi203と
γ−Bi2o、の最強ピークがコθζ、2g0で重なる
ので、コθ=3λ〜3り0に現われるピークによって再
加熱処理による酸化ビスマスの変態を量的に調査した。As seen in Figures 6 and 7, the strongest peaks of β-Bi203 and γ-Bi2o overlap at θζ and 2g0, so the peak appearing between θ=3λ and 30 indicates the bismuth oxide produced by reheating. We quantitatively investigated the metamorphosis of
即ち、β−Bi203は(グθθ)によるピークに、γ
−Bi2o3は(,7,2/)によるピークに注目して
、それらのピークを測定した記録紙上でバックグランド
より上に出現した全体を切り抜いて、これを天秤にて計
り、その重量をピーク積分強度相当として第3図に示し
た。図中曲線Hはβ−Bi203(グ00)のピーク積
分強度相当を、曲線工はγ−B1.o、(3,21)の
ピーク積分強度相当をそれぞれ示す。That is, β-Bi203 has a peak due to (gθθ), and γ
-Bi2o3 focuses on the peaks due to (,7,2/), cuts out the entire area that appears above the background on the recording paper on which those peaks were measured, weighs it on a balance, and calculates its weight by peak integration. It is shown in Fig. 3 as equivalent strength. In the figure, curve H corresponds to the peak integrated intensity of β-Bi203 (g00), and curve H corresponds to the peak integrated intensity of β-Bi203 (g00). The peak integrated intensity equivalents of o and (3,21) are shown, respectively.
第3図より、約11.y O’C;よりβ−B1tos
(D γ−Bi、03への変態が始まり、約65θ℃で
ほぼ完全にr−Bi、 0.へ転化し終ることがわかる
。酸化ビスマスが完全にγ−Bi2O3(!:なった?
00 ℃におけるγ−Bi2O3のピーク積分強度相
当値に対する、各加熱温度におけるr−Bi20sのピ
ーク積分強度相当値の割合を第り図に示す。即ち第9図
は再加熱処理による酸化ビスマスのγ相への転化率を示
す。From Figure 3, approximately 11. y O'C; more β-B1tos
(It can be seen that the transformation to D γ-Bi, 03 begins, and the conversion to r-Bi, 0. is almost completely completed at about 65θ℃. Bismuth oxide is completely transformed into γ-Bi2O3 (!: Has it become?
The ratio of the value equivalent to the peak integrated intensity of r-Bi20s at each heating temperature to the value equivalent to the peak integrated intensity of γ-Bi2O3 at 00°C is shown in FIG. That is, FIG. 9 shows the conversion rate of bismuth oxide to γ phase by reheating treatment.
制限電圧比(第3図)、もれ電流(第9図)、課電特性
(第S図)、および酸化ビスマスのγ相への転化率(第
9図)、を比較検討すると、酸化ビスマスのうち20〜
ざθチがγ−Bi2O3相であるとき、制限電圧比、も
れ電流を悪化させずに重責路な条件のもとて素子の課電
特性を安定に保つこさが可能である。Comparing and examining the limiting voltage ratio (Figure 3), leakage current (Figure 9), charging characteristics (Figure S), and conversion rate of bismuth oxide to γ phase (Figure 9), it was found that bismuth oxide 20~
When the phase θ is the γ-Bi2O3 phase, it is possible to keep the charging characteristics of the element stable under heavy load conditions without worsening the limiting voltage ratio or leakage current.
なお上記実施例では最適な1−Bi2O3の生成量を再
加熱処理によって制御したが、γ−Bi、o3の生成量
を制御できる方法ならいずれでもよく、例えば焼成雰囲
気や素子の組成を工夫する方法てあってもよい。In the above example, the optimal amount of 1-Bi2O3 produced was controlled by reheating treatment, but any method that can control the amount of γ-Bi and o3 produced may be used, such as a method of devising the firing atmosphere or the composition of the element. It is also possible.
以上述べたように、この発明によれば、酸化亜鉛形避雷
器素子中の酸化ビスマスを、その結晶相がγ相でかつそ
の量が全酸化ビスマスの2θ〜gθ係であるように制御
することlこよって、制限電圧比、もれ電流を悪化させ
ずに、重責路な条件のもとて素子課電特性を安定に保つ
ことができる効果がある。As described above, according to the present invention, the bismuth oxide in the zinc oxide type lightning arrester element can be controlled so that the crystal phase thereof is the γ phase and the amount thereof is in the ratio of 2θ to gθ of the total bismuth oxide. Therefore, there is an effect that the element charging characteristics can be kept stable under heavy load conditions without deteriorating the limiting voltage ratio and leakage current.
第1図は従来の酸化亜鉛形避雷器素子の電圧電流特性、
を示す図、第2図は第1図の素子の課電特性を概念的に
示した図、第3図は実施例による素子の再加熱による制
限電圧比の変化を示す図、第9図は実施例による素子の
再加熱によるもれ電流の変化を示す図、第3図は実施例
による素子の再加熱による課′ル特性の変化を示す図、
第6図は再加熱処理前の実施例による素子のX線回折パ
ターンを示す図、第7図は7θθ℃で再加熱処理した実
施例による素子のxi回折パターンを示す図、第3図は
再加熱によるBi2O3ピーク強I更の変化を示す図、
第9図は再加熱処理による酸化ビスマスのγ相への転化
率を示す図である。
代理人 大 岩 増 雄
第1図
本
第2図
課電開開
第4図
第5図
“° 再 カロ 李杯 )品 ハゲ (・C)2θ (
度)
2θ (度)
手続補正書「自発」
昭和!7年3月ユ゛と日
特許庁長官殿
1、事件の表示 特願昭zg−//J/4J号2、発明
の名称
酸化亜鉛形避雷器素子
3、補正をする者
代表者片山仁へ部
(1) 明細書の発明の詳細な説明の欄ム 補正の内容
(1) 明細書箱2頁第グ行「電流」を「電圧」に正す
る。
(2) 同第り頁10?//行r(Al (No !
)り、・9H20)−1を「(Aj、(NO3h・9H
20)Jに補正する。Figure 1 shows the voltage-current characteristics of a conventional zinc oxide arrester element.
FIG. 2 is a diagram conceptually showing the charging characteristics of the device shown in FIG. 1, FIG. FIG. 3 is a diagram showing changes in leakage current due to reheating of the element according to the example; FIG.
FIG. 6 is a diagram showing the X-ray diffraction pattern of the device according to the example before reheating treatment, FIG. 7 is a diagram showing the xi diffraction pattern of the device according to the example after reheating treatment at 7θθ℃, and FIG. A diagram showing further changes in Bi2O3 peak intensity due to heating,
FIG. 9 is a diagram showing the conversion rate of bismuth oxide to γ phase by reheating treatment. Agent Masuo Oiwa Figure 1 Book Figure 2 Section Electrical opening Figure 4 Figure 5
Degrees) 2θ (degrees) Procedural Amendment ``Spontaneous'' Showa! March 7, 2007, Mr. Yu and the Commissioner of the Japanese Patent Office1, Indication of the case, Patent Application No. 1, No. 2, Title of the invention: Zinc oxide type lightning arrester element 3, To the representative of the person making the amendment, Hitoshi Katayama. (1) Column for detailed explanation of the invention in the specification Details of the amendment (1) In the second page of the specification box, line G, "current" is corrected to "voltage." (2) Same page 10? //line r(Al (No!
)ri,・9H20)-1 as “(Aj, (NO3h・9H
20) Correct to J.
Claims (1)
t化亜30形′!:1雷器崇子において、該1”、桑化
ビスマスの結晶相のノθ〜ざθ係がガンマ1“2化ビス
マスであることを’i’!7 Qとする(1′2化亜鉛
形避雷器素子。ri containing at least l':"bismuth dioxide as an additive.
T-type 30'! :1 In Takako Raiki, 'i' says that the crystalline phase of bismuth mulberry has a gamma of 1 and is bismuth 2! 7 Q (1' Zinc dioxide type lightning arrester element.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58113163A JPS604202A (en) | 1983-06-22 | 1983-06-22 | Zinc oxide type arrester element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58113163A JPS604202A (en) | 1983-06-22 | 1983-06-22 | Zinc oxide type arrester element |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS604202A true JPS604202A (en) | 1985-01-10 |
| JPH0522362B2 JPH0522362B2 (en) | 1993-03-29 |
Family
ID=14605141
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58113163A Granted JPS604202A (en) | 1983-06-22 | 1983-06-22 | Zinc oxide type arrester element |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS604202A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01192104A (en) * | 1988-01-28 | 1989-08-02 | Ngk Insulators Ltd | Manufacture of voltage dependent non-linear resistor |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5321509A (en) * | 1976-08-11 | 1978-02-28 | Nippon Telegr & Teleph Corp <Ntt> | Digital signal two-way repeater unit |
-
1983
- 1983-06-22 JP JP58113163A patent/JPS604202A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5321509A (en) * | 1976-08-11 | 1978-02-28 | Nippon Telegr & Teleph Corp <Ntt> | Digital signal two-way repeater unit |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01192104A (en) * | 1988-01-28 | 1989-08-02 | Ngk Insulators Ltd | Manufacture of voltage dependent non-linear resistor |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0522362B2 (en) | 1993-03-29 |
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