JPS6050461A - Method of non-destructive insulation test - Google Patents

Method of non-destructive insulation test

Info

Publication number
JPS6050461A
JPS6050461A JP16063583A JP16063583A JPS6050461A JP S6050461 A JPS6050461 A JP S6050461A JP 16063583 A JP16063583 A JP 16063583A JP 16063583 A JP16063583 A JP 16063583A JP S6050461 A JPS6050461 A JP S6050461A
Authority
JP
Japan
Prior art keywords
gas
resistance
insulation
pressure
atmosphere
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16063583A
Other languages
Japanese (ja)
Other versions
JPH0417395B2 (en
Inventor
Yoichi Kawasumi
川澄 陽一
Akio Sakai
昭雄 酒井
Osamu Hashimoto
修 橋本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP16063583A priority Critical patent/JPS6050461A/en
Publication of JPS6050461A publication Critical patent/JPS6050461A/en
Publication of JPH0417395B2 publication Critical patent/JPH0417395B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Relating To Insulation (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

PURPOSE:To enable easy and positive detection of insulation defect caused by contamination etc., by changing gas-pressure and kind of gas inside a pressure vessel and gas resistance of atmosphere of a machine or an instrument to be tested. CONSTITUTION:A specimen 10 is placed in a pressure vessel 20 and pressure inside the vessel 20 is available for change by a vacuum pump 22. As an example, when an apparent insulation resistance is tested by admitting helium into the vessel 20 as a gas the initial spark voltage of which being lower than air and lowering the inside gas pressure under a constant applied voltage, the value of opparent insulation resistance by starting of discharge drops abruptly and further, changes of insulating distance as well as kind of gas invite obvious difference of gas pressure under which the insulating resistance drops drastically. Consequently, by lowering gas resistance of atmosphere by means of changing gas pressure and kind of gas of atmosphere, easy and positive detection of insulation defect caused by contamination, etc. susceptible to overlooking can be available.

Description

【発明の詳細な説明】 〔発明の技術分野〕 この発明は、電気機器の絶縁性能の良否を診断する非破
壊絶縁試験方法、特に被試験機器を圧力容器に入れ、こ
の圧力容器内の圧力および気体の種類を変えて被試験機
器の絶縁抵抗を測定するようにした被破壊P線試験方法
に関するものである。
Detailed Description of the Invention [Technical Field of the Invention] The present invention relates to a non-destructive insulation testing method for diagnosing the quality of the insulation performance of electrical equipment, and in particular, to a non-destructive insulation testing method for diagnosing the quality of the insulation performance of electrical equipment. The present invention relates to a method for testing a P-wire to be destroyed, in which the insulation resistance of a device under test is measured by changing the type of gas.

〔従来技術〕[Prior art]

従来のこの種の絶縁試験には以下に示すものがあった。 Conventional insulation tests of this type include the following.

第1図には、コイル等の絶縁試験のモデルとして用られ
る試料10が示されている。図において、/は導体、コ
は導体lの絶縁物、3&ま絶縁物−の1の長さに対して
絶縁距離を両端1コずつ残したLlの長さに取り付けら
れた電極である。
FIG. 1 shows a sample 10 used as a model for insulation testing of coils and the like. In the figure, / is the conductor, C is the insulator of the conductor l, and 3 & is the electrode attached to the length of Ll, leaving an insulation distance of 1 on each end for the length of 1 of the insulator.

第一図には、従来の試験装置の概略図が示されている。FIG. 1 shows a schematic diagram of a conventional test device.

第2図において、10は第1図に示した試料であり、こ
の試料IOの導体lと電極3との間には、電源Eと絶縁
抵抗測定器Aが直列に接続されている。そして電源EK
よって電圧が印加され。
In FIG. 2, reference numeral 10 is the sample shown in FIG. 1, and a power source E and an insulation resistance measuring device A are connected in series between the conductor 1 and the electrode 3 of this sample IO. And power supply EK
Therefore, voltage is applied.

その漏れ電流を絶縁抵抗測定器AKよってめることによ
り絶縁抵抗を測定する。なお1通常、簡易的にはメガオ
ームメータを用いる。また、第一図の電気的等価回路を
示すと第3図のようになる。
The insulation resistance is measured by measuring the leakage current using an insulation resistance measuring device AK. Note 1: Normally, a megohmmeter is used for simplicity. Further, the electrical equivalent circuit of FIG. 1 is shown in FIG. 3.

第3図において、R’、Aはそれぞれ電源、絶縁抵抗測
定器であり、RVは絶縁物20体積抵抗−Rsは電極3
より導体lまでの終縁物コの長さlj(第1図参照)に
相当する部分の表面抵抗、そしてRAは、やはり電極3
より導体lまでの絶縁物ユの長さ1.2(第1図参照)
に相当する部分の雰囲気の気体抵抗である。これらの3
つの抵抗Rv+Rs+RAは、電源Eと絶縁抵抗測定器
Aとにそれぞれ並列に接続されている。
In Figure 3, R' and A are the power supply and insulation resistance measuring device, respectively, RV is the volume resistance of the insulator 20, and Rs is the electrode 3.
The surface resistance of the portion corresponding to the length lj (see Fig. 1) of the terminal end to the conductor l, and RA are also the same as those of the electrode 3.
The length of the insulator from the conductor l to the conductor l is 1.2 (see Figure 1)
is the gas resistance of the atmosphere in the area corresponding to . These 3
The two resistors Rv+Rs+RA are connected in parallel to the power source E and the insulation resistance measuring device A, respectively.

第3図の等何回路より5第一図の試験方法で得られる試
料の全体の抵抗値Rは と表わすことができる。通常、被試験機器の表面状態が
良い場合、低温度雰囲気中でS緑抵抗を測定すると体積
抵抗Rv 、表面抵抗R8および雰囲気の気体抵抗RA
が共産大きな絶縁抵抗値を有するので、(1)式におけ
る全体の絶縁抵抗値Rは当然大きくなる。しかし、被試
験機器の表面状態が吸湿性の抵抗粉塵で汚損されている
場合は表面抵抗R8が小さくなり、体積抵抗Rv、測定
雰囲気の気体抵抗RAが大きくても、(1)式の全体の
絶縁抵抗値Rはほとんど表面抵抗Rsと同じ値を示す。
From the circuit shown in FIG. 3, the overall resistance value R of the sample obtained by the test method shown in FIG. 1 can be expressed as follows. Normally, when the surface condition of the device under test is good, when measuring the S green resistance in a low temperature atmosphere, the volume resistance Rv, the surface resistance R8, and the gas resistance RA of the atmosphere are measured.
Since both have a large insulation resistance value, the overall insulation resistance value R in equation (1) naturally becomes large. However, if the surface of the device under test is contaminated with hygroscopic resistance dust, the surface resistance R8 becomes small, and even if the volume resistance Rv and the gas resistance RA of the measurement atmosphere are large, the overall equation (1) The insulation resistance value R shows almost the same value as the surface resistance Rs.

また1例えば絶縁物に放電路となるような欠陥部が生じ
た場合は、その体積抵抗Rvが小さくなり、表面抵抗R
s、雰囲気の気体抵抗RAが大きくても全体の絶縁抵抗
値Rはほとんど体積抵抗Rvと同じ値を示す。
In addition, 1. For example, if a defective part that becomes a discharge path occurs in an insulator, its volume resistance Rv decreases and its surface resistance Rv decreases.
s, even if the gas resistance RA of the atmosphere is large, the overall insulation resistance value R shows almost the same value as the volume resistance Rv.

以上のように、従来の試験方法では、第3図のような等
何回路となっている場合は、絶縁物の表面の汚損、或い
はPR物の欠陥部処する絶縁欠陥が検出できた。しかし
、例えば第グ図に示すように−i緑物コの12の長さの
内2コaで示されたIJの長さの分のみ汚損粉塵が付着
して表面抵抗が小さくなっており、コbで示されたJ−
夕゛の部分が健全で大きな表面抵抗をもっている場合が
ある。
As described above, with the conventional test method, in the case of a circuit as shown in FIG. 3, it was possible to detect dirt on the surface of the insulator or an insulation defect in the defective part of the PR material. However, as shown in Fig. 1, for example, contamination dust adheres to only the length of the IJ shown by 2 out of 12 lengths of the green material -i, and the surface resistance is reduced. J- indicated by b
In some cases, the bottom part is healthy and has a large surface resistance.

この時の等何回路は第5図のようになる、第S図におい
て、R8a’ * R8bはそれぞれ絶縁物2の、2a
The circuit at this time is as shown in Figure 5. In Figure S, R8a' * R8b are the insulators 2 and 2a, respectively.
.

コbの部分の表面抵抗であり、その他の部分は第3図と
同じ符号を付しである。そこで、この時の絶縁抵抗値R
′は となる。この時、絶縁物−の体積抵抗Rv、雰囲気の気
体抵抗RAおよび絶、緑物コのubの部分の表面抵抗R
8bが十分大きいと、絶縁物−のλaの部分の表面抵抗
Rsaが非常に小さい抵抗値であっても全体の絶縁抵抗
値Wは大きい値となり、実際の機器のメンテナンス等を
行なう場合に誤った判断を下す可能性がある。また、第
6図に示すように、絶縁物コに穴があくなどして欠陥部
!が生じていても、欠陥部りに絶縁抵抗の高い雰囲気が
充填されている場合がある。この時の等何回路は第7図
のようになる。第7図において、R8には欠陥部50表
面抵抗であり、これに直列に接続されているRAは欠陥
部S中の雰囲気の気体抵抗を示している。その他の部分
は第3図と同じ符号を付しである。この時の絶縁抵抗値
R1は、 と表わされる。そして、絶縁物20体積抵抗と表面抵抗
Rv、Rsおよび雰囲気の気体抵抗RAが大きく、かつ
欠陥部の表面抵抗Rsrも十分大きい場合には、測定さ
れる絶縁抵抗値R“は大きい値を示し、この場合も欠陥
を見逃すことになる。従来の試験方法には、以上のよう
な欠点があった。
This is the surface resistance of the part marked b, and the other parts are given the same reference numerals as in FIG. Therefore, the insulation resistance value R at this time
′ becomes . At this time, the volume resistance Rv of the insulator, the gas resistance RA of the atmosphere, and the surface resistance R of the ub part of the green material
If 8b is sufficiently large, even if the surface resistance Rsa of the λa portion of the insulator is very small, the overall insulation resistance value W will be a large value, which may cause errors when performing actual equipment maintenance, etc. judgment may be made. Also, as shown in Figure 6, there may be defects such as holes in the insulator! Even if this occurs, an atmosphere with high insulation resistance may fill the area around the defect. The equivalent circuit at this time is as shown in FIG. In FIG. 7, R8 represents the surface resistance of the defective portion 50, and RA connected in series with R8 represents the gas resistance of the atmosphere within the defective portion S. Other parts are given the same reference numerals as in FIG. The insulation resistance value R1 at this time is expressed as follows. Then, when the volume resistance and surface resistance Rv, Rs of the insulator 20 and the gas resistance RA of the atmosphere are large, and the surface resistance Rsr of the defective part is also sufficiently large, the measured insulation resistance value R'' shows a large value, In this case as well, defects will be overlooked.The conventional testing methods have the above-mentioned drawbacks.

〔発明の概要〕[Summary of the invention]

この発明は上記のような従来の試験方法の欠点を除去す
るためになされたもので、被試験機器を圧力容器の内に
入れ、この圧力容器内のガス圧およびガスの種類を変え
ることにより、被試験機器の雰囲気の気体抵抗を変化さ
せることにより、的確に絶縁欠陥が把握できるようKし
た被破壊終縁試験方法を提供することを目的としている
This invention was made in order to eliminate the drawbacks of the conventional test method as described above, and by placing the device under test in a pressure vessel and changing the gas pressure and type of gas in the pressure vessel, It is an object of the present invention to provide a destructive termination testing method that allows accurate identification of insulation defects by changing the gas resistance of the atmosphere of the equipment under test.

〔発明の実施例〕[Embodiments of the invention]

以下、この発明の一実施例について説明する。 An embodiment of the present invention will be described below.

第g図には、実際の試験装置が示されている。図におい
て、10は試料、Eは試料IOの導体/と電極30間に
電圧を印加するための電源、A)まその漏れ電流を測定
する絶縁抵抗測定器であり5これらは第1図および第一
図に示した従来の試験方法のものと同じである。SOは
圧力容器であり、試料lOはこの中に入れられている。
Fig. g shows the actual test equipment. In the figure, 10 is a sample, E is a power source for applying a voltage between the conductor of the sample IO and the electrode 30, and A) an insulation resistance measuring device for measuring the leakage current of the sample IO. This is the same as the conventional test method shown in Figure 1. SO is a pressure vessel in which the sample IO is placed.

U/は圧力容器20内の圧力を示す圧力計、−一は圧力
容器SOの中の圧力を変えるための真空ポンプ1.23
は圧力容器−〇と真空ポンプユコをつなぐ管に設けられ
たバルブである。そこで、実験として、まず、第1図に
示した試料IOの絶縁距離1コがlミリメートルのもの
とクミリメートルのものを用意した。そして、これを圧
力容器20の中に入れ。
U/ is a pressure gauge that indicates the pressure inside the pressure vessel 20, and -1 is a vacuum pump 1.23 for changing the pressure inside the pressure vessel SO.
is a valve installed in the pipe connecting the pressure vessel -〇 and the vacuum pump Yuko. Therefore, as an experiment, first, samples IO shown in FIG. 1 with an insulation distance of 1 millimeter and a sample IO with an insulation distance of 1 mm were prepared. Then, put this into the pressure vessel 20.

空気中および空気より最小火花電圧の低い気体としてヘ
リウムガス中で、一定印加電圧のもとにガス圧を下げて
いった時のみかけの絶縁抵抗を測定し、それぞれのガス
圧と絶縁抵抗の特性をめてみた。その結果が第9図に示
すものである。第を図において、縦軸には絶縁抵抗が終
縁抵抗指数(logtoR)としてとってあり、また横
軸にはガス圧力l111Hf でとっである。曲線A/
、A4’、H/、Hグはそれぞれの特性を示しA/は空
気中の絶縁距離1コがlミリのもの、Al’は空気中の
絶縁距離1−がlミリのもの、H/はヘリウムガス中の
絶縁距離1コがlミリのもの、セしてH41はヘリウム
ガス中の絶縁距離1コがqミリのものである。第9図か
られかったことは、放電が開始することにより見かけの
P縁抵抗値は急激に低下すること、また、電極間距離に
当る絶縁距離およびガスの種類が異なると絶縁抵抗が急
激に低下を始めるガス圧が歴然と異なることである。ま
た、絶縁距離が短いと放電を開始するガス圧は大きくな
っており。
The apparent insulation resistance was measured in air and in helium gas, a gas with a lower minimum spark voltage than air, when the gas pressure was lowered under a constant applied voltage, and the characteristics of each gas pressure and insulation resistance were measured. I looked at it. The results are shown in FIG. In the figure, the vertical axis shows the insulation resistance as the terminal resistance index (logtoR), and the horizontal axis shows the gas pressure l111Hf. Curve A/
, A4', H/, and Hg indicate their respective characteristics. A/ is for the insulation distance in the air of 1 mm, Al' is for the insulation distance in the air of 1 mm, and H/ is for the insulation distance in the air of 1 mm. The insulation distance in helium gas is 1 mm, and the H41 has an insulation distance of 1 mm in helium gas. What we learned from Figure 9 is that the apparent P-edge resistance value rapidly decreases when discharge starts, and that insulation resistance rapidly decreases when the insulation distance corresponding to the interelectrode distance and the type of gas differ. The difference is that the gas pressure at which the drop begins is clearly different. Also, if the insulation distance is short, the gas pressure that starts the discharge is high.

この現象はパッシェンの法則の火花発生電圧は雰囲気の
圧力とギャップの長さの積に正比例するとい5事実を裏
付けている。
This phenomenon supports the fact of Paschen's law that the spark generation voltage is directly proportional to the product of the atmospheric pressure and the gap length.

この実験の場合、体積抵抗および浴面絶縁の表面抵抗は
雰囲気のガス圧により変化することがなくても、電極間
距離つまり絶縁距離の間における雰囲気の気体抵抗が変
化すること妊より清面放電が生じ、これによって放電電
流が流れ、みかけの絶縁抵抗が変化する。そこで放電を
開始する時のみかけの?縁抵抗値をrとし、その時の雰
囲気のガス圧なp、絶縁距離を1、雰囲気のガスの種類
による係類をkとすると、 rcx−kX p X 1 ・・・(glと表わすこと
ができる。第7図に示したような絶縁抵抗の低い汚損物
が付着している試料では、結果的に絶縁距離が短かくな
っている。従って、みかけの絶縁抵抗値rが小さくなっ
ているため、汚損物のない試料に比べて高いガス圧で放
電が開始するので、汚損の有無がはっきりと見分けるこ
とができる。また、ガスの種類による差異については、
ヘリウムガスの最小火花電圧時の雰囲気のガス圧pとギ
ャップの長さ、つまり絶縁距離Jの積pxJ−が空気の
場合よりかなり大きく、一定印加電圧時の放電開始ガス
圧は、ヘリウムガスの方が空気疋比べて大きいことがわ
かる。これは(ダ)式のkの値が空気とヘリウムではヘ
リウムの方が小さいということからも理解でき、このこ
とは、この実験を実際にコイルの船縁試験等に適用する
際、圧力容器の真空度が、空気の場合に比べて低(設計
でき、装置が安価にできることになる。さらに、この実
験では、絶縁抵抗測定器として超?縁抵抗計および5o
ovメガオームメータを用いたが、測定後の試料の放電
による劣化を調べたが損傷もなく、簡易で、安全で、確
実な絶縁試験方法であることもわかった。
In the case of this experiment, even though the volume resistivity and the surface resistance of the bath insulation do not change due to the atmospheric gas pressure, the gas resistance of the atmosphere changes between the electrode distance, that is, the insulation distance. occurs, which causes a discharge current to flow and the apparent insulation resistance to change. What about the appearance when the discharge starts? If the edge resistance value is r, the gas pressure of the atmosphere at that time is p, the insulation distance is 1, and the relationship depending on the type of gas in the atmosphere is k, then rcx - kX p X 1 ... (can be expressed as gl) As shown in Figure 7, in a sample with low insulation resistance contaminants attached, the insulation distance becomes short.Therefore, the apparent insulation resistance value r becomes small. Since discharge starts at a higher gas pressure than a sample without contaminants, it is possible to clearly distinguish whether there is contamination or not.In addition, regarding the differences depending on the type of gas,
The product pxJ- of the gas pressure p in the atmosphere at the minimum spark voltage of helium gas and the length of the gap, that is, the insulation distance J, is considerably larger than that of air, and the gas pressure at which discharge starts at a constant applied voltage is higher for helium gas. It can be seen that the air is larger than that of the air. This can be understood from the fact that the value of k in equation (da) is smaller for helium than for air, and this means that when this experiment is actually applied to coil edge tests, etc. In this experiment, we used an ultra-edge resistance meter and a 5o
Although an OV megohmmeter was used, after the measurement, the sample was examined for deterioration due to discharge, and no damage was observed, and it was found to be a simple, safe, and reliable insulation testing method.

この試験方法を、実際のコイル等の絶縁試験に適用する
際には、予じめそのコイル等の未使用のもののガス圧と
絶縁抵抗の特性、或いはそのコイルの健全サンプルのガ
ス圧と絶縁抵抗の特性を調べてオキ、これと実際に試験
されるべきコイルの特性とを比較することにより、絶縁
性能の良否を簡易に、安全にそして確実に判定すること
ができる。すなわち、絶縁試験されるべきコイルのIP
緑低抵抗急激に低下するガス圧が未使用のもの、或いは
健全サンプルのもののそれより高くなっていれば、絶縁
距離が短かくなっているか、或いは対地P縁に欠陥があ
ることを示しており、それぞれのコイルの使用情況に応
じて、不良状態を把握することができる。
When applying this test method to an actual insulation test of a coil, etc., first check the gas pressure and insulation resistance characteristics of an unused coil, or the gas pressure and insulation resistance of a healthy sample of the coil. By examining the characteristics of the coil and comparing them with the characteristics of the coil to be actually tested, it is possible to easily, safely and reliably determine whether the insulation performance is good or bad. i.e. the IP of the coil to be tested for insulation
Green Low Resistance If the rapidly decreasing gas pressure is higher than that of the unused one or the healthy sample, it indicates that the insulation distance is short or there is a defect in the ground P edge. , it is possible to grasp the defective state according to the usage situation of each coil.

な′お、上記実施例では、D小火孔電圧が空気より小さ
い気体とじずヘリウムガスをあげたが、不活性ガスであ
るアルゴンガス、或は窒素ガス等でもよい。また適用機
器もコイルに限られるものではなく、プリント基板等の
電気回路と絶縁部分から構成される部品等の絶縁試験に
も適用できる。
In the above embodiment, helium gas, which has a smaller D-hole voltage than air, was used, but argon gas, nitrogen gas, etc., which are inert gases, may also be used. Furthermore, the applicable equipment is not limited to coils, but can also be applied to insulation tests of components such as printed circuit boards that are composed of electrical circuits and insulating parts.

〔発明の効果〕〔Effect of the invention〕

以上のようにこの発明によれば、絶縁抵抗を測定する際
、被試験機器の雰囲気のガス圧およびガスの種類を変え
て、雰囲気の気体抵抗を下げることにより、従来測定し
ても見逃しがちであった汚損等による絶縁欠陥を容易に
、安全に、そして的確に検出できるようになった。
As described above, according to the present invention, when measuring insulation resistance, by changing the gas pressure and type of gas in the atmosphere of the equipment under test to lower the gas resistance of the atmosphere, it is possible to reduce the gas resistance of the atmosphere, which would otherwise be overlooked even with conventional measurements. Insulation defects due to contamination, etc. can now be detected easily, safely, and accurately.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はP線抵抗を測定する試料のf11図、第一図は
従来の試験装置の概略図、第3図は第一図の電気的等価
回路図、第弘図は汚損のある試料の斜視図、第S図は第
v図の試料の電気的等価回路図、第6図は欠陥のある試
料の長手方向の断面図、第7図は第6図の試料の電気的
等価回路図、第を図はこの発明の一実施例の試験装置の
概略図、第9図はガス圧を絶縁抵抗の特性を示す線図。 E・・電源、A・・絶縁抵抗測定器、IO・・試料、−
〇・・圧力容器、U/・・圧力計1.22・・真空ポン
プ+23・・パルプ0 尚、図中、同一符号は、同−又は相当部分を示す。 代理人 大 岩 増 雄 ん1図 懲2図 先3図 篤4図 b ん5図
Figure 1 is an f11 diagram of a sample for measuring P-line resistance, Figure 1 is a schematic diagram of a conventional test device, Figure 3 is an electrical equivalent circuit diagram of Figure 1, and Figure 1 is a diagram of a contaminated sample. A perspective view, FIG. S is an electrical equivalent circuit diagram of the sample shown in FIG. Fig. 9 is a schematic diagram of a test device according to an embodiment of the present invention, and Fig. 9 is a diagram showing the characteristics of gas pressure and insulation resistance. E...power supply, A...insulation resistance measuring device, IO...sample, -
〇...Pressure vessel, U/...Pressure gauge 1.22...Vacuum pump +23...Pulp 0 In the drawings, the same reference numerals indicate the same - or equivalent parts. Agent Masu Oiwa Figure 1 Figure 2 Figure 3 Atsushi Figure 4 Figure 5

Claims (1)

【特許請求の範囲】 (1) 電気様器の絶縁性能の良否を診断する非破壊絶
縁試験方法において、被試鉄機器を圧力容器内に入れ、
この圧力容器内の空気の圧力を減圧するが或は上記圧力
客器内の空気をその最小火花電圧よりも低い最小火花電
圧を有する気体に変えてこれを減圧して上記破壊試駆機
器のMAR抵抗を測定する非破壊絶縁試験方法。 ((2) 空気よりも最小火花電圧が低い気体が窒素ガ
スである特許請求の範囲第7項記載の非破壊絶縁試験方
法。 (3)空気よりも最小火花電圧が低い気体が不活性ガス
である特許請求の範囲第7項記載の非破壊?緑試絵方法
。 (す不活性ガスがヘリウムガスである特許請求の範囲第
3項記載の非破壊絶縁試験方法。 (、t) 不ra性ガスがアルゴンガスである特許請求
の範囲第3項記載の非破壊絶縁試験方法。
[Claims] (1) In a non-destructive insulation test method for diagnosing the quality of the insulation performance of an electrical regulator, the iron equipment to be tested is placed in a pressure vessel,
The pressure of the air in the pressure vessel is reduced, or the air in the pressure passenger vessel is changed to a gas having a minimum spark voltage lower than the minimum spark voltage, and the pressure is reduced to obtain the MAR of the destructive test equipment. A non-destructive insulation test method to measure resistance. ((2) The non-destructive insulation testing method according to claim 7, wherein the gas having a lower minimum spark voltage than air is nitrogen gas. (3) The gas having a lower minimum spark voltage than air is an inert gas. A non-destructive green test method according to claim 7. (A non-destructive insulation testing method according to claim 3, wherein the inert gas is helium gas. (,t) Inertness 4. The non-destructive insulation testing method according to claim 3, wherein the gas is argon gas.
JP16063583A 1983-08-30 1983-08-30 Method of non-destructive insulation test Granted JPS6050461A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16063583A JPS6050461A (en) 1983-08-30 1983-08-30 Method of non-destructive insulation test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16063583A JPS6050461A (en) 1983-08-30 1983-08-30 Method of non-destructive insulation test

Publications (2)

Publication Number Publication Date
JPS6050461A true JPS6050461A (en) 1985-03-20
JPH0417395B2 JPH0417395B2 (en) 1992-03-25

Family

ID=15719186

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16063583A Granted JPS6050461A (en) 1983-08-30 1983-08-30 Method of non-destructive insulation test

Country Status (1)

Country Link
JP (1) JPS6050461A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6276675U (en) * 1985-10-31 1987-05-16
WO2001088558A1 (en) * 2000-05-16 2001-11-22 Wee-Electrotest Engineering Gmbh Detection of damage to the insulation of electric components
JP2007220558A (en) * 2006-02-17 2007-08-30 Sumitomo Wiring Syst Ltd Metal terminal fitting and positioning jig
JP2019012652A (en) * 2017-06-30 2019-01-24 株式会社豊田自動織機 Battery module and battery pack

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6276675U (en) * 1985-10-31 1987-05-16
WO2001088558A1 (en) * 2000-05-16 2001-11-22 Wee-Electrotest Engineering Gmbh Detection of damage to the insulation of electric components
JP2007220558A (en) * 2006-02-17 2007-08-30 Sumitomo Wiring Syst Ltd Metal terminal fitting and positioning jig
JP2019012652A (en) * 2017-06-30 2019-01-24 株式会社豊田自動織機 Battery module and battery pack

Also Published As

Publication number Publication date
JPH0417395B2 (en) 1992-03-25

Similar Documents

Publication Publication Date Title
US6289716B1 (en) Method for on-line assessment and indication of transformer conditions
WO2009157255A1 (en) Insulation coated conductor testing method and apparatus
US5760590A (en) Cable integrity tester
CN118376897B (en) Cable GIS terminal performance test system and method
CN107290399B (en) Transformer Water Content Measuring Device Based on PDC/FDS Dielectric Response Method
CN112379235B (en) GIS insulation fault testability evaluation method
JPS6050461A (en) Method of non-destructive insulation test
US8860429B2 (en) System and method for detecting sensor leakage
CN110007202A (en) A kind of proficiency testing and its sample preparation methods of electrical strength test
CN108593714B (en) Transformer internal moisture measurement system based on dielectric response characteristics of transformer built-in oiled paper insulation sample
CN118625072A (en) Tank type circuit breaker insulation cylinder test detection device and method
CN207965118U (en) The special graded resistance detection check device of circuit resistance tester
JPS5817377A (en) Continuity testing device for flat cable
US2194303A (en) Radio noise testing equipment
CN112255509A (en) A system and method for detecting equipment insulation defects based on low temperature plasma
KR200268679Y1 (en) Cable puncture tester for withstanding and insulation
TWI416129B (en) Quality testing method for transformer bushings
JPH03246477A (en) Breaker inspecting device
CN220136925U (en) Oilpaper insulating sleeve fault simulation device
JPH05264642A (en) Method for diagnosing deterioration of cable
KR100355716B1 (en) Test method of low resistor for in-circuit tester
CN212569019U (en) Electricity core testing arrangement
JP2002260533A (en) Inspection method for withstand voltage between stem pins
Gradin et al. Research to correct misconceptions regarding significance of PI and IR testing of motors
CN118914781A (en) Special tool for testing transformer bushing