JPS605462Y2 - 密閉形開閉装置の操作機構 - Google Patents

密閉形開閉装置の操作機構

Info

Publication number
JPS605462Y2
JPS605462Y2 JP17737078U JP17737078U JPS605462Y2 JP S605462 Y2 JPS605462 Y2 JP S605462Y2 JP 17737078 U JP17737078 U JP 17737078U JP 17737078 U JP17737078 U JP 17737078U JP S605462 Y2 JPS605462 Y2 JP S605462Y2
Authority
JP
Japan
Prior art keywords
operating shaft
operating
joint
closed type
phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP17737078U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5598110U (2
Inventor
誠 小山
一郎 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP17737078U priority Critical patent/JPS605462Y2/ja
Publication of JPS5598110U publication Critical patent/JPS5598110U/ja
Application granted granted Critical
Publication of JPS605462Y2 publication Critical patent/JPS605462Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Driving Mechanisms And Operating Circuits Of Arc-Extinguishing High-Tension Switches (AREA)
  • Gas-Insulated Switchgears (AREA)
JP17737078U 1978-12-27 1978-12-27 密閉形開閉装置の操作機構 Expired JPS605462Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17737078U JPS605462Y2 (ja) 1978-12-27 1978-12-27 密閉形開閉装置の操作機構

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17737078U JPS605462Y2 (ja) 1978-12-27 1978-12-27 密閉形開閉装置の操作機構

Publications (2)

Publication Number Publication Date
JPS5598110U JPS5598110U (2) 1980-07-08
JPS605462Y2 true JPS605462Y2 (ja) 1985-02-20

Family

ID=29186806

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17737078U Expired JPS605462Y2 (ja) 1978-12-27 1978-12-27 密閉形開閉装置の操作機構

Country Status (1)

Country Link
JP (1) JPS605462Y2 (2)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7161363B2 (en) 2002-05-23 2007-01-09 Cascade Microtech, Inc. Probe for testing a device under test
US7233160B2 (en) 2000-12-04 2007-06-19 Cascade Microtech, Inc. Wafer probe
US7285969B2 (en) 2002-11-13 2007-10-23 Cascade Microtech, Inc. Probe for combined signals
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
WO2015107694A1 (ja) * 2014-01-20 2015-07-23 三菱電機株式会社 開閉器およびガス絶縁開閉装置
US12281672B2 (en) 2020-08-24 2025-04-22 Kabushiki Kaisha Toshiba Opening/closing device

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017134885A (ja) 2014-06-12 2017-08-03 三菱電機株式会社 ガス絶縁スイッチギヤの開閉器およびガス絶縁開閉装置
JP5968580B1 (ja) * 2015-06-10 2016-08-10 三菱電機株式会社 ガス絶縁スイッチギヤの開閉器およびガス絶縁開閉装置

Cited By (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7233160B2 (en) 2000-12-04 2007-06-19 Cascade Microtech, Inc. Wafer probe
US7495461B2 (en) 2000-12-04 2009-02-24 Cascade Microtech, Inc. Wafer probe
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US7518387B2 (en) 2002-05-23 2009-04-14 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7161363B2 (en) 2002-05-23 2007-01-09 Cascade Microtech, Inc. Probe for testing a device under test
US7436194B2 (en) 2002-05-23 2008-10-14 Cascade Microtech, Inc. Shielded probe with low contact resistance for testing a device under test
US7482823B2 (en) 2002-05-23 2009-01-27 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7453276B2 (en) 2002-11-13 2008-11-18 Cascade Microtech, Inc. Probe for combined signals
US7285969B2 (en) 2002-11-13 2007-10-23 Cascade Microtech, Inc. Probe for combined signals
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7501842B2 (en) 2003-05-23 2009-03-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US8013623B2 (en) 2004-09-13 2011-09-06 Cascade Microtech, Inc. Double sided probing structures
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
WO2015107694A1 (ja) * 2014-01-20 2015-07-23 三菱電機株式会社 開閉器およびガス絶縁開閉装置
US12281672B2 (en) 2020-08-24 2025-04-22 Kabushiki Kaisha Toshiba Opening/closing device

Also Published As

Publication number Publication date
JPS5598110U (2) 1980-07-08

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