JPS605882A - Formation of hard carbonaceous film on surface of substrate - Google Patents
Formation of hard carbonaceous film on surface of substrateInfo
- Publication number
- JPS605882A JPS605882A JP11226583A JP11226583A JPS605882A JP S605882 A JPS605882 A JP S605882A JP 11226583 A JP11226583 A JP 11226583A JP 11226583 A JP11226583 A JP 11226583A JP S605882 A JPS605882 A JP S605882A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- hydrocarbon
- carbonaceous film
- gas
- gaseous
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/26—Deposition of carbon only
Landscapes
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
この発明は、通常イオンビーム発生装置として知られて
いるデュオ・プラズマトロンを用いて、基体表面に硬質
の炭素質膜を形成する方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for forming a hard carbonaceous film on the surface of a substrate using a Duo Plasmatron, which is commonly known as an ion beam generator.
一般に、デュオ・プラズマトロンは、イオンビーム発生
装置としてよく知られているものである。In general, the Duo Plasmatron is a well-known ion beam generator.
このデュオ・プラズマトロンは、放電ガス導入孔よI)
Arガスを導入し、このArガスをA1−イ・オンビー
ムとして発生させる装置であり、例えば第1図に示され
るように金属のスパッタリングに際してのスパッタ源と
して用いられるものである。すなわち、第1図に示され
るイオンビームを用いたスパッタリング装置においては
、デュオ・プラズマトロン1の放電ガス導入孔2からA
rガスが導入され、これによって発生またArイオンビ
ーム3が、これと隣接して設けた蒸着室(l Q to
rr以上の真空)4内の例えばMOターゲット5に照射
され、仁のターゲット5よりスパッタされプζMog気
が基板60表面に蒸着するようになっている。This Duo Plasmatron has a discharge gas introduction hole.
This device introduces Ar gas and generates the Ar gas as an A1-ion beam, and is used as a sputtering source for metal sputtering, for example, as shown in FIG. That is, in the sputtering apparatus using an ion beam shown in FIG.
r gas is introduced, and thereby an Ar ion beam 3 is generated and an Ar ion beam 3 is introduced into the vapor deposition chamber (l Q to
For example, an MO target 5 in a vacuum (vacuum of rr or higher) is irradiated, and the ζMog air is sputtered from the solid target 5 and is deposited on the surface of a substrate 60.
このようにデュオ・プラズマトロンはイオンビ−ム発生
装置として知られるものであるが、本発明者等は、かか
るデュオ・プラズマトロンを用いて炭素質膜を形成すべ
く研究を行なつズと結果、放電ガスとして知られている
Arガスと、炭化水素ガストラ、デュオ・プラズマトロ
ンの放電ガス導入孔より別々に、あるいは混合状態で導
入し、との結果このデュオ・プラズマトロンからRi
生した、[)11記炭化水素が部分的に分解した状態の
イオンビームを、蒸着室内に配置し、かつ負の電圧を印
加した基体の表面に照射すると、前記基体表面には、ビ
ッカース硬さで2500〜5000 Kg/ mA ’
z有する硬質の炭素質膜が形成されるようになるといつ
知見を得たのである。As described above, the Duo Plasmatron is known as an ion beam generator, and the inventors of the present invention conducted research to form a carbonaceous film using such a Duo Plasmatron, and as a result, Ar gas, which is known as a discharge gas, is introduced separately or in a mixed state through the discharge gas inlet of the hydrocarbon gastra or Duo Plasmatron, and as a result, Ri is released from the Duo Plasmatron.
When the ion beam containing the partially decomposed hydrocarbons ([)11] is irradiated onto the surface of a substrate placed in a deposition chamber and to which a negative voltage is applied, the surface of the substrate has a Vickers hardness. at 2500-5000 Kg/mA'
It was discovered when a hard carbonaceous film having z began to be formed.
したがって、この発明は、上記知見にもとづいてなされ
たものであって、デュオ・プラズマトロンの放電カス導
入孔より、炭化水素ガスとArガスとを別々に、あるい
は混合状態で、かつ炭化水素ガスとArガスの割合:炭
化水素/ A r f、容積比で2〜5の範囲内とした
条件で導入して、前記炭化水素が:30〜90係の割合
で一部分分解した状態のイオンビームな発生させ、この
イオンビームを、10−3〜10tOrrの真空中、−
200−−1000Vの電圧を印加した基体の表面に照
射して、前記基体の表面に硬質の炭素質膜全形成する方
法に特徴を有するものである。Therefore, this invention was made based on the above knowledge, and it is possible to introduce hydrocarbon gas and Ar gas separately or in a mixed state through the discharge sludge introduction hole of the Duo Plasmatron, and to An ion beam is generated in which the hydrocarbons are partially decomposed at a ratio of 30 to 90 by introducing Ar gas at a ratio of hydrocarbon/A rf in a volume ratio of 2 to 5. This ion beam is heated in a vacuum of 10-3 to 10tOrr,
This method is characterized by the method of irradiating the surface of a substrate to which a voltage of 200 to 1000 V is applied to form a hard carbonaceous film on the entire surface of the substrate.
つぎに、この発明の方法において、炭素質膜の形成条件
を」−記の通りに限定した理由を説明ずろ。Next, in the method of this invention, explain the reason why the conditions for forming the carbonaceous film are limited as described below.
fa) 炭化水素/Arの割合
炭化水素はデュオ・プラズマトロンで部分分解され、こ
の部分分解によって生じた炭素イオンが炭素質膜を形成
し、さらに分解した残9のイオンや活性粒子が前記炭素
質膜の蒸着形成に有効に作用するのであるが、その割合
が2未満ては相対的に炭化水素に比してl\rが多くな
りすぎ、炭素質膜の形成速度が急激に低下するようにな
り、一方その割合が5を越えると、Arに比して炭化水
素が多くなりすぎて、デュオ・プラズマトロンにおける
放電が不活発になシ、この結果炭化水素に所望の部分分
解を起させることができなくなることから、その割合を
2〜5と定めた。fa) Hydrocarbon/Ar ratio Hydrocarbons are partially decomposed in the Duo Plasmatron, carbon ions generated by this partial decomposition form a carbonaceous film, and the remaining 9 ions and active particles that are further decomposed form the carbonaceous film. It acts effectively on the formation of a film by vapor deposition, but if the ratio is less than 2, l\r becomes relatively too large compared to the hydrocarbon, and the formation rate of the carbonaceous film sharply decreases. On the other hand, if the ratio exceeds 5, there will be too much hydrocarbon compared to Ar, and the discharge in the duo-plasmatron will become inactive, resulting in the desired partial decomposition of the hydrocarbon. Since this makes it impossible to do so, the ratio was set at 2 to 5.
(1)) 蒸着雰囲気の真空度
その31.、H2空141.)がl Q torr未満
の低真空では、デュオ・プラズマトロンと基板間の距6
1+にも関係するが、イオンビートが蒸着雰囲気中の残
留ガスに衝突[−1電価を失ったり、エネルギーケ失っ
たりして炭素質膜形成の障害となり、一方10torr
を越えて高いJ′℃空度にすると、相対的に蒸着雰囲気
中のイオンビームの濃度が低くなりすぎて炭素IP(膜
の蒸着速度が著しく低下するようになることから、その
真空度を10〜l Otorrと定めた。(1)) Vacuum degree of vapor deposition atmosphere Part 31. , H2 sky 141. ) is less than l Q torr, the distance between the duo-plasmatron and the substrate 6
This is also related to 1+, but ion beats collide with residual gas in the deposition atmosphere [-1] They lose charge and energy, which becomes an obstacle to carbon film formation;
If the degree of vacuum exceeds J'℃, the concentration of the ion beam in the deposition atmosphere will become relatively too low, and the deposition rate of carbon IP (film) will decrease significantly. ~l Otorr.
(C) イオンビームにおける炭化水素の分解割合その
分解割合が30%未満では、炭素質膜形成に直接作用す
る炭素イオンの相対割合が低くなるので、膜形成速度が
著しく遅くなるばかりてなく、相対的に多い割合の未分
解の炭化水素によって膜質も悪化するようになり、一方
その分解割合が90%を越えると、遊Pil[炭素を析
出し易くなって膜質が黒色を帯びるようになるばかりで
なく、黒鉛化し易くなることから、その分解割合’53
0〜90係と定めた。(C) Decomposition rate of hydrocarbons in the ion beam If the decomposition rate is less than 30%, the relative proportion of carbon ions that directly act on carbon film formation will be low, which will not only significantly slow down the film formation rate but also The film quality deteriorates due to a large proportion of undecomposed hydrocarbons, and on the other hand, when the decomposition ratio exceeds 90%, free Pil [carbon] is easily precipitated and the film quality becomes blackish. Because it becomes easier to graphitize, its decomposition rate is '53.
It has been set as 0 to 90 staff.
(d) 基体の印加電圧
その印加電圧が一200v未満では炭素質膜の基体表面
に対する刺着強度が弱いばかりでなく、良好な膜質のも
のを形成することができず、一方−1000V 、ff
越えると、蒸着速度が遅くなると共に、形成膜の温度が
上昇して黒鉛化するようになるととから、その印加電圧
f、1−200〜−too。(d) Applied voltage to the substrate If the applied voltage is less than 1200V, not only the adhesion strength of the carbonaceous film to the substrate surface is weak, but also a film of good quality cannot be formed;
If it exceeds this, the deposition rate will slow down and the temperature of the formed film will rise, causing graphitization. Therefore, the applied voltage f is 1-200 to -too.
Vと定めた。It was set as V.
つぎに、この発明の方法を実施例により具体的に説明す
る。Next, the method of the present invention will be specifically explained using examples.
実施例
基体として、S1ウエハー、WCC超超硬合金チップお
よび石英カラス板をそれぞれ用意し、かつ、第2図に概
略説明図で示される、反応ガスとしての炭化水素ガスと
Arガスとを混合状態で放電ガス導入孔2より導入する
装置(以下A装置という)と、同じく第3図に示される
、炭化水素ガスを放電ガス導入孔2′より導入し、一方
Arガスを放電ガス導入孔2より導入する装置(以下B
装置という)を用い、前記の基体を、デュオ・プラズマ
トロン■に接して設けた蒸着に;≦4内の基体ホルダー
〇A」二に載16″し、ついて、それぞれ第1表に示さ
れる条件にて、反応ガス全導入し、デュオ・プラズマ表
面に炭素質膜を形成する本発明法1〜8および1[;ぐ
:ζ、火 1〜531・そ、tl そ力、 ′−1′、
j丁’i シた5゜なお、比較法1〜5は、いずれも炭
素質膜形成条件のうちのいずれかの条件(第1表に※印
を利す)がこの発明の範囲から外れた条件てブこ施した
ものである3、tた、イオンビームにおける炭化水素の
分解割合は四M相の質量分析M−t Kより測定した。An S1 wafer, a WCC cemented carbide chip, and a quartz glass plate were prepared as the example substrates, and hydrocarbon gas and Ar gas as a reaction gas were mixed in a state as shown in the schematic diagram in FIG. There is a device (hereinafter referred to as device A) that introduces hydrocarbon gas through the discharge gas introduction hole 2', and a device that introduces the hydrocarbon gas through the discharge gas introduction hole 2', and a device that introduces Ar gas through the discharge gas introduction hole 2, as shown in FIG. Equipment to be introduced (hereinafter referred to as B
The above-mentioned substrate was placed on a substrate holder 〇A''2 within ≦4 for evaporation using a device (referred to as a device), and was placed in contact with a Duo Plasmatron II under the conditions shown in Table 1, respectively. Methods 1 to 8 and 1 of the present invention, in which the entire reaction gas is introduced and a carbonaceous film is formed on the surface of the duo plasma.
Note that in Comparative Methods 1 to 5, any one of the carbonaceous film forming conditions (marked with * in Table 1) is outside the scope of this invention. The decomposition rate of hydrocarbons in the ion beam was measured using 4M phase mass spectrometry M-tK.
ついで、この結果形成された炭素質膜の平均膜Jr7、
ビッカース硬さ、および電気抵抗を測定すると共に、そ
の色調を観察した。゛これらの結果を第1表に合ぜて示
した。Next, the average film Jr7 of the carbonaceous film formed as a result,
Vickers hardness and electrical resistance were measured, and the color tone was observed.゛These results are also shown in Table 1.
第1表に示される結果から、本発明法1〜8によって形
成された炭素質膜は、いずれも高硬度を有し、かつ完全
な電気絶縁体−であり、しかも透明なものであった。こ
れに対して、比較法1〜5に見られる」二うに、その形
成条件がとの発明の範囲から外れると、前記の特性のう
ち、少なくともいずれかの特性が劣った炭素質膜しか形
成することができないことが明らかである。From the results shown in Table 1, the carbonaceous films formed by methods 1 to 8 of the present invention all had high hardness, were perfect electrical insulators, and were transparent. On the other hand, as seen in Comparative Methods 1 to 5, if the formation conditions deviate from the scope of the invention, only a carbonaceous film is formed that is inferior in at least one of the above characteristics. It is clear that this cannot be done.
上述のように、この発明の方法によれば、硬質にして透
明な炭素ヂ■膜を基f1ζ責而(’=ニー IFg成す
/、ことができるので、基体が、スローアウェイチッソ
やドリルなどの切削工具、並びにダイス、ノズル。As mentioned above, according to the method of the present invention, it is possible to form a hard and transparent carbon film based on a hard and transparent carbon film. Cutting tools, dies, and nozzles.
およびガイド部材などの耐J¥ス千工具であれば、前記
炭素質膜の形成によって削斤耗性が著しく向−1−する
ように々シ、また基体が太陽電池などてあれば、前記炭
素・質膜の形成によって耐腐食性が向上し、かつ保護膜
としても作用し、さらに基体が透光性全必要とするレン
ズや装飾品などであれば、この炭素質膜はこれをよく保
護するなど工業−1−イ〕用な効果がもたらされるので
ある。If the tool is resistant to scratches, such as a guide member, the abrasion resistance will be significantly improved by the formation of the carbonaceous film, and if the substrate is a solar cell or the like, the carbonaceous・The formation of a carbonaceous film improves corrosion resistance and also acts as a protective film.Furthermore, if the substrate is a lens or ornament that requires full translucency, this carbonaceous film will protect it well. Industrial effects such as 1-1) are brought about.
第1図は従来のイオンビームを用いたスパソクリング装
置の概略説明図、第2図および第3図は本発明法の実施
装置を示す概略説明図である。図面において、
1・・・デュオ・プラズマトロン、
2.2′・・・放rにガス導入孔、3・イオンビーム、
4・・・蒸着室、 5・・・ターゲット、6・・・基体
。
出願人 三菱金属株式会社
代理人 富 1)第1 夫 外1名
第1図
条2図
第3図FIG. 1 is a schematic explanatory diagram of a conventional spasoaking apparatus using an ion beam, and FIGS. 2 and 3 are schematic explanatory diagrams showing an apparatus for implementing the method of the present invention. In the drawing, 1. Duo plasmatron, 2. 2'... Gas introduction hole at the bottom, 3. Ion beam,
4... Vapor deposition chamber, 5... Target, 6... Substrate. Applicant Mitsubishi Metals Co., Ltd. Agent Tomi 1) 1st Husband and 1 other person Figure 1 Figure 2 Figure 3
Claims (1)
ガスとArガスとを別々に、あるいは混合状態で、かつ
炭化水素ガスとArガスの割合:炭化水素/A1″を、
容積比で、2〜5の範囲内とした条件で導入して、前記
炭化水素が30〜90%の割合で部分分解した状態のイ
オンビームを発生さぜ、このイオンビームを、10−3
〜10 torrの真空中、−200〜−1000Vの
電圧を印加した基体の表面に照射することを特徴とする
基体表面に硬質の炭素質膜を形成する方法。Hydrocarbon gas and Ar gas are introduced separately or in a mixed state through the discharge gas introduction hole of Duo Plasmatron, and the ratio of hydrocarbon gas and Ar gas is: hydrocarbon/A1''.
The ion beam is introduced at a volume ratio of 2 to 5 to generate an ion beam in which the hydrocarbon is partially decomposed at a rate of 30 to 90%.
A method for forming a hard carbonaceous film on the surface of a substrate, the method comprising irradiating the surface of the substrate to which a voltage of -200 to -1000V is applied in a vacuum of ~10 torr.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11226583A JPS605882A (en) | 1983-06-22 | 1983-06-22 | Formation of hard carbonaceous film on surface of substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11226583A JPS605882A (en) | 1983-06-22 | 1983-06-22 | Formation of hard carbonaceous film on surface of substrate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS605882A true JPS605882A (en) | 1985-01-12 |
| JPS6154871B2 JPS6154871B2 (en) | 1986-11-25 |
Family
ID=14582371
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11226583A Granted JPS605882A (en) | 1983-06-22 | 1983-06-22 | Formation of hard carbonaceous film on surface of substrate |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS605882A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61136678A (en) * | 1984-12-06 | 1986-06-24 | Matsushita Electric Ind Co Ltd | Formation of high-hardness carbon film |
-
1983
- 1983-06-22 JP JP11226583A patent/JPS605882A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61136678A (en) * | 1984-12-06 | 1986-06-24 | Matsushita Electric Ind Co Ltd | Formation of high-hardness carbon film |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6154871B2 (en) | 1986-11-25 |
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