JPS6072006A - Logical circuit diagnostic system - Google Patents

Abstract

PURPOSE:To execute exactly and easily a diagnosis by inputting a mimic signal, and diagnosing its output result, with regard to a logical circuit whose diagnosis and quantitative evaluation are difficult. CONSTITUTION:A logical circuit diagnostic system 9 is constituted of a diagnostic result displaying CRT picture 1, a line printer 2, a logical circuit diagnostic device 3 for executing a diagnosis by generating a mimic signal, and a data storage device 4. In this storage device 4, an abnormal pattern, etc. of a logical circuit 6 of an operating device 8 are inputted in advance, a decision of a fact that a data is a mimic signal in the maximum signal generation rate by said diagnostic device 3, and a calculation of the generation probability are executed, and the signal is inputted to the logical circuit 6 through an input processing device 5. This signal is returned to said diagnostic device 4 through an output processing device 7. In this case, whether a signal processing result of the logical circuit 6 is an abnormal processing pattern or not is checked, and displayed on a CRT picture 1, etc.

Description

[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to a logic circuit that processes human foot signals, such as large-scale plans 1 to 1, and can diagnose a logic circuit reliably, easily, and in a short time. Regarding diagnostic systems.

[Background of the invention]

Conventional logic circuits are diagnosed by humans on a desk, and it takes a relatively long time to diagnose whether the logic circuit that has been created meets the specifications. There are large differences in production time and quality depending on the ability and experience of the individual. Therefore, even after delivery, there are many cases where the logic circuit does not meet the specifications and is modified, and it takes a considerable amount of time to finally complete a reliable product. Additionally, since it is difficult to quantitatively evaluate a product, it takes about the same amount of time to create a new one even if a similar logic circuit is required for another system, or if it is rebuilt or repurposed.

When diagnosing a logic circuit when starting up a plant, it is necessary to check whether the bit configuration in the logic circuit is the same as when it was first created.
It had the disadvantage that it was not possible to diagnose whether the signal was actually being output and whether the result was being output correctly, since it also included an input processing device.

[Purpose of the invention]

An object of the present invention is to diagnose a logic circuit using a logic circuit diagnosis system, thereby making the work reliable and easy, shortening the production time, and quantitatively evaluating the logic circuit.

In addition, when applying this system to diagnose logic circuits when Plans 1 to B are activated, make the logic circuit perform actual signal processing, confirm that the same results as at the time of creation are output, and then This type includes an output processing device and is intended to enable accurate diagnosis.

[Invention (already required)]

The present invention is a system that makes it possible to diagnose logic circuits that are difficult to diagnose and evaluate based on capacity by inputting simulated signals and diagnosing the output results.

[Embodiments of the invention]

FIG. 1 is a diagram showing the configuration of this system.

In the same figure, there is a logic circuit diagnostic system, a CRT screen trine printer 2 for displaying diagnostic results, and a logic circuit diagnostic device 3 that generates pseudo signals and diagnoses signals from the logic circuit. , a data storage device 4 for storing logic circuit data and diagnosis 191 results;
It consists of

When diagnosing the logic circuit 6, check the input of the logic circuit 6, the probability of signal occurrence at the input point, the maximum signal occurrence rate that indicates the range of signals handled by the logic circuit 6, and the abnormality information for diagnosing the signal processing results. A processing pattern is input into the data storage device 4 in advance.

The data in the data storage device 4 is input to the logic circuit diagnostic device 3, which determines whether the signal is a simulated signal within the maximum probability of occurrence, calculates the probability of occurrence, and then passes through the input processing device 5. , are input to the logic circuit 6.

This signal is processed by the logic circuit 6, and the result is returned to the logic circuit diagnostic device 3 via the output processing device 7. Here, the signal processing result of the diagnostic circuit 6 is
Check whether it is an abnormal processing pattern, check the logic circuit diagnosis result, maximum signal occurrence rate, and display the status of the input signal and output signal on the CRT screen.
, displayed on the line printer 2.

Based on this diagnosis result, when modifying the logic circuit 6,
Inappropriate logic sections can be easily found from the states of input and output signals, and by following the same steps after correction, it is possible to reliably, easily, and quickly create logic circuits that meet specifications. becomes.

Furthermore, with this system, it is possible to quantitatively determine the percentage of signal occurrence probability that a logic circuit can handle, and the grade of the logic circuit can be determined. Therefore, when converting a logic circuit to another system, all you need to do is check whether the probability of occurrence of the signal being handled is within the range that the logic circuit can handle, and then evaluate and consider the logic circuit again. This becomes unnecessary.

Next, the diagnosis flow in the logic circuit diagnosis device 3 will be explained with reference to FIG. The number of input points of the logic circuit, which has been input in advance to the data storage device, is 2N, and the signal address of the input point is f.
, the abnormal processing pattern, and the data of F' within the maximum signal occurrence rate are taken in. In order to input all combinations of signals within the maximum signal generation rate to the logic circuit, change the input signal state value 2■, which represents the state of Rokukai No. A, from I=O to ■=2N, and calculate the Input human signals into a logic circuit and diagnose the output results.

First, convert ■ into binary I2, and set the 1 and 0 signals of each digit to the pins 1- of input points B1 to BN. Probability that this input signal pattern will occur at the same time Ft = f 1
Calculate X=-XfN by aI. If pj is greater than F, no input is made to the logic circuit, 1 is added to ■, and the same process is repeated again. If Ft is smaller than F, it is input to the logic circuit and the output result is taken in. If the output result includes an abnormal processing pattern, the input signal at that time and
Display the pattern of output A on the CRT screen and line printer, add 1 to ■, and repeat this process until ■ becomes 2N or more.

When modifying a logic circuit, look for the input and output signal patterns displayed on the CRT screen or line printer to find the location where inappropriate signal processing is being performed in the logic circuit, and then correct the logic circuit. Modify the circuit.

In order to specifically explain this system, a simple logic circuit is taken as an example, and a numerical processing method of the logic circuit and a diagnosis method of this system are shown in FIG.

The arithmetic unit 8 represents a part of the signal processing device that performs starting/stopping of the high pressure reactor Vespray system (HPC8) in the nuclear coupler operation system 1 to the system.

The signal processing method of the arithmetic unit 8 is to input a 1.0 digital signal from the blunt processed by the input processing device to the logic circuit 6, and based on the output result, start or stop the HPC 8 to guide the plant operation. This information will be provided to employees on a CRT screen, audio notification device, etc. A functional explanation of each symbol used in the logic circuit 6 is shown in FIG.

The AND symbol represents a function in which when all of the input signals are beeps 1-1, the output signal is beeps 1-1.

The OR symbol represents a function in which a bit 1 is set in the output signal when at least one of the input signals has a bit l-1 set.

The symbol before NO indicates that the opposite bit of bin 1~ that was set on the input symbol is set on the output signal.

The diagnosis method of the logic circuit diagnosis system is as follows: First, the data of the logic circuit 6 to be diagnosed, the number of input points 2N=8, the probability of occurrence of a human input point signal: f1=lO-', f2=1
0-', f3=10-1. f4=・9. f5=
・9° f6=・9. f7=・9. f8=・7 Maximum signal generation rate: F=], O-6 Abnormal processing pattern: C1=1 and 3-1 are input into the data storage device @4, and after the connection between this system and the arithmetic device 8 is completed, the data The data in the storage device 4 is loaded into the logic circuit diagnostic device 3, and according to the diagnosis flow shown in FIG. 2, the input signal state value ■ is changed from I=0 to ■=26, and the corresponding input signal pattern is It is input to the circuit 6 and the output result is diagnosed.

Below, I=7. I=]05. The signal processing sequence will be explained for the case of I=121.

(2) In the case of -7, 12=111. Therefore, the input signal pattern at this time is B1=l.

B2=1. B3=1, B4=O, . . . , B8=0. Also, the probability of occurrence of this input signal pattern Ft=f
LX...X'f8 becomes Ft=f1xf2Xf3=IO-'.

The signal generation probability in the case of I=7 is h handled by the logic circuit 6.
Since the maximum signal generation rate F = 10-7 or less of No. j,
Similar signal processing is performed on the next input state value without inputting it to the logic circuit.

If I=105, then 12=1101001, so the input signal pattern is B1=1°B2=O,B
3=O, B4'=1. B5=O, B6=1. B7=1.
B8=O. Furthermore, the probability of occurrence of this input signal pattern is Ft=f], Xf4xf6xf7 =7.29×10-2, so the maximum signal generation rate: F=], O-"
The above is determined, and the signal is input to the logic circuit.

When the input signal pattern in the case of 1 = l O5 is input to the input point 12, the logic circuit 6 performs signal processing, and the result is output to the output point 17.

Output signal at output point 17, CI=1. C2=O.

C3=1. , includes the abnormal processing pattern C1=1 and C3=1, so 1. = l The signal processing in the case of O5 is diagnosed as inappropriate, and the diagnosis result, maximum signal generation rate F, input signal pattern, and output signal pattern are displayed on the CRT screen 1 and line printer 2. be done.

When I=121, l2=111.100], and the input signal pattern is B1=1. B2=O.

B 3 ” O, B 4 = O, B 5 = 1,
B 6 = I, B 7 = 1. B8=O.

The input signal pattern at this time is Ft:flXf4Xf5Xf6Xf7 =6.56xlo-2, and since the maximum signal generation rate is less than F2, the signal is input to the logic circuit 6.

The signal processing result in the logic circuit 6 is CI=1°C2=O,
C3=O, and difference '1: (Since the processing pattern does not include C1=1 and C3=1, it is determined that appropriate signal processing has been performed, and the process moves on to the processing of the next input signal state value.

Further, the input signal pattern and output signal pattern at this time are stored in the data storage device 4 in order to be used as reference data of the logic circuit diagnostic system at the time of plan 1 to start-up, which will be described later.

According to an embodiment of the present invention, it is possible to determine whether the signal processing function of a logic circuit is performing accurate signal processing within its specifications, and to create a logic circuit reliably, easily, and quickly. It can be done in a short amount of time, and when creating a logic circuit, it is possible to identify areas where inappropriate signal processing is being performed and shorten the work time by a large amount of +1J.

Additionally, with this system, it is possible to quantitatively evaluate the logic circuit's R1 rating and determine its grade based on the maximum signal occurrence probability that the logic circuit can handle.This makes it possible to transfer the logic circuit to other systems. In this case, it is possible to save the trouble of newly diagnosing the logic circuit by simply checking that the maximum probability of occurrence of the signal handled by the system is within the maximum signal occurrence probability of the logic circuit. Become.

Next, as a first embodiment of the present invention, an (online) logic circuit diagnosis system that periodically diagnoses logic circuits at the time of plant start-up will be described with reference to FIG.

Plan 1 to operation/diagnosis guide system 2 shown in the same figure
5, the input processing device 5 replaces the signal from the measuring instrument installed in the plant 23 with a type that is easy to perform arithmetic processing, and the logic circuit 6 converts the signal from the plan 1 to grasping the status.
Performs diagnosis, abnormality detection, etc. This is a system in which the output processing device 7 displays Plan 1 to Slater and a diagnostic guide on a CRT for plant monitoring in accordance with the operator's requests.

The logic circuit diagnostic system includes a logic circuit diagnostic device 3 and a data storage device 4, and is a system that displays diagnostic results on a plant monitoring CRT 2Q and a line printer 2I.

The logic circuit diagnosis method of this system incorporates the combination of the input signal pattern and output signal pattern stored in the data storage device 4 into the logic circuit diagnosis device 3 at the time of plant startup, and converts the input signal pattern into the logic circuit diagnosis device 3. The signal is inputted to the logic circuit 8 via the input processing device 5, and the signal processing result is taken in from the output processing device 7, the combination of the input signal pattern and the output signal pattern is checked, and the output signal pattern of the logic circuit is stored. In this system, if the output signal pattern is different from the one that has been set, the plan 1, monitoring CRT 20, and line printer 2I will display that the logic circuit is correct.

〔Effect of the invention〕

This system allows logic circuits to actually perform signal processing and diagnose logic circuits that include input/output processing devices.

[Brief explanation of the drawing]

Fig. 1 is a schematic diagram of one embodiment of the present invention, Fig. 2 is a diagnosis flow diagram, Fig. 3 is an explanatory diagram of the diagnosis method, and Fig. 4 is a diagram showing the diagnosis method.
The figure is a functional explanatory diagram of each symbol, and FIG. 5 is a diagram of another embodiment. ■...CRT drawing, 2...Line printer, 8...
Computing device. (e) and f) l-一云--zu θ-outside--/

Claims (1)

[Claims] ■The logic circuit diagnosis function of the plant operation diagnosis system,
When creating a logic circuit, input signal patterns and output signal patterns are stored using a one-to-one system that combines a data storage device, a logic circuit diagnostic device, a CRT, and a line printer. Input the pattern into the circuit, and the same output pattern as when creating the circuit will be output]L
A logic circuit diagnostic system characterized by checking the following: