JPS6086267A - Preparation of electric insulating film - Google Patents

Preparation of electric insulating film

Info

Publication number
JPS6086267A
JPS6086267A JP19176083A JP19176083A JPS6086267A JP S6086267 A JPS6086267 A JP S6086267A JP 19176083 A JP19176083 A JP 19176083A JP 19176083 A JP19176083 A JP 19176083A JP S6086267 A JPS6086267 A JP S6086267A
Authority
JP
Japan
Prior art keywords
gases
gas
plasma
hydrogen
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19176083A
Other languages
Japanese (ja)
Inventor
Kenji Yanagihara
健児 柳原
Mitsuo Kimura
光夫 木村
Masahiro Shinkai
新海 正浩
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Chemical Corp
JSR Corp
Original Assignee
Nippon Synthetic Chemical Industry Co Ltd
Japan Synthetic Rubber Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Synthetic Chemical Industry Co Ltd, Japan Synthetic Rubber Co Ltd filed Critical Nippon Synthetic Chemical Industry Co Ltd
Priority to JP19176083A priority Critical patent/JPS6086267A/en
Publication of JPS6086267A publication Critical patent/JPS6086267A/en
Pending legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05DPROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D1/00Processes for applying liquids or other fluent materials
    • B05D1/62Plasma-deposition of organic layers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Physical Vapour Deposition (AREA)
  • Insulating Bodies (AREA)

Abstract

PURPOSE:To obtain an electric insulating film having high heat conductivity, by subjecting polymerizable gas formed by combining gaseous hylogenated hydrocarbon, gaseous hydrocarbon, hydrogen and gaseous halogen in a predetermined combination to plasma polymerization reaction at a predetermined electron temp. CONSTITUTION:Halogenated hydrocarbon gas A, hydrocarbon gas B, hydrogen gas C and halogen gas D are prepared. 10 kinds of gases are prepared in the combination of only gas A, gases A and B, gases A and C, gases A and D, gases A, B and C, gases A, B and D, gases A, C and D, gases A, B, C and D, gases B and D, and gases B, C and D. One or more of these combined gases is mixed so as to adjust the ratio of the number of halogen atoms and the number of hydrogen atoms to 1:5-5:1. This polymerizable gas is subjected to plasma polymerization reaction at the plasma electron temp. of 2,000-60,000K in a reaction zone.

Description

【発明の詳細な説明】 本発明は、高い熱伝導率を有する電気絶縁膜の製法に関
する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for producing an electrically insulating film having high thermal conductivity.

一般に高い熱伝導率を有する電気絶縁材料は、熱を発生
する各種電子部品、タイオード、トランジスター、IC
,LSI等の半導体素子、その他のヒートシンク材料に
電気絶縁性等に加えて放熱性を高めるために利用されて
いる。しかし、従来のii7+記絶縁材料は一般に、銅
などの金属に比較して低い熱伝導率を示すため、小さな
面積で大量の熱を流すことは困難であった。特に各種電
子部品や半導体素子の小型化に伴なって、単位面積当り
に大量の熱を流す必要が生じてきた。
Generally, electrical insulating materials with high thermal conductivity are used in various electronic components that generate heat, diodes, transistors, and ICs.
It is used in semiconductor devices such as , LSI, and other heat sink materials to improve heat dissipation in addition to electrical insulation. However, conventional insulating materials listed in II7+ generally exhibit lower thermal conductivity than metals such as copper, so it has been difficult to flow a large amount of heat in a small area. In particular, with the miniaturization of various electronic components and semiconductor elements, it has become necessary to flow a large amount of heat per unit area.

具体的には、醇化アルミニウムや窒化はう素笠が銅など
に近い高い熱伝導率の電気絶縁材料として知られている
が、これらはセラミックスであり次のような欠点を有す
る。■焼結体であるため、被コーテイング物の形状に合
わせて膜を随意に形成したり、目的に応じた任意の厚み
のQ IIAを15)ることが容易でない。(■高い硬
度を有しているが、もろく、割れやすい。(須電気抵抗
は、絶縁材才1として十分高いが、熱伝導度は銅などに
比較してやや小さい。
Specifically, aluminum oxide and boron nitride caps are known as electrical insulating materials with high thermal conductivity close to that of copper, but these are ceramics and have the following drawbacks. (2) Since it is a sintered body, it is not easy to form a film arbitrarily to match the shape of the object to be coated, or to form a QIIA of any thickness according to the purpose15). (■Although it has high hardness, it is brittle and breaks easily. (The electrical resistance is high enough to be used as an insulating material, but the thermal conductivity is slightly lower than that of copper.

本発明の目的は、銅などの全屈以上の高い熱伝導度を有
し、しかも高いミス抵抗を有する電気絶縁1jりを任意
の厚さ、任意の形状で製造できる方法を提供するもので
ある。
An object of the present invention is to provide a method for producing an electrical insulating material having a thermal conductivity higher than that of copper or the like and having a high failure resistance in an arbitrary thickness and in an arbitrary shape. .

本発明によると、ハロゲン化炭化水素カス(A) 、 
y&化水素ガス(B)、水素ガス(C)およびハロゲン
ガス(D)から、下記(1)〜(lO)のいずれかの組
合せで選ばれた1種又は2種以上のガスを含有する重合
用ガス: (1)Aのみ、 (2)A+B、 (3)A+C1 (4)A+D、 (5)A+B十〇、 (B)A+B+D、 (7)A+C+D、 (8)A+B+C十D、 (!’l)B+D、 (10)B + C+ p であって、該屯合用カス中のハロゲン原子数と水素原子
数の比が1:5〜5:1であるものを、反応帯域におけ
るプラズマの電子温度が2,000〜130.0OOK
であるプラズマ重合反応に供することからなる電気絶縁
11分の製造方法が提供される。
According to the present invention, halogenated hydrocarbon scum (A),
Polymerization containing one or more gases selected from y&hydrogen gas (B), hydrogen gas (C) and halogen gas (D) in any combination of the following (1) to (lO) Gas for: (1) A only, (2) A+B, (3) A+C1 (4) A+D, (5) A+B 10, (B) A+B+D, (7) A+C+D, (8) A+B+C 10 D, (!' l) B + D, (10) B + C + p, in which the ratio of the number of halogen atoms to the number of hydrogen atoms in the combined waste is 1:5 to 5:1, and the electron temperature of the plasma in the reaction zone is is 2,000~130.0OOK
A method of manufacturing an electrical insulation in 11 minutes is provided, which comprises subjecting the electrical insulation to a plasma polymerization reaction.

本発明方法における被コーテイング物は、普通は実際に
使用する電子部品や素子であるが、たとえば、塩化すI
・リウムや臭化カリウム等からなる成形物を被コーテイ
ング物として利用し、コーテイング後、被コーテイング
物を溶かし去ることにより自由な膜単体を得ることがで
きる。
The objects to be coated in the method of the present invention are usually electronic parts and elements that are actually used, but for example,
- By using a molded article made of lithium, potassium bromide, etc. as the object to be coated, and after coating, the object to be coated can be dissolved away to obtain a free membrane.

以下本発明について具体的に説明する。The present invention will be specifically explained below.

第1図は本発明方法の実施に好適に用いられる装置例を
示す。この装置は、真空ポンプ1が接続された真空容器
2内に、互に対向する一対の板状電極3.3°が設けら
れ、該電極3.3°は例えば交流電源4に接続されてい
る。一方、前記真空容器2には、その内部に千ツマーガ
スを供給する単数若しくは複数の千ツマーカス供給管5
が接続されている。運転時には、被コーテイング物、例
えばシリコンウェハー7を乗せたガラス繊維製エン(・
レスベルト8が、ロール6A及び6Bにより1111記
電極3.3゛間を通過するよう走行せしめられ、次のよ
うにして本発明の高い熱伝導率を有する電気絶縁性膜が
形成される。
FIG. 1 shows an example of an apparatus suitable for carrying out the method of the present invention. In this device, a pair of plate-shaped electrodes 3.3° facing each other are provided in a vacuum container 2 to which a vacuum pump 1 is connected, and the electrodes 3.3° are connected to, for example, an AC power source 4. . On the other hand, the vacuum vessel 2 includes one or more gas supply pipes 5 for supplying gas into the vacuum vessel 2.
is connected. During operation, a glass fiber encasement (.
The rest belt 8 is made to run between the 1111 electrodes 3.3'' by the rolls 6A and 6B, and the electrically insulating film having high thermal conductivity of the present invention is formed in the following manner.

即ち、真空ポンプlにより真空容器2内を損気しながら
、モノマーカス供給管5を介して、前述の組成に既に調
整された重合用ガスを真空容器2内に導入するか、或い
は前述のガス(A)〜(D)の1種又は2種以上を別々
に真空容器2内に導入して該容器内で所要の組成を有す
る重合用ガスが調整されるようにする。ここで導入され
、または調整された重合用ガスは、真空容器2内におい
て、ハロケン原子数と水素原子数との比が1:5〜5:
1、好ましくは1:3〜2:1の範囲内にあるものであ
ることが肝要である。
That is, while the inside of the vacuum container 2 is deaerated by the vacuum pump 1, a polymerization gas already adjusted to the above-mentioned composition is introduced into the vacuum container 2 via the monomarcus supply pipe 5, or the above-mentioned gas ( One or more of A) to (D) are separately introduced into the vacuum vessel 2 so that a polymerization gas having a desired composition is adjusted within the vessel. The polymerization gas introduced or adjusted here has a ratio of the number of halogen atoms to the number of hydrogen atoms in the vacuum container 2 of 1:5 to 5:
1, preferably in the range of 1:3 to 2:1.

真空容器2内の雰囲気を、上述のようにして一定に保っ
た状態において、電極3.3゛に交流電源4により電力
を供給し、これにより電極3.3゛間に放電によるプラ
ズマを生起せしめ、更に当該プラズマを被コーテイング
物、例えはシリコンウェハーを設置したヘルド8が通過
する位置において電子温度が2,000〜so、oo。
While the atmosphere inside the vacuum container 2 is kept constant as described above, power is supplied to the electrodes 3.3'' from the AC power source 4, thereby generating plasma by discharge between the electrodes 3.3''. Further, the electron temperature is 2,000 to so, oo at the position where the plasma passes through the heald 8 on which the object to be coated, for example a silicon wafer, is placed.

Kの状態とし、このプラズマをシリコンウェハーに作用
させてその表面に前記モノマーガスによるプラズマ重合
膜より成る高い熱伝導率を有する電気絶縁性膜を連続的
に形成する。
This plasma is applied to the silicon wafer to continuously form an electrically insulating film having a high thermal conductivity and made of a plasma polymerized film using the monomer gas on the surface of the silicon wafer.

本発明における電子温度は、特開昭54−135574
じ公報に記載された、加熱探針を用いて測定されるもの
である。該加熱探針Pを第1図に示すように電極表面近
傍のいわゆるプラズマシース領域以外のプラズマ領域内
に、第1図で紙面に垂直な方向に挿入することによって
行なうことができ、その温度制御は、例えば交流電源4
より電極3.3°に供給される電力、真空容器2内の真
空度、その他の条件を変更調整することによって実行す
ることができる。
The electron temperature in the present invention is disclosed in Japanese Patent Application Laid-Open No. 54-135574.
It is measured using a heated probe as described in the same publication. This can be done by inserting the heating probe P into the plasma region other than the so-called plasma sheath region near the electrode surface in a direction perpendicular to the plane of the paper in FIG. 1, as shown in FIG. 1, and its temperature can be controlled. For example, AC power supply 4
This can be carried out by changing and adjusting the electric power supplied to the electrode 3.3°, the degree of vacuum in the vacuum vessel 2, and other conditions.

なお真空容器2内の真空度は101・−ル以−にを達成
できることが好ましく、プラズマ重合1!1の3 真空度は通常10〜1ト一ル程度とされる。 重合用ガ
ス中のハロゲン原子数が水素原子数の5倍を越えると膜
成長速度が小さくなり、逆にハロゲンB;〔予成が水素
原子数の175未満であると、形成される膜は電気抵抗
の低いものとなる。
The degree of vacuum in the vacuum vessel 2 is preferably 101 torr or less, and the degree of vacuum in plasma polymerization 1.1 is usually about 10 to 1 torr. When the number of halogen atoms in the polymerization gas exceeds 5 times the number of hydrogen atoms, the film growth rate decreases; It has low resistance.

また本発明においては、膜の形成に関与するプラズマは
その電子温度が2,000〜80,0OOKの状態のも
のであることが必要であり、2,000 K未満では必
ずしも高い熱伝導率を有する膜が形成されず、また60
,0OOKを越えると厚さや性質等の点で均一な膜を得
ることが困難となる。
In addition, in the present invention, the plasma involved in the formation of the film must have an electron temperature of 2,000 to 80,000 K, and if it is less than 2,000 K, it does not necessarily have high thermal conductivity. No film was formed and 60
, 0OOK, it becomes difficult to obtain a uniform film in terms of thickness, properties, etc.

本発明において、プラズマの電子温度は2,000〜G
o、QOQKの範囲内であれば側段制約を受けるもので
はないが、電子温度30,0OOKを概略的な一応の境
界として、その上下の各電子温度領域では、形成される
絶縁膜の特性に差が傾向として認められ、絶縁+1Qの
特性は5,0OOK以上30.000に未満でより好ま
しい傾向がある。第1表に各電子温度領域で電気絶縁膜
を形成したときの特性値を示す。試料は、測定用基板を
用い、これにプラズマの電子温度を変えるようにしたほ
かは後述の実施例1における電気絶縁膜の形成と同様に
してプラズマ重合膜を形成することによって得られたも
のである。
In the present invention, the plasma electron temperature is 2,000~G
If it is within the range of o, QOQK, there will be no side-stage constraints, but with the electron temperature of 30.0OOK as a rough boundary, the characteristics of the insulating film formed in each electron temperature range above and below it are A difference is recognized as a tendency, and there is a tendency that the characteristics of insulation +1Q are more preferable when it is 5,0OOK or more and less than 30,000. Table 1 shows the characteristic values when an electrical insulating film is formed in each electron temperature range. The sample was obtained by forming a plasma polymerized film in the same manner as in the formation of an electrical insulating film in Example 1 described below, except that a measurement substrate was used and the electron temperature of the plasma was changed. be.

第1表の数値から、電子温度の異なるプラズマによれば
異なる特性の電気絶縁膜が形成されること、並びに何れ
の電子温度領域のプラズマによるものであるにせよ、優
れた特性の電気絶縁膜が形成されることが理解される。
From the values in Table 1, it can be seen that electrical insulating films with different characteristics are formed by plasmas with different electron temperatures, and that electrical insulating films with excellent properties are formed regardless of the plasma in which electron temperature range. It is understood that it is formed.

本発明において用いる千ツマーガスは、既述のガス(A
)〜(D)のうちから選ばれるガスを含有するか、場合
によっては、Ar、 Heなどの不活性ガスを含んでも
よい。これらのガスのうちハロゲン化炭化水素は、炭化
水素の水素原子の少なくとも1つが炭化水素のハロゲン
原子によって置換されたものである。好ましいものとし
ては、炭素原子数1〜8のハロゲン化飽和炭化水素、た
とえば、1〜4フツ化メタン、1〜6フツ化エタン、1
〜87フ化プロパン等およびこれらのフッ素原子の全部
若しくは一部が塩素原子で置換された化合物を挙げるこ
とができる。これらのうち、1〜4フン化メタン、1〜
6フツ化エタンが特に好ましい。
The gas used in the present invention is the gas described above (A
) to (D), or may optionally contain an inert gas such as Ar or He. Among these gases, halogenated hydrocarbons are hydrocarbons in which at least one hydrogen atom is replaced by a halogen atom of the hydrocarbon. Preferred are halogenated saturated hydrocarbons having 1 to 8 carbon atoms, such as 1 to 4 fluorinated methane, 1 to 6 fluorinated ethane, 1 to 6 fluorinated ethane,
~87 Fluorinated propane, etc., and compounds in which all or part of these fluorine atoms are replaced with chlorine atoms can be mentioned. Among these, 1-4 fluorinated methane, 1-4
Particularly preferred is hexafluoroethane.

炭化水素ガスとして好ましいものは、炭素数1〜8の飽
和炭化水素であり、たとえば、メタン、エタン、プロパ
ン、ブタン等である。特に好ましいものはメタンおよび
エタンである。
Preferred hydrocarbon gases are saturated hydrocarbons having 1 to 8 carbon atoms, such as methane, ethane, propane, butane, and the like. Particularly preferred are methane and ethane.

ハロゲンガスとしては、フッ素、塩素、臭素およびヨウ
素のうち1種又は2種以上を任意に用いることができる
が、特にフッ素または塩素が好ましい。
As the halogen gas, one or more of fluorine, chlorine, bromine, and iodine can be arbitrarily used, and fluorine or chlorine is particularly preferred.

本発明の高い伝導・Vを有する電気絶縁膜は、熱伝導率
が銅などの金属のそれと同程度かそれ以」二であり、し
かも、電気抵抗が電気絶縁材料として十分な値を持って
いるため、その効果はきわめて大きいうまたこの膜はL
SIや、tIiLSIの基板から熱を放出するための絶
縁膜、小型の大電力用薄膜抵抗器や、やはり小型の大電
力用コンデンサーの誘電膜、さらには小型のプリント基
板材料や光学素子用基板材料等として用いることができ
る。
The electrical insulating film of the present invention having high conductivity and V has a thermal conductivity comparable to or higher than that of metals such as copper, and has a sufficient electrical resistance as an electrical insulating material. Therefore, the effect is extremely large.
Insulating films for dissipating heat from SI and tIiLSI substrates, dielectric films for small high-power thin film resistors, small high-power capacitors, and even small printed circuit board materials and substrate materials for optical elements. It can be used as, etc.

これらの41f長に加えて、本発明の方法がドライプロ
セスであるプラズマ重合法によって行なわれる点を強調
しなければならない。すなわち、被コーテイング物の形
状や大きさを自由に遼べ、それに適合した膜を容易に形
成できる。
In addition to these 41f lengths, it must be emphasized that the method of the present invention is carried out by plasma polymerization, which is a dry process. That is, the shape and size of the object to be coated can be freely adjusted, and a film suitable for the object can be easily formed.

膜の厚さは数+A〜数pmの範囲で任意に形成できる。The thickness of the film can be formed arbitrarily within the range of several amps to several pm.

廃液処理やそれによる公害の問題がない。さらに、原料
ガスに重金属や毒性元素を含まないので、作業上安全で
あり、公害の恐れもない。したがって、工業化に際して
きわめて有利である。
There are no problems with waste liquid treatment or pollution caused by it. Furthermore, since the raw material gas does not contain heavy metals or toxic elements, it is safe to work with and there is no risk of pollution. Therefore, it is extremely advantageous in industrialization.

以下、実施例により本発明を具体的に説明するがこれら
に本発明を限定するものではない。
EXAMPLES Hereinafter, the present invention will be specifically explained with reference to Examples, but the present invention is not limited to these.

〔実施例1〕 第1図の装置を用い、測定用基板である金を真空蒸着し
たガラス板および光音f fill定用基板(銅板)の
」二に本発明の方法により次のようにプラズマ重合膜を
形成した。
[Example 1] Using the apparatus shown in Fig. 1, a glass plate on which gold was vacuum-deposited as a measurement substrate and a photoacoustic f fill measurement substrate (copper plate) were subjected to plasma treatment according to the method of the present invention as follows. A polymer film was formed.

モノマーガスとしてメタンと四フッ化メタンヲ用イ、ソ
レソレノ流量は20cc(STP) / min と1
0cc (STP) / minであった。真空度は排
気速度を調節することにより50ミリトールに保った。
For methane and tetrafluoride methane as monomer gas, the flow rate is 20cc (STP) / min and 1
It was 0cc (STP)/min. The degree of vacuum was maintained at 50 mTorr by adjusting the pumping speed.

プラズマは20kHzの交流電源を用いて励起させ、供
給電力を調節することにより測定用基板斗 伺近の電子温度を1.5X 10 Kに保った。
The plasma was excited using a 20 kHz AC power source, and the electron temperature near the measurement substrate was maintained at 1.5×10 K by adjusting the supplied power.

+1lll定用基板をプラズマ中に50分間保つことに
より、約1grnの膜厚を有するプラズマ重合膜を測定
基板」二に形成した。
A plasma-polymerized film having a film thickness of approximately 1 grn was formed on the measurement substrate by keeping the measurement substrate in plasma for 50 minutes.

電気抵抗は、プラズマ重合11Qを形成したガラスス(
板上に金を再度蒸着し、」二の金の層と下の金の層との
間の体積抵抗率をn11定した。また、熱伝導率は、上
記と同様にしてプラズマ重合膜を表面に形成した光音響
測定用基板を使用し、M、J、Adamsらの方法(A
nalyst、102 p、1378(197?))に
したがって光音響測定用セルに固定してJlll定した
結果を表2に示す。
The electrical resistance is determined by the glass formed by plasma polymerization 11Q (
Gold was deposited again on the plate and the volume resistivity between the second gold layer and the underlying gold layer was determined to be n11. Thermal conductivity was measured using the method of M. J. Adams et al. (A
Table 2 shows the results of fixing and determining Jllll in a photoacoustic measurement cell according to Nalyst, 102 p., 1378 (197?)).

〔比較例1〕 実施例1において、測定基板伺近の電子温度件 を7.5X10 Kとした点を除いて、全く回−条件に
してプラズマ重合■りを形成した。実施例1と同様にし
て体積抵抗率と熱伝導率を411足した。結果を表2に
示す。
[Comparative Example 1] In Example 1, except that the electron temperature near the measurement substrate was changed to 7.5×10 K, plasma polymerization was performed under the same conditions as in Example 1. In the same manner as in Example 1, the volume resistivity and thermal conductivity were added by 411. The results are shown in Table 2.

〔比較例2〕 実施例1において、メタンおよび四フッ化メタンの流量
を、それぞれ30cc(STP)/min、 5cc(
STP) /minとした点を除いて、全く同二条件に
てプラズマ重合膜を形成し、体積抵抗率と熱伝導率を1
111定した。結果を第2表に示す。
[Comparative Example 2] In Example 1, the flow rates of methane and tetrafluoromethane were set to 30 cc (STP)/min and 5 cc (STP)/min, respectively.
A plasma polymerized film was formed under exactly the same conditions except that the volume resistivity and thermal conductivity were set to 1.
111 was established. The results are shown in Table 2.

〔実施例2〕 電子温度を4.OX 10 Kとした点を除いて。[Example 2] Set the electron temperature to 4. Except that it was set to OX 10K.

実施例1と同一の条件でプラズマ重合膜を形成し、体積
抵抗率と熱伝導率をAl1定した。結果を第2表に示す
A plasma polymerized film was formed under the same conditions as in Example 1, and the volume resistivity and thermal conductivity were determined as Al1. The results are shown in Table 2.

〔実施例3〕 六フフ化エタンと水素をモノマーガスとして選び、第1
図に示す装置を用いて測定用基板表面にプラズマ重合膜
を形成した。測定用基板は実施例1と同じである。六フ
ッ化エタンと水素の流量は、それぞれ10cc(STP
) / minと30cc(STP) /winであっ
た。プラズマ励起電源として13.58MHzのRF主
電源用い測定用基板付近の4 ゛ 電子温度を2.5X 10 Kに保った。測定用基板を
プラズマ中に約40分間保つことにより、約lILmの
厚みのプラズマ重合11りを測定基板」二に形成した。
[Example 3] Hexafluoroethane and hydrogen were selected as monomer gases, and the first
A plasma polymerized film was formed on the surface of the measurement substrate using the apparatus shown in the figure. The measurement substrate is the same as in Example 1. The flow rates of hexafluoroethane and hydrogen were each 10 cc (STP
) /min and 30cc (STP) /win. A 13.58 MHz RF main power source was used as a plasma excitation power source, and the 4° electron temperature near the measurement substrate was maintained at 2.5×10 K. By keeping the measurement substrate in the plasma for about 40 minutes, a plasma polymerization film having a thickness of about 1Lm was formed on the measurement substrate.

実施例1と同様の方法で評価した結果を、実施例4およ
び比較例3〜5とともに第3表に示す。
The results of evaluation using the same method as in Example 1 are shown in Table 3 together with Example 4 and Comparative Examples 3 to 5.

〔実施例4〕 牛 電子温度を5.5X 10 Kとした点を除いて、実施
例3と同−条ヂ]、でプラズマ重合膜を形成した。
[Example 4] A plasma polymerized film was formed in the same manner as in Example 3 except that the cow electron temperature was 5.5×10 K.

〔比較例3〕 午 電子温度を7;OX 1OKとした点を除いて、実施例
3と同一条件でプラズマ重合膜を形成した。
[Comparative Example 3] A plasma polymerized film was formed under the same conditions as in Example 3, except that the electron temperature was set to 7; OX 1 OK.

〔比較例4〕 六フッ化エタンと水素の流量を、それぞれ10cc(S
TP) / winおよび2cc(STP) /min
とした点を除いて、実施例3と同一条件でプラズマ重合
膜の製造を試みた。この場合、プラズマ重合膜はほとん
ど形成されなかった。
[Comparative Example 4] The flow rates of hexafluoroethane and hydrogen were each 10 cc (S
TP)/win and 2cc(STP)/min
An attempt was made to produce a plasma polymerized film under the same conditions as in Example 3, except that In this case, almost no plasma polymerized film was formed.

〔比較例5〕 六フッ化エタンと水素の流量を、それぞれ2cc(ST
P)/ minおよび40cc(STP) / min
とした点を除いて、実施例3と同一条件でプラズマ重合
膜を形成した。
[Comparative Example 5] The flow rates of hexafluoroethane and hydrogen were each 2 cc (ST
P)/min and 40cc(STP)/min
A plasma polymerized film was formed under the same conditions as in Example 3 except for the following points.

〔実施例5〜12’l 第1図の装置を用い実施例1に順じてプラズマ重合膜を
形成し、電気抵抗および熱伝導率を一実施例1と同様の
方法で測定した。
[Examples 5 to 12'l Plasma polymerized films were formed according to Example 1 using the apparatus shown in FIG. 1, and the electrical resistance and thermal conductivity were measured in the same manner as in Example 1.

各実施例に使用したモノマーカスの種類、供給流量、プ
ラズマ重合時の1111定用基板伺近における電子温度
および重合時間は、それぞれ表4に示したとおりであっ
た。また、いずれの実施例の場合も、重合時の真空度は
50ミリト−ルに保ち、プラズマは20kHzの交流電
源を用いて励起した。いずれの場合も、厚さ約1pmの
7°ラズマ千合膜を形成した。体積抵抗率および熱伝導
率の測定結果を表4に示す。
The type of monomercus used in each example, the supply flow rate, the electron temperature near the 1111 regular substrate during plasma polymerization, and the polymerization time are as shown in Table 4, respectively. Further, in all Examples, the degree of vacuum during polymerization was maintained at 50 mTorr, and the plasma was excited using a 20 kHz AC power source. In each case, a 7° lasma film with a thickness of about 1 pm was formed. Table 4 shows the measurement results of volume resistivity and thermal conductivity.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施に使用する装置例を表す。 1・・・真空ポンプ、2・・・真空容器、3.3′・・
・電極、5・・・モノマーガス供給管、6・・・ヘルド
、7・・・被コーテイング物 特許出願人 日木合成ゴム株式会社 代 理 人 弁理士 岩見谷 周志
FIG. 1 represents an example of equipment used to practice the invention. 1... Vacuum pump, 2... Vacuum container, 3.3'...
・Electrode, 5... Monomer gas supply pipe, 6... Held, 7... Coated object Patent applicant: Hiki Synthetic Rubber Co., Ltd. Representative Patent attorney: Shushi Iwamiya

Claims (1)

【特許請求の範囲】 1、ハロゲン化炭化水素ガス(A) 、 )R化水素ガ
ス(B)、水素ガス(C)およびハロゲンガス([))
から、下記(1)〜(10)のいずれかの組合せで選ば
れた1種又は2種以上のガスを含有する利合用ガス: (1)Aのみ、 (2)A+B、 (3)A+C1 (4)A+D、 (5)A+B+C1 (6)A+B+D、 (7)A+C+D、 (8)A+B+c+D、 (9)B+D、 (10)B + C+ D であって、該重合用ガス中の/\ロゲン原子数と水素原
子数の比がl:5〜5:1であるものを、反応帯域にお
けるプラズマの電子温度が2 、000〜60.0OO
Kであるプラズマ重合反応に供することからなる電気絶
縁膜の製造方法。
[Claims] 1. Halogenated hydrocarbon gas (A), )R hydrogen gas (B), hydrogen gas (C), and halogen gas ([))
Utilization gas containing one or more gases selected from the following combinations of (1) to (10): (1) A only, (2) A+B, (3) A+C1 ( 4) A+D, (5) A+B+C1 (6) A+B+D, (7) A+C+D, (8) A+B+c+D, (9) B+D, (10) B + C+ D, and the number of /\logen atoms in the polymerization gas and the number of hydrogen atoms is 1:5 to 5:1, and the electron temperature of the plasma in the reaction zone is 2,000 to 60.0OO.
A method for producing an electrical insulating film, which comprises subjecting K to a plasma polymerization reaction.
JP19176083A 1983-10-14 1983-10-14 Preparation of electric insulating film Pending JPS6086267A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19176083A JPS6086267A (en) 1983-10-14 1983-10-14 Preparation of electric insulating film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19176083A JPS6086267A (en) 1983-10-14 1983-10-14 Preparation of electric insulating film

Publications (1)

Publication Number Publication Date
JPS6086267A true JPS6086267A (en) 1985-05-15

Family

ID=16280050

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19176083A Pending JPS6086267A (en) 1983-10-14 1983-10-14 Preparation of electric insulating film

Country Status (1)

Country Link
JP (1) JPS6086267A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61190526A (en) * 1985-02-20 1986-08-25 Japan Synthetic Rubber Co Ltd Metallic product covered with plasma-polymerized film
JPS61190525A (en) * 1985-02-20 1986-08-25 Japan Synthetic Rubber Co Ltd Metallic product covered with plasma-polymerized film
CN103337320A (en) * 2013-06-13 2013-10-02 天津学子电力设备科技有限公司 Surface charge quick dissipation method for silicone rubber composite insulator
US12528966B2 (en) 2015-06-09 2026-01-20 P2I Ltd Coatings

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5216981A (en) * 1975-07-31 1977-02-08 Toshiba Corp Integrate circuit unit
JPS5838701A (en) * 1981-08-31 1983-03-07 Japan Synthetic Rubber Co Ltd Surface treatment method using plasma chemical reaction

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5216981A (en) * 1975-07-31 1977-02-08 Toshiba Corp Integrate circuit unit
JPS5838701A (en) * 1981-08-31 1983-03-07 Japan Synthetic Rubber Co Ltd Surface treatment method using plasma chemical reaction

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61190526A (en) * 1985-02-20 1986-08-25 Japan Synthetic Rubber Co Ltd Metallic product covered with plasma-polymerized film
JPS61190525A (en) * 1985-02-20 1986-08-25 Japan Synthetic Rubber Co Ltd Metallic product covered with plasma-polymerized film
CN103337320A (en) * 2013-06-13 2013-10-02 天津学子电力设备科技有限公司 Surface charge quick dissipation method for silicone rubber composite insulator
US12528966B2 (en) 2015-06-09 2026-01-20 P2I Ltd Coatings

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