JPS608771A - Measuring device of time difference - Google Patents

Measuring device of time difference

Info

Publication number
JPS608771A
JPS608771A JP11800083A JP11800083A JPS608771A JP S608771 A JPS608771 A JP S608771A JP 11800083 A JP11800083 A JP 11800083A JP 11800083 A JP11800083 A JP 11800083A JP S608771 A JPS608771 A JP S608771A
Authority
JP
Japan
Prior art keywords
time difference
adder
clock signal
output
supplied
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11800083A
Other languages
Japanese (ja)
Other versions
JPH0467156B2 (en
Inventor
Osamu Hamada
修 浜田
Yasushi Katsumata
勝又 泰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP11800083A priority Critical patent/JPS608771A/en
Publication of JPS608771A publication Critical patent/JPS608771A/en
Publication of JPH0467156B2 publication Critical patent/JPH0467156B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G04HOROLOGY
    • G04FTIME-INTERVAL MEASURING
    • G04F10/00Apparatus for measuring unknown time intervals by electric means
    • G04F10/04Apparatus for measuring unknown time intervals by electric means by counting pulses or half-cycles of an AC

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manipulation Of Pulses (AREA)
  • Measurement Of Unknown Time Intervals (AREA)

Abstract

PURPOSE:To measure a time difference with high precision without raising so much the frequency of a clock signal to be supplied to a counter by providing the counter, the first latch circuit, an adder, and the second latch circuit and outputting a time difference detection signal from the adder. CONSTITUTION:An M-fold counted value of a counted value latched with a sampling frequency fso is held in a latch circuit 4. A time difference l'n is the sum of a time difference l'n-1 and a normalized period To/Ti, which is obtained by normalizing an output sampling period To with an input sampling period Ti, in accordance with a formula; and since the period To/Ti is obtained only by shifting right the output of the latch circuit 4 by m-number of bits, the period To/Ti (parallel output) is shifted right by m-number of bits and is supplied to an adder 5, and the time difference l'n-1 (parallel output) latched already in a latch circuit 6 is supplied to the adder 5, and they are added to obtain the time difference l'n (parallel output). This time difference l'n is latched in the latch circuit 6 by the third clock signal having frequency fso and is supplied to the adder and is used for obtaining a time difference ln+1.

Description

【発明の詳細な説明】 産業上の利用分野 本発明はデータ補間処理装置に通用して好適な時間差測
定装置に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a time difference measuring device suitable for use in data interpolation processing devices.

背景技術とその問題点 データ補間処理装置は、第1図にボず如く、アナログ信
号Sに対し、あるサンプリング周期Tiを有する入力サ
ンプル列(黒丸にて示す)を基にして補間演算を行なっ
て、これとは異なるサンプリング周期Toの出力サンプ
ル列(白丸にて示す)を出力する装置である。この捕間
演算の方法は精度の11低に応じて種々あるが、−例と
して1次補間演算について第2図を参照して説明する。
BACKGROUND TECHNOLOGY AND PROBLEMS A data interpolation processing device performs interpolation calculations on an analog signal S based on an input sample sequence (indicated by a black circle) having a certain sampling period Ti, as shown in Fig. 1. , is a device that outputs an output sample sequence (indicated by a white circle) with a sampling period To different from this. There are various methods for performing this interpolation calculation depending on the degree of precision, but as an example, a linear interpolation calculation will be explained with reference to FIG.

第2図に於いて、サンプリング周期Tiのつ・ンブル列
(黒丸)のn及びn+1番目のサンプル点の時点を夫々
X n + X TL+1 、その各レベルをyn。
In FIG. 2, the times of the n and n+1th sample points of the triple string (black circles) of the sampling period Ti are respectively X n + X TL+1 and the respective levels are yn.

)’ netとする。又、サンプリング周期Toのサン
プル列(白丸)のうち、時点xn + xIDIの間に
あるヘキサンプル点の時点をX、そのレベルをylその
1次袖間演算によって得られる近似レベルをy′とする
。又、X−XQをx−Xfi =Ilnと置く。
)'net. Also, among the sample string (white circle) with sampling period To, let X be the time point of the hex sample point between time point xn + xIDI, its level be yl, and the approximate level obtained by the primary sleeve calculation be y'. . Also, set X-XQ as x-Xfi = Iln.

かくすると、y′は次式のような演算により得られる。Thus, y' can be obtained by the following calculation.

xB◆1−X n この(11式でl n/ T i = j2 ′n(0
< it ’B < l )と置けば、次式が得られる
xB◆1−X n This (In equation 11, l n/T i = j2 ′n(0
< it 'B < l ), the following equation is obtained.

)” −(’In+、3’n) ・βh+yrL ・・
・(2)また、β′nは7!1l−1が既知であれば次
式のように表わされる。
)” −('In+, 3'n) ・βh+yrL ・・
(2) Also, if 7!1l-1 is known, β'n can be expressed as the following equation.

li=β3−1+To /Ti ・・・(31しかして
、補間処理演算を行なうためには、その補間演算の種類
の如何を問わず、差し当り入出力サンプル列の時間差(
入力サンプル列の周期Tiで規格化された時間差)βh
を測定する必要がある。
li=β3-1+To/Ti...(31However, in order to perform an interpolation processing operation, regardless of the type of interpolation operation, the time difference between the input and output sample sequences (
time difference (normalized by the period Ti of the input sample sequence) βh
need to be measured.

かかる時間差β實の測定は、従来第3図に示すような装
置を以って行っていた。即ち、入力サンプル列のサンプ
リング周波数fsiの整数N倍の周波数Nfsiを有す
るクロック信号をカウンタ(1)に供給して計数し、そ
の計数出力(並列出力)を′ラッチ回路(2)に供給し
て出力サンプル列のサンプリング周波数fsiOのクロ
ック信号でランチを繰返ゼば、毎回の時間差βKが出力
される。
The measurement of the time difference β-fact has conventionally been carried out using an apparatus as shown in FIG. That is, a clock signal having a frequency Nfsi that is an integer N times the sampling frequency fsi of the input sample sequence is supplied to a counter (1) for counting, and the counting output (parallel output) is supplied to a latch circuit (2). If the launch is repeated with the clock signal of the sampling frequency fsiO of the output sample sequence, the time difference βK each time is output.

ところが、補間精度を高くするためには、時間差i1 
の精度を而<シなければならない。しかし、かかる従来
の時間差測定装置に於いて、時間差7!箸の精度を鵡く
するために、Nをあまり大きくすると、カウンタ(1)
に供給するクロック信号の周波数が高くなりすぎ、ハー
ドウェアの規模、価格、技術的難易度の上昇につながっ
てしまう。
However, in order to increase the interpolation accuracy, the time difference i1
The accuracy must be maintained. However, in such a conventional time difference measuring device, the time difference is 7! In order to increase the precision of the chopsticks, if N is made too large, the counter (1)
The frequency of the clock signal supplied to the device becomes too high, leading to an increase in the scale, price, and technical difficulty of the hardware.

発明の目的 かかる点に鑑み、本発明はカウンタに供給するクロック
信号の周波数を左程高(しなくても、時間差を高精度を
以って測定することのできる時間差測定装置を提案しよ
うとするものである。
Purpose of the Invention In view of the above points, the present invention seeks to propose a time difference measuring device that can measure time differences with high accuracy even if the frequency of the clock signal supplied to the counter is not as high as possible. It is something.

発明の概要 本発明は、互いに異なる周波数fsi、fsoのパルス
列の時間差を測定する装置に於いて、周波数Nfsi(
但しNは整数)の第1のクロック信号を計数すると共に
、周波数f so / M (但し、M=2m。
Summary of the Invention The present invention provides an apparatus for measuring the time difference between pulse trains of different frequencies fsi and fso.
(where N is an integer), the first clock signal is counted and the frequency is f so / M (where M = 2 m).

m = L2+3+・・・)の第2のクロック信号によ
ってリセットされるカウンタと、このカウンタの内容を
第2のクロック信号によってランチする第1のランチ回
路と、この第1のランチ回路の出力がmビットだけ右シ
フトされて供給される加算器と、この加算器の出力が周
波数Lsoの第3のクロック信号を以ってラッチされ°
ζ加算器に供給される第2のラッチ回路とを有し、加算
器より時間差検出信号が出力されるようにしたものであ
る。
m = L2+3+...); a first launch circuit that launches the contents of this counter by the second clock signal; and an output of the first launch circuit that is m an adder which is shifted to the right by bits and the output of this adder is latched with a third clock signal of frequency Lso;
A second latch circuit is supplied to the ζ adder, and the adder outputs a time difference detection signal.

かかる本発明によれば、カウンタに供給するクロック信
号の周波数を左程高くしなくても、時間差を高オv度を
以って測定することのできる時間差測定装置を得ること
ができる。
According to the present invention, it is possible to obtain a time difference measuring device that can measure time differences with high accuracy without increasing the frequency of the clock signal supplied to the counter so much.

実施例 以下に第4図を参照しζ、本発明の一実施例を説明する
。入カバルス例のサンプリング周波数fsiのN倍の周
波数Nfsiの第1のクロック信号をカウンタ(3)に
供給して計数せしめる。そして、出力パルス列のサンプ
リング周波数fsoの整数M(但し、M=2m、m=L
2,3.・・1分の1の周波数f so / Mの第2
のクロック信号をリセット信号としてカウンタ(3)に
供給すると共に、カウンタ(3)の出力(並列出力)を
ランチ回路(4)に供給して、上述の周波数がf so
 / Mの第2のクロック信号を以ってラッチする。従
って、ラッチ回路(41には、サンプリング周波数rs
oを以ってラッチされる計数値のM倍の計数値がホール
ドされる。
EXAMPLE An example of the present invention will be described below with reference to FIG. A first clock signal having a frequency Nfsi that is N times the sampling frequency fsi of the input signal example is supplied to a counter (3) for counting. Then, an integer M of the sampling frequency fso of the output pulse train (where M=2m, m=L
2, 3. ... 1/1 frequency f so / M second
The clock signal of is supplied to the counter (3) as a reset signal, and the output (parallel output) of the counter (3) is supplied to the launch circuit (4) so that the above frequency is
/M second clock signal. Therefore, the latch circuit (41 has a sampling frequency rs
A count value M times the count value latched by o is held.

上述の(3)式から、時間差βhは時間差β6.と出力
サンプリング周期Toを入カザンプリング周期Tiで規
格化した規格化周期To/Tiの和で表わされるが、周
期To/Tiはランチ回路(4)の出力をmビット右シ
フトするだけで得られるから、この周期To/Ti(並
列出力)をmビット右シフトして加算器(5)に供給す
ると共に、ランチ回路(6)に既にラッチされている時
間差β簡(並列出力)を加算器(アダー)(5)に供給
してこれらを加笠ずれば、時間差l′n (並列出力)
が得られる。かかる時間差βhは周波数rsoの第3の
クロック信号を以ってランチ回路(6)にランチされ、
加算器(5)に供給されてN6や、を得るために用いら
れる。
From the above equation (3), the time difference βh is the time difference β6. It is expressed as the sum of the normalized period To/Ti obtained by normalizing the output sampling period To by the input sampling period Ti, but the period To/Ti can be obtained by simply shifting the output of the launch circuit (4) to the right by m bits. , this cycle To/Ti (parallel output) is shifted to the right by m bits and supplied to the adder (5), and the time difference β (parallel output) already latched in the launch circuit (6) is transferred to the adder ( Adder) (5) and add them together, the time difference l'n (parallel output)
is obtained. This time difference βh is launched into the launch circuit (6) with a third clock signal of frequency rso,
It is supplied to an adder (5) and used to obtain N6.

面、ランチ回路(4)の各桁の出力端子を、加算器(5
)の各桁の入力端子に対しm桁だけ下位の各桁の入力端
子に接続することにより、ランチ回路(4)の出力はm
ビット右シフトされることになる。
The output terminal of each digit of the launch circuit (4) is connected to the adder (5).
), the output of the launch circuit (4) is m.
It will be shifted bits to the right.

かかる時間差測定装置によれば、時間差19の精度を最
大でM倍上昇させることができる。
According to such a time difference measuring device, the accuracy of the time difference 19 can be increased by a maximum of M times.

面、Mが大でランチ回路(4)に於ける累積時間が長く
、規格化周期To/Tiに誤差が生じる虞がある場合は
、第3図の装置をも併用し、これによって時間差βtの
比較及び補正を行なうようにすれば良い。
If the surface and M are large, the cumulative time in the launch circuit (4) is long, and there is a risk that an error will occur in the normalized period To/Ti, the device shown in Fig. 3 is also used, thereby reducing the time difference βt. What is necessary is to perform comparison and correction.

例えばfsl、f Soが50kllz 、 N及びM
が28とすると、Nfsiは12.8Ml1z 、 f
 6o/ Mは195Hz程度になる。この場合、カウ
ンタ(3)及びラッチ回路(4)のビット数が夫々24
ビツト、加算器(5)及びランチ回路(6)のビット数
が夫々16ビツトである。
For example, fsl, f So is 50kllz, N and M
is 28, Nfsi is 12.8Ml1z, f
6o/M is about 195Hz. In this case, the number of bits of the counter (3) and latch circuit (4) is 24 each.
The number of bits of the adder (5) and the launch circuit (6) is 16 bits each.

因みに、第3図の装置で、時間差l′oの精度を上述し
た第4図の装置のそれと同様に採ろうとすると、fsi
= fso=50 (kllz )の場合、Nが216
となって、NfSiは3.3Gllzにもなってしまう
Incidentally, if we try to obtain the same precision of the time difference l'o with the device shown in FIG. 3 as that of the device shown in FIG. 4 mentioned above, then fsi
= fso=50 (kllz), N is 216
Therefore, NfSi becomes 3.3 Gllz.

発明の効果 上述せる本発り魯こよれは、カウンタに供給するクロッ
ク信号の周波数を左程高くしなくても、時間差を面精度
を以っ°ζ測定することのできる時間差測定装置を得る
ことができる。従っζ、時間差測定装置のハードウェア
の規検、価格、技術的難易度の上昇を伴わずして、所期
の目的を達成することができる。
Effects of the Invention The above-mentioned object of the present invention is to obtain a time difference measuring device that can measure time differences with surface accuracy without increasing the frequency of the clock signal supplied to the counter so much. I can do it. Therefore, the desired purpose can be achieved without increasing the hardware, cost, or technical difficulty of the time difference measuring device.

【図面の簡単な説明】[Brief explanation of drawings]

第1図及び第2図はデータ補間処理装置の説明に供する
グラフ、第3図は従来の時間差測定装置を示すフロック
線図、第4図は本発明による時間差測定装置の一実施例
を示すブロック線図である。 (3)はカウンタ、(4)は第1のラッチ回路、(5)
は加算器、(6)は第2のラッチ回路である。
1 and 2 are graphs for explaining the data interpolation processing device, FIG. 3 is a block diagram showing a conventional time difference measuring device, and FIG. 4 is a block diagram showing an embodiment of the time difference measuring device according to the present invention. It is a line diagram. (3) is a counter, (4) is the first latch circuit, (5)
is an adder, and (6) is a second latch circuit.

Claims (1)

【特許請求の範囲】 互いに異なる周波数fsi、fsoのパルス列の時間差
を測定する装置に於いて、周波数Nfsi(但しNは整
数)の第1のクロック信号を計数すると共に、周波数f
so/M(但し、M =2”、 m=l。 2.3.・・・)の第2のクロック信号によってリセッ
トされるカウンタと、該カウンタの内容を上記第2のク
ロック信号によってランチする第1のランチ回路と、該
第1のラッチ回路の出力がmビットだけ右シフトされて
供給される加算器と、該加算器の出力が周波数rsoの
第3のクロ・ツク信号を以ってラッチされて上記加算器
に供給される第2のランチ回路とを有し、上記加算器よ
り時間差゛検出信号が出力されるようにしたことを特徴
とする時間差測定装置。
[Claims] In an apparatus for measuring the time difference between pulse trains having different frequencies fsi and fso, a first clock signal having a frequency Nfsi (N is an integer) is counted, and a first clock signal having a frequency fsi and a first clock signal having a frequency fso are counted.
a counter that is reset by a second clock signal of so/M (where M = 2", m = l. 2.3...), and the contents of the counter are launched by the second clock signal. a first launch circuit; an adder to which the output of the first latch circuit is shifted to the right by m bits; and the output of the adder is supplied with a third clock signal of frequency rso; and a second launch circuit which is latched and supplied to the adder, and a time difference detection signal is output from the adder.
JP11800083A 1983-06-28 1983-06-28 Measuring device of time difference Granted JPS608771A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11800083A JPS608771A (en) 1983-06-28 1983-06-28 Measuring device of time difference

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11800083A JPS608771A (en) 1983-06-28 1983-06-28 Measuring device of time difference

Publications (2)

Publication Number Publication Date
JPS608771A true JPS608771A (en) 1985-01-17
JPH0467156B2 JPH0467156B2 (en) 1992-10-27

Family

ID=14725563

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11800083A Granted JPS608771A (en) 1983-06-28 1983-06-28 Measuring device of time difference

Country Status (1)

Country Link
JP (1) JPS608771A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01117420A (en) * 1987-10-29 1989-05-10 Nec Corp Phase comparator
JP2011191178A (en) * 2010-03-15 2011-09-29 Tesetsuku:Kk Time-width measuring device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01117420A (en) * 1987-10-29 1989-05-10 Nec Corp Phase comparator
JP2011191178A (en) * 2010-03-15 2011-09-29 Tesetsuku:Kk Time-width measuring device

Also Published As

Publication number Publication date
JPH0467156B2 (en) 1992-10-27

Similar Documents

Publication Publication Date Title
JPH08211165A (en) Pulse duration measuring device
JPH03207115A (en) Pwm signal demodulation system
SU748868A1 (en) Method of experimental determination of dynamic characteristics of voltage to frequency converters
SU1564671A1 (en) Device for adaptive compression of information
RU2231922C1 (en) Analog-to-digital converter
SU928249A1 (en) Logic phase-meter
SU721796A1 (en) Recirculation measuring time-to-code converter
JPH02196371A (en) Differential correlator
SU590663A1 (en) Digital ultrasonic wave propagation velocity meter
SU1640547A1 (en) Ultrasonic thickness gauge
SU418857A1 (en)
JPH0798336A (en) Sampling type measuring device
JPH03102266A (en) Pulse width measurer
SU543882A1 (en) Digital low frequency
JPH0467156B2 (en)
RU1797726C (en) Detonation meter
SU917107A1 (en) Method and device for measuring signal instantaneous value
SU1404973A1 (en) Mean-value digital phase meter
SU612241A1 (en) Pulse-counting converter of the difference between series codes into parallel code
SU1348744A1 (en) Digital phase-meter
SU902245A1 (en) Device for measuring digital-analogue converter error
SU942044A1 (en) Device for determining mean power of random signals
SU723569A1 (en) Computing device
SU955050A1 (en) Device for adding pulse trains
SU391490A1 (en) YOU-UNION