JPS6097525A - Operation diagnosing device of relays arranged in matrix state - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of the Invention] The present invention relates to a diagnostic pli device that automatically diagnoses the presence or absence of a failure in lj relays arranged in a matrix.

[Prior Art] A matrix relay circuit in which one contact of a 0N10FF relay is arranged at a grid point of a matrix is well known.

By the way, the relays used in such matrix relay circuits are mechanical parts and usually have a lower probability of failure than electric circuit parts such as ICs. 71
- Relays in relay circuits are often used at key points in electrical circuits, in which case the circuit no longer works properly if a fault occurs. Conventionally, there has been no method for automatically diagnosing the presence or absence of a relay failure in such a case, and there has been a problem in that it is not possible to take immediate action.

[Object of the Invention] In view of the above points, it is an object of the present invention to provide a diagnostic device that can easily diagnose 41 failures of 63+j relays in a matrix relay circuit.

According to the present invention, (■ A relay circuit that can drive a large number of relays under test arranged in a matrix, and a relay driver circuit that can energize each relay of this relay circuit, 1) A diagnostic circuit capable of detecting the ON or OFF state of two relays in adjacent columns or rows of the relay circuit and outputting the result as a binary signal; and the relay drive circuit. In order to drive and turn the target relay ON or OFF, the circuit 1 to 1 call 15 and the diagnostic circuit are generated. The apparatus is equipped with a medium heat processing device capable of identifying a faulty relay and specifying the position of at least a pair of relays including the faulty relay based on the results obtained.

[Example] The present invention will be explained in detail below using the drawings. Figure 1 shows the operation diagnosis of the relay according to the present invention (in the title). In Figure 1111, H3 (, 10 is a matrix (LO to L3)) 71 to 6 grid points (6/I points) consisting of 16 columns (PO・~P'I5) are ON, /O
F f = Sliding contact relays are arranged and row and column designation (・Each relay is driven.
It was completed in 474 years in Kosetza. Dozens of this device CP
It is abbreviated as O. ) 30 control J, relay circuit 64
It is designed to be able to handle each relay individually. 40 is a diagnostic circuit (11i), the output of which is connected to columns 1)0 and 1)1 of the two-wire relay circuit 10, and is designed to detect lightning in the relay. C
P U 30 is 1 so as to control υ11 the diagnostic IQi circuit 40.
Konatsu C, that controller (-roll (H6 doshi U C1
-C3 and has the following abilities.

C″1: Diagnosis...Connect the output of i times 40 to PO and []1.

C2: Small IJ til+ for current supply in the diagnostic circuit 40
.

C3: Clear the flip-flop (details will be described later) of the diagnostic circuit 40 A7.

Further, the CPU is configured to be able to receive the output of the diagnostic circuit (a binary signal that is a test result of relay operation).

Figure 2 shows the details of the diagnostic circuit.

In the diagram, H3, XI and X2 are the relay contacts of the relay circuit.
(・There is. 411.l+12 is a D type flip・) 1” knob (hereinafter referred to as D-FF), 421 is 1
~Ran resistor, 422 is a batsft amplifier, 425 (
There is a dry inverter circuit that drives the relay contacts/123 and 424. A signal QC1 is added to this drive circuit. 430 is a comparator circuit, 431 and 432 are ':1 inverters, and 433 to 436 are resistance elements, respectively. The control 1-roll signal C2 is applied to the transistors 1 to 421 via the amplifier 422.
21 as an emitter (this is also connected to the X quasi-potential +j;
(This is connected to one end of the relay contact under test, and the other end of the relay contact under test is connected to the standard potential point COM via the relay contact 424.Resistance elements 433 and 4
Voltage dividing point B of 311 is connected to one input terminal of comparator/131, and voltage dividing point C of resistive elements 434 and 435 is connected to the ten input heirs of comparator/132. The connection point El between the resistive element 436 and the relay contact '123 is connected to the + and - input terminals of the comparators 7'131 and 432, respectively. D −F F /I'+1, /11
2, 1 terminal of brisera 1 in dj P RLi- + output terminal of cibarators 431, 432, 1 terminal (j reference potential point CO minus 1, and clear terminal C1,..., R is +5V terminal! Controls 1 to C3 are added to the L1 switch CK as a (JRI1) switch signal.

The operation of this condition will be explained next. Diagnostic items include the ON test and the OT: t: test.

The ON test checks whether the contacts are closed when they should be, ① whether the contact resistance is high, and ② whether the operating time is too long.

On the other hand, in the OFF test, (b) check whether the contact is being heard properly when it is open, ■ whether the contact resistance is too small, and ■ whether the return time is too long. (If the appearance and ■, ■, and ■ are all normal, then the relay is judged to be abnormal.)

Next, we will explain the h-formula for diagnosis. Please refer to Figure 3.
), as seen from the diagnostic circuit 40, the two relays X+ and X2 in series are diagnosed alternately. (OFFkl, 'l) command is written as 1lroak command.In the case of testing relay X, relay x2 is always m
aka a, conduct an ON test by making only relay x1, and conduct an OFF test by breaking T of relay x1 that has been made.

The same applies to relay x2.

Both the ON test and the OFF test are performed six times according to the processing flow L1- as shown in FIG. The operation will be explained below with reference to FIGS. 4 and 5.

A control signal is given from the CPU 30 to the relay driver/inno circuit 20', and the relay x1 is driven to become Ilwake as shown in <[J] in Fig. 5. Subsequently, -c1 relay X2 is also made in the same manner ((c) in the same figure).

The waiting time a from the start of the relay drive as shown in (a) in Figure 5
After (relay operation time and revenge time), cp
The diagnostic circuit 40 is activated by the control signal c'+-c3 from u. The drive circuit 425 is energized by the signal C1, the relays 423 and /124 are both turned on, and the transistor 4 is turned on by the signal C2.
When 21 turns on, current is supplied to the voltage dividing circuit 430 ((d) in FIG. 5), and then the signal C3 causes the D-FF4
11,412 is cleared ((Bo) in the same figure).

This turns relays X+ and X2 ON /' Or
I: Detection of state becomes OFi. Now, relays x1 and
2 are both ON, the inverter 43
The output of the comparator 432 is I L 11, the output of the comparator 432 is I Bi, and each output is D −F F /I 1 '
l.

412 is inputted to precera 1 to terminal PR. l) -
``Well, 'L゛° is given to the preset I terminal,
Since its Q output is set to 'l-1', D-FF 411 outputs the D1 signal of 'H',
412 outputs the D2 signal of "L". The CPU reads this D'l and D21Ei and determines whether the relay is good or bad (
If a failure occurs, the location of that pair of relays can be determined. ) (same figure (e)), and then a medical examination 1fli.
Drop the control signal to the circuit.

In this processing step 1]-, failure diagnosis of each relay is performed.
An example of the order of diagnosis when diagnosing all relays will be described below.

■Tub 1 As shown in FIG. 6, the four pairs of relays arranged in the 10th column and 21st row of the relay circuit are sequentially diagnosed.

■Step 2 As shown in Figure 7, column 10 [row 0, column P1, row L1, 2
Make one relay and place C, LO line and L1
Check the 14 pairs of relays in the row. After the medical examination,
Both the two relays in column FlO, row LO and column 11, row 11 are set to break, and 'CAj <.

■Step 3 As shown in Figure 8, set the two relays in row L2 of column PO and row L3 of column [)1 to +nake, and check the 171 pairs of relays in row 12 and row L3! 7i 'Jru. After diagnosis, both the two relays in column 10 and row 2 and column P1 and row 3 are set to peak in January.

The above procedure can diagnose 964 relays.

However, relays inspected in step 1 will be inspected in step 2.
, 3 contains relays, so if an abnormality is detected in step 1, the inspection of steps 2 and 3 is interrupted.

If a malfunctioning relay is detected in the OFF test, it can be said that one of the two relays being tested at that time is abnormal.

Note that connection 4 of the diagnostic circuit to the relay circuit; 1. F
f is not limited to the example and may be any other column or row.

In addition, the number of relay circuits can be arbitrarily set to 2×2 or more.

[Effect of the invention] As explained above, according to the present invention, 71 to
Name of relay circuit Turns on relay failure, /'Or- "-
(Experimentally, it is easier to detect, and moreover, the location of a faulty relay can be pinpointed.)

[Brief explanation of the drawing]

a'+ 1 * L shows an embodiment of the present invention 4 Conceptual 1
Figures 1 and 1 are diagrams, Figure 2 is an example of a diagnostic circuit, Figure 3 is a diagram to explain the relay ON/' OFF test, and Figure 4 is a flowchart to explain the diagnostic method. −
1 to 5 are time charts for explaining motion 1'l'.
---1-1 Figures 6 through 8 are diagrams showing the order of diagnosis and diagnosis relay. 10, , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , ,. ,. Relay drive circuit, 30. ,,central processing LIE device,l
IO,,,diagnosis...1 circuit. Figure 2 4U Figure 3 Figure 4

Claims (1)

[Claims] 71 - A relay circuit that is arranged in a box shape and has a large number of relays under test, a relay driver circuit that can control each relay of this relay circuit, and an adjacent relay circuit of the relay circuit. A diagnosis 11i circuit that detects the ON or OFF state of two relays related to a column or row and can obtain the result as a binary signal, and a circuit that drives the relay drive circuit to turn on the target relay.
It also generates a control signal for controlling the OFF state and a control signal for controlling the diagnostic circuit, and also determines whether there is a faulty relay or not, and at least a pair of faulty relays, based on the result of the IFJ from the diagnostic circuit. An apparatus for diagnosing the operation of relays arranged in a matrix 1i, characterized by comprising a central processing unit capable of specifying the positions of relays.