JPS61116066U - - Google Patents
Info
- Publication number
- JPS61116066U JPS61116066U JP20210084U JP20210084U JPS61116066U JP S61116066 U JPS61116066 U JP S61116066U JP 20210084 U JP20210084 U JP 20210084U JP 20210084 U JP20210084 U JP 20210084U JP S61116066 U JPS61116066 U JP S61116066U
- Authority
- JP
- Japan
- Prior art keywords
- mass spectrometer
- ion
- mass
- slit
- interconnecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004885 tandem mass spectrometry Methods 0.000 claims description 2
- 238000001514 detection method Methods 0.000 claims 1
- 238000004949 mass spectrometry Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000005192 partition Methods 0.000 description 1
Landscapes
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984202100U JPH0342616Y2 (2) | 1984-12-28 | 1984-12-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984202100U JPH0342616Y2 (2) | 1984-12-28 | 1984-12-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61116066U true JPS61116066U (2) | 1986-07-22 |
| JPH0342616Y2 JPH0342616Y2 (2) | 1991-09-06 |
Family
ID=30764505
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1984202100U Expired JPH0342616Y2 (2) | 1984-12-28 | 1984-12-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0342616Y2 (2) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5941968U (ja) * | 1982-09-09 | 1984-03-17 | 日本電子株式会社 | 衝突室を備えた質量分析装置 |
-
1984
- 1984-12-28 JP JP1984202100U patent/JPH0342616Y2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5941968U (ja) * | 1982-09-09 | 1984-03-17 | 日本電子株式会社 | 衝突室を備えた質量分析装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0342616Y2 (2) | 1991-09-06 |
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