JPS61137329A - 半導体の微細加工方法 - Google Patents
半導体の微細加工方法Info
- Publication number
- JPS61137329A JPS61137329A JP59260295A JP26029584A JPS61137329A JP S61137329 A JPS61137329 A JP S61137329A JP 59260295 A JP59260295 A JP 59260295A JP 26029584 A JP26029584 A JP 26029584A JP S61137329 A JPS61137329 A JP S61137329A
- Authority
- JP
- Japan
- Prior art keywords
- impurity concentration
- electrode
- substrate
- siox
- potential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
Landscapes
- Weting (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59260295A JPS61137329A (ja) | 1984-12-10 | 1984-12-10 | 半導体の微細加工方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59260295A JPS61137329A (ja) | 1984-12-10 | 1984-12-10 | 半導体の微細加工方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61137329A true JPS61137329A (ja) | 1986-06-25 |
| JPH0434817B2 JPH0434817B2 (2) | 1992-06-09 |
Family
ID=17346057
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59260295A Granted JPS61137329A (ja) | 1984-12-10 | 1984-12-10 | 半導体の微細加工方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61137329A (2) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5677204A (en) * | 1995-10-17 | 1997-10-14 | Mitsubishi Denki Kabushiki Kaisha | Method of evaluating a thin film for use in semiconductor device |
| US5705027A (en) * | 1995-04-18 | 1998-01-06 | Mitsubishi Denki Kabushiki Kaisha | Method of removing etching residues |
| US5850149A (en) * | 1996-05-27 | 1998-12-15 | Mitsubishi Denki Kabushiki Kaisha | Evaluation method for semiconductor devices |
| JP2008078202A (ja) * | 2006-09-19 | 2008-04-03 | Yokogawa Electric Corp | ボロン拡散型単結晶振動子及びその製造方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6130039A (ja) * | 1984-07-23 | 1986-02-12 | Nec Corp | エツチングの方法 |
-
1984
- 1984-12-10 JP JP59260295A patent/JPS61137329A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6130039A (ja) * | 1984-07-23 | 1986-02-12 | Nec Corp | エツチングの方法 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5705027A (en) * | 1995-04-18 | 1998-01-06 | Mitsubishi Denki Kabushiki Kaisha | Method of removing etching residues |
| US5677204A (en) * | 1995-10-17 | 1997-10-14 | Mitsubishi Denki Kabushiki Kaisha | Method of evaluating a thin film for use in semiconductor device |
| US5850149A (en) * | 1996-05-27 | 1998-12-15 | Mitsubishi Denki Kabushiki Kaisha | Evaluation method for semiconductor devices |
| JP2008078202A (ja) * | 2006-09-19 | 2008-04-03 | Yokogawa Electric Corp | ボロン拡散型単結晶振動子及びその製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0434817B2 (2) | 1992-06-09 |
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