JPS6128209B2 - - Google Patents
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- JPS6128209B2 JPS6128209B2 JP50086905A JP8690575A JPS6128209B2 JP S6128209 B2 JPS6128209 B2 JP S6128209B2 JP 50086905 A JP50086905 A JP 50086905A JP 8690575 A JP8690575 A JP 8690575A JP S6128209 B2 JPS6128209 B2 JP S6128209B2
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Description
本発明は、チタン酸ストロンチウムを主成分と
する焼結体を誘電体とする半導体磁器粒界絶縁型
コンデンサに関するものであり、詳細には、この
コンデンサの温度特性、tan δ及び絶縁抵抗の
改善に関するものである。
一般に、コンデンサ等の誘電体材料としては、
入手の容易なマイラーフイルム等プラスチツクフ
イルムが使用されているが、耐熱性に劣り燃焼す
るので、電力が大きくなつてきたことに伴う発熱
量の増加等により、使用範囲が限定されるという
問題がある。
そこで、近年、耐熱性に優れ、誘電率の非常に
大きな誘電体として、磁気半導体の粒界を選択的
に絶縁処理した多結晶性磁器半導体粒界絶縁型誘
電体が開発されており、この種の誘電体を使用し
た半導体磁器粒界絶縁型コンデンサ(BLコンデ
ンサ)が提供されている。
この種の誘電体材料としては、例えばチタン酸
バリウム(BaTiO3)系のものが知られており、こ
れを使用したBLコンデンサでは、50000〜70000
程度の誘電率が達成されている。しかし、この
BLコンデンサでは、温度変化−30℃〜+85℃の
範囲において、20℃における値に対して約±40%
程度の静電容量変化があり、またtan δも約5
〜10%と比較的大きい等の欠点があつてコンデン
サとしての有用性が制限されていた。すなわち、
この静電容量の温度変化は、例えばチユーナ等に
用いた場合に、周波数特性が温度によつて変化す
るという要因になる。
一方、上記誘電体材料として、チタン酸ストロ
ンチウム(SrTiO3)系を主成分としたものも知ら
れており、これを使用したBLコンデンサも提案
されてる。
この種のものは、前記温度変化における静電容
量変化が約±15%程度と低く、かつtan δも2
〜5%と低いので、BaTiO3系BLコンデンサより
も優れたものと言える。
しかしながら、このSrTiO3系BLコンデンサ
は、実用面で競合すると思われるマイラーフイル
ムコンデンサと比べると、絶縁抵抗とtan δの
点で大幅に劣つている。
そこで本発明は、かかる実情に鑑みて提案され
たものであつて、静電容量の温度変化が少なく、
かつ絶縁抵抗やtan δに優れるとともに、誘電
率の高い半導体磁器粒界絶縁型コンデンサを提供
することを目的とする。
本発明者等は、上述の目的を達成せんものと鋭
意研究の結果、SrTiO3に所定量のBaTiO3を加え
ることにより絶縁抵抗やtan δ、温度特性を改
善することができ、さらに半導体化促進剤として
Nb2O5あるいはTa2O5が、また結晶成長促進剤と
してSiO2が好適であつて、これらを焼結して得
られる多結晶性磁器半導体粒界絶縁型誘電体を誘
電体とするコンデンサが優れた特性を示すことを
見出し本発明を完成するに至つたものであつて、
SrTiO3を主成分としてNb2O5,Ta2O5のうち少な
くとも一種を0.05〜5重量%含有するとともに
SiO2を0.02〜1重量%とBaTiO3を0.5〜20重量%
含有してなり粒界層が絶縁体化された半導体磁器
を誘電体とすることを特徴とするものである。
SrTiO3を主成分とする多結晶性磁器半導体粒
界絶縁型誘電体を得るには、先ず、このSrTiO3
の半導体化を促進し、磁器半導体粒子を成長させ
る必要があるが、本発明者等がSrTiO3に種々の
不純物を添加しH2を含む還元性雰囲気中で焼成
したところ、Nb2O5やTa2O5等の金属酸化物が特
に顕著に半導体化を促進することがわかつた。
例えば、SrTiO3にNb2O5を添加し、H2を1%
含むN2ガス雰囲気中で1400℃、2時間焼成を行
つたところ、抵抗値は添加量に応じて第1図に示
すように変化した。すなわち、Nb2O5をSrTiO3
に対して0.05重量%添加した付近から低抗値が急
激に下がり、SrTiO3の半導体化が著しくなり、
特に上記Nb2O5の添加量が1重量%を越えると半
導体化の効果が飽和し、ほとんど等しい低抗値と
なる。この傾向は、Nb2O5の代わりにTa2O5を添
加した場合にも同様であつた。ただし、Nb2O5や
Ta2O5の添加量が5重量%を越えると焼結性が極
端に悪くなつてコンデンサに用いるには不適当で
ある。
したがつて、上記Nb2O5やTa2O5の添加量とし
ては、SrTiO3に対して0.05〜5重量%の範囲内
であることが好ましい。上記添加量が0.05重量%
未満では、SrTiO3の半導体化が充分に達成され
ない。また、逆に上記添加量が5重量%を越える
と、焼結性が極端に悪くなり、誘電体を作製する
ことが難しくなる。
このように半導体化した粒子の結晶粒界のみを
絶縁化させるためには、結晶粒子は大きくてそろ
つていることが必要である。結晶粒子があまり小
さいと、絶縁化する際に結晶内部まで絶縁化さ
れ、誘電率が低下する。
そこで、SrTiO3には、さらに結晶成長促進剤
を加える必要があるが、この結晶成長促進剤とし
ては、SiO2が特に顕著に結晶成長を促進させる
ことがわかつた。第2図に1400℃、2時間還元雰
囲気中で焼成したときのSiO2量と結晶粒径の関
係を示す。この第2図より、SiO2量を0.02重量%
とした付近から粒径が10μm以上となり、BLコ
ンデンサに使用するのに充分な大きさとなる。し
かし、1重量%を越すと、粒径が大きくなりす
ぎ、通常のコンデンサの厚み(0.4mm程度)を越
す粒子も出てくる可能性があり好ましくない。ま
た、粒子の強度も弱くなる。
以上のようにSrTiO3に所定量のNb2O5あるい
はTa2O5とSiO2を添加し、H2を含む還元性雰囲気
中で1次焼成し、B2O3―Bi2O3系またはPbO―
B2O3―Bi2O3系ガラスを塗布し、空気中で2次焼
成することによつて誘電率の高いBLコンデンサ
が得られる。
しかしながら、これだけでは静電容量の温度特
性やtan δの小さい、かつ絶縁抵抗の大きいコ
ンデンサを得ることは難しい。
そこで、これらの特性を改善するために更に実
験を加えた。
常温付近では、静電容量は温度に対して
SrTiO3では負の関係にあり、BaTiO3では正の関
係にあることが知られている。そこで、本発明者
は、SrTiO3のうちSrの一部をBaで置換すれば、
温度特性が零に近いものが得られるであろうと考
えた。
かかる見地から、本発明者等が、SrTiO3に対
してNb2O5を1重量%、SiO2を0.5重量%添加
し、さらにBaTiO3を添加してBLコンデンサを作
製し、このBaTiO3の添加量を変えて諸特性の変
化を調べたところ、第3図に示すような結果が得
られた。
先ず、第3図aは、BaTiO3の添加量とtan δ
の関係を示すものであり、BaTiO3が1重量%〜
20重量%の範囲なら充分実用に供する。なお、
tan δは測定周波数1kHz、測定電圧1Vの条件
でブリツジ法により測定した。
また、第3図cは、BaTiO3の添加量と絶縁抵
抗の関係を示すものである。なお、この絶縁抵抗
は、DC100Vを1分間加えた後に測定した。
この第3図cからは、絶縁抵抗はBaTiO3の添
加量の増加とともに急激に高くなり、10〜15重量
%では絶縁抵抗が1013Ω・cm程度にもなることが
わかる。ただし、20重量%を越えると再び劣化す
る。
さらに、第3図dは、BaTiO3の添加量と静電
容量の温度変化率を示すものである。ここで、上
記温度変化率は、20℃での容量値を基準として20
℃〜80℃の範囲で測定した。
この第3図dから、BaTiO3の添加とともに温
度変化率は正の方向に移つてゆき、約10重量%で
零温度係数のものが得られることがわかる。
上述のように、上記BaTiO3の添加は、SrTiO3
を主成分とする誘電体の絶縁抵抗やtan δ、静
電容量の温度変化の改善に極めて有効であること
が判明したが、過剰に添加すると、tan δが却
つて増加し、さらに第3図bに示すように、誘電
率が低下することもわかつた。
したがつて、上記BaTiO3の添加量は、SrTiO3
に対して0.5〜20重量%の範囲内とすることが好
ましい。このような範囲に設定することにより、
絶縁抵抗やtan δ、静電容量の温度特性が改善
され、誘電率も確保される。
ところで、上述の誘電体を作成する場合に、原
料の純度性質にも注意を払う必要がある。一般
に、SrTiO3を作るためには、TiO2とSrCO3を用
いるが、ここでTiO2にはアナタス型とルチル型
があり、焼結性はアナタス型が優れるが、誘電率
はルチル型が優れる。また、どちらも不純物とし
てFe2O3を含むが、このFe2O3は、半導体化の妨
げとなつたり、絶縁特性を劣化させる要因となる
ので、注意を要する。SrCO3は主としてBaCO3や
CaCO3を不純物として含み、誘電率の温度特性
にバラツキを生じさせる原因になる。また、
TiCO3も製法によつてはNa成分を含み、焼結性
や絶縁性に重大な影響を与える。しかしながら、
原料の純度を極端に良くすることは、焼結性の点
で好ましいものではない。なぜなら、焼結にとつ
て微量の不純物は重要な働きをするからである。
本発明を実施するにあたつては、このようなこ
とを念頭に置きながら原料を調製すべきである。
次に本発明の具体的な実施例について説明す
る。
実施例 1
SrTiO3に対してTa2O5 0.8重量%、SiO2 0.4重
量%およびBaTiO3 10重量%からなる組成を通常
のセラミツク製造手段にて混合乾燥した粉末に
PVA(ポリビニルアルコール)の如きバインダ
ーを加え顆粒成形し、これを、N2ガス中にH2を
1%含む雰囲気中で1450℃、2時間焼成した。
これにBi2O3 50重量%、B2O3 10重量%、PbO
40重量%からなるガラス粉末を筆にて塗布し、空
気中で1180℃、2時間焼成し、銀電極を焼付けて
BLコンデンサを作成した。このコンデンサの特
性は、ε=14000、tan δ=0.35%、絶縁抵抗=
7×1012Ω・cm、静電容量の温度係数は20℃〜80
℃で0%であつた。なお、tan δ及び静電容量
は、オートマチツク・キヤバシタンス・ブリツジ
(Automatic Capacitance Bridge)(商品名YHP
4270A)を用い、測定周波数1kHz、測定電圧1V
の条件で測定した。(以下同じ。)
実施例 2
SrTiO3に対してTa2O5 0.1重量%、SiO2 0.4重
量%およびBaTiO3 10重量%からなる組成を通常
のセラミツク製造手段にて混合乾燥した粉末に
PVA(ポリビニルアルコール)の如きバイング
ーを加え顆粒成形し、これをN2ガス中にH2を1
%含む雰囲気中で1450℃、2時間焼成した。
以下、先の実施例1と同様の方法によりBLコ
ンデンサを作成した。このコンデンサの特性は、
ε=7000、tan δ=0.3%、絶縁抵抗=10×1012
Ω・cm、温度係数は20℃〜80℃で+1.3%であつ
た。
実施例 3
SrTiO3に対してTa2O5 1.0重量%、SiO2 0.6重
量%およびBaTiO3 10重量%からなる組成を通常
のセラミツク製造手段にて混合乾燥した粉末に
PVA(ポリビニルアルコール)の如きバインダ
ーを加え顆粒成形し、これを、N2ガス中にH2を
1%含む雰囲気中で1450℃、2時間焼成した。
以下、先の実施例1と同様の方法によりBLコ
ンデンサを作成した。このコンデンサの特性は、
ε=20000、tan δ=0.45%、絶縁抵抗=3×
1012Ω・cm、温度係数は20℃〜80℃で0%であつ
た。
実施例 4
SrTiO3に対してNb2O5,SiO2およびBaTiO3を
第1表に示すような割合で添加し、先の実施例1
と同様の方法によりBLコンデンサを作成した。
各コンデンサの特性は、第2表に示すようなもの
であつた。
The present invention relates to a semiconductor porcelain grain boundary insulated capacitor whose dielectric is a sintered body mainly composed of strontium titanate, and in particular relates to improvements in the temperature characteristics, tan δ, and insulation resistance of this capacitor. It is something. In general, dielectric materials for capacitors etc.
Plastic films such as Mylar film are used, which are easily available, but they have poor heat resistance and burn, so there is a problem that the range of use is limited due to the increase in heat generation due to the increase in electric power. . Therefore, in recent years, polycrystalline porcelain semiconductor grain boundary insulated dielectrics have been developed as dielectrics with excellent heat resistance and extremely high permittivity, in which the grain boundaries of magnetic semiconductors are selectively insulated. Semiconductor porcelain grain boundary insulated capacitors (BL capacitors) using dielectric materials are available. As this type of dielectric material, for example, barium titanate (BaTiO 3 ) type is known, and a BL capacitor using this has a
A dielectric constant of about 100% has been achieved. However, this
For BL capacitors, the temperature change is approximately ±40% of the value at 20°C in the range of -30°C to +85°C.
There is a change in capacitance of about 5%, and tan δ is also about 5
Its usefulness as a capacitor was limited due to its relatively large size of ~10%. That is,
This temperature change in capacitance causes frequency characteristics to change depending on the temperature when used in, for example, a tuner. On the other hand, as the above-mentioned dielectric material, a material mainly composed of strontium titanate (SrTiO 3 ) is also known, and a BL capacitor using this material has also been proposed. This kind of capacitance change due to temperature change is as low as about ±15%, and tan δ is also 2.
Since it is as low as ~5%, it can be said to be superior to BaTiO 3 series BL capacitors. However, this SrTiO 3 -based BL capacitor is significantly inferior in terms of insulation resistance and tan δ compared to mylar film capacitors, which are thought to compete in practical terms. Therefore, the present invention was proposed in view of the above circumstances, and has a small temperature change in capacitance.
Another object of the present invention is to provide a semiconductor porcelain grain boundary insulated capacitor that has excellent insulation resistance and tan δ and has a high dielectric constant. As a result of intensive research to achieve the above-mentioned purpose, the present inventors have found that by adding a predetermined amount of BaTiO 3 to SrTiO 3 , it is possible to improve insulation resistance, tan δ, and temperature characteristics, and further promote semiconductorization. as an agent
A capacitor whose dielectric material is a polycrystalline porcelain semiconductor grain-boundary insulated dielectric material obtained by sintering Nb 2 O 5 or Ta 2 O 5 , and SiO 2 as a crystal growth promoter. The present invention was completed by discovering that the compound exhibits excellent characteristics,
Mainly composed of SrTiO 3 and containing 0.05 to 5% by weight of at least one of Nb 2 O 5 and Ta 2 O 5
0.02-1% by weight of SiO2 and 0.5-20% by weight of BaTiO3
It is characterized in that the dielectric material is semiconductor porcelain in which the grain boundary layer is made into an insulator. In order to obtain a polycrystalline ceramic semiconductor grain boundary insulated dielectric material mainly composed of SrTiO 3 , this SrTiO 3
It is necessary to promote the conversion of SrTiO 3 into a semiconductor and grow ceramic semiconductor particles, but when the present inventors added various impurities to SrTiO 3 and fired it in a reducing atmosphere containing H 2 , Nb 2 O 5 and It was found that metal oxides such as Ta 2 O 5 particularly promote semiconductor formation. For example, add Nb 2 O 5 to SrTiO 3 and add 1% H 2
When firing was performed at 1400° C. for 2 hours in an atmosphere containing N 2 gas, the resistance value changed as shown in FIG. 1 depending on the amount added. That is, Nb 2 O 5 is replaced by SrTiO 3
When 0.05% by weight of SrTiO 3 was added, the low resistance value suddenly decreased, and SrTiO 3 became significantly semiconducting.
In particular, when the amount of Nb 2 O 5 added exceeds 1% by weight, the effect of semiconductor formation is saturated, resulting in almost the same low resistance value. This tendency was the same when Ta 2 O 5 was added instead of Nb 2 O 5 . However, Nb 2 O 5 and
If the amount of Ta 2 O 5 added exceeds 5% by weight, the sinterability becomes extremely poor, making it unsuitable for use in capacitors. Therefore, the amount of Nb 2 O 5 and Ta 2 O 5 added is preferably within the range of 0.05 to 5% by weight based on SrTiO 3 . The amount added above is 0.05% by weight
If it is less than that, SrTiO 3 cannot be sufficiently converted into a semiconductor. On the other hand, if the amount added exceeds 5% by weight, the sinterability will be extremely poor and it will be difficult to produce a dielectric. In order to insulate only the crystal grain boundaries of the semiconductor-converted particles in this manner, the crystal particles need to be large and uniform. If the crystal grains are too small, the inside of the crystal will be insulated during insulation, resulting in a decrease in dielectric constant. Therefore, it is necessary to further add a crystal growth promoter to SrTiO 3 , and it has been found that among these crystal growth promoters, SiO 2 particularly significantly promotes crystal growth. Figure 2 shows the relationship between the amount of SiO 2 and the crystal grain size when fired at 1400°C for 2 hours in a reducing atmosphere. From this figure 2, the amount of SiO 2 is 0.02% by weight.
The particle size increases from around 10 μm or more, which is large enough to be used in BL capacitors. However, if it exceeds 1% by weight, the particle size becomes too large and there is a possibility that particles exceeding the thickness of a normal capacitor (approximately 0.4 mm) will appear, which is not preferable. In addition, the strength of the particles also becomes weaker. As described above, a predetermined amount of Nb 2 O 5 or Ta 2 O 5 and SiO 2 are added to SrTiO 3 and primary firing is performed in a reducing atmosphere containing H 2 to form a B 2 O 3 -Bi 2 O 3 system. or PbO—
A BL capacitor with a high dielectric constant can be obtained by applying B 2 O 3 -Bi 2 O 3 glass and performing secondary firing in air. However, with this alone, it is difficult to obtain a capacitor with a small temperature characteristic of capacitance, a small tan δ, and a large insulation resistance. Therefore, we conducted further experiments to improve these characteristics. At room temperature, capacitance varies with temperature.
It is known that SrTiO 3 has a negative relationship and BaTiO 3 has a positive relationship. Therefore, the present inventor proposed that if a part of Sr in SrTiO 3 is replaced with Ba,
We thought that we would be able to obtain a temperature characteristic close to zero. From this point of view, the present inventors added 1% by weight of Nb 2 O 5 and 0.5% by weight of SiO 2 to SrTiO 3 and further added BaTiO 3 to produce a BL capacitor. When the changes in various properties were investigated by changing the amount added, the results shown in FIG. 3 were obtained. First, Figure 3a shows the amount of BaTiO 3 added and tan δ
It shows the relationship that BaTiO 3 is 1% by weight ~
A range of 20% by weight is sufficient for practical use. In addition,
tan δ was measured by the bridge method under the conditions of a measurement frequency of 1 kHz and a measurement voltage of 1 V. Further, FIG. 3c shows the relationship between the amount of BaTiO 3 added and the insulation resistance. Note that this insulation resistance was measured after applying DC 100V for 1 minute. From FIG. 3c, it can be seen that the insulation resistance increases rapidly as the amount of BaTiO 3 added increases, and at 10 to 15% by weight, the insulation resistance reaches about 10 13 Ω·cm. However, if it exceeds 20% by weight, it will deteriorate again. Furthermore, FIG. 3d shows the amount of BaTiO 3 added and the rate of change in capacitance with temperature. Here, the temperature change rate above is 20°C based on the capacitance value at 20°C.
It was measured in the range of ℃ to 80℃. From FIG. 3d, it can be seen that the rate of temperature change shifts in the positive direction as BaTiO 3 is added, and a material with a zero temperature coefficient can be obtained at about 10% by weight. As mentioned above, the addition of BaTiO 3 above can lead to SrTiO 3
It has been found that it is extremely effective in improving the insulation resistance, tan δ, and capacitance of dielectrics whose main components are temperature changes; however, when added in excess, tan δ increases, and furthermore, as shown in Figure 3. As shown in b, it was also found that the dielectric constant decreased. Therefore, the above amount of BaTiO 3 added is equal to SrTiO 3
It is preferably within the range of 0.5 to 20% by weight. By setting this range,
The temperature characteristics of insulation resistance, tan δ, and capacitance are improved, and the dielectric constant is also secured. By the way, when producing the above-mentioned dielectric, it is necessary to pay attention to the purity properties of the raw materials. Generally, TiO 2 and SrCO 3 are used to make SrTiO 3 , but here there are two types of TiO 2 : anatase type and rutile type. The anatas type has better sinterability, but the rutile type has better dielectric constant. . In addition, both contain Fe 2 O 3 as an impurity, but care must be taken because this Fe 2 O 3 interferes with semiconductor formation and causes deterioration of insulation properties. SrCO 3 is mainly BaCO 3 and
Contains CaCO 3 as an impurity, which causes variations in the temperature characteristics of the dielectric constant. Also,
Depending on the manufacturing method, TiCO 3 also contains Na components, which has a significant effect on sinterability and insulation properties. however,
Increasing the purity of the raw material to an extremely high degree is not preferable in terms of sinterability. This is because trace amounts of impurities play an important role in sintering. When carrying out the present invention, raw materials should be prepared keeping this in mind. Next, specific examples of the present invention will be described. Example 1 A composition consisting of 0.8% by weight of Ta 2 O 5 , 0.4% by weight of SiO 2 and 10% by weight of BaTiO 3 based on SrTiO 3 was mixed and dried into a powder using a normal ceramic manufacturing method.
A binder such as PVA (polyvinyl alcohol) was added to form granules, which were then fired at 1450° C. for 2 hours in an atmosphere containing 1% H 2 in N 2 gas. Add to this 50% by weight Bi 2 O 3 , 10% by weight B 2 O 3 and PbO
Glass powder consisting of 40% by weight was applied with a brush and baked in air at 1180℃ for 2 hours to bake the silver electrode.
I created a BL capacitor. The characteristics of this capacitor are: ε=14000, tan δ=0.35%, insulation resistance=
7×10 12 Ω・cm, temperature coefficient of capacitance is 20℃~80
It was 0% at ℃. Note that tan δ and capacitance are based on Automatic Capacitance Bridge (product name: YHP).
4270A), measurement frequency 1kHz, measurement voltage 1V
Measured under the following conditions. (The same applies hereinafter.) Example 2 A composition consisting of 0.1% by weight of Ta 2 O 5 , 0.4% by weight of SiO 2 and 10% by weight of BaTiO 3 based on SrTiO 3 was mixed and dried into powder using a normal ceramic manufacturing method.
Bingu such as PVA (polyvinyl alcohol) is added and formed into granules, which are then mixed with 1 H 2 in N 2 gas.
It was baked at 1,450°C for 2 hours in an atmosphere containing %. Hereinafter, a BL capacitor was produced in the same manner as in Example 1 above. The characteristics of this capacitor are
ε=7000, tan δ=0.3%, insulation resistance=10×10 12
The temperature coefficient was +1.3% from 20°C to 80°C. Example 3 A composition consisting of 1.0% by weight of Ta 2 O 5 , 0.6% by weight of SiO 2 and 10% by weight of BaTiO 3 based on SrTiO 3 was mixed and dried into powder using a normal ceramic manufacturing method.
A binder such as PVA (polyvinyl alcohol) was added to form granules, which were then fired at 1450° C. for 2 hours in an atmosphere containing 1% H 2 in N 2 gas. Hereinafter, a BL capacitor was produced in the same manner as in Example 1 above. The characteristics of this capacitor are
ε=20000, tan δ=0.45%, insulation resistance=3×
10 12 Ω·cm, and the temperature coefficient was 0% from 20°C to 80°C. Example 4 Nb 2 O 5 , SiO 2 and BaTiO 3 were added to SrTiO 3 in the proportions shown in Table 1, and the same procedure as described in Example 1 was carried out .
A BL capacitor was created using the same method.
The characteristics of each capacitor were as shown in Table 2.
【表】【table】
【表】
上述の説明からも明らかなように、本発明を適
用することにより従来のBLコンデンサとは比較
にならないほど優れた特性のコンデンサを得るこ
とができる。
すなわち、BaTiO3を添加することにより、得
られる多結晶性半導体粒界絶縁型誘電体の絶縁抵
抗が大幅に向上し、静電容量の温度変化率も極め
て小さなものとななるとともに、tan δも低下
する。さらに、Nb2O5やTa2O5を添加し、SiO2を
添加することにより、半導体化や結晶成長が促進
され、誘電率が大きなものとなる。
したがつて、この多結晶性磁器半導体粒界絶縁
型誘電体を誘電体として使用することによつて、
耐熱性に優れ、例えばチユーナに使用した際にフ
イルタの周波数特性が温度の変化によつて変動す
ることのないような半導体磁器粒界絶縁型コンデ
ンサを得ることができる。[Table] As is clear from the above description, by applying the present invention, it is possible to obtain a capacitor with characteristics far superior to that of conventional BL capacitors. In other words, by adding BaTiO 3 , the insulation resistance of the resulting polycrystalline semiconductor grain boundary insulated dielectric material is greatly improved, the temperature change rate of capacitance becomes extremely small, and tan δ also decreases. descend. Further, by adding Nb 2 O 5 or Ta 2 O 5 and adding SiO 2 , semiconductor formation and crystal growth are promoted, and the dielectric constant becomes large. Therefore, by using this polycrystalline ceramic semiconductor grain boundary insulated dielectric as a dielectric,
It is possible to obtain a semiconductor porcelain grain boundary insulated capacitor which has excellent heat resistance and whose filter frequency characteristics do not change due to changes in temperature when used in a tuner, for example.
第1図はNb2O5の添加量と半導体化の関係を示
すグラフ、第2図はSiO2添加量と平均結晶粒径
の関係を示すグラフ、第3図はBaTiO3添加量と
諸特性の関係を示すグラフである。
Figure 1 is a graph showing the relationship between the amount of Nb 2 O 5 added and semiconductor formation, Figure 2 is a graph showing the relationship between the amount of SiO 2 added and average grain size, and Figure 3 is the amount of BaTiO 3 added and various characteristics. It is a graph showing the relationship between.
Claims (1)
少なくとも一種を0.05〜5重量%含有するととも
にSiO2を0.02〜1重量%とBaTiO3を0.5〜20重量
%含有してなり粒界層が絶縁体化された半導体磁
器を誘電体とする半導体磁器粒界絶縁型コンデン
サ。1 SrTiO 3 as the main component, containing 0.05 to 5% by weight of at least one of Nb 2 O 5 and Ta 2 O 5 , and 0.02 to 1% by weight of SiO 2 and 0.5 to 20% by weight of BaTiO 3 A semiconductor porcelain grain boundary insulated capacitor whose dielectric material is semiconductor porcelain with an insulating grain boundary layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50086905A JPS5210597A (en) | 1975-07-16 | 1975-07-16 | Insulated grain boundary type piezo-electric substance of polycrystall ine ceramic semiconductor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50086905A JPS5210597A (en) | 1975-07-16 | 1975-07-16 | Insulated grain boundary type piezo-electric substance of polycrystall ine ceramic semiconductor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5210597A JPS5210597A (en) | 1977-01-26 |
| JPS6128209B2 true JPS6128209B2 (en) | 1986-06-28 |
Family
ID=13899843
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50086905A Granted JPS5210597A (en) | 1975-07-16 | 1975-07-16 | Insulated grain boundary type piezo-electric substance of polycrystall ine ceramic semiconductor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5210597A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5461720A (en) * | 1977-10-27 | 1979-05-18 | Nissan Motor Co Ltd | Device for securing wheelchair on wheelchair transport vihicle |
| NL7802690A (en) * | 1978-03-13 | 1979-09-17 | Philips Nv | SINTER BODY OF SEMICONDUCTIVE CERAMIC MATERIAL BASED ON NIOOB OR TANTAL DOTATED STRONTIUM TITANATE, WITH ELECTRIC INSULATING LAYERS ON THE GRANULAR BORDERS. |
| JPS5654025A (en) * | 1979-10-09 | 1981-05-13 | Murata Manufacturing Co | Grain boundary insulating type semiconductor porcelain composition |
| JPS5654024A (en) * | 1979-10-09 | 1981-05-13 | Murata Manufacturing Co | Grain boundary insulating type semiconductor porcelain composition |
-
1975
- 1975-07-16 JP JP50086905A patent/JPS5210597A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5210597A (en) | 1977-01-26 |
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