JPS613059A - Determination of flaw position for ultrasonic flaw - Google Patents
Determination of flaw position for ultrasonic flawInfo
- Publication number
- JPS613059A JPS613059A JP59124819A JP12481984A JPS613059A JP S613059 A JPS613059 A JP S613059A JP 59124819 A JP59124819 A JP 59124819A JP 12481984 A JP12481984 A JP 12481984A JP S613059 A JPS613059 A JP S613059A
- Authority
- JP
- Japan
- Prior art keywords
- probe
- flaw
- axis
- weld line
- position coordinates
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
- G01N29/265—Arrangements for orientation or scanning by relative movement of the head and the sensor by moving the sensor relative to a stationary material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/30—Arrangements for calibrating or comparing, e.g. with standard objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02854—Length, thickness
Landscapes
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Molecular Biology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
Description
【発明の詳細な説明】
この発明は、被検材の溶接部に存在する欠陥の位置を探
触子の移動走査により算出する超音波探傷における傷位
置割出し方法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a flaw position indexing method in ultrasonic flaw detection in which the position of a flaw existing in a welded part of a material to be inspected is calculated by moving and scanning a probe.
一般に、超音波探傷においては、被検材の溶接部に沿っ
て探触子をジグザグに走行させ、この探触子からの信号
を探傷器にCRT表示し、(のエコー画像を熟視してエ
コーの高さとビーム路程とから欠陥を判断するとともK
、探触子を移動させながら傷のスタート点とエンド点會
見つけ出してメジャーで実測することにより欠陥の長さ
全割出し、さらにその傷のエコーの一番高い位Qj t
−探触子の首振り動作させて見つけ出し、その時のエコ
ーの高さ七ビーム路程全読取って探触子の位IRkメジ
ャーで実測して記録し、これら記録内容の探触子の位置
、ビーム程度と被検材の板厚から計算により傷位置金側
出すことが行なわれている。Generally, in ultrasonic flaw detection, a probe is run in a zigzag pattern along the welded part of the test material, the signal from this probe is displayed on a CRT on a flaw detector, and the echo image of ( The defect is determined from the echo height and beam path.
, while moving the probe, find the starting point and end point of the flaw and measure it with a tape measure to find out the total length of the flaw, and then find the highest point of the echo of the flaw, Qj t.
- Find it by swinging the probe, read the height of the echo at that time, read all seven beam paths, measure the probe position with an IRk measure, record it, and record the recorded content of the probe position and beam level. The flaws are located on the gold side by calculation based on the thickness of the material to be inspected.
しかしながら、上記した従来の超音波探傷における傷位
置の割出し手段にあっては、CRT表示される探傷器の
読取りに熟練全装し、個人的な読取り誤差が非常に大き
いことから、記録ミスや計算ミスなどを惹起し易く、こ
のため探傷精度が低いばかりでなく、作業性も悪いなど
、種々の問題があった。However, with the above-mentioned conventional flaw position indexing means in ultrasonic flaw detection, it is difficult to read the flaw detector displayed on a CRT by a skilled person, and the personal reading error is very large. It is easy to cause calculation errors, and as a result, there are various problems such as low flaw detection accuracy and poor workability.
また、従来、例えば0開昭48−40495号公報など
に開示されているように、探触子を被検材の溶接部に沿
って平行に自走させることにより、超音波探傷全自動的
に行ない、欠陥位置全測定し得るようにした走査装置が
周知でちるが、この種のものでは、走査装置全被検材上
の溶接線に沿って平行に設置する必要があり、その位置
決めに高い精度が要求されるなどの不都合がある。In addition, conventionally, as disclosed in, for example, Japanese Patent No. 48-40495, ultrasonic flaw detection can be carried out fully automatically by moving a probe parallel to the welded part of the test material. There is a well-known scanning device that can measure all the defect positions by scanning, but in this type of device, it is necessary to install the scanning device parallel to the weld line on all the materials to be inspected, and the positioning is expensive. There are disadvantages such as the need for precision.
この発明は、上記の事情のもとになされたもので、その
目的とするところは、被検材の溶接部に対する探触子に
よる探傷データ及び位置データを自動的に取込み、かつ
この取込まれた探触子の各種データに基づき傷の位#、
全自動的に演算処理して割出すとともに、被検材上への
走査装置の設置がランダムに行なえるようにした超音波
探傷における傷位置割出し方法全提供することにある。This invention was made under the above circumstances, and its purpose is to automatically import flaw detection data and position data using a probe for a welded part of a material to be inspected, and to Based on various data of the probe, the number of scratches is
It is an object of the present invention to provide a complete method for determining flaw positions in ultrasonic flaw detection, which performs fully automatic calculation processing and is capable of randomly placing a scanning device on a material to be inspected.
上記した目的?達成させるために、この発明は、被検材
の溶接線に沿って設置されるX軸フレームの軸方向に可
動自在に設けたY軸フレームに、探触子を軸方向に可動
自在にかつ首振り回動自在に保持させた走査装置を備え
、該走査装置の探触子による探傷データ及び位置データ
をデータ収録装置の記憶媒体に収録するとともに、該記
憶媒体に収録したデータ情報をデータ処理装置に別途入
力してデータ解析処理を行々う超音波探傷手段において
、前記探触子の入射点を被検材の溶接線上の第1の基準
点に合せてX軸・Y軸の位置座標及び首振シ角度がOの
スケール基準点として取込み、次いで該第1の基準点か
ら前記探触子の入射点を溶接線−ヒの任意の点である第
2の基準点に合せてそのX軸・Y軸の位置座標を取込ん
で前記第1の基準点の位置座標とにより走査装置自体の
溶接線に対する設置角度を求め、該走査装置の設置角度
に基づいて欠陥検出位置における溶接線全基準にした探
触子の入射点の位置座標を求めるとともに、予め設定さ
れた探触子の斜角と傷1でのビーム路程により探触子か
ら傷位置までの平面上の直線距離を求め、これら探触子
の入射点の溶接線を基準とした位置座標1首振り角度及
び傷位置までの平面−ヒのw線距離から偏位[1割出し
得るようにしてなる構成を有し、これによって被検材の
#接部の傷位置全自動的に割出す仁とが可能になり、探
傷精度及び作業能率を高めるととも罠、走査装置が被検
材の溶接線に対して非平行なうンダムな状態に設置可能
になるといった大なる効果全期待することができるもの
である。The purpose mentioned above? In order to achieve this, the present invention provides a probe that is movable in the axial direction and attached to the Y-axis frame that is movable in the axial direction of the X-axis frame that is installed along the weld line of the material to be tested. It is equipped with a scanning device held in a swingable manner, and records flaw detection data and position data from the probe of the scanning device in a storage medium of a data recording device, and also records data information recorded in the storage medium in a data processing device. In the ultrasonic flaw detection means, which performs data analysis processing by inputting data separately to the Take the head oscillation angle as a scale reference point of O, and then align the incident point of the probe from the first reference point to a second reference point, which is an arbitrary point on the welding line, and adjust its X axis. - Incorporate the Y-axis position coordinates and use the position coordinates of the first reference point to determine the installation angle of the scanning device itself with respect to the weld line, and determine the entire weld line reference at the defect detection position based on the installation angle of the scanning device. In addition to finding the positional coordinates of the incident point of the probe that has been set to It has a configuration in which the position coordinate of the incident point of the probe with respect to the weld line is 1, and the deviation [1] can be determined from the swing angle and the w-line distance between the plane and the scratch position. It is now possible to fully automatically determine the flaw location at the # contact part of the material to be inspected, which improves flaw detection accuracy and work efficiency, and also prevents the trap and scanning device from being placed non-parallel to the weld line of the material to be inspected. We can expect great effects such as being able to install it in a safe condition.
以下、この発明全図示の一実施例に基づいて詳細に説明
する。EMBODIMENT OF THE INVENTION Hereinafter, this invention will be described in detail based on an embodiment fully illustrated.
第1図に示すように、図中1は超音波探傷データ収納装
置で、後述する走査装置による被検材G上の探傷信号に
基づいて超音波探傷器2にCRT表示すると同時に出力
されるビーム路程及びエコー高さ等の探傷データと、探
触子のX軸・Y軸及び首振り角度等の位置データを取込
み、これら各種データをカセットテープまたはフロッピ
ーデイスフ等の記憶媒体に収録し得るようになっている
とともに、この記憶媒体に収録された探傷データ及び位
置データをデータ処理装置3に入力し解析して傷の位置
あるいは等数分類等を自動的に行ないプリントアウトし
得るように構成されている。As shown in FIG. 1, reference numeral 1 in the figure is an ultrasonic flaw detection data storage device, which outputs a beam to an ultrasonic flaw detector 2 at the same time as displaying it on a CRT based on a flaw detection signal on a test material G by a scanning device, which will be described later. Captures flaw detection data such as path length and echo height, and position data such as the X-axis, Y-axis and swing angle of the probe, and records these various data on a storage medium such as a cassette tape or floppy disc. In addition, the flaw detection data and position data recorded on this storage medium are input to the data processing device 3, analyzed, and automatically classified into flaw positions or equal numbers, etc., and printed out. ing.
上記した走査装置4は、第2図に示すように、被検材G
の溶接線T’−Tに沿う左右方向に設置されるX軸フレ
ーム5と、このX軸フレーム5の軸方向に沿って設けた
ガイドレール6に直りするように連結されたY軸フレー
ム7とからなり、このY軸フレーム7の基端部7aVi
、、前記ガイドレール6に係合する案内ローラ8,8を
介して左右可動自在になっている。そして、前記Y軸フ
レーム7には、スライドレール9が軸方向に沿う前後方
向に配設され、このスライドレール9には、スライダ1
0に固定した支持アーム11を介して探触子用ホルダー
12が可動自在に取付けられているとともに、前記支持
アーム11は、被検材Gの鉛直面に対して水平回動自在
な第1のリンク110に前記ホルダー12を左右揺動自
在に軸支させ、かつこの第1のリンク110に、前記ス
ライドレール9の中心軸廻りに上下回動自在な第2のリ
ンク111に軸着してなる構成を有し、これによって前
記ホルダー12は、前後左右及び上下方向に揺動自在に
なっている。さらに、前記ホルダー12には、探触子1
3が着脱自在に装着され、との探触子13は操作杆14
を介して前記被検材Gの探傷面に対して水平方向に首振
り回動自在になっている。As shown in FIG. 2, the above-mentioned scanning device 4 is configured to
An X-axis frame 5 installed in the left-right direction along the welding line T'-T, and a Y-axis frame 7 straightly connected to a guide rail 6 provided along the axial direction of the X-axis frame 5 The base end 7aVi of this Y-axis frame 7
,, is movable left and right via guide rollers 8, 8 that engage with the guide rail 6. A slide rail 9 is disposed on the Y-axis frame 7 in the front-rear direction along the axial direction, and the slide rail 9 includes a slider 1.
A probe holder 12 is movably attached via a support arm 11 fixed at 0, and the support arm 11 is attached to a first support arm 12 which is horizontally rotatable with respect to the vertical plane of the specimen G. The holder 12 is pivotally supported by a link 110 so as to be swingable left and right, and a second link 111 which is movable up and down about the central axis of the slide rail 9 is pivoted to the first link 110. This allows the holder 12 to swing freely in the front, rear, left, right, and up and down directions. Further, the holder 12 includes a probe 1.
3 is removably attached, and the probe 13 is attached to the operating rod 14.
It can swing freely in the horizontal direction with respect to the flaw detection surface of the material G to be inspected.
すなわち、上記走査装置4は、X軸フレーム5に対する
Y軸フレーム7の可動位置、Y軸フレーム7に対する探
触子13の可動位置及び探触子13の首振り角度θとい
った位置データや被検材Gの欠陥検出位置におけるビー
ム路程W及びエコー高さEといった探傷データをデータ
収録装置1に取込むための前後走査、左右走査1首振り
走査、振子走査、ジグザグ走査、平行走査及び斜め平行
走査のすべて全行なうことを可能にしてなるものである
。That is, the scanning device 4 scans position data such as the movable position of the Y-axis frame 7 with respect to the X-axis frame 5, the movable position of the probe 13 with respect to the Y-axis frame 7, and the swing angle θ of the probe 13, and the specimen material. Back and forth scanning, left and right scanning, 1 swinging scan, pendulum scanning, zigzag scanning, parallel scanning and diagonal parallel scanning in order to import flaw detection data such as beam path length W and echo height E at the defect detection position of G into the data recording device 1. It makes it possible to do everything.
次に、上記走査装置4による探傷走査手段及び傷位置割
出し手段について、第3図から第6図を参照しながら具
体的に説明フる。Next, the flaw detection scanning means and flaw position indexing means by the scanning device 4 will be explained in detail with reference to FIGS. 3 to 6.
咬ず、上記ホルダー12の操作杆14の回転軸に探触子
13の入射点P′l!ニ一致させて装着した走査装置4
を、第3図に示すように、被検材G上に設置する。この
とき、X軸フレーム5は、被検材Gの溶接線T−Tに対
して非平行なうンダムな状態に位置決めされる。次に、
第4図にフローチャートで示すように、探触子13の入
射点P’に被検材Gの溶接線T−T上の第1の基準点と
なるA点に合せ、かつこのときの首4辰り角度θを0度
の目盛にセットした後(STI)、A点のY軸・Y@の
位置座標fcA(0,0)にしてスケール、&単点をセ
ットする(Sr2)。次いで、探触子130入射点P全
溶接線T−T上の任意の点B、つまりX軸フレーム5の
長さ範囲の適宜の点である第2の基準点に合せて(Sr
3)、そのY軸・Y軸の位1斤座標(XB、YB)を取
込んだ後(Sr1)、探触子13を手動によりジグザグ
走査して探傷を開始する(Sr1)。The incident point P'l of the probe 13 is placed on the rotation axis of the operating rod 14 of the holder 12 without interfering with it! (d) Scanning device 4 mounted in a matching manner.
is placed on the test material G as shown in FIG. At this time, the X-axis frame 5 is positioned in a random state non-parallel to the welding line TT of the test material G. next,
As shown in the flowchart in FIG. After setting the merging angle θ to the 0 degree scale (STI), set the Y-axis/Y@ position coordinates of point A to fcA (0, 0) and set the scale and single point (Sr2). Next, the incident point P of the probe 130 is aligned with a second reference point which is an arbitrary point B on the entire welding line TT, that is, an appropriate point in the length range of the X-axis frame 5 (Sr
3) After acquiring the coordinates (XB, YB) of the Y-axis and Y-axis (Sr1), flaw detection is started by manually scanning the probe 13 in a zigzag pattern (Sr1).
仁のとき、超音波探傷器2から探触子13全介して被検
材Gの内部へ超音波パルスが所定の斜角(屈折角)φで
発射され(Sr1)、被検材Gの溶接部内の欠陥(wj
)に当った超音波エコー信号が探触子13全介して電気
信号に変換されて超音波探傷器2に返ってくると(Sr
1)、超音波探傷器2でその傷の解析をしてCRT表示
し、データ収録装を道1にそのときのビーム路程W及び
エコー高さEといった探傷データ全出力しく5T8)、
その探傷データが有効傷であるか否かの判断全行なう(
Sr9)。At this time, an ultrasonic pulse is emitted from the ultrasonic flaw detector 2 through the probe 13 into the interior of the material G to be tested at a predetermined oblique angle (refraction angle) φ (Sr1), and the material G to be welded is welded. Defects within the department (wj
) is converted into an electrical signal through the probe 13 and returned to the ultrasonic flaw detector 2.
1) Analyze the flaw with the ultrasonic flaw detector 2 and display it on the CRT, and output all the flaw detection data such as the beam path W and echo height E to the data recording device 5T8).
Make a complete judgment as to whether the flaw detection data is a valid flaw or not (
Sr9).
そして、前記傷が有効傷でなければSr1の処理に戻り
、前記した各動作金縁返し行なう一方、有効傷と判断さ
れた場合には、その探傷データW・Eと走査装置4にお
けるX軸フレーム5及びY軸フレーム7上のY軸・Y軸
の位置座標N (Xo 、Yo )及び首振り角度θと
いった位置データf f−夕収録装置1に取込む(ST
IO)。次いで、このような被検材Gの溶接部全域に亘
って行なわれたか否かを判断しく5TII)、終了して
いなければSr1の処理に戻り、終了していればデータ
収録装置】内に取込まれた探傷データ及び位置データを
カセットテープあるいはフロッピディスタ等の記憶媒体
に収録する(ST12)。If the flaw is not a valid flaw, the process returns to Sr1 and the above-mentioned operations are repeated, while if it is determined to be a valid flaw, the flaw detection data W and E and the X-axis frame 5 in the scanning device 4 are processed. The position data f such as the position coordinates N (Xo, Yo) of the Y-axis and Y-axis on the Y-axis frame 7 and the swing angle θ are imported into the recording device 1 (ST
IO). Next, it is determined whether or not the welding has been performed over the entire area of the test material G (5TII), and if it has not been completed, the process returns to Sr1, and if it has been completed, it is recorded in the data recording device. The loaded flaw detection data and position data are recorded on a storage medium such as a cassette tape or a floppy disc (ST12).
このように探傷現場において収録さJした被検材Gの探
傷データ及び位置データ鉱、データ処理装置3に別途入
力され解析処理が行なわれるもので、傷位置の割出しに
ついては、第5図にフローチャートで示すように、まず
探傷データによるビーム路程Wと、予めインプットされ
た探触子13の斜角φモニタにより、第6図に示すよう
に、探触子13の入射点Pから偏位[Q−1での平面上
の直線距離りを求め(ST13);
L =Wo sinφ −〕 W0 °ビーム路程、
φ、斜角ここで、 W、=WxV/2 W:5T
10で読込1れたビーム路程〔μs〕
■=音速(m/s)
次いで、A点・B点における位置データにより走査装f
t4の被検材G上への溶接線T−Tに対する設置角度α
を求め(ST14);
に=/770]ζ;’ K:A点・B点間の距離さら
に、この走査装置ぺ1の設置角度αと位置データN(X
、 、Y、 )VCより溶接@T −T(5基準とした
探触子13の入射点Pの位置座標N(XI 、Yl )
w求めた後(SrI2);
Yl = (Yo −Xo ・tana ) −saこ
れら探触子13の首振り角度θと、溶接線を基準とした
位置座標N(X、 、Y、 Jと平面上の直線距離りと
から下記の式を満たすような傷の位1i1Q(X、Y)
を求め(ST16)、
Yl = (Yo −Xo ・―α)・■α−L■(θ
−α) ゛これをプリントアウトしてなるもので
ある。In this way, the flaw detection data and position data of the test material G recorded at the flaw detection site are separately input to the data processing device 3 for analysis processing. As shown in the flowchart, first, the beam path length W based on the flaw detection data and the oblique angle φ monitor of the probe 13 inputted in advance are used to calculate the deviation [ from the incident point P of the probe 13, as shown in FIG. Find the straight line distance on the plane at Q-1 (ST13); L = Wo sinφ −] W0 ° beam path,
φ, oblique angle where: W, = WxV/2 W: 5T
Beam path length [μs] read in step 10 = sound speed (m/s) Next, the scanning device f is determined based on the position data at points A and B.
Installation angle α with respect to welding line T-T on test material G at t4
(ST14); = /770]ζ;' K: Distance between points A and B. Furthermore, the installation angle α and position data N(X
, , Y, ) Welding from VC @ T - T (Position coordinates N (XI, Yl) of the incident point P of the probe 13 based on 5 standards
After w is determined (SrI2); From the straight line distance ri, find the flaw size 1i1Q(X,Y) that satisfies the following formula:
(ST16), Yl = (Yo −Xo ・−α)・■α−L■(θ
-α) ゛This is what you print out.
ところで、傷の深さdf求めるにおいては、第6図に示
すように、5T13で求めた探触子13の入射点Pから
傷位置Q1での平面上の直線距離りの他に、スキップ点
までの距離Llを求め;L、=t、X−φ
t、:被検材の板厚
φ :探触子の斜角(屈折角)
さらに傷位置までのスキップ倍数S全求め;5=INT
(L/L+ )
このスキップ倍数Sの値が奇数の場合には、d−t、(
S+1)−W(1(2)φ
またスキップ倍数Sが偶数の場合には
d=Woamφ−t、−8
の式から求めてなるものである。By the way, in determining the flaw depth df, as shown in Fig. 6, in addition to the straight line distance on the plane from the incident point P of the probe 13 found in 5T13 to the flaw position Q1, we also calculate the distance from the skip point to the skip point. Find the distance Ll; L, = t,
(L/L+) If the value of this skip multiple S is an odd number, d-t, (
S+1)-W(1(2)φ Also, when the skip multiple S is an even number, it is obtained from the formula d=Woamφ-t, -8.
したがって、上記したこの発明に係る構成によれば、A
点・B点からなる溶接線T−T上の2点の基準点の設定
によって走査装置4の設置角度αを算出し、この設置角
度αに基づいて溶接線T−Tt−基準とした位置座標に
変換してなることから、走査装置4の被検材G上への設
置がランダムに行なえ、設置作業が簡便にでき、またり
動部は直線的な走行動作を採用していることから、三角
関数による計算式も簡単になり、演算処理が迅速にでき
るなどの作用・効果を奏するものである。Therefore, according to the configuration according to the present invention described above, A
The installation angle α of the scanning device 4 is calculated by setting two reference points on the welding line T-T consisting of points and points B, and based on this installation angle α, the position coordinates are determined based on the welding line T-Tt. Since the scanning device 4 can be installed randomly on the material G to be inspected, the installation work can be done easily, and since the moving parts adopt a linear traveling motion, Calculation formulas using trigonometric functions can be simplified, and calculation processing can be performed quickly.
第1図はこの発明に係る走査装置を用いた超音波探傷ノ
ステムの全体構成を示す説明図、第2図は走査装置の全
体図、第3図は走査装置の被検材上への設置状態及び探
触子の探傷位置座標を示す説明図、第4図は探傷動作を
示すフローチャート、第5図は傷位置の割出し手段を示
すフローチャート、第6図は被検材上の探触子の入射点
と傷位置との関係を示す説明図である。
1・・データ収録装置、2・・・超音波探傷器、3・・
・データ処理装置、4・・・走査装置、5・・・X軸フ
レーム、7・・・Y軸フレーム、13・・探触子、G・
・・被検材、T−T・・・溶接線、A・・・第1の基準
点、B・・・第2の基準点、P・・・入射点、Q・・・
傷位置、(Xo 、Yo )・・走査装置を基準とした
探触子の位置座標、(Xl。
Yl )・・・溶接線を基準とした探触子の位置座標、
α・・・溶接線に対する走査装置の設置角度、θ・・・
探触子の首振り角度、φ・・探触子の斜角(屈折角)、
L・・探触子の入射点から傷までの平面上の直線距離、Fig. 1 is an explanatory diagram showing the overall configuration of an ultrasonic flaw detection system using a scanning device according to the present invention, Fig. 2 is an overall view of the scanning device, and Fig. 3 is a state in which the scanning device is installed on a material to be inspected. FIG. 4 is a flowchart showing the flaw detection operation, FIG. 5 is a flowchart showing flaw position indexing means, and FIG. 6 is an explanatory diagram showing the flaw detection position coordinates of the probe. FIG. 3 is an explanatory diagram showing a relationship between an incident point and a flaw position. 1...Data recording device, 2...Ultrasonic flaw detector, 3...
- Data processing device, 4... Scanning device, 5... X-axis frame, 7... Y-axis frame, 13... Probe, G.
...Test material, T-T...Welding line, A...First reference point, B...Second reference point, P...Incidence point, Q...
Flaw position, (Xo, Yo)... positional coordinates of the probe with respect to the scanning device, (Xl. Yl)... positional coordinates of the probe with respect to the weld line,
α... Installation angle of the scanning device with respect to the welding line, θ...
Probe swing angle, φ...probe oblique angle (refraction angle),
L: Straight line distance on a plane from the point of incidence of the probe to the flaw,
Claims (1)
向に可動自在に設けたY軸フレームに、探触子を軸方向
に可動自在にかつ首振り回動自在に保持させた走査装置
を備え、該走査装置の探触子による探傷データ及び位置
データをデータ収録装置の記憶媒体に収録するとともに
、該記憶媒体に収録したデータ情報をデータ処理装置に
別途入力してデータ分析処理を行なう超音波探傷手段に
おいて、前記探触子の入射点Pを被検材の溶接線上の第
1の基準点Aに合せてX軸・Y軸の位置座標及び首振り
角度θが0のスケール基準点として取込み、次いで該第
1の基準点Aから前記探触子の入射点を溶接線上の任意
の点である第2の基準点Bに合せてそのX軸・Y軸の位
置座標を取込んで前記第1の基準点Aの位置座標とによ
り走査装置自体の溶接線に対する設置角度αを求め、該
走査装置の設置角度αに基づいて欠陥検出位置における
溶接線を基準にした探触子の入射点の位置座標N(X_
1、Y_1)を求めるとともに、予め設定された探触子
の斜角φと傷までのビーム路程Wにより探触子の入射点
から傷位置Qまでの平面上の直接距離Lを求めて該傷位
置Qの溶接線に対する位置座標(X_2、Y_2)が下
記の式を満足するようにしたことを特徴とする超音波探
傷における傷位置割出し方法; X_2=Lsin(θ−α)+(Y_0−X_0・ta
nα)・sinα+X_0/cosα Y_2=(Y_0−X_0−tanα)・cosα−L
cos(θ−α) 但し、(X_0、Y_0):傷位置での探触子の走査装
置を基準としたX軸・Y軸の位置座標[Scope of Claims] A probe is attached to a Y-axis frame that is movable in the axial direction of an X-axis frame that is installed along the welding line of the material to be inspected, and the probe is movable in the axial direction and can be oscillated. Equipped with a scanning device that can be held freely, flaw detection data and position data from the probe of the scanning device are recorded on a storage medium of a data recording device, and the data information recorded on the storage medium is separately input to a data processing device. In an ultrasonic flaw detection means that performs data analysis processing, the incident point P of the probe is aligned with the first reference point A on the weld line of the test material, and the position coordinates of the X-axis and Y-axis and the swing angle are determined. Take it as a scale reference point where θ is 0, and then align the incident point of the probe from the first reference point A to the second reference point B, which is an arbitrary point on the welding line, and adjust its X-axis and Y-axis. The installation angle α of the scanning device itself with respect to the weld line is obtained by taking in the position coordinates of the first reference point A, and the weld line at the defect detection position is referenced based on the installation angle α of the scanning device. The position coordinates N(X_
1, Y_1), and the direct distance L on the plane from the incident point of the probe to the scratch position Q using the preset probe oblique angle φ and the beam path length W to the scratch. A flaw position indexing method in ultrasonic flaw detection characterized in that the position coordinates (X_2, Y_2) of position Q with respect to the weld line satisfy the following formula: X_2=Lsin(θ-α)+(Y_0- X_0・ta
nα)・sinα+X_0/cosα Y_2=(Y_0−X_0−tanα)・cosα−L
cos(θ-α) However, (X_0, Y_0): X-axis and Y-axis position coordinates based on the scanning device of the probe at the scratch position
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59124819A JPS613059A (en) | 1984-06-18 | 1984-06-18 | Determination of flaw position for ultrasonic flaw |
| US07/021,576 US4742713A (en) | 1984-06-01 | 1987-03-02 | Ultrasonic flaw detecting system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59124819A JPS613059A (en) | 1984-06-18 | 1984-06-18 | Determination of flaw position for ultrasonic flaw |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS613059A true JPS613059A (en) | 1986-01-09 |
Family
ID=14894892
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59124819A Pending JPS613059A (en) | 1984-06-01 | 1984-06-18 | Determination of flaw position for ultrasonic flaw |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS613059A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011513719A (en) * | 2008-02-26 | 2011-04-28 | シーメンス アクチエンゲゼルシヤフト | Non-destructive material inspection system for inspection object by ultrasonic |
-
1984
- 1984-06-18 JP JP59124819A patent/JPS613059A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011513719A (en) * | 2008-02-26 | 2011-04-28 | シーメンス アクチエンゲゼルシヤフト | Non-destructive material inspection system for inspection object by ultrasonic |
| US8418562B2 (en) | 2008-02-26 | 2013-04-16 | Siemens Aktiengesellschaft | Device for nondestructive material testing of a test subject using ultrasonic waves |
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