JPS6136628B2 - - Google Patents

Info

Publication number
JPS6136628B2
JPS6136628B2 JP54037503A JP3750379A JPS6136628B2 JP S6136628 B2 JPS6136628 B2 JP S6136628B2 JP 54037503 A JP54037503 A JP 54037503A JP 3750379 A JP3750379 A JP 3750379A JP S6136628 B2 JPS6136628 B2 JP S6136628B2
Authority
JP
Japan
Prior art keywords
transistor
test
level
semiconductor device
turned
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54037503A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55129771A (en
Inventor
Kazuhiro Kakihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP3750379A priority Critical patent/JPS55129771A/ja
Publication of JPS55129771A publication Critical patent/JPS55129771A/ja
Publication of JPS6136628B2 publication Critical patent/JPS6136628B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3750379A 1979-03-29 1979-03-29 Semiconductor test unit Granted JPS55129771A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3750379A JPS55129771A (en) 1979-03-29 1979-03-29 Semiconductor test unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3750379A JPS55129771A (en) 1979-03-29 1979-03-29 Semiconductor test unit

Publications (2)

Publication Number Publication Date
JPS55129771A JPS55129771A (en) 1980-10-07
JPS6136628B2 true JPS6136628B2 (2) 1986-08-19

Family

ID=12499317

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3750379A Granted JPS55129771A (en) 1979-03-29 1979-03-29 Semiconductor test unit

Country Status (1)

Country Link
JP (1) JPS55129771A (2)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5462228B2 (ja) * 2011-09-21 2014-04-02 Ｎｅｃエンジニアリング株式会社 半導体試験装置及び半導体試験方法

Also Published As

Publication number Publication date
JPS55129771A (en) 1980-10-07

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