JPS55129771A - Semiconductor test unit - Google Patents

Semiconductor test unit

Info

Publication number: JPS55129771A
Authority: JP; Japan
Prior art keywords: test; section; semiconductor element; tested semiconductor; socket
Prior art date: 1979-03-29
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

JP3750379A

Other languages

English (en)

Japanese (ja)

Other versions

JPS6136628B2 (2

Inventor

Kazuhiro Kakihara

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Toshiba Corp

Original Assignee

Toshiba Corp

Tokyo Shibaura Electric Co Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1979-03-29

Filing date

1979-03-29

Publication date

1980-10-07

1979-03-29 Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp

1979-03-29 Priority to JP3750379A priority Critical patent/JPS55129771A/ja

1980-10-07 Publication of JPS55129771A publication Critical patent/JPS55129771A/ja

1986-08-19 Publication of JPS6136628B2 publication Critical patent/JPS6136628B2/ja

Status Granted legal-status Critical Current

Links

239000004065 semiconductor Substances 0.000 title abstract 6
238000001514 detection method Methods 0.000 abstract 5
238000003780 insertion Methods 0.000 abstract 2
230000037431 insertion Effects 0.000 abstract 2

Landscapes

Testing Of Individual Semiconductor Devices (AREA)
Testing Or Measuring Of Semiconductors Or The Like (AREA)

JP3750379A 1979-03-29 1979-03-29 Semiconductor test unit Granted JPS55129771A (en)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP3750379A JPS55129771A (en)	1979-03-29	1979-03-29	Semiconductor test unit

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP3750379A JPS55129771A (en)	1979-03-29	1979-03-29	Semiconductor test unit

Publications (2)

Publication Number	Publication Date
JPS55129771A true JPS55129771A (en)	1980-10-07
JPS6136628B2 JPS6136628B2 (2)	1986-08-19

Family

ID=12499317

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP3750379A Granted JPS55129771A (en)	1979-03-29	1979-03-29	Semiconductor test unit

Country Status (1)

Country	Link
JP (1)	JPS55129771A (2)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2013068474A (ja) *	2011-09-21	2013-04-18	Nec Engineering Ltd	半導体試験装置及び半導体試験方法

1979
- 1979-03-29 JP JP3750379A patent/JPS55129771A/ja active Granted

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2013068474A (ja) *	2011-09-21	2013-04-18	Nec Engineering Ltd	半導体試験装置及び半導体試験方法

Also Published As

Publication number	Publication date
JPS6136628B2 (2)	1986-08-19

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