JPS6153577A - Partial discharge measuring apparatus - Google Patents
Partial discharge measuring apparatusInfo
- Publication number
- JPS6153577A JPS6153577A JP17545484A JP17545484A JPS6153577A JP S6153577 A JPS6153577 A JP S6153577A JP 17545484 A JP17545484 A JP 17545484A JP 17545484 A JP17545484 A JP 17545484A JP S6153577 A JPS6153577 A JP S6153577A
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- Prior art keywords
- circuit
- discharge
- values
- charge
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Testing Relating To Insulation (AREA)
- Protection Of Static Devices (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の鵜する技術分野〕
本発明は高電圧電気機器絶縁あるいは使用絶縁材の部分
放電試験ζこ用いられる部分放電測定装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Technical field to which the invention pertains] The present invention relates to a partial discharge measuring device used for partial discharge testing of high voltage electric equipment insulation or insulating materials used.
陽電圧電気機器の固体絶縁物からなる絶縁中に気泡やき
裂などの欠陥が存在すると、電気機器に電圧を印加した
際上記欠陥中の気体が火花放電を起こしていわゆる部分
放電が発生する。そこでこの部分放電によって試験回路
に流れる放電パルスを検出し、その放電電荷量、放電開
始電圧、放電消滅電圧、単位時間当りの放−パルス数(
パルス発生頻度)等を測定すれば、これらの諸量から絶
縁中の欠陥の大きさや形状をおよそ推定することができ
るとともlこ、運転中の機器について冗期的な測定を繰
返すことにより絶縁の経年劣化をも推定することができ
る。このような理由から部分放電試験は高電圧1B気機
器絶縁の非破壊検光法あるいは絶縁診断法として広く知
られており、この部分放電試験に用いられる部分放電測
定装置も種々のものが市販されている(たとえば、日本
計611j器製造所製CD−5/PDC−5形測定器)
。If defects such as bubbles or cracks are present in the insulation made of solid insulators of positive voltage electrical equipment, when voltage is applied to the electrical equipment, the gas in the defects causes spark discharge, resulting in so-called partial discharge. Therefore, the discharge pulse flowing through the test circuit due to this partial discharge is detected, and the amount of discharge charge, discharge starting voltage, discharge extinction voltage, and number of discharge pulses per unit time (
By measuring pulse generation frequency), it is possible to roughly estimate the size and shape of defects in insulation from these quantities. It is also possible to estimate deterioration over time. For these reasons, partial discharge testing is widely known as a nondestructive analysis method or insulation diagnostic method for high-voltage 1B electrical equipment insulation, and various partial discharge measurement devices are commercially available for use in this partial discharge test. (For example, CD-5/PDC-5 type measuring instrument manufactured by Nippon Kei 611j Instrument Manufacturing Co., Ltd.)
.
第5図は部分放電試験回路に接続された従来の部分放電
測定装置の構成を示す概念図である。図において、1は
被検体で、阻波器4を介して交流高電圧電源2をこ接続
されるとともに、被検体1と、結合コンデンサ3と、部
分放電測定器@、10の入力回路5とからなる放電パル
スの閉回路が形成されることにより、入力回路5に流れ
る放電パルス電流を検出することができる。図の場合、
入力回路5は特定の中心周波数たとえば150〜400
kHzに同調特性を有する同調回路からなり、放電パ
ルス原波形のうちの特定の周波数成分が検出され信号処
理しやすいパルス波形に変換される。入力回路の出力パ
ルスは増幅器6でたとえば対数増幅され、可変減衰器7
を介して所定のしきい値を有する計数器8に入力される
。この測定装置における放電電荷量の校正は、被検体1
の両端子間に既知の放it荷量(以下Qと略称する)を
注入し、可変減衰器7を調整して計数器8が計数を開始
する可変減衰器7の減衰量を求めることによって行われ
、その後は可変減衰器7をあらかじめ定まるQの区分値
たとえば100PC(IPCはlXl0 クーロン)
、300PC,100OPC,3000PCといったス
テップに合うよう減衰量を調整することによって区分値
1こ対応する放電パルス数を求めることができる。しか
しながら、一つの被検体に対してQの区分値やパルス発
生頻度(以下N/ tと略称する)等の一連の部分放電
特性を測定するためには、被検体の印加電圧をステップ
状に変える度に可変減衰器7を前述のステップで調整し
て計数器8のカウント数を遂−記録し、隣接するカウン
ト数Nの差を求めてQの区分値に対応したN/を値を算
出する必要がある。したがって測定およびデータ整理に
多大の時間を要するという欠点を有するとともに、被検
体に高電圧を長時間印加することにより絶縁中の欠陥の
放電の様相が変わってしまい、再現性のよい測定データ
が得られ難いという欠点があり、その改善が求められて
いる。FIG. 5 is a conceptual diagram showing the configuration of a conventional partial discharge measuring device connected to a partial discharge test circuit. In the figure, reference numeral 1 denotes a test object, which is connected to an AC high voltage power supply 2 via a blocker 4, and is connected to the test object 1, a coupling capacitor 3, and an input circuit 5 of a partial discharge measuring device @10. By forming a closed circuit of discharge pulses, the discharge pulse current flowing through the input circuit 5 can be detected. In the case of the figure,
The input circuit 5 has a specific center frequency, for example 150 to 400.
It consists of a tuning circuit having a tuning characteristic at kHz, and a specific frequency component of the original discharge pulse waveform is detected and converted into a pulse waveform that is easy to process. The output pulse of the input circuit is, for example, logarithmically amplified by an amplifier 6 and is then amplified by a variable attenuator 7.
is input to a counter 8 having a predetermined threshold value. Calibration of the amount of discharged charge in this measuring device is performed on the test object 1.
This is done by injecting a known discharge load (hereinafter abbreviated as Q) between both terminals of After that, the variable attenuator 7 is set to a predetermined Q division value, for example, 100PC (IPC is lXl0 coulombs).
, 300PC, 100OPC, and 3000PC, the number of discharge pulses corresponding to one division value can be determined. However, in order to measure a series of partial discharge characteristics such as Q division values and pulse generation frequency (hereinafter abbreviated as N/t) for one test object, it is necessary to change the applied voltage to the test object in steps. At the same time, the variable attenuator 7 is adjusted in the above-mentioned step, the count number of the counter 8 is finally recorded, and the difference between adjacent count numbers N is calculated to calculate the value of N/ corresponding to the division value of Q. There is a need. Therefore, it has the disadvantage that it takes a lot of time to measure and organize the data, and applying high voltage to the test object for a long time changes the appearance of discharge from defects in the insulation, making it difficult to obtain measurement data with good reproducibility. It has the disadvantage of being difficult to detect, and there is a need for improvement.
本発明は前述の状況に鑑みてなされたもので。 The present invention has been made in view of the above-mentioned situation.
測定時間を短縮でき、したがって放電の様相の変化の影
響を受けることなく正確かつ効率的な部分放電試験を行
うに適した部分放電測定器を提供することを目的とする
。It is an object of the present invention to provide a partial discharge measuring device that can shorten measurement time and is therefore suitable for performing accurate and efficient partial discharge tests without being affected by changes in the aspect of discharge.
本発明は、入力回路で検出され、増幅回路で増幅された
放電パルスを、増幅回路の出力側(こ電荷量区分値のス
テップ数だけ設けられ電荷量区分値に対応したしきい値
を有する電荷量区分回路1こより区分値を超える大きさ
のパルスのみを出力するようにし、各電荷量区分回路t
こ対応して設けられた計数回路によりそれぞれ電荷量区
分値を超える放電パルス数を計数し、計数回路の出力側
に共通に設けられた記憶演算回路に前記計数値を一時記
憶させるとともIこ隣接する電荷量区分値間の計数値の
差を演算して区分値ごとの累積パルス発生頻度を求め、
この値を表示器に区分値ごとに表示するよう構成するこ
とにより、上述の目的を達成したものである。In the present invention, the discharge pulse detected by the input circuit and amplified by the amplifier circuit is transferred to the output side of the amplifier circuit (this is a charge amount provided by the number of steps of the charge amount division value and having a threshold value corresponding to the charge amount division value). Only pulses with a magnitude exceeding the division value are output from the quantity division circuit 1, and each charge division circuit t
The number of discharge pulses exceeding the charge amount classification value is counted by a correspondingly provided counting circuit, and the counted value is temporarily stored in a storage arithmetic circuit commonly provided on the output side of the counting circuit. Calculate the difference in the count values between adjacent charge amount division values to find the cumulative pulse generation frequency for each division value,
By configuring this value to be displayed on a display for each category value, the above-mentioned objective is achieved.
以下本発明を一実施例に基づいて説明する。 The present invention will be explained below based on one embodiment.
第1図は本発明の実施例を示す測定装置のブロック図で
ある。図において、入力回路5および増幅回路6につい
てはすでに従来技術について説明した通りである。11
.IIA、IIB、・・・・・・。FIG. 1 is a block diagram of a measuring device showing an embodiment of the present invention. In the figure, the input circuit 5 and the amplifier circuit 6 are the same as those already described in the prior art. 11
.. IIA, IIB,...
11Nは増幅回路6の出力側に並列に設けられた電荷量
区分回路で、増幅回路6の出力放電パルスの電荷量区分
値に対もする値のしきい値たとえば100PC,100
OPC,100OOPCに対応する電圧値にそれぞれ設
定されており、増幅回路6の出力放電パルスを受けた複
数の電荷量区分回路11゜11A、11B等は、それぞ
れのしきい値を超える放電パルスのみを出力する。12
,12A。11N is a charge amount classification circuit provided in parallel on the output side of the amplifier circuit 6, and has a threshold value corresponding to the charge amount classification value of the output discharge pulse of the amplifier circuit 6, for example, 100PC, 100
The voltage values corresponding to OPC and 100OOPC are respectively set, and the plurality of charge amount classification circuits 11, 11A, 11B, etc. that receive the output discharge pulses of the amplifier circuit 6 only receive discharge pulses exceeding their respective thresholds. Output. 12
, 12A.
12B、・・・、12N等は各電荷量区分回路1こ対応
してその出力側に設けられた計数回路で、各′[し荷量
区分回路の出力放電パルス信号をたとえば1秒間取込み
そのパルス数を計数する。13は各計数回路の出力側に
共通1こ設けられた記憶演算回路で。12B, . . . , 12N, etc. are counting circuits provided on the output side corresponding to each of the charge amount dividing circuits. Count the numbers. 13 is a memory/arithmetic circuit provided in common on the output side of each counting circuit.
各計数回路の計数値をそれぞれ一時記憶するとともに、
互い1こ隣接する電荷量区分値たとえば100pcと1
00OPC,100OPCと100OOPC,1000
0PC以上に対応する計数値の差すなわち(N100−
Nl 000 ) 、 (Nl 000−NIO000
) 、 (N100OO以上)を演算する。このよう番
こすることにより。In addition to temporarily storing the count values of each counting circuit,
Adjacent charge amount division values, for example, 100pc and 1
00OPC, 100OPC and 100OOPC, 1000
The difference between the count values corresponding to 0 PC or more, that is, (N100-
Nl 000) , (Nl 000-NIO000
) , (N100OO or more) is calculated. By rubbing like this.
電荷区分値たとえば(100〜1000PC)、(10
00〜100OOPC)、()100OOPC)ごとに
区分された1秒間ごとのパルス発生数、すなわち放電パ
ルス発生頻度(Nll)の区分値を得ることができる。Charge classification value e.g. (100~1000PC), (10
00 to 100OOPC) and ()100OOPC), the number of pulses generated per second, that is, the division value of the discharge pulse occurrence frequency (Nll) can be obtained.
表示器14は記憶演算回路による演算結果を表示または
記録するものである。上述の測定を被検体に印加する電
圧値を変える度に繰返し行うことにより、表示器には印
加電圧をパラメータとする放電電荷tQ対放電パルス発
生頻度N/を特性データあるいは特性線図を表示するこ
とができる。The display 14 is for displaying or recording the calculation results by the storage calculation circuit. By repeating the above measurement every time the voltage value applied to the object is changed, the display displays characteristic data or a characteristic diagram of discharge charge tQ versus discharge pulse generation frequency N/ with the applied voltage as a parameter. be able to.
v、2図は前述の実施例1こおける電荷量区分回路の一
例を示す回路図で、差動増幅器からなる波高値弁別回路
を用いた場合の例を示したものである。FIG. 2 is a circuit diagram showing an example of the charge amount classification circuit in the first embodiment described above, and shows an example in which a peak value discrimination circuit consisting of a differential amplifier is used.
図において15は差動増幅器、馬は入力抵抗、R。In the figure, 15 is a differential amplifier, and numeral 15 is an input resistance, R.
は出力抵抗であり、R1,RLを所定の値に保ち、しき
い値V、をそれぞれ電荷区分値に対応する値番こ設定し
ておくことにより、しきい値気を超える入力電圧v1が
入力されたとき、出力側に高レベルの出力信号v、)が
出力される。なお図中J)、、D、は過大入力に対する
保獲用ダイオードであり、D、、D。is the output resistance, and by keeping R1 and RL at predetermined values and setting the threshold value V to a value corresponding to the charge classification value, the input voltage v1 exceeding the threshold value is input. When this happens, a high-level output signal v,) is output to the output side. Note that J), ,D in the figure are diodes for protection against excessive input, and D, ,D.
は出力信号v6の出力レベルの規制用ダイオードである
。is a diode for regulating the output level of the output signal v6.
第3図詔よび第4図は前述の実施例の測定装置を用いて
得られる被検体の部分放電特性の一例を示す特性線図で
、第3図は計数回路の出力計数値をグラフ化したもの、
第4図は表示器の表示内容をグラフ化したもので、第4
図は表示器に直接表示させ得る特性線図である。第3図
において、曲線111は被検体11こ印加電圧V、を加
えたとき被検体の絶縁中で発生し、入力回路5で検出さ
れ、増幅回路6で増幅され、しきい値の異なる複数の電
荷量区分回路11でそれぞれしきい値と比較され波高値
がしきい値を超えたことにより計数回路 (12に
入力された放電パルス信号の発生頻度(Nl)と放it
荷i′Qとの関係を示す特性曲線、曲線112は印加電
圧をvzに高めたとき上記説明と同様にして得られる特
性曲線である。この測定装置においては、電荷量区分値
の段階的増加に対応してしきい値が段階的lこ高くなる
よう設定された複数の電荷量区分回路11.11A、I
IB等を放電パルス信号が通ることにより、しきい値よ
り波高値が低い放電パルス信号が切捨てられるものの、
しきい値を超えるパルス信号はすべて計数されるために
、計数回路12,12A、12B等には放電パルス発生
頻度N/lの累積値が測定され、放電電荷量Qがある値
を超えるとNllが減少しはじめ、ざらにQが増加する
とNllが零になるという累積分布曲線111,112
等が得られることになる。Figures 3 and 4 are characteristic diagrams showing an example of the partial discharge characteristics of the test object obtained using the measuring device of the above-mentioned embodiment, and Figure 3 is a graph of the output count value of the counting circuit. thing,
Figure 4 is a graph of the display contents.
The figure is a characteristic diagram that can be displayed directly on a display. In FIG. 3, a curve 111 is generated in the insulation of the test object when an applied voltage V is applied to the test object 11, is detected by the input circuit 5, is amplified by the amplifier circuit 6, and is detected by the input circuit 5. The charge amount classification circuit 11 compares the respective threshold values, and when the peak value exceeds the threshold, the frequency of occurrence (Nl) of the discharge pulse signal input to the counting circuit (12) and the discharge pulse signal are determined.
A characteristic curve 112 showing the relationship with the load i'Q is a characteristic curve obtained in the same manner as described above when the applied voltage is increased to vz. In this measuring device, a plurality of charge amount classification circuits 11.11A and I are set so that the threshold value increases stepwise in response to a stepwise increase in the charge amount classification value.
As the discharge pulse signal passes through IB etc., the discharge pulse signal whose peak value is lower than the threshold value is truncated, but
Since all pulse signals exceeding the threshold are counted, the cumulative value of the discharge pulse generation frequency N/l is measured in the counting circuits 12, 12A, 12B, etc., and when the discharge charge amount Q exceeds a certain value, Nll Cumulative distribution curves 111, 112 in which Nll becomes zero as Q begins to decrease and Q increases roughly.
etc. will be obtained.
第5図の従来装置においては、曲線111を求めるため
1こ、印加電圧をV、+こ保っておいて可変減衰器7の
減衰量を区分値の増加に対応して順次大きくし、計数器
8の表示を読取るという測定手順を必要としたために、
一つの曲線を求めるだけでも数分間を要し電圧ステップ
が多い場合には測定1こ10分間もかかる場合があり、
この間iこ放電の様相が変化するなどの問題を生じたが
、本発明の装置においては1曲線111,112 そ
れぞれに対応する測定を同時に、かつ1秒間程の短時間
で行ってしまうために、試験時間が短縮されるとともに
放電の様相が変化する以前に測定を終らせることができ
るという利点が得られる。In the conventional device shown in FIG. 5, in order to obtain the curve 111, the applied voltage is held at V, +, and the attenuation amount of the variable attenuator 7 is sequentially increased in accordance with the increase in the division value. Because the measurement procedure of reading the display of 8 was required,
It takes several minutes just to find one curve, and if there are many voltage steps, one measurement can take up to 10 minutes.
During this time, problems such as changes in the aspect of the discharge occurred, but in the device of the present invention, measurements corresponding to each of the curves 111 and 112 are performed simultaneously and in a short period of about 1 second. This has the advantage that the test time is shortened and the measurement can be completed before the aspect of discharge changes.
第4図は表示器14に出力される表示データを示す特性
線図で、計数回路12の出力計数値信号を、記憶演算回
路の記憶部に一時記憶し、互いに隣接する電荷区分値に
対応する計数値信号の差を求めることにより第3図の累
積分布曲線は第4図の頻度分布曲線141.142 l
こ変換され、印加電圧’i’t 、Vt等lこ対してど
の位の放電電荷i−Qの放電パルスがどれ位の頻度分布
N/lで発生しているかを直ち1こ知ることができ、し
たがって従来装置においては直接得られなかった第4図
の特性曲線を自動的lこ表示できる利点が得られる。FIG. 4 is a characteristic diagram showing display data outputted to the display 14, in which the output count value signal of the counting circuit 12 is temporarily stored in the storage section of the storage calculation circuit, and the output count value signal of the counting circuit 12 is temporarily stored in the storage section of the storage calculation circuit, and the output count value signal of the counting circuit 12 is temporarily stored in the storage section of the storage calculation circuit, and the output count value signal of the counting circuit 12 is temporarily stored in the storage section of the storage calculation circuit, and the output count value signal of the counting circuit 12 is temporarily stored in the storage section of the storage calculation circuit, and the output count value signal of the counting circuit 12 is temporarily stored in the storage section of the storage calculation circuit, and the output count value signal of the counting circuit 12 is temporarily stored in the storage section of the storage calculation circuit, and the output count value signal of the counting circuit 12 is temporarily stored in the storage section of the storage calculation circuit. By finding the difference between the count signals, the cumulative distribution curve in Figure 3 becomes the frequency distribution curve 141.142 l in Figure 4.
By converting this, it is possible to immediately know in what frequency distribution N/l the discharge pulse of discharge charge i-Q is generated with respect to the applied voltage 'i't, Vt, etc. Therefore, there is an advantage that the characteristic curve shown in FIG. 4, which could not be directly obtained with the conventional device, can be automatically displayed.
本発明は前述のよう1こ、入力回路および増幅回路の後
lこしきい値の異なる複数の電荷量区分回路と計数回路
を設けて放電パルスの累積頻度対放電電荷量特性データ
を同時に測定できるよう1こするととも(こ、計数回路
の出力側に記憶演算回路を設けて放電パルスの発生頻度
対放電電荷量特性データをも同時ζこ測定できるよう構
成した。その給気従来の測定装置に比べて測定に要する
時間を著しく短縮でき、かつ従来測定1こ長時間を要す
るが故に被検体の部分放電の模様が変化してしまうとい
う問題点が排除され、精度のよい部分放電試験を効率よ
く行うことができる部分放電測定装置を提供することが
できる。As described above, the present invention provides a plurality of charge amount classification circuits and a counting circuit having different threshold values after the input circuit and the amplifier circuit, so that the cumulative frequency of discharge pulses versus discharge charge amount characteristic data can be measured simultaneously. 1.A memory/arithmetic circuit is provided on the output side of the counting circuit to enable simultaneous measurement of discharge pulse frequency vs. discharge charge characteristic data. The time required for measurement can be significantly shortened, and the problem of changing the partial discharge pattern of the test object due to the long time required for conventional measurements is eliminated, allowing efficient partial discharge testing with high accuracy. It is possible to provide a partial discharge measuring device that can perform the following steps.
第1図は本発明の一実施例を示す測定装置のブロック図
、第2図は前述の実施例1こおける電荷量区分回路の一
例を示す回路図、第3図は前述の実施例ζこおける計数
回路の出力データ内容を示す部分放電特性線図、第4図
は前述の実施例における表示器の表示データ内容を示す
部分放電特性線図。
第5図は部分放電試験回路1こ接続された従来の測定装
置の構成図である。
1・・・被検体、2・−・高電圧電源、5・・・入力回
路。
6・・・増幅回路、7・・・可変減衰器、11.IIA
。
11B、IIN・・・電荷量区分回路、8,12゜12
A’、12B、12N・・・計数回路、13・・・記憶
演算回路、14・・・表示器、Q・・・放電電荷量、N
/ t・・・パルス発生頻度。
第1図
第2図
放電電荷量Q (対数値)→
第3図
枚1!電指量Q (対数値)→
算4図
Q
第5図FIG. 1 is a block diagram of a measuring device showing one embodiment of the present invention, FIG. 2 is a circuit diagram showing an example of the charge amount division circuit in the first embodiment described above, and FIG. FIG. 4 is a partial discharge characteristic diagram showing the content of output data of the counting circuit in the above-mentioned embodiment; FIG. FIG. 5 is a configuration diagram of a conventional measuring device to which one partial discharge test circuit is connected. 1... Object to be inspected, 2... High voltage power supply, 5... Input circuit. 6... Amplification circuit, 7... Variable attenuator, 11. IIA
. 11B, IIN...Charge amount division circuit, 8, 12゜12
A', 12B, 12N...Counting circuit, 13...Storage calculation circuit, 14...Display device, Q...Discharged charge amount, N
/t...Pulse generation frequency. Figure 1 Figure 2 Discharge charge amount Q (logarithmic value) → Figure 3 Sheet 1! Power index quantity Q (logarithmic value) → Calculation 4 Figure Q Figure 5
Claims (1)
分放電パルスを検出してあらかじめ定まる放電電荷区分
値ごとのパルス発生頻度を同時に計測表示する測定装置
であって、前記部分放電パルスを検出して波形整形する
入力回路と、入力回路の出力パルスを入力とする増幅回
路と、この増幅回路の出力側に複数個並列に設けられた
それぞれしきい値の異なる電荷量区分回路と、この電荷
量区分回路に対応してそれぞれ設けられた計数回路と、
この計数回路の出力側に共通に設けられ計数回路の出力
信号を一時記憶して区分値ごとの放電パルス発生頻度を
演算する記憶演算回路と、この記憶演算回路の出力放電
パルス頻度を区分値ごとに表示する表示器とを備えたこ
とを特徴とする部分放電測定装置。1) A measuring device that simultaneously measures and displays the frequency of pulse occurrence for each predetermined discharge charge classification value by detecting partial discharge pulses generated in an insulated part of a test object to which a high voltage is applied, An input circuit that detects and shapes the waveform, an amplifier circuit that receives the output pulses of the input circuit, and a plurality of charge division circuits each having a different threshold value, which are installed in parallel on the output side of this amplifier circuit. a counting circuit provided respectively corresponding to the charge amount division circuit;
A memory calculation circuit is provided in common on the output side of this counting circuit and temporarily stores the output signal of the counting circuit to calculate the discharge pulse generation frequency for each division value, and a storage calculation circuit that temporarily stores the output signal of the counting circuit and calculates the discharge pulse generation frequency for each division value. 1. A partial discharge measuring device characterized by comprising: a display for displaying.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17545484A JPS6153577A (en) | 1984-08-23 | 1984-08-23 | Partial discharge measuring apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17545484A JPS6153577A (en) | 1984-08-23 | 1984-08-23 | Partial discharge measuring apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6153577A true JPS6153577A (en) | 1986-03-17 |
| JPH0521429B2 JPH0521429B2 (en) | 1993-03-24 |
Family
ID=15996351
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17545484A Granted JPS6153577A (en) | 1984-08-23 | 1984-08-23 | Partial discharge measuring apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6153577A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6459084A (en) * | 1987-08-29 | 1989-03-06 | Ee T I Kk | Measuring instrument for partial discharging charge amount |
| JPH0479275U (en) * | 1990-11-24 | 1992-07-10 | ||
| JPH0634696A (en) * | 1992-07-14 | 1994-02-10 | Fujikura Ltd | High-frequency partial discharge detection system |
| JPH07262866A (en) * | 1994-03-23 | 1995-10-13 | Tokyo Electric Power Co Inc:The | Partial discharge detection method |
| JP2005326379A (en) * | 2004-05-17 | 2005-11-24 | Sumitomo Metal Ind Ltd | Damage detection method for partial discharge and damage detection apparatus for partial discharge |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54115176A (en) * | 1978-02-27 | 1979-09-07 | Shii Emu Shii Shii Kk | Electric insulator diagnoser |
-
1984
- 1984-08-23 JP JP17545484A patent/JPS6153577A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54115176A (en) * | 1978-02-27 | 1979-09-07 | Shii Emu Shii Shii Kk | Electric insulator diagnoser |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6459084A (en) * | 1987-08-29 | 1989-03-06 | Ee T I Kk | Measuring instrument for partial discharging charge amount |
| JPH0479275U (en) * | 1990-11-24 | 1992-07-10 | ||
| JPH0634696A (en) * | 1992-07-14 | 1994-02-10 | Fujikura Ltd | High-frequency partial discharge detection system |
| JPH07262866A (en) * | 1994-03-23 | 1995-10-13 | Tokyo Electric Power Co Inc:The | Partial discharge detection method |
| JP2005326379A (en) * | 2004-05-17 | 2005-11-24 | Sumitomo Metal Ind Ltd | Damage detection method for partial discharge and damage detection apparatus for partial discharge |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0521429B2 (en) | 1993-03-24 |
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