JPS616276A - Plasma CVD equipment - Google Patents
Plasma CVD equipmentInfo
- Publication number
- JPS616276A JPS616276A JP59125199A JP12519984A JPS616276A JP S616276 A JPS616276 A JP S616276A JP 59125199 A JP59125199 A JP 59125199A JP 12519984 A JP12519984 A JP 12519984A JP S616276 A JPS616276 A JP S616276A
- Authority
- JP
- Japan
- Prior art keywords
- drum
- raw material
- material gas
- electrode
- plasma cvd
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/24—Deposition of silicon only
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Photoreceptors In Electrophotography (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Chemical Vapour Deposition (AREA)
- Light Receiving Elements (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
[技術分野]
本発明は、プラズマCVD技術を用いてドラム等の円筒
状基体の表面にアモルファス・シリコン等の膜を蒸着し
て、例えば、電子写真用感光体ドラムを連続的に生産す
ることのできるプラズマCVD装置に関し、特にその原
料ガスを適切に処理してドラム表面に7モリフアス・シ
リコン膜を均等に蒸着することができるプラズマCVD
装置に関するものである。Detailed Description of the Invention [Technical Field] The present invention relates to the production of electrophotographic photoreceptor drums, for example, by depositing a film of amorphous silicon or the like on the surface of a cylindrical substrate such as a drum using plasma CVD technology. Regarding a plasma CVD device that can continuously produce, in particular, a plasma CVD device that can uniformly deposit a 7-molyphasic silicon film on the drum surface by appropriately processing the raw material gas.
It is related to the device.
]従来技術1
この種の装置は、プラズマCVD装置の電極配置方式か
ら分類すれば、従来の容量結合型プラズマCVD装置と
同様の構造を有するが、この構造を主に電子写真用感光
体ドラム作製用のプラズマCVD装置に適用すると、カ
ソード電極とアノード電極(ドラム)とが同心固状に配
置されているため、ドラム収納個数が制約され、装置構
造が複雑になる。] Prior art 1 This type of device has a structure similar to a conventional capacitively coupled plasma CVD device if classified based on the electrode arrangement method of the plasma CVD device. When applied to a commercial plasma CVD apparatus, the cathode electrode and the anode electrode (drum) are arranged concentrically and rigidly, which limits the number of drums that can be accommodated and complicates the apparatus structure.
そこで以上のような問題を考慮して、主とじてアモルフ
ァス・シリコン感光体材料を用いる電子写真用感光体ド
ラムの量産装置を得るべく、−L述の従来例のごとき複
雑な装置構造を大幅に簡素化し、ドラムの収納個数を増
やし、かつ電極配置方法、及び形状を改善することによ
り、従来の装置では困難であった電子写真用ドラム等の
量産、及び高速成膜を有利に可能ならしめた装置が提案
された。Therefore, in consideration of the above-mentioned problems, in order to obtain a mass production device for electrophotographic photoreceptor drums that mainly uses amorphous silicon photoreceptor material, the complicated device structure such as the conventional example described in -L was significantly reduced. By simplifying the system, increasing the number of drums that can be stored, and improving the electrode arrangement method and shape, we have made it possible to advantageously mass-produce electrophotographic drums and perform high-speed film formation, which was difficult with conventional equipment. A device was proposed.
第1図はこのようなプラズマCVD装置を示し、図中1
5は表面にアモルファス・シリコン膜を形成するように
アルミニウム基板をドラム状に形成した円筒状基体とし
てのドラムである。FIG. 1 shows such a plasma CVD apparatus, and in the figure 1
Reference numeral 5 denotes a drum as a cylindrical base body, which is an aluminum substrate formed into a drum shape so as to form an amorphous silicon film on its surface.
1はドラムを加熱するための加熱室、2は加熱室lに続
けて設けられ、ドラム15の表面にプラズマCVD法に
よりアモルファス・シリコン膜を形成するための反応室
、および3は反応室2に続けて設けられ、膜形成後のド
ラムを冷却するための冷却室である。これらの室1.2
および3は気密構造を有している。6は複数のドラム1
5を軸中心に回転させると共に、これらの中心軸が互い
に同一平面」−になるように、かつ各軸が平行になるよ
うに直立して保持し、さらにドラム回転搬送機構を備え
た保持枠である。1 is a heating chamber for heating the drum, 2 is a reaction chamber provided following the heating chamber 1 and for forming an amorphous silicon film on the surface of the drum 15 by plasma CVD, and 3 is a reaction chamber in the reaction chamber 2. A cooling chamber is provided next to the drum for cooling the drum after film formation. These chambers 1.2
and 3 have an airtight structure. 6 is multiple drums 1
5 are rotated around their axes, and held upright so that their central axes are on the same plane and parallel to each other, and further, using a holding frame equipped with a drum rotation conveyance mechanism. be.
4は加熱室1内に各室1.2および3の連続方向に沿う
ように配置された一対のヒーターである。A pair of heaters 4 are arranged in the heating chamber 1 along the continuous direction of the chambers 1, 2 and 3.
この一対のヒーター4は、互いに平行になるように直立
して配置され、かつその間に配列方向がヒーター4に平
行になるように配置されたドラム15を加熱する。5は
各室の一側壁に設けられ、各室を真空に保つためのフィ
ルター及びバッフルを備えた排気系である。7はカソー
ド電極としての一対の平板状電極であって、互いに平行
になるように直立して反応室2内に配置されている。こ
の一対の電極7は原料ガス供給のため二重構造となし、
その間に配列方向が電極7と平行になるように配置され
たドラム15に向ってガスを噴出する多数の孔を内側全
面にわたって有し、さらにヒータにより加熱される。8
は平板状電極7の外側に接続された、同電極7の二重構
造内に原料ガスを供給するための原料ガス供給パイプ、
8は電極7にパイプ8を介して高周波パワーを供給する
ための電源、 10は保持枠6に保持されたドラム15
をアノード電極とするためのアースである。The pair of heaters 4 are arranged upright so as to be parallel to each other, and heat a drum 15 arranged between them so that the arrangement direction is parallel to the heaters 4. Reference numeral 5 denotes an exhaust system provided on one side wall of each chamber and equipped with a filter and baffle for keeping each chamber in a vacuum. A pair of flat electrodes 7 serve as cathode electrodes, and are arranged upright in the reaction chamber 2 so as to be parallel to each other. This pair of electrodes 7 has a double structure for supplying raw material gas,
The drum 15 has a large number of holes over its entire inner surface that ejects gas toward the drum 15, which is arranged so that its arrangement direction is parallel to the electrodes 7, and is further heated by a heater. 8
is a raw material gas supply pipe connected to the outside of the flat electrode 7 for supplying raw material gas into the double structure of the electrode 7;
8 is a power source for supplying high frequency power to the electrode 7 via the pipe 8; 10 is a drum 15 held by the holding frame 6;
This is the ground for using as an anode electrode.
11は一対の冷却板であって、互いに平行になるように
直立して冷却室3内に配置されている。一対の冷却板1
1はその間にある膜形成の終ったドラム15を冷却する
ために内部に水等の冷媒流路を有する。 12は冷却板
11内に供給する水等の冷媒、 13は各室1,2およ
び3を隔離し、かつドラム15が保持枠6とともに移動
するときに開状態になるように制御されるゲートΦバル
ブ、 14は加熱室1及び冷却室3の排気系5に設けら
れ各室1および3を大気に戻すためのリーク拳バルブで
ある。A pair of cooling plates 11 are arranged upright in the cooling chamber 3 so as to be parallel to each other. A pair of cooling plates 1
1 has a refrigerant flow path for water or the like inside to cool the drum 15 between which the film formation has been completed. 12 is a refrigerant such as water to be supplied into the cooling plate 11; 13 is a gate Φ which isolates each chamber 1, 2, and 3 and is controlled to be open when the drum 15 moves together with the holding frame 6; A valve 14 is a leak valve provided in the exhaust system 5 of the heating chamber 1 and the cooling chamber 3 to return each chamber 1 and 3 to the atmosphere.
保持枠6に固定されたドラム15は、第1図中左端のゲ
ート・バルブ13内を通って、加熱室lに入り、排気系
5により真空にされた後の、加熱室l内において回転し
ながらヒーター4により加熱さ゛れる。加熱されたドラ
ム15は両室lおよび2間のゲート・バルブ13内を通
って排気系5により真空に保たれた反応室2に保持枠8
とともに入る0反応室2に入ったドラム15はアースl
Oに接続されて、高周波電源8に接続されたカソード電
極としての一対の電極7に対するアノード電極を形成す
る。電極7と電場を形成し、ヒーターにより加熱された
ドラム15の表面には、原料ガス供給パイプ8から送ら
れるシラン等の原料ガスがプラズマ中で分解することに
よってアモルファス−シリコン膜が形成される。膜形成
の終ったドラム15は反応室2と冷却室3との間のゲー
ト番バルブ13内を通って、排気系5により真空に保た
れた冷却室3に入り、冷却板11を介して冷媒12と熱
交換して冷却され、リーク争バルブ14により大気に戻
された冷却室3から第1図中右端のゲート・バルブ13
内を通って冷却室3外に出され蒸着工程を終了する。The drum 15 fixed to the holding frame 6 passes through the gate valve 13 at the left end in FIG. Meanwhile, it is heated by the heater 4. The heated drum 15 passes through the gate valve 13 between the two chambers 1 and 2, and is transferred to the reaction chamber 2, which is kept in vacuum by the exhaust system 5, into the holding frame 8.
The drum 15 that entered the reaction chamber 2 is connected to the ground l.
0 to form an anode electrode for a pair of electrodes 7 serving as cathode electrodes connected to a high frequency power source 8. An amorphous silicon film is formed on the surface of the drum 15, which forms an electric field with the electrode 7 and is heated by a heater, by decomposing a raw material gas such as silane sent from the raw material gas supply pipe 8 in plasma. The drum 15 on which the film has been formed passes through the gate valve 13 between the reaction chamber 2 and the cooling chamber 3, enters the cooling chamber 3 kept in vacuum by the exhaust system 5, and is pumped with refrigerant through the cooling plate 11. The gate valve 13 at the right end in FIG.
The vapor deposition process is completed by passing through the inside and being taken out of the cooling chamber 3.
しかしながら以上のような構成のプラズマCVD装置に
おいては次のような欠点がある。すなわち、第2図は冷
却室2の断面を示し、図中矢印で示すように、原料ガス
は平板状電極7の内側に全面にわたって形成されたガス
噴出用の孔7^からドラム15に向って噴出する0図中
右側の平板状電極7から噴111シた原料ガスは、ドラ
ム15の主として右側の半周部分に接触し、そして、左
側の平板状電極7の周辺を通って排気系5に排気され、
一方、図中左側のモ板状7電極から噴出した原料ガスは
ドラム15の主として左側の半周部分に接触して左側の
平板状電極7の周辺を通って排気系5に排気される。However, the plasma CVD apparatus having the above configuration has the following drawbacks. That is, FIG. 2 shows a cross section of the cooling chamber 2, and as indicated by arrows in the figure, the raw material gas is directed toward the drum 15 from the gas jet holes 7^ formed over the entire surface inside the flat electrode 7. The raw material gas ejected from the flat electrode 7 on the right side in Figure 0 contacts mainly the right half circumference of the drum 15, and then passes around the flat electrode 7 on the left side and is exhausted to the exhaust system 5. is,
On the other hand, the raw material gas ejected from the plate-like seven electrodes on the left side of the figure contacts mainly the left half-periphery of the drum 15 and is exhausted to the exhaust system 5 through the periphery of the left-side plate-like electrode 7.
このように反応室2内においては、第2図に示すように
ドラAI5の左側における軸方向の中間部分近傍の原料
ガスおよび左側の平板状電極7の内側のl−F両端部分
から噴出した原料ガスなどがよどみやすい、その結果、
ドラム15の周囲において、原料ガスの密度は不均一に
なりやすく、そのため、ドラム15の表面に得られたア
モルファス・シリコンの膜厚および膜質は不均一になり
やすい。In this way, in the reaction chamber 2, as shown in FIG. Gas etc. tend to stagnate, as a result,
The density of the raw material gas tends to be non-uniform around the drum 15, and therefore the thickness and quality of the amorphous silicon film obtained on the surface of the drum 15 tends to be non-uniform.
一方平板状カソード電極7は電極とガス噴出f段とを兼
ねており、したがってその構造が複雑であり、ガス噴出
孔において異常放電する恐れがある。On the other hand, the flat cathode electrode 7 serves both as an electrode and as a gas ejection stage f, and therefore has a complicated structure, which may cause abnormal discharge at the gas ejection holes.
[■的j
本発明の[1的は以上のような問題を解消し、適切な原
料ガスの流れを形成して、表面に膜厚および膜質の均一
なアモルファス拳シリコン等の膜を有するドラム等の円
筒状基体が得られるプラズマCVD装置を提供すること
にある。The first aspect of the present invention is to solve the above-mentioned problems and to provide a drum, etc., which forms an appropriate flow of raw material gas and has a film of amorphous silicon or the like on its surface with a uniform film thickness and film quality. An object of the present invention is to provide a plasma CVD apparatus capable of obtaining a cylindrical substrate.
【実施例1
第3図は本発明の一実施例にかかるプラズマCVD装置
の平面図、第4図は同装置の要部を丞す斜視図、第5図
は同装置の要部の断面図である。[Example 1] Fig. 3 is a plan view of a plasma CVD apparatus according to an embodiment of the present invention, Fig. 4 is a perspective view of the main parts of the apparatus, and Fig. 5 is a sectional view of the main parts of the apparatus. It is.
本発明にかかるプラズマCVD装置においては、反応室
内の電極および原料ガス供給排気のための構造を除いて
第1図に示したプラズマCVD装置と同様な構成である
ので、以下1反応室について主に説明する。The plasma CVD apparatus according to the present invention has the same configuration as the plasma CVD apparatus shown in FIG. 1 except for the electrodes in the reaction chamber and the structure for supplying and exhausting raw material gas, so the following will mainly explain one reaction chamber. explain.
すなわち第3図および第4図に示すように、本発明にか
かるプラズマCVD装置における反応室21内には、内
側が平坦な一対の平板状電極22および25が、従来の
平板状電極7と同様の位置に、互いに平行になるように
直立して配置されており、この一対の平板状電極22お
よび25はヒーターにより加熱される。この一対の平板
状電極22および25のうち、一方の電極22は、従来
の電極7と同様に、原料ガス供給のための二重構造とし
、内側全面にわたってガス噴射用の多数の孔23を有す
る。また他方の電極25は、その内側にガス噴出用の孔
を有さずに、平坦になっており、接続手段25^を介し
て高周波電源8に接続し、一方のカソード電極とする。That is, as shown in FIGS. 3 and 4, in the reaction chamber 21 of the plasma CVD apparatus according to the present invention, a pair of flat electrodes 22 and 25 with flat insides are provided, similar to the conventional flat electrode 7. The pair of flat electrodes 22 and 25 are heated by a heater. Among the pair of flat electrodes 22 and 25, one electrode 22 has a double structure for supplying raw material gas, like the conventional electrode 7, and has numerous holes 23 for gas injection over the entire inner surface. . The other electrode 25 is flat without having a gas ejection hole inside thereof, and is connected to the high frequency power source 8 via a connecting means 25^, and serves as one cathode electrode.
一方の平板状電極22の外側には、その二重構造内に原
料ガスを供給するための原料ガス供給パイプ24を接続
し、このパイプ24を介して高周波電源8に電極22を
接続して、他方のカソード電極とする。A raw material gas supply pipe 24 for supplying raw material gas into the double structure is connected to the outside of one flat electrode 22, and the electrode 22 is connected to a high frequency power source 8 via this pipe 24. This is the other cathode electrode.
他方の平板状電極25の−L端および下端には、これに
近接して、かつこれと平行に、すなわちドラム15の配
列方向と平行に一対の排気管2Bの各々が設けられてい
る。排気管2Bの長さは、平板状電極25の長さとほぼ
同一である。At the -L end and the lower end of the other flat electrode 25, a pair of exhaust pipes 2B are provided, respectively, close to and parallel to this, that is, parallel to the arrangement direction of the drums 15. The length of the exhaust pipe 2B is approximately the same as the length of the flat electrode 25.
排気管26にはその長さ方向に沿って複数のガス吸込用
の孔27が形成されている。原料ガス供給パイプ24は
、図示しない原料ガス供1viSに接続されており、排
気管2Bには図示しない排気装置に接続された管2[I
Bが連通している。A plurality of gas suction holes 27 are formed in the exhaust pipe 26 along its length. The raw material gas supply pipe 24 is connected to a raw material gas supply 1viS (not shown), and the exhaust pipe 2B is connected to a pipe 2[I] connected to an exhaust device (not shown).
B is communicating.
ドラム15はアースされて、アノード電極となっている
。The drum 15 is grounded and serves as an anode electrode.
以上のような構成による本発明プラズマCVD装置の作
用を次に説明する。第4図および第5図に矢印で示すよ
うに、一方の電極22の内側の孔23から反応室21内
にドラム15に向って噴出した原料ガスは、一対の平板
状電極22および25の間の空間をドラム15の軸心方
向と直角に流れてドラム15の周囲を通過し、ついで、
他方の電極25の上下端の排気管2Bの孔27に吸い込
まれて反応室21外に排気される。このように原料ガス
は、電極22の孔23から噴出して、ドラム15の表面
へのアモルファス・シリコン膜形成に寄榮するまで、ド
ラム15の周囲全体に、その軸心と直角な方向にそった
よどみないスムーズな流れを形成し、ついで排気管26
から反応室21外に排気される。The operation of the plasma CVD apparatus of the present invention having the above configuration will be explained next. As shown by arrows in FIGS. 4 and 5, the raw material gas ejected from the inner hole 23 of one electrode 22 into the reaction chamber 21 toward the drum 15 flows between the pair of flat electrodes 22 and 25. It flows through the space perpendicular to the axial direction of the drum 15 and passes around the drum 15, and then,
The gas is sucked into the holes 27 of the exhaust pipe 2B at the upper and lower ends of the other electrode 25 and exhausted to the outside of the reaction chamber 21. In this way, the raw material gas is ejected from the hole 23 of the electrode 22 and is spread all around the drum 15 in a direction perpendicular to its axis until it contributes to the formation of an amorphous silicon film on the surface of the drum 15. A smooth flow is formed without stagnation, and then the exhaust pipe 26
is exhausted to the outside of the reaction chamber 21.
したがってドラム15の周囲のガス密度が全体にわたっ
て均一になり、ドラム15の表面には膜厚および膜質が
均一なアモルファス・シリコン膜が形成される。Therefore, the gas density around the drum 15 becomes uniform throughout, and an amorphous silicon film with uniform thickness and quality is formed on the surface of the drum 15.
なお、原料ガスの吸い込み用の孔27の位置2間隔およ
び個数を適当に設定することによって、ドラム15の配
列方向におけるガス密度を適切に制御することができ、
したがって同配列方向における原料ガスの分解効率を効
率的に制御することができる。Note that by appropriately setting the spacing between the positions and the number of holes 27 for sucking the raw material gas, the gas density in the arrangement direction of the drums 15 can be appropriately controlled.
Therefore, the decomposition efficiency of the source gas in the same arrangement direction can be efficiently controlled.
加熱室1および冷却室3におけるドラム15の処理は従
来と同様である。The processing of the drum 15 in the heating chamber 1 and the cooling chamber 3 is the same as in the conventional case.
また、上記実施例では、一対の電極22および25は共
に高周波電源8に接続してカソード電極としたが、これ
らのいずれか一方をカソード電極とし、他方を高周波電
源9に接続せずにアースして、アノード電極としてもよ
い(ドラム15はいずれの場合もアースする)。Furthermore, in the above embodiment, the pair of electrodes 22 and 25 were both connected to the high frequency power source 8 to serve as cathode electrodes, but it is also possible to use one of them as a cathode electrode and the other to be grounded without being connected to the high frequency power source 9. Alternatively, it may be used as an anode electrode (the drum 15 is grounded in either case).
[効果]
以上説明したように本発明によれば、膜厚および膜質が
均一であり、電気的特性に優れたアモルファス・シリコ
ン等の膜を表面に有する円筒状基体を効率的に得ること
ができる。また本発明によれば、円筒状基体の配列方向
におけるガス密度分布を適切に制御することができる。[Effects] As explained above, according to the present invention, it is possible to efficiently obtain a cylindrical substrate having a film of amorphous silicon or the like on its surface that has uniform film thickness and film quality and excellent electrical properties. . Further, according to the present invention, the gas density distribution in the arrangement direction of the cylindrical substrates can be appropriately controlled.
さらに本発明によれば平行平板電極が簡単な構造で済む
。Furthermore, according to the present invention, a simple parallel plate electrode structure is sufficient.
ラズマCvD装置の概略平面図、
第2図は同装置における反応室の縦断面図、第3図は電
子写真感光体ドラム製造用の本発明にかかるプラズマC
VD装置の一実施例を示す平面図、
第4図は同装置の要部を示す斜視図、
第5図は同装置における反応室の縦断面図である。A schematic plan view of a plasma CvD apparatus, FIG. 2 is a longitudinal sectional view of a reaction chamber in the apparatus, and FIG. 3 is a plasma CvD apparatus according to the present invention for manufacturing an electrophotographic photosensitive drum.
FIG. 4 is a plan view showing an embodiment of the VD device, FIG. 4 is a perspective view showing the main parts of the device, and FIG. 5 is a longitudinal sectional view of a reaction chamber in the device.
15・・・ドラム、 21・・・反応室、 22.25・・・平板状電極、 23・・・原料ガス噴出用の孔、 24・・・原料ガス供給パイプ、 26・・・排気管、 27・・・原料ガス吸い込み用の孔。15...Drums, 21... reaction chamber, 22.25... flat electrode, 23... hole for ejecting raw material gas, 24... Raw material gas supply pipe, 26...exhaust pipe, 27... Hole for sucking raw material gas.
「つ"Tsu
Claims (1)
側に原料ガスの噴出部を形成した一対の平行平板電極と
、各中心軸が前記電極と平行な同一平面上に位置し、か
つ互いに平行になるように複数の円筒状基体を前記一対
の平行平板電極の間に配置するための基体保持手段と、
前記一対の平行平板電極の間に配置した複数の円筒状基
体の配列方向に沿って原料ガスの吸込部が位置するよう
に前記一対の電極の他方の周囲近傍に配置した原料ガス
排気手段とを具えたことを特徴とするプラズマCVD装
置。A pair of parallel plate electrodes arranged parallel to each other and having a raw material gas ejection part formed inside one of them; substrate holding means for arranging a plurality of cylindrical substrates between the pair of parallel plate electrodes so that
a raw material gas exhaust means arranged near the periphery of the other of the pair of electrodes so that the raw material gas suction part is located along the arrangement direction of the plurality of cylindrical substrates arranged between the pair of parallel plate electrodes; A plasma CVD apparatus characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59125199A JPS616276A (en) | 1984-06-20 | 1984-06-20 | Plasma CVD equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59125199A JPS616276A (en) | 1984-06-20 | 1984-06-20 | Plasma CVD equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS616276A true JPS616276A (en) | 1986-01-11 |
| JPS6242027B2 JPS6242027B2 (en) | 1987-09-05 |
Family
ID=14904359
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59125199A Granted JPS616276A (en) | 1984-06-20 | 1984-06-20 | Plasma CVD equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS616276A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100631719B1 (en) | 2004-12-27 | 2006-10-11 | 엘지전자 주식회사 | Gas supply structure of plasma polymerization apparatus |
-
1984
- 1984-06-20 JP JP59125199A patent/JPS616276A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100631719B1 (en) | 2004-12-27 | 2006-10-11 | 엘지전자 주식회사 | Gas supply structure of plasma polymerization apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6242027B2 (en) | 1987-09-05 |
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|---|---|---|---|
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