JPS6164364A - Method for forming coating film - Google Patents
Method for forming coating filmInfo
- Publication number
- JPS6164364A JPS6164364A JP59187008A JP18700884A JPS6164364A JP S6164364 A JPS6164364 A JP S6164364A JP 59187008 A JP59187008 A JP 59187008A JP 18700884 A JP18700884 A JP 18700884A JP S6164364 A JPS6164364 A JP S6164364A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- coating film
- plate
- rotation
- shaped substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Application Of Or Painting With Fluid Materials (AREA)
- Photovoltaic Devices (AREA)
Abstract
Description
【発明の詳細な説明】
く技術分野〉
本発明は板状基板を回転させて表面に塗布膜を形成する
方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION Technical Field The present invention relates to a method for forming a coating film on the surface of a plate-shaped substrate by rotating it.
〈従来技術〉
例えば単結晶シリコン太陽電池は、P型シリコン半導体
基板を利用し、その表面にN型不純物を添加した被膜を
形成し、被膜で被われたシリコン基板を熱処理すること
によって表面に上記N型不純物を拡散させて光電変換の
ためのPN接合が作られている。<Prior art> For example, a single-crystal silicon solar cell uses a P-type silicon semiconductor substrate, forms a film doped with N-type impurities on its surface, and heat-treats the silicon substrate covered with the film to add the above-mentioned properties to the surface. A PN junction for photoelectric conversion is created by diffusing N-type impurities.
上記N型不純物を添加した被膜はPN接合形成のためだ
けではなく、近年では熱処理中の反応によって例えばチ
タン酸化物を生成して反射防止膜になり得る材料が用い
られる。この踵の材料は揮発性の溶媒にN型不純物及び
チタンの化合物が溶けた溶液として供給され、該溶液を
塗布してシリコン表面に膜が形成される。上記塗布膜が
形成される際、シリコン基板を回転させることによって
滴下した塗布液をシリコン基板面に拡げる方法が採られ
ている。シリコン基板が円形をなす場合には、上述のよ
うに回転によって塗布液を拡げることにより、基板全域
にわたって比較的容易に均一な塗布膜を形成することが
できる。しかし円形からずれた例えば正方形や矩形状の
ウェハでは、上記従来の同じ回転塗布法によれば、コー
ナ部と中央部で膜厚が異なり、そのために太陽電池など
では光電変換効率を低下させる惧れがあった。The film doped with N-type impurities is not only used to form a PN junction, but in recent years, materials have been used that can produce, for example, titanium oxide through a reaction during heat treatment and become an antireflection film. The heel material is supplied as a solution in which an N-type impurity and a titanium compound are dissolved in a volatile solvent, and the solution is applied to form a film on the silicon surface. When the coating film is formed, a method is adopted in which the silicon substrate is rotated to spread the dropped coating liquid over the silicon substrate surface. When the silicon substrate has a circular shape, a uniform coating film can be formed relatively easily over the entire substrate area by spreading the coating liquid by rotation as described above. However, for wafers that are deviated from circular shapes, such as squares or rectangles, if the same conventional spin coating method is applied, the film thickness will be different between the corners and the center, which may reduce photoelectric conversion efficiency in solar cells, etc. was there.
〈発明の目的〉
本発明は上記従来の塗布膜形成法の間頂点に鑑みてなさ
れたもので、円形とは異なる形状の板状基板表面にも均
一な厚膜の被膜を形成することができる塗布膜形成法を
提供する。<Object of the Invention> The present invention has been made in consideration of the above-mentioned conventional coating film forming method, and it is possible to form a uniform thick film even on the surface of a plate-shaped substrate having a shape different from a circular one. A coating film forming method is provided.
〈実施列〉
第1図において、正方形又は矩形に裁断されたP型シリ
コン単結晶半導体基板1は、回転速度の調整が可能な回
転軸2上に装着され、回転が付勢される。動作開始時の
回転は第2図中の実線で示す如く低速回転からはじめら
れる。回転開始前又は低速回転の期間に塗布液3がシリ
コン基板1の表面に滴下される。該滴下された塗布液1
−を回転に伴なう円心力で周囲に拡げられ、シリコン基
板1の表面全面に塗布膜が形成される。<Implementation row> In FIG. 1, a P-type silicon single crystal semiconductor substrate 1 cut into a square or rectangle is mounted on a rotating shaft 2 whose rotational speed can be adjusted, and rotation is applied. The rotation at the start of the operation starts at low speed rotation as shown by the solid line in FIG. The coating liquid 3 is dropped onto the surface of the silicon substrate 1 before the rotation starts or during a period of low speed rotation. The dropped coating liquid 1
- is spread around by the centripetal force accompanying the rotation, and a coating film is formed on the entire surface of the silicon substrate 1.
上記低速回転によって塗布C夜3が基板表面に広げられ
た時点で、続いて急速て高速回転(例えば3000 r
pm)に加速される。高速回転の期間は例えばα5 s
ecのような短時間であるが、この期間に不要な塗布液
が飛び散ると共に、生成される塗布膜の膜厚が決定され
、更には溶媒の乾燥がなされる。高速回転の期間の後瞬
時に回転が停止され、熱処理工程に付される0
基板1に滴下される塗布液3r/i有機溶媒にチタンの
化合物が溶けていると共だ、N型不純物であるリンをも
含んだ溶液であり、該溶液の濃度によって上記塗布膜形
成時の回転数及び時間は変り得る。溶液の濃度を低くし
て揮発性を高め、高速期間の短縮をはかり、基板周囲に
溶液が溜るのを防止する。Once the coating C3 has been spread on the substrate surface by the above-mentioned low-speed rotation, it is then rapidly rotated at a high speed (e.g., 3000 rpm).
pm). For example, the period of high-speed rotation is α5 s.
Although it is a short period of time such as ec, during this period, unnecessary coating liquid is scattered, the thickness of the coating film to be produced is determined, and the solvent is further dried. After a period of high-speed rotation, the rotation is stopped instantaneously and the coating liquid is subjected to a heat treatment process.The titanium compound dissolved in the organic solvent of the coating liquid 3r/i dropped onto the substrate 1 is an N-type impurity. The solution also contains phosphorus, and the number of revolutions and time during the formation of the coating film can vary depending on the concentration of the solution. The concentration of the solution is lowered to increase volatility, shorten the high speed period, and prevent solution buildup around the substrate.
尚比較のために従来の塗布膜形成工程の時間変化を第2
図中に破線で示す。For comparison, the time change of the conventional coating film forming process is shown in the second graph.
Indicated by a broken line in the figure.
第2図中の実線で示した本実施例は、低速回転によって
一応基板表面に塗布液が拡げられた後瞬時に高速回転に
もたらし、また高速回転からの停止時にも瞬時に行う狐
のである。In this embodiment, shown by the solid line in FIG. 2, after the coating liquid is spread over the substrate surface by low-speed rotation, high-speed rotation is instantaneously brought about, and also instantaneously when stopping from high-speed rotation.
上記工程を経て塗布膜形成後、熱処理したシリコン基板
は、基板表面KPN接合が形成され、表面がチタン酸化
物からなる反射防上膜で被われた太陽電池基板が得られ
る。After the coating film is formed through the above steps, the heat-treated silicon substrate has a KPN junction formed on the substrate surface, and a solar cell substrate whose surface is covered with an anti-reflection film made of titanium oxide is obtained.
太陽電池基板表面を観察したところ、本実施例による太
陽電池は、反射防止膜として最適な膜厚、即ちブルーの
干渉色を基板全面に得ることができた。しかし、実線で
示しだ工程を経た太陽電池基板は矩形のコーナ部分等に
膜の不均一がみられ、このため((変換効率において本
実施例の工程を経て作製した太陽電池(ri、第2図中
の破線で示した工程のものに比べて約2.5%高い変換
効率が得られた。When the surface of the solar cell substrate was observed, it was found that the solar cell according to this example was able to obtain an optimal film thickness as an antireflection film, that is, a blue interference color over the entire surface of the substrate. However, in the solar cell substrate that underwent the process shown by the solid line, non-uniformity of the film was observed in the corners of the rectangle, etc. A conversion efficiency higher by about 2.5% was obtained than in the step shown by the broken line in the figure.
く効果〉
以上本発明によれば、塗布液を回転によって広げる際の
回転運動を制御することにより、円形基板のみならず、
円形からはずれた形状の板状基板の表面全域に塗布膜を
均一に作成することができるOEffects> As described above, according to the present invention, by controlling the rotational movement when spreading the coating liquid by rotation, it is possible to apply not only circular substrates but also circular substrates.
A coating film can be uniformly created over the entire surface of a plate-shaped substrate with a shape that deviates from a circle.
第1図は本発明の説明に供する半導体基板取付図、第2
図は本発明の一実施例の動作及び従来の動作を比較説明
するタイムチャートである01:半導体基板、 2
:回転軸、 3:塗布液。Fig. 1 is a semiconductor substrate mounting diagram used to explain the present invention;
The figure is a time chart for comparing and explaining the operation of one embodiment of the present invention and the conventional operation. 01: Semiconductor substrate, 2
: Rotating shaft, 3: Coating liquid.
Claims (3)
て、板状基板を回転軸上に装着した後板状基板に塗布液
を滴下し、低速回転によって塗布液を板状基板全面に広
げ、その後急速に高速回転させて瞬時に停止させ、板状
基板面に均一な塗布膜を形成することを特徴とする塗布
膜形成法。(1) In a method of forming a volatile coating film on the surface of a plate-shaped substrate, the plate-shaped substrate is mounted on a rotating shaft, and then a coating liquid is dropped onto the plate-shaped substrate, and the coating liquid is applied over the entire surface of the plate-shaped substrate by slow rotation. A coating film forming method characterized by spreading, then rapidly rotating at high speed and stopping instantly to form a uniform coating film on the surface of a plate-shaped substrate.
特徴とする請求の範囲第1項記載の塗布膜形成法。(2) The coating film forming method according to claim 1, wherein the plate-like substrate has a shape deviated from a circle.
であり、塗布膜はシリコン基板表面を被う反射防止膜で
あることを特徴とする請求の範囲第2項記載の塗布膜形
成法。(3) The coating film forming method according to claim 2, wherein the plate-like substrate is a silicon wafer cut into a rectangular shape, and the coating film is an antireflection film covering the surface of the silicon substrate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59187008A JPS6164364A (en) | 1984-09-05 | 1984-09-05 | Method for forming coating film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59187008A JPS6164364A (en) | 1984-09-05 | 1984-09-05 | Method for forming coating film |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6164364A true JPS6164364A (en) | 1986-04-02 |
Family
ID=16198585
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59187008A Pending JPS6164364A (en) | 1984-09-05 | 1984-09-05 | Method for forming coating film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6164364A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63200866A (en) * | 1987-02-17 | 1988-08-19 | Hitachi Maxell Ltd | Method for coating optical disk with protective film |
| JPH0248078A (en) * | 1988-08-08 | 1990-02-16 | Toppan Printing Co Ltd | Spin coating method |
-
1984
- 1984-09-05 JP JP59187008A patent/JPS6164364A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63200866A (en) * | 1987-02-17 | 1988-08-19 | Hitachi Maxell Ltd | Method for coating optical disk with protective film |
| JPH0248078A (en) * | 1988-08-08 | 1990-02-16 | Toppan Printing Co Ltd | Spin coating method |
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