JPS6177724A - Infrared-ray control device - Google Patents
Infrared-ray control deviceInfo
- Publication number
- JPS6177724A JPS6177724A JP59200113A JP20011384A JPS6177724A JP S6177724 A JPS6177724 A JP S6177724A JP 59200113 A JP59200113 A JP 59200113A JP 20011384 A JP20011384 A JP 20011384A JP S6177724 A JPS6177724 A JP S6177724A
- Authority
- JP
- Japan
- Prior art keywords
- infrared
- lens
- amount
- target
- aperture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/07—Arrangements for adjusting the solid angle of collected radiation, e.g. adjusting or orienting field of view, tracking position or encoding angular position
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0806—Focusing or collimating elements, e.g. lenses or concave mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/084—Adjustable or slidable
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0856—Slit arrangements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の技術分野〕
この発明は、撮影対象目標からの赤外光量が多くて2次
元IR−CCD (Infra Red −Charg
eCoupled Devtce )の赤外線センサの
蓄積部の蓄積電荷量が飽和するのを防止できるようにし
た赤外光制御装置に関する。[Detailed Description of the Invention] [Technical Field of the Invention] The present invention provides a two-dimensional IR-CCD (Infra Red-Charg
The present invention relates to an infrared light control device that can prevent the amount of accumulated charge in the accumulation section of an infrared sensor of eCoupled Devtce from becoming saturated.
一般に、赤外光の検知素子のひとつであるIR−COD
を使った赤外撮像装置で赤外光を放射している目標を映
像としてとらえる場合、IR−CCDの蓄積部のエレク
トロン蓄Ft fiが限られているために、常温から高
温の目標を映し出すには、ダイナミ、ツクレンツが小さ
い。また、低温側に赤外レンズの開口を設定すると高温
では飽和してしまう。後に記す(1)式で明らかなよう
に、一般には感光時間Δtを可変にして対処している。Generally, IR-COD is one of the infrared light detection elements.
When capturing images of targets emitting infrared light using an infrared imaging device using , the dynamism and power consumption are small. Furthermore, if the aperture of the infrared lens is set on the low temperature side, it will become saturated at high temperatures. As is clear from equation (1) described later, this is generally handled by making the exposure time Δt variable.
C背景技術の問題点〕 しかし、このΔtの可変には自と制限が生ずる。C Problems with background technology] However, there are limits to the variation of this Δt.
また、(1)式で明らかなようにλ1〜λ2を狭く(す
なわち光学帯域フィルタを挿入)する。これは目標から
の信号も小さくなりあまり狭くできない。Furthermore, as is clear from equation (1), λ1 to λ2 are narrowed (that is, an optical bandpass filter is inserted). This means that the signal from the target will also be small, making it impossible to narrow it down too much.
さらに、赤外レンズの開口径(F値)が異る種々の赤外
レンズを用意し、目標に応じて交換すればよいが、交換
のわずられしさと、費用がかかり得策でな〜・。Furthermore, it is possible to prepare various infrared lenses with different aperture diameters (F-numbers) and replace them according to the target, but this is not a good idea as it is cumbersome and expensive to replace. .
一方、赤外センサに使用される2次元IR−COD検知
素子は一般の可視のCODイメージ検知器に比して、暗
電流分が多い。この暗電流が蓄稜部に蓄積される。目標
からの信号によりIR−CCD検知素子の一画素に蓄積
されるエレクトロンの数は(1)式の通りである。On the other hand, a two-dimensional IR-COD detection element used in an infrared sensor has a larger amount of dark current than a general visible COD image detector. This dark current is accumulated in the storage ridge. The number of electrons accumulated in one pixel of the IR-CCD detection element due to the signal from the target is expressed by equation (1).
・・−・・・・・・・・・・・(1)式Ko:レンズの
透過率
Ka:大気の透過率
F :レンズのF値(レンズの焦点距離をf (m)レ
ンズの開口径なり(crn)
とした場合 F=−)
Sd:2次元IR−CCD検知素子の受光面積(cnl
)Δt:感光時間(S)
η :検知素子の量子効率
ε 二目標のエミッシビテイー
C:光速(2,9979X10 (cnlg )
)h ニブランク定数(6,626196X10 (
Jl+))λ :波長(cnt)
k :ゲルラマン定数(1,380622X10−23
(JK−1))T :目標の温度
λ1.λ!:検知素子のフィルタのカットオフ波長とこ
ろで、大気を通して目標をとらえる場合は、大気の温度
による黒体放射によるいわゆるパックグランド雑音が常
に混入し、これも蓄積部にエレクトロンに変換されて、
蓄積される。・・・・・・・・・・・・・・(1) Equation Ko: Lens transmittance Ka: Atmospheric transmittance F: Lens F value (lens focal length is f (m) Lens aperture diameter (crn) When F=-) Sd: Light receiving area of two-dimensional IR-CCD detection element (cnl
) Δt: Photosensitive time (S) η: Quantum efficiency of the sensing element ε Emissivity of two targets C: Speed of light (2,9979X10 (cnlg)
)h Ni blank constant (6,626196X10 (
Jl+))λ: Wavelength (cnt) k: Gel-Raman constant (1,380622X10-23
(JK-1))T: Target temperature λ1. λ! : Cutoff wavelength of the filter of the detection element By the way, when capturing a target through the atmosphere, so-called back-ground noise due to black body radiation due to the temperature of the atmosphere is always mixed in, and this is also converted into electrons in the storage section.
Accumulated.
以上述べたごとく、通常でも暗電流と、パックグランド
雑音で、蓄積部の目標の光電変換後のエレクトロン蓄積
量のダイナミックレンジが小さくなっている。As described above, the dynamic range of the target amount of electrons stored in the storage section after photoelectric conversion is usually small due to dark current and back-ground noise.
上記から明らかなように、第4図に示すごとく、2次元
IR−CCD21の前方に絞りのない一般の赤外−レン
ズ22を配設した場合には、目標23(温度T)からの
光を受光する場合に大気の温度による黒体放射によるパ
ックグランド雑音24が視野角θ内において常に混入す
る。なお、Kaは大気の透過率である。As is clear from the above, when a general infrared lens 22 without an aperture is placed in front of the two-dimensional IR-CCD 21 as shown in FIG. 4, light from the target 23 (temperature T) is When receiving light, back-ground noise 24 due to black body radiation due to atmospheric temperature always mixes within the viewing angle θ. Note that Ka is the transmittance of the atmosphere.
この発明は上記従来の欠点を除去するためになされたも
ので、撮影対象目標からの赤外線光量が多くても、2次
元IR−CODの赤外線センサの蓄積部の蓄積電荷量の
飽和を防止でき、実質入力のダイナミックレンジを拡大
できる赤外光制御装置を提供することを目的とする。This invention was made to eliminate the above-mentioned drawbacks of the conventional technology, and even if the amount of infrared light from the target to be photographed is large, it is possible to prevent the amount of accumulated charge in the accumulation part of the infrared sensor of the two-dimensional IR-COD from saturating. It is an object of the present invention to provide an infrared light control device that can expand the dynamic range of actual input.
この発明の赤外光制御装置は、2次元IR−CODによ
る赤外線センサの前方に赤外線レンズを配設し、この赤
外線レンズに撮像対象目標からの赤外Eメ光量に応じて
自動的に赤外線レンズの開口面積を増減できる機械的な
絞り機構を設けたものである。The infrared light control device of the present invention has an infrared lens disposed in front of an infrared sensor using a two-dimensional IR-COD, and automatically adjusts the infrared lens according to the amount of infrared E-mail from the target to be imaged. It is equipped with a mechanical diaphragm mechanism that can increase or decrease the opening area.
以下、この発明の赤外光制御装置の実施例について図面
に基づき説明する。第1図はその一実施例の構成を示す
図である。この第1図において、2次元IR−CCDに
よる赤外線センサ21の前方に、この赤外線レンジ2ノ
の受光面に結像させるために赤外レンズ22が配設され
ている。Embodiments of the infrared light control device of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing the configuration of one embodiment. In FIG. 1, an infrared lens 22 is disposed in front of an infrared sensor 21 using a two-dimensional IR-CCD in order to form an image on the light receiving surface of the infrared range 2.
この赤外レンズ22の後方には、絞り25が設けられて
いる。絞り25は目標23(tm度T)からの赤外線の
受光量に応じて自動的に赤外レンズ22の開口面積を増
減するように絞り機能(機械的絞り)を有するものであ
る。A diaphragm 25 is provided behind this infrared lens 22. The diaphragm 25 has a diaphragm function (mechanical diaphragm) to automatically increase or decrease the aperture area of the infrared lens 22 according to the amount of infrared rays received from the target 23 (tm degrees T).
なお、この第1図において、24はパックグランド雑音
(T、=300K )、26は絞り25かラノ雑音、θ
は赤外V 7 、e 22 ノF、O,V、(Fiel
dof Vievr ;視野角)、φは絞り25により
狭くなった赤外レンズ22の等価F、0.Vである。In Fig. 1, 24 is pack ground noise (T, = 300K), 26 is aperture 25 or Rano noise, θ
is infrared V 7 , e 22 no F, O, V, (Fiel
dof Vievr (viewing angle), φ is the equivalent F of the infrared lens 22 narrowed by the aperture 25, 0. It is V.
次に、以上のように構成されたこの発明の赤外光制御装
置の作用について説明する。第2図1(、)は第1図の
赤外レンズ22の絞り25と絞り25からの熱雑音の関
係を示すもので、第2図(b)は第2図(、)の側面図
である。この第2図(、)、第2図(b)において、坏
1図と同一部分には同一符号が付されており、27は絞
り25を見込む立体角である。Next, the operation of the infrared light control device of the present invention configured as above will be explained. Figure 2 1 (,) shows the relationship between the aperture 25 of the infrared lens 22 in Figure 1 and the thermal noise from the aperture 25, and Figure 2 (b) is a side view of Figure 2 (,). be. In FIGS. 2(a) and 2(b), the same parts as in FIG.
この発明では、光学帯域フィルタ(図示せず)を固定値
とし、感光時間を固定値にした場合に、低温から高温目
標まで、機械的な絞り25により、ダイナミックレンジ
を拡大しようとするものである。In this invention, when the optical bandpass filter (not shown) is set to a fixed value and the exposure time is set to a fixed value, the dynamic range is expanded from a low temperature to a high temperature target using a mechanical aperture 25. .
第1図において、パックグランドからの雑音24により
光電変換され、2次元IR−CODの赤外線センサ21
の1画素に蓄積されるエレクトロンの数QBを(2)式
で示す。ただし、赤外レンズ22の明るさをFとして、
絞りFBまで絞った場合、赤外レンズ22の等価F、O
,Vが、FのときθがFBでψとなったとする。In FIG. 1, noise 24 from the pack ground is photoelectrically converted into a two-dimensional IR-COD infrared sensor 21.
The number QB of electrons accumulated in one pixel is expressed by equation (2). However, assuming that the brightness of the infrared lens 22 is F,
When the aperture is stopped down to FB, the equivalent F and O of the infrared lens 22 are
, V are F, and θ becomes ψ at FB.
Q、==[g # (l Km) ・Sd ・Δ1xη
”i+X+(1−cai(2tan−1(著月〕Ko
) Ka r Sd rΔt、η、C,h、に、λ、。Q, == [g # (l Km) ・Sd ・Δ1xη
”i+X+(1-cai(2tan-1)Ko
) Ka r Sd rΔt, η, C, h, λ,.
λ2は(1)式と同じ、
εB=大気のエミッシビテイー
FB:絞り値(レンズの等価F値)
T、二大気の温度
この第1図において、絞り25による黒体放射により光
電変換され、2次元IR−CODの赤外線センサ2ノの
一画素に蓄積されるエレクトロンの数Q、を(3)式で
示す。λ2 is the same as equation (1), εB = atmospheric emissivity FB: aperture value (equivalent F value of the lens) T, temperature of the two atmospheres. The number Q of electrons accumulated in one pixel of the infrared sensor 2 of the IR-COD is expressed by equation (3).
Qt:=Sd −Δt ・η・tix+ [[C1−w
(2tm−’ (2’y)) )(エレクトロン)・
・・・・・・・・(3) 式εi:絞りのエミッシピテ
ィ
以上(1ン式、(2)式、(3)式で得られたエレクト
ロンの数に、さらに暗電流分のエレクトロンQ。Qt:=Sd −Δt・η・tix+ [[C1−w
(2tm-'(2'y)) ) (electron)・
・・・・・・・・・(3) Equation εi: More than the emissivity of the aperture (1 n equation, the number of electrons obtained by equations (2), and (3), plus the electron Q for the dark current.
が加算されることになる。will be added.
いま、2次元IR−CODの赤外線センサ2ノの一画素
の蓄積容量をQll(エレクトロン)とすると、
Q8> (QT+QB+Q、 +Q、 )なる条件を満
すように、絞りFBを切り換えれば、飽和しないで低温
から高温まで、広いダイナミックレンジで撮像可能であ
る。Now, if the storage capacity of one pixel of the infrared sensor 2 of the two-dimensional IR-COD is Qll (electron), then if the aperture FB is switched so that the condition Q8> (QT+QB+Q, +Q, ) is satisfied, saturation is achieved. It is possible to capture images in a wide dynamic range from low to high temperatures.
以下に、下記条件のもとで算出した目標温度対蓄積部へ
変換されたエレクトロン数を、F。Below, the target temperature calculated under the following conditions versus the number of electrons converted to the storage section is expressed as F.
をパラメータとして第3図に示す。is shown in FIG. 3 as a parameter.
レンズの透過率(光学系の透過率) Ko=0.
5大気の透過率 Ka=0.8レン
ズの明るさ F=1.8検知素子の一
画素の受光面積 5d=4.7X10 cm感光時間
Δを冨1ms量子効率
η=0.1目標のエミッシビテイ−
ε= 1
大気のエミッシビティー εB:1絞りのエミ
ッシビティー ε、= 1大気、測定系周
りの温度 T、=300に光学フィルタの帯域
λ、=4.4μm〜λ、=4.7μm2次元IR−CO
Dの赤外線センサ21の蓄積部の面積を800μmとし
た場合の飽和電荷(エレクトロン)の数は5X106(
エレクトロン)であり、Δt ” 1 m s間の一画
素蓄積部への暗電流が電荷に換算された量は5×105
(エレクトロン)である(この暗電流分は、一般のIR
−CODに対して少し多いモデルである)。Lens transmittance (optical system transmittance) Ko=0.
5 Atmospheric transmittance Ka=0.8 Lens brightness F=1.8 Light receiving area of one pixel of detection element 5d=4.7X10 cm Photosensitivity time Δ to 1ms Quantum efficiency
Emissivity of η = 0.1 target
ε = 1 Emissivity of the atmosphere εB: Emissivity of 1 aperture ε, = 1 Atmosphere, temperature around the measurement system T, = Bandwidth of the optical filter at 300
λ, = 4.4 μm ~ λ, = 4.7 μm 2-dimensional IR-CO
When the area of the accumulation part of the infrared sensor 21 of D is 800 μm, the number of saturated charges (electrons) is 5×106 (
electrons), and the amount of dark current flowing into one pixel storage unit during Δt ” 1 ms converted into charge is 5×105
(electron) (this dark current is a typical IR
- This is a model with a little more than COD).
第3図で示すごとくに、F=1.8(絞り全開)時には
常温300に近くの目標は、非常に感度よく温度差を弁
別できるが、すぐに飽和レベルに達する。飽和レベルに
達すれば、絞り25をFB=3に切り換えて、より高温
の目標を弁別できる。この実施例では275に〜715
Kまで、F = 1.8〜22で弁別可能である。As shown in FIG. 3, when F=1.8 (fully open aperture), a target close to room temperature 300 can discriminate temperature differences with great sensitivity, but it quickly reaches a saturation level. Once the saturation level is reached, the aperture 25 can be switched to FB=3 to discriminate higher temperature targets. In this example 275 to 715
Up to K, discrimination is possible with F = 1.8-22.
以上のように、この発明の赤外光制御装置によれば、赤
外レンズに受光量に応じて自動的に絞りが開閉する絞り
機能をもたせるようにしたので、撮像対象目標からの赤
外光量が多(でも赤外線センサの蓄積部の蓄積電荷量の
飽和を未然に防止でき、実質入力ダイナミックレンジを
拡大できる効果を奏するものである。As described above, according to the infrared light control device of the present invention, since the infrared lens has an aperture function that automatically opens and closes the aperture according to the amount of received light, the amount of infrared light from the target to be imaged is However, saturation of the amount of charge stored in the storage section of the infrared sensor can be prevented, and the effective input dynamic range can be expanded.
第1図はこの発明の赤外光制御装置の−実施例の構成を
示す断面図、第2図(、)は同上赤外光制御装置におけ
る赤外レンズの絞りと絞りからの熱雑音の関係を示す断
面図、第2図(b)は第2図(、)の側面図、第3図は
同上赤外光制御装置における絞りを切り換えた場合の撮
像対象目標対赤外線センサの蓄積部の総蓄積エレクトロ
ン数の関係を示す図、第4図は従来の赤外レンズを利用
した赤外線撮像装置の赤外線センサへの入射光の様子を
示す図である。
2ノ・・・赤外線センサ、22・・・赤外レンズ、23
・・・目標、24・・・バックグランド雑音、25・・
・絞り、26・・・絞りからの雑音。
出願人代理人 弁理士 鈴 江 武 彦第1図
2−′
7−′
第2図
(2) % (b)
日々し払慶閃Fig. 1 is a sectional view showing the configuration of an embodiment of the infrared light control device of the present invention, and Fig. 2 (,) is the relationship between the aperture of the infrared lens and the thermal noise from the aperture in the infrared light control device. FIG. 2(b) is a side view of FIG. 2(a), and FIG. 3 is a cross-sectional view showing the target to be imaged versus the total storage section of the infrared sensor when the aperture in the infrared light control device is switched. A diagram showing the relationship between the number of accumulated electrons and FIG. 4 is a diagram showing the state of incident light on an infrared sensor of an infrared imaging device using a conventional infrared lens. 2 No.. Infrared sensor, 22.. Infrared lens, 23
...Target, 24...Background noise, 25...
・Aperture, 26...Noise from the aperture. Applicant's agent Patent attorney Takehiko Suzue Figure 1 2-'7-' Figure 2 (2) % (b)
Claims (1)
ンサと、この赤外線センサの前方に配設され赤外線セン
サの受光面に赤外光を結像させる赤外レンズと、入射光
量に応じて自動的に赤外レンズの実行開口面積を可変す
る絞りとを具備する赤外光制御装置。An infrared sensor using an infrared charge coupled device, an infrared lens placed in front of the infrared sensor that forms an image of infrared light on the receiving surface of the infrared sensor, and an infrared lens that automatically forms an image according to the amount of incident light. An infrared light control device comprising: an aperture that changes the effective aperture area of the infrared light control device;
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59200113A JPS6177724A (en) | 1984-09-25 | 1984-09-25 | Infrared-ray control device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59200113A JPS6177724A (en) | 1984-09-25 | 1984-09-25 | Infrared-ray control device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6177724A true JPS6177724A (en) | 1986-04-21 |
Family
ID=16419042
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59200113A Pending JPS6177724A (en) | 1984-09-25 | 1984-09-25 | Infrared-ray control device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6177724A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04128619A (en) * | 1990-09-19 | 1992-04-30 | Suga Shikenki Kk | Radiation-illumino-meter |
| WO2016051848A1 (en) * | 2014-09-30 | 2016-04-07 | 富士フイルム株式会社 | Infrared imaging device, diaphragm control method, and diaphragm control program |
| CN106716991A (en) * | 2014-09-30 | 2017-05-24 | 富士胶片株式会社 | Infrared imaging device, image processing method, and image processing program |
-
1984
- 1984-09-25 JP JP59200113A patent/JPS6177724A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04128619A (en) * | 1990-09-19 | 1992-04-30 | Suga Shikenki Kk | Radiation-illumino-meter |
| WO2016051848A1 (en) * | 2014-09-30 | 2016-04-07 | 富士フイルム株式会社 | Infrared imaging device, diaphragm control method, and diaphragm control program |
| JPWO2016051848A1 (en) * | 2014-09-30 | 2017-04-27 | 富士フイルム株式会社 | Infrared imaging device, aperture control method, and aperture control program |
| CN106716991A (en) * | 2014-09-30 | 2017-05-24 | 富士胶片株式会社 | Infrared imaging device, image processing method, and image processing program |
| CN106796142A (en) * | 2014-09-30 | 2017-05-31 | 富士胶片株式会社 | Infrared camera device, aperture control method and aperture control program |
| CN106716991B (en) * | 2014-09-30 | 2019-07-23 | 富士胶片株式会社 | Infrared imaging device, image processing method, and recording medium |
| US10362243B2 (en) | 2014-09-30 | 2019-07-23 | Fujifilm Corporation | Infrared imaging device, diaphragm control method, and diaphragm control program |
| US10462387B2 (en) | 2014-09-30 | 2019-10-29 | Fujifilm Corporation | Infrared imaging device, image processing method, and image processing program |
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