JPS6186942A - Discharge reaction apparatus using rotary magnetic field - Google Patents

Discharge reaction apparatus using rotary magnetic field

Info

Publication number
JPS6186942A
JPS6186942A JP59207530A JP20753084A JPS6186942A JP S6186942 A JPS6186942 A JP S6186942A JP 59207530 A JP59207530 A JP 59207530A JP 20753084 A JP20753084 A JP 20753084A JP S6186942 A JPS6186942 A JP S6186942A
Authority
JP
Japan
Prior art keywords
electrode
magnetic field
vacuum container
discharge
discharge reaction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59207530A
Other languages
Japanese (ja)
Other versions
JPH0346172B2 (en
Inventor
Kiyoushiyoku Kin
金 京植
Uirukinson Ooen
オーエン ウイルキンソン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Anelva Corp
Original Assignee
Anelva Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anelva Corp filed Critical Anelva Corp
Priority to JP59207530A priority Critical patent/JPS6186942A/en
Priority to KR1019850006330A priority patent/KR910000508B1/en
Priority to EP85306186A priority patent/EP0173583B1/en
Priority to DE8585306186T priority patent/DE3580953D1/en
Publication of JPS6186942A publication Critical patent/JPS6186942A/en
Priority to US07/110,622 priority patent/US4829215A/en
Publication of JPH0346172B2 publication Critical patent/JPH0346172B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32623Mechanical discharge control means
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/517Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using a combination of discharges covered by two or more of groups C23C16/503 - C23C16/515
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3266Magnetic control means

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Chemical Vapour Deposition (AREA)
  • ing And Chemical Polishing (AREA)
  • Drying Of Semiconductors (AREA)

Abstract

PURPOSE:To enable high quality and high speed treatment, by providing a means for generating a rotary magnetic field along the surface of an electrode and a means for limiting or prohibiting the motion of the electron moving around the electrode. CONSTITUTION:An article 102 to be treated is placed on a non-earthed electrode 101, of which the entire surface is covered with an insulator 103 made of a fluorocarbon resin, within an earthed metal vacuum container 100. High frequency power is applied between the vacuum container 100 and the electrode 101 from a power source 125 and, at the same time, a three-phase AC current is flowed to the coils 104, 105, 106 provided to the outside of the vacuum container 100 from a power source 127 and a rotary magnetic field B parallel to the flat surface of the electrode 101 is formed. As a result, an electron is inhibited from a turn-around dummy cycloid motion around the electrode 101 by the side surface of the insulator 103 and the inner wall of the vacuum container 100 but rotated in the direction of the magnetic field B and high density plasma is generated in the vicinity of the flat surface part of the electrode 101.

Description

【発明の詳細な説明】 (茨業上の利用分野) 本発明は、A’Z中で放電により気体プラズマを発生さ
せ、これを用いて被処理物表面に薄膜堆積。
Detailed Description of the Invention (Field of Ibara Industrial Application) The present invention generates gas plasma by electric discharge in A'Z, and uses this to deposit a thin film on the surface of a workpiece.

エツチング、清浄化、硬化9表面変質等の処理を施す放
電反応装置に関する。
This invention relates to a discharge reaction device that performs treatments such as etching, cleaning, hardening, and surface alteration.

(従来技術とその問題点) 従来これらの装置としては、2電極放電力式のものが代
表的であるが、例えばその非接地1+j電極上に被処理
物を載置して処理を行なう場会、七の処理速度を尚めん
として電極間に加える電力を垢加させてプラズマの密度
を上昇させると、七〇)非接地0IIl電極の負電圧の
絶対値が増加して、その結果処理が低効率化し、イオン
慟撃か強くなって被処理物を大きく損傷する欠点がある
0 この問題を解決「るために、電v!、面に半行に、また
は電極面を憶う形に磁界を作り、この磁界Q)力をかり
て簡密度の放電プラズマを電極の近切ζこ発生させ、こ
のプラズマで被処理物を処理することが行なわれている
(Prior art and its problems) Conventionally, these devices are typically of the two-electrode discharge force type, but for example, in cases where the object to be processed is placed on the non-grounded 1+j electrode and processed. If the density of the plasma is increased by increasing the power applied between the electrodes in order to maintain the processing speed of 70), the absolute value of the negative voltage of the ungrounded 0IIl electrode will increase, resulting in a reduction in processing speed. In order to solve this problem, the magnetic field is applied in half a line on the surface or in a shape that follows the electrode surface. This magnetic field Q) is used to generate discharge plasma with a low density near the electrode, and the object to be processed is treated with this plasma.

このときの高密度放電プラズマ発生の理由は、周知のよ
うに、電子の運動が磁界の力で凹げられて軌追が湾曲し
t@璧寺と憫笑を株返して擬似サイクロイド運動を生ず
る7ζめであり、これを第1」用する従来の装置の代表
的なものとしては第8,9゜10図の構成の装置をあげ
ることができる。
The reason for the generation of high-density discharge plasma at this time is, as is well known, that the motion of the electrons is concave due to the force of the magnetic field, causing the trajectory to curve, resulting in pseudo-cycloidal motion. A typical example of a conventional device using this method is a device having the structure shown in FIGS. 8, 9 and 10.

これらの図で、10は電極、11は電子eの擬似サイク
ロイド運動、12は磁力線、Bは磁界の方向を示す。第
10図の13は真空容器である。
In these figures, 10 indicates the electrode, 11 indicates the pseudo-cycloid motion of the electron e, 12 indicates the lines of magnetic force, and B indicates the direction of the magnetic field. 13 in FIG. 10 is a vacuum container.

第8,9図では真空容器の図示は省略しである。In FIGS. 8 and 9, illustration of the vacuum container is omitted.

この擬似サイクロイド運動11において、電子eは’6
jmlOの表面又はその回りに沿って一定方向に周回運
動−4−る。この周回運動の方向は、磁界の方向と直泥
1シ界の方向とで自づから決り、第8図では平板状をし
た電極10の表面のトラックを時計回りにエンドレスに
走り、第9図では柱状をしだ電極10の1わりを図の如
くエンドレスに周回し、第10図では、真空容器13の
内壁を覆って取付けられた多数の電極10を、次々と伝
って内壁に沿って時計方向にエンドレスに周回運動する
ことになる。
In this pseudo-cycloid motion 11, the electron e is '6
Circulating motion in a fixed direction along or around the surface of jmlO. The direction of this circular motion is determined by the direction of the magnetic field and the direction of the linear magnetic field, and in FIG. 8 it runs clockwise endlessly on the surface of the flat electrode 10, and in FIG. As shown in the figure, the columnar electrode 10 goes around endlessly as shown in the figure, and in FIG. It will move endlessly in the direction.

さて、この擬似サイクロイド運動が電極10の表面また
はその(ロ)りを周回運動するのを禁止もしくは制限し
て、擬似サイクロイド運動が電極10の所望の表面での
み行なわれるように装置を構成すれば、少くともその分
だけは昼密度のプラズマ、従って速い処理が実現しそう
であるが、これを行なう第11.12図の構成の装置は
未だ実施されていない。ただし、第11.12図には前
記と同じ部材には同じ符号を付与しである。14は絶縁
物、15は絶縁物で作られた障壁であって、ともに電子
の周回運動を制限又は禁止することを目的として取付け
られたものである。
Now, if the device is configured such that this pseudo-cycloidal motion is prohibited or restricted from moving around the surface of the electrode 10 or around it, so that the pseudo-cycloidal motion is performed only on a desired surface of the electrode 10. , it is likely that a daytime-density plasma and thus faster processing will be realized, at least to that extent, but an apparatus having the configuration shown in FIGS. 11 and 12 that accomplishes this has not yet been implemented. However, in FIGS. 11 and 12, the same members as above are given the same reference numerals. 14 is an insulator, and 15 is a barrier made of an insulator, both of which are installed for the purpose of restricting or prohibiting the circular movement of electrons.

第11.12図の装置が実用されない理由は、電子の周
回が前述したように一方向に限られるためであり、周回
を禁止または制限する部材があると、電子はその部材に
衝突して跳躍するが、反対方向には周回し得ず再びもと
の方向に周回せんと結局障害物の近傍に停滞することに
なり、第13図に多数の点で示したように、プラズマの
@度分布に大きい勾配即ち不均一を生じてこのプラズマ
に曝される被処理物の処理に甚だしい不均一性を生ずる
ためである。
The reason why the device shown in Figure 11.12 is not put into practical use is that the orbiting of electrons is limited to one direction as mentioned above, and if there is a member that prohibits or restricts orbiting, the electrons will collide with that member and jump. However, it cannot orbit in the opposite direction and if it does not orbit in the original direction again, it will end up stagnating near the obstacle, and as shown by the many points in Figure 13, the plasma @ degree distribution This is because a large gradient or non-uniformity occurs in the plasma, resulting in significant non-uniformity in the treatment of the workpiece exposed to this plasma.

(発明の目的) 本発明は、電極の表面に沿ってその近傍に、高密度でし
かも均一性にすぐれたプラズマを実現し高品質かつ高速
の処理を可能にする放電反応装置を提供することを目的
とする。
(Object of the Invention) The present invention aims to provide a discharge reactor that realizes high-density and highly uniform plasma along and near the surface of an electrode, thereby enabling high-quality and high-speed processing. purpose.

(発明の構成) 本発明は、電極を内蔵する真空容器と、前記真空容器内
に所定のガスを導入する手段と、前記真空容器内の圧力
を制御する手段と、前記t&に電力を供給して放電を発
生させる手段とを七し、この真空容器内に行かれた被処
理物を、前記放電によって生じたプラズマで処理する放
電反応装置において、上記構成の上に、前記電極の表面
に沿う回転磁界を発生する手段と、前記電極の1わりに
周回せんとする電子の周回運動を制限または祭する手段
とを加味するaDMの装置によって前記目的を達成した
ものである。
(Structure of the Invention) The present invention includes a vacuum container containing an electrode, a means for introducing a predetermined gas into the vacuum container, a means for controlling the pressure in the vacuum container, and a means for supplying electric power to the t&. In the discharge reaction apparatus, a means for generating a discharge is provided, and a workpiece placed in the vacuum vessel is treated with the plasma generated by the discharge. The above object has been achieved by an aDM device which includes means for generating a rotating magnetic field and means for restricting or restricting the orbital movement of electrons that are intended to orbit around one of the electrodes.

(実施例) 以下、本発明の実施例を図面に基いて説明する。(Example) Embodiments of the present invention will be described below with reference to the drawings.

第1図の実施例においては、接地された金属製真を容器
100内には、弗素樹脂製の絶縁体103で下部全体を
覆われた非接地電極101の上に被処理物102が載置
されている。
In the embodiment shown in FIG. 1, a grounded metal stem is placed in a container 100, and a workpiece 102 is placed on a non-grounded electrode 101 whose entire lower part is covered with an insulator 103 made of fluororesin. has been done.

ガス入口108からは、複数のガスポンベ123より、
バルブ122.バリアプルリーク121を経由して所定
の成分・混合比の処理ガスがX空容器100内に導入さ
れて前6己電極101の表面に流され、排気口109か
らは圧力調整パルプ110を経由してポンプ120によ
って真空容器100内のガスが外部に排出される。
From the gas inlet 108, a plurality of gas pumps 123,
Valve 122. Processing gas with predetermined components and mixing ratio is introduced into the X-empty container 100 via the barrier pull leak 121 and is flowed onto the surface of the front electrode 101, and from the exhaust port 109 via the pressure adjusting pulp 110. The gas inside the vacuum container 100 is then exhausted to the outside by the pump 120.

真空容器100 (!: @、% 101 )jHJk
:、t(2源125より高周波電力を印加すると同時に
、真空容器100の外部のコイル104,105.10
6に電源127から図示しない配線を通して三相交流電
流を流して、電極101の平面部(表面)に平行な回転
磁界Bを作ると、電子は絶縁体103の側面及び真空容
器100の内壁で、電極101をめぐる周回擬似サイク
ロイド運動を阻止されるが、磁界Bの方向が回転するた
め、停面をまぬがルで分散し、電極101の平面部の近
傍に均一〃\つ高密度のプラズマを発生する。ただし、
こ\でnう均−とは、プラズマの時間的な平均値が、電
極の平面部上面の各場所で均一であることを意味してい
る。この均一かつ高密朋のプラズマによって被処理物1
()2は高い均一度で高速に処理されることになる。1
′i、極】02を冷却あるいは温度調節するために流体
の4肯129か設備ちれている。第1図(71円弧状の
矢印111は磁界Bが回転することをン■テすで)ので
ある。
Vacuum container 100 (!: @, % 101 )jHJk
:, t(When high frequency power is applied from the two sources 125, the coils 104, 105, 10 outside the vacuum vessel 100
When a three-phase alternating current is applied to 6 through wiring (not shown) from a power source 127 to create a rotating magnetic field B parallel to the plane portion (surface) of the electrode 101, electrons are generated on the side surface of the insulator 103 and the inner wall of the vacuum container 100. Circulating quasi-cycloid motion around the electrode 101 is prevented, but since the direction of the magnetic field B rotates, the stopping surface is dispersed around the entire surface, creating a uniform high-density plasma near the flat part of the electrode 101. occurs. however,
Here, "uniform" means that the temporal average value of the plasma is uniform at each location on the upper surface of the flat part of the electrode. The workpiece 1 is heated by this uniform and highly dense plasma.
()2 is processed at high speed with high uniformity. 1
'i, Pole] 02 is equipped with four fluids to cool or adjust the temperature. As shown in FIG. 1 (71, the arc-shaped arrow 111 indicates that the magnetic field B rotates).

11i米υ)嶽がBが固定されている場合は、被処理物
102の処理速度に速いか、処理速度の均一性は非mに
憇い。例えは第1図の装置で、真空容器100内にct
ur”、ガスを導入して、直径5インチのシリコンウェ
ハーを被処理物102として、その表面の8102膜を
食刻するとき、食刻速度の均一性は±40係であった。
11i If B is fixed, the processing speed of the object 102 is fast, or the uniformity of the processing speed is inadequate. For example, in the apparatus shown in FIG.
ur'' gas was introduced to etch the 8102 film on the surface of a 5-inch diameter silicon wafer as the workpiece 102, the uniformity of the etching speed was ±40.

これに対し、同じ装置。On the other hand, the same device.

同じ被処理物を使う本実施例においては、コイル] (
+ 4 、105 、106に商用三相反流を(電源1
27)から印加して同様に食刻したところ、食刻の均一
性を±5%以内に向上させることができた。食刻速度は
5000λ;/m l n以上で従来同様光分に高速で
あった。
In this example, where the same workpiece is used, the coil ] (
+4, 105, 106 with commercial three-phase current (power supply 1
When etching was performed in the same manner by applying the voltage from 27), the uniformity of the etching could be improved to within ±5%. The etching speed was 5000 λ/ml or more, which was faster than the conventional method.

本願の発明者は、これより先に、第1図の装置の印加磁
界として単純な交番磁界を使用し、同様の高速処理と均
一処理の実現に成功した経験をもつが、本実施例の如く
、回転磁界を印加するときは、プラズマは、単純な交番
磁界のときよりも一層均一に、二次元的に分散場れて好
成績の得られることが判明した。
The inventor of this application previously had experience in successfully achieving similar high-speed processing and uniform processing by using a simple alternating magnetic field as the applied magnetic field in the apparatus shown in FIG. It has been found that when a rotating magnetic field is applied, the plasma is more uniformly and two-dimensionally distributed than when a simple alternating magnetic field is applied, resulting in good results.

コイル104.105.106に流す三相父流菟流を犬
にするほど、低い圧力領域で食刻がす\むようになり圧
力数ITITo r rから数十m’i”urrでは食
刻速度7oooA/叫n以上が得られている。
As the three-phase father flow to the coils 104, 105, and 106 is made more precise, etching occurs in a lower pressure range, and the etching speed is 7oooA/ from the pressure number ITITo r r to several tens of m'i''urr. More than a shout is obtained.

一般に、低圧領域では、Bを犬にすればするほど高密度
のプラズマが電極部に集中し、食刻速度が増加する傾向
が見られるが、これにはさらに、圧力、高周波電力との
相関がある。
Generally, in a low-pressure region, the higher B is, the higher the density of plasma is concentrated on the electrode, and the etching rate tends to increase. be.

上記は食刻の場合を述べたが、この真空容器100内に
プラズマCVDに用いられる諸ガスを導入して、電極1
01の近傍に置かれた被処理基板例えは130(接地又
は浮遊電位で用いる)上に所望の薄膜を堆積することが
できる。
Although the case of etching has been described above, various gases used for plasma CVD are introduced into this vacuum container 100, and the electrode 1 is
A desired thin film can be deposited on a substrate to be processed, for example 130 (used at ground or floating potential), placed near 01.

導入7「るガスとJg積できる薄膜とを例示すると丁d
己の通りである。
Introduction 7: To give an example of a gas and a thin film that can be multiplied by Jg,
As per myself.

8+ I’14+ N2 + NHJ   −81s 
144膜5il14又はSi2H6等 −a−8,:H
膜S+ Ha + N20    =  510z膜膜
質、膜厚の均一性、膜の堆積速読は、従来の、一方間磁
場を用い電子の周回運動を許容する諸装置と較・\て同
程度又Vまそルを凌ぐものがある。即ち第1図の装置は
プラズマCVD装置としても側めて有’+jヒである。
8+ I'14+ N2 + NHJ -81s
144 film 5il14 or Si2H6 etc. -a-8,:H
Film S + Ha + N20 = 510z Film quality, film thickness uniformity, and film deposition speed reading are comparable to conventional devices that use a one-sided magnetic field and allow electrons to circulate, or V. There is something that surpasses Le. That is, the apparatus shown in FIG. 1 can also be used as a plasma CVD apparatus.

なお、第1図の130を電極とし、これを接地ずハとき
は、真空容器100を弗素樹脂、ガラスなどの絶縁物で
構成Cることかできる。
Note that if 130 in FIG. 1 is used as an electrode and this is not grounded, the vacuum container 100 can be constructed of an insulating material such as fluororesin or glass.

第2図〜第5図には本発明の他の実施例を示す。2 to 5 show other embodiments of the present invention.

第1凶と同依能の部材には同一の符号を付しである。The same reference numerals are given to the members having the same function as the first one.

第2図は装置の平面図で5りって、真空容器100を囲
む6個の励磁コイル104と1041.105と105
°、106と106°に圏用三相父流の各相の電流を流
して回転磁界を作るものを示す。これは三相誘導電動機
の励磁で慣用されている典型的な手法である。
FIG. 2 is a plan view of the device, showing six excitation coils 104, 1041, 105, and 105 surrounding the vacuum vessel 100.
106°, 106°, and 106° to create a rotating magnetic field by passing the current of each phase of the three-phase father current for the sphere. This is a typical method commonly used to excite three-phase induction motors.

第3図には励磁コイルを3個(104,105゜106
)たけにして、その各に三相反流の各相の電流を直し回
転磁界を作るも(hを示す。
Figure 3 shows three excitation coils (104, 105° 106
), the current of each phase of the three-phase flow is adjusted in each of them to create a rotating magnetic field (h is shown).

第4図の装置では、電極101の下方の空間を殆んど完
全に絶線物で埋め、電極101を周回ぜんとする電子Q
)運動を禁止している。ルノ蜂コイルは鞍型にして励磁
効率を上け、装置の小型化を達成している。
In the device shown in FIG. 4, the space below the electrode 101 is almost completely filled with a wireless material, and the electron Q
) Exercise is prohibited. The Lunobee coil is saddle-shaped to increase excitation efficiency and make the device more compact.

第5図の装置は、本発明を三電極二重vr方式を採用す
る真空放電処理袋η′4に虐用したものである。
The apparatus shown in FIG. 5 applies the present invention to a vacuum discharge processing bag η'4 employing a three-electrode double VR system.

真空容器100を接地し、電極101.130Z)それ
ぞれに別個の電源125.135から電力が供給されて
いる。これらの電源には、直流、画用交流を高周波の電
力又はでnもの組合せ、および各電力値の組合せが、処
理の内容に応じて選定され、処理の速波を一層犬さくす
ることかできる。
The vacuum vessel 100 is grounded, and each of the electrodes 101, 130Z) is powered by a separate power source 125, 135. For these power supplies, DC, AC, high-frequency power, or combinations of various power values are selected depending on the content of the processing, and the high-speed waves of the processing can be made even more precise. .

第6図は、電子υ〕周回連動を制限乃至禁止するため、
電極101の周辺部を立上がらせたものである。電子は
この立上りの壁面に衝突してその周回が阻止される。
Figure 6 shows that in order to limit or prohibit electronic υ] rotation interlocking,
The periphery of the electrode 101 is raised. Electrons collide with this rising wall and are prevented from orbiting.

第7図は、第6図の立上り権を絶縁物で作ったものでぬ
る。
In Figure 7, the rising right of Figure 6 is painted with an insulating material.

上記力よりに、本発明の電車はこ7’Lを並置しでまた
ばこれを従来M式の電・本と組付せて、侍々のイ1゛4
成で実tイ!1′4−ることかできる。
Due to the above force, the electric train of the present invention can be placed side by side with the electric train 7'L of the present invention and assembled with the conventional M-type electric train/book, and the Samurai's I1 and 4 can be assembled.
It's real! It is possible to do 1'4-.

■だ不発1カの前記周回連動を制限又は禁止する部材は
、平面2曲面、側壁、電圧印加電極、接地電池、金1萬
、絶縁物及びそれらの組付せで自由に選定できるもので
ある。
■The members that limit or prohibit the above-mentioned rotational interlocking of the unexploded unit can be freely selected from two curved plane surfaces, a side wall, a voltage application electrode, a ground battery, 10,000 pieces of gold, an insulator, and their assembly. .

(発明の効果) 本発明の放電反応装置は上記の通りであって、電嘆上に
均一かつ高密度のグラメマを生成し、その近傍にIli
かれた被処理物の処理を、高効率かつ小さいイオン倹撃
の下イこ高速〃1つ旨い均一度で行な9効呆がりる。
(Effects of the Invention) The discharge reaction device of the present invention is as described above, and generates a uniform and high-density gramma on an electric current, and has Ili in the vicinity thereof.
The processed material can be processed at high speed with high efficiency and small ion bombardment with excellent uniformity.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施例の放電反応装置の構成を示す図
。 第2,3図は回転磁界を作るための電磁コイルの配置図
。 第4,5図は不発明の別の実施ν1」の構成を示す図。 第6,7図は電子の周回連動を基土または池j眠する障
壁を例示する図。 第8 、9 、101/11は従来の放電反応装b1シ
の’[IL子の連動を示す図。 第11.12図は、プラスマ市度を増加芒ぞんとして、
−子の周回運動を制限又は禁止したときの電子の運動を
示す図。 第13図はそのときのプラズマ台度の分布を示す図。 10.101・・・・・・非依地電憔 102・・・・・・・・・・・・・・・仮処理物11・
・・・・・電子の侠似ブイクロイド連動12・・・・・
・磁力線、13・・・磁界の方向、e・・電子13.1
00・・・・・・A空容器 14.103・・・・・・絶縁体、 130・・・・・
・電極104.105,106−[EJ転磁界発生用’
it磁コイル、 108・・・・・・ガス導入口109
・・・・ガス併出口
FIG. 1 is a diagram showing the configuration of a discharge reactor according to an embodiment of the present invention. Figures 2 and 3 are layout diagrams of electromagnetic coils for creating a rotating magnetic field. FIGS. 4 and 5 are diagrams showing the structure of another embodiment of the invention ν1. FIGS. 6 and 7 are diagrams illustrating a barrier that inhibits the circulation of electrons. 8th, 9th, and 101/11 are diagrams showing the interlocking of the IL element of the conventional discharge reaction device b1. Figure 11.12 shows that when the plasma market rate is increased,
- A diagram showing the movement of electrons when the circular movement of the child is restricted or prohibited. FIG. 13 is a diagram showing the distribution of plasma intensity at that time. 10.101...Non-dependent electric power 102...Temporarily processed material 11.
・・・・・・Electronic chivalry-like buikroid interlocking 12・・・・・・
・Magnetic field lines, 13... Direction of magnetic field, e... Electrons 13.1
00...A empty container 14.103...Insulator, 130...
・Electrodes 104, 105, 106-[For generating EJ rotating magnetic field'
IT magnetic coil, 108...Gas inlet 109
・・・Gas exit

Claims (2)

【特許請求の範囲】[Claims] (1)電極を内蔵する真空容器と、該真空容器内に所定
のガスを導入する手段と、該真空容器内の圧力を制御す
る手段とをそなえ、該電極に電力を供給して放電を発生
させることにより該真空容器内に置かれた被処理物を処
理する放電反応装置において、該電極の表面に沿う回転
磁界を発生させる手段と、該電極のまわりに周回運動す
る電子の運動を制限または禁止する手段とをそなえたこ
とを特徴とする回転磁界を用いた放電反応装置。
(1) A vacuum container containing an electrode, a means for introducing a predetermined gas into the vacuum container, and a means for controlling the pressure inside the vacuum container, and electricity is supplied to the electrode to generate discharge. In a discharge reaction apparatus for treating a workpiece placed in the vacuum container by causing a discharge reaction to occur, a means for generating a rotating magnetic field along the surface of the electrode, and a means for restricting or restricting the movement of electrons orbiting around the electrode are provided. 1. A discharge reaction device using a rotating magnetic field, characterized by comprising means for inhibiting the discharge.
(2)該電極が平面部をそなえ、該回転磁界が該電極の
該平面部に沿うものである特許請求の範囲第1項記載の
回転磁界を用いた放電反応装置。
(2) A discharge reaction device using a rotating magnetic field according to claim 1, wherein the electrode has a flat portion, and the rotating magnetic field is along the flat portion of the electrode.
JP59207530A 1984-08-31 1984-10-03 Discharge reaction apparatus using rotary magnetic field Granted JPS6186942A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP59207530A JPS6186942A (en) 1984-10-03 1984-10-03 Discharge reaction apparatus using rotary magnetic field
KR1019850006330A KR910000508B1 (en) 1984-08-31 1985-08-30 Discharge Reactor Using Dynamic Magnetic Field
EP85306186A EP0173583B1 (en) 1984-08-31 1985-08-30 Discharge apparatus
DE8585306186T DE3580953D1 (en) 1984-08-31 1985-08-30 UNLOADING DEVICE.
US07/110,622 US4829215A (en) 1984-08-31 1987-10-20 Discharge reaction apparatus utilizing dynamic magnetic field

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59207530A JPS6186942A (en) 1984-10-03 1984-10-03 Discharge reaction apparatus using rotary magnetic field

Publications (2)

Publication Number Publication Date
JPS6186942A true JPS6186942A (en) 1986-05-02
JPH0346172B2 JPH0346172B2 (en) 1991-07-15

Family

ID=16541244

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59207530A Granted JPS6186942A (en) 1984-08-31 1984-10-03 Discharge reaction apparatus using rotary magnetic field

Country Status (1)

Country Link
JP (1) JPS6186942A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62118429U (en) * 1986-01-20 1987-07-28
JPS63142636A (en) * 1986-12-05 1988-06-15 Anelva Corp Vacuum apparatus
JPS63277778A (en) * 1987-05-08 1988-11-15 Anelva Corp Revolving magnetic field generation device for electric discharge chemical reaction apparatus
JPH02156089A (en) * 1988-12-09 1990-06-15 Shimadzu Corp Plasma sticking device
JPH02237117A (en) * 1989-03-10 1990-09-19 Mitsubishi Electric Corp Semiconductor treatment apparatus
US5695597A (en) * 1992-11-11 1997-12-09 Mitsubishi Denki Kabushiki Kaisha Plasma reaction apparatus
US5880034A (en) * 1997-04-29 1999-03-09 Princeton University Reduction of semiconductor structure damage during reactive ion etching
WO2001073159A1 (en) * 2000-03-27 2001-10-04 Mitsubishi Heavy Industries, Ltd. Method for forming metallic film and apparatus for forming the same
JPWO2014199421A1 (en) * 2013-06-14 2017-02-23 国立大学法人東北大学 Plasma generating apparatus, plasma processing apparatus, plasma generating method and plasma processing method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5143371A (en) * 1974-10-12 1976-04-14 Daido Steel Co Ltd Netsushorihohooyobi netsushorisochi
JPS5645761A (en) * 1979-09-25 1981-04-25 Mitsubishi Electric Corp Plasma reaction apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5143371A (en) * 1974-10-12 1976-04-14 Daido Steel Co Ltd Netsushorihohooyobi netsushorisochi
JPS5645761A (en) * 1979-09-25 1981-04-25 Mitsubishi Electric Corp Plasma reaction apparatus

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62118429U (en) * 1986-01-20 1987-07-28
JPS63142636A (en) * 1986-12-05 1988-06-15 Anelva Corp Vacuum apparatus
JPS63277778A (en) * 1987-05-08 1988-11-15 Anelva Corp Revolving magnetic field generation device for electric discharge chemical reaction apparatus
JPH02156089A (en) * 1988-12-09 1990-06-15 Shimadzu Corp Plasma sticking device
JPH02237117A (en) * 1989-03-10 1990-09-19 Mitsubishi Electric Corp Semiconductor treatment apparatus
US5695597A (en) * 1992-11-11 1997-12-09 Mitsubishi Denki Kabushiki Kaisha Plasma reaction apparatus
US5880034A (en) * 1997-04-29 1999-03-09 Princeton University Reduction of semiconductor structure damage during reactive ion etching
WO2001073159A1 (en) * 2000-03-27 2001-10-04 Mitsubishi Heavy Industries, Ltd. Method for forming metallic film and apparatus for forming the same
US6656540B2 (en) 2000-03-27 2003-12-02 Mitsubishi Heavy Industries, Ltd. Method for forming metallic film and apparatus for forming the same
JPWO2014199421A1 (en) * 2013-06-14 2017-02-23 国立大学法人東北大学 Plasma generating apparatus, plasma processing apparatus, plasma generating method and plasma processing method

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