JPS62120576A - Similarity converting system for pattern - Google Patents

Abstract

PURPOSE:To obtain plural high quality patterns of various sizes out of one single pattern by adding the line width control information to a flection point significant to the line width control among those flection points extracted out of the contour lines of a pattern and multiplying said flection point and the pattern line width decided by the flection point by a similarity conversion factor for generation of the line width control value and then for control of the line width. CONSTITUTION:The flection points are extracted out of the counter lines of a character pattern 11 by a flection point extracting part 10 and then stored in a flection point storing part 12. The segments among those extracted flection points are integrated 13 and a contour line number is given to each integrated segment. A line group is decided 14 by means of said integrated lines and the decoration processing 15 is carried out for connection of the line group by means of this line group. Based on these information, an attribute list of the line width control information is formed 16 and stored 17. A deciding part 18 multiplies the pattern line width obtained from the flection points stored in both parts 12 and 17 by a similarity conversion factor to generate the line width control value. Based on this control value, a character pattern 26 is outputted via a coordinate conversion part 20, the table forming parts 21 and 23, a flection point coordinate rewriting part 24, and a paint-out part 25 respectively.

Description

[Detailed description of the invention] [Table of contents] [Summary] ...2 pages [Industrial application field] ...3 pages [Prior art] ...4 pages [Problems to be solved by the invention] ...Page 4 [Means to solve the problem] ...Page 4 [Effect]
...5 pages [Example] ・
...Page 6 [Effects of the invention] ...23
Page [) Already required] Line width control information is added to the vertical lines and horizontal lines of the pattern, or the vertical lines and horizontal lines, and the vertical lines and horizontal lines, and the vertical lines and horizontal lines of the pattern, and the vertical lines and horizontal lines, and the vertical lines and horizontal lines, and the vertical lines and horizontal lines, and the vertical lines and horizontal lines, and the vertical lines and horizontal lines, and the vertical lines and horizontal lines, and the vertical lines and horizontal lines, and the vertical lines and horizontal lines, and the vertical lines and horizontal lines, and the vertical lines and horizontal lines of the pattern, and A line width control value is generated by multiplying the pattern line width found from the line width control information and the line width control information by a similarity conversion rate, and the line width control value is generated by referring to the line width control information and the line width control value when enlarging or reducing the pattern (similarity conversion). The width can now be controlled.

[Industrial application field]

The present invention relates to a pattern similarity conversion method, and more specifically, the present invention relates to a pattern similarity conversion method, and more specifically, line width control information added to contour bending points that are significant for line width control and line width control obtained by multiplying the pattern line width by a similarity conversion rate. The present invention relates to a pattern similarity transformation method in which a value is used when enlarging or reducing a pattern.

In processing character patterns, the pattern may be enlarged or reduced. In such enlargement or reduction, it is required that the original pattern be faithfully enlarged or reduced. Otherwise, the meaning of enlarging or reducing the original pattern will be lost.

[Conventional technology]

As a method for enlarging or reducing a character pattern, the applicant has already proposed a technique for enlarging or reducing a character pattern while controlling the line width.

[Problem that the invention seeks to solve]

According to this technique, when enlarging or reducing a character pattern, the line width must be controlled manually, which is troublesome.

The present invention was created in view of such problems, and provides a pattern similarity conversion method that can generate patterns of various sizes from one pattern with high quality based on automatic line width control. The purpose is to

[Means for solving problems]

FIG. 1 shows a block diagram of the principle of the present invention. In a pattern similarity conversion method, the present invention includes an extraction means 1 for extracting bending points from the outline of a pattern, and an addition unit for adding line width control information to a bending point that is significant for line width control among the extracted bending points. means 2; line width control value generating means 3 for generating a line width control value by multiplying the pattern line width determined using the extracted bending point and the line width control information by a similarity conversion rate; and expanding the pattern. Alternatively, the line width control means 4 controls the line width by referring to the line width control information and the line width control value at the time of reduction.

[Effect]

The extraction means 1 extracts bending points on the pattern contour. Means 2 for adding line width control information to curved points significant for line width control constituting pattern vertical lines and horizontal lines or vertical lines and horizontal lines and decorations connected thereto among the extracted curved points.
added by

In addition, a line width control value is generated from a line width control value generating means 3 which performs an operation of multiplying the pattern line width determined from the extracted bending point and the line width control information by a similarity conversion rate. After performing such pre-processing, when enlarging or reducing the pattern, the above-mentioned line width control information and line width control value are referred to by the line width control means 4 and used to control the line width, The pattern is enlarged or reduced.

In this way, a pattern enlarged or reduced from one original pattern can be obtained with high quality while automatically controlling the line width.

〔Example〕

FIG. 2 shows an embodiment of the invention. In this figure, 1
0 is a bending point extracting unit that extracts bending points on the contour line from the supplied character pattern 1).

The extracted bending points are stored in the bending point storage unit 12 for later use.

Reference numeral 13 denotes a contour line segment integration unit that integrates contour line segments between the extracted bending points.

14 is a line group determination unit that determines a line group using the integrated line segments. Here, the line group refers to one line on a pattern made up of a plurality of contour line segments.

Reference numeral 15 denotes an ornament recognition unit that uses the determined line group to process ornaments connected thereto.

Reference numeral 16 denotes an attribute table creation unit that creates an attribute table of line width control information based on the information obtained from each of the above-mentioned processes.

The attribute table created by the creation unit 16 is stored in the attribute table storage unit 17 for later use.

18 generates a line width control value by multiplying the pattern line width obtained using the line width control information stored in the attribute table storage unit 17 and the bending points stored in the bending point storage unit by a relative conversion rate. This is a line width control value determining unit.

The bending points, attribute table, and line width control values stored as described above are used in the following required sections.

Reference numeral 20 denotes a coordinate conversion unit that changes the coordinates of the bending point stored in the bending point storage unit 12 by a predetermined value.

21 writes temporary coordinate values into the coordinate value field of a temporary line width control table used to perform line width control using the coordinates of the bending point formed by the attribute table stored in the attribute table storage unit 17. This is a temporary line width control table creation unit that creates a line width control table. The created temporary line width control table is stored in the line width control table storage unit 22 for later use.

Reference numeral 23 denotes a line width control table creation unit that performs necessary processing on a temporary line width control table while referring to the contents of the line width determination table storage unit 19 to create a line width control table.

24 is a bending point coordinate rewriting unit that rewrites the coordinates of the coordinate converting unit 18 using a line width control table.

Reference numeral 25 denotes a filling portion inside the contour for outputting a character pattern 26 by filling out the inside of the bending point whose line width is controlled by the above-mentioned portions 18 to 24.

Next, the processing mode of the embodiment of the present invention having each of the above-mentioned components will be explained using an example of a character pattern shown in FIG.

First, a process (2) for extracting bending points from the outline of a character pattern is performed. Through this extraction process, the bending points P1 to P13 of the character pattern in FIG. 3 are extracted by the bending point extraction unit 10.

After this inflection point extraction process, the attribute table creation process (2) begins.

Here, it is assumed that numbers 1 to L13 in FIG. 3 represent line segments. Further, the positive direction of X is set to the right of the figure, and the positive direction of Y is set to the bottom, and the coordinates of point P are expressed as (Xt, Y+). Line segment L1 is a line segment obtained by connecting point P1 and point p++. Further, Pl4 is Pl.

<5 tapl) Under such a stage classification, the following processing is performed in the contour line segment integration unit 13.

First, the line segment L1 is classified into the following five types. However, T
h is a predetermined darkness value.

C1...Y1=Yi+t, (Xt and X++1
difference)≧Th1 C2...Xl =Xi+1. (Difference between Yl and X1+1)≧T h.

C3... (difference between Yl and Yi+) = 1° (Xi
and X1÷, ) ≧ Tht C4... (difference between Xt and
'+ and X1+)≧T h IC6... (
Difference between Xt and X1+) = 1° (Yl and Yl+1
difference) = 1 Co...For cases other than the above.

Under this classification method, the line segment ~L13 in Figure 3 is classified as follows.

C1°°°L1・L4・L7・L1)C2...
L3. LGI L9. L12C5...None C4...None C6...None Go...L2. Ls, La, L, O+ Lt3
Based on the classification results, line segments are integrated according to the following line segment integration criteria, and a contour line number En is given to each set of integrated line segments.

Find a line segment with classification number 01 or C2 and set it as Lk.

(1) Rule 1 → If Lk is C1, integrate L k− or if L k++ is C1 or C3. If Lk is 02, it is integrated if it is C2 or C4.

(2)) If Lt-7L/2-Lk is C1, L
If k-1 is 05 and L k-2 is C1 or C3, or Lk+t is 05 and L k+2 is C1 or C3, they are integrated. When Lk is 02, if it is C2 or C4, it is integrated.

(3) Rule 3 - In cases other than the above, the integration is terminated.

Each line segment integrated in this manner is given a contour number, but line segments that are not integrated are not given a contour number. An example of assigning contour numbers in the third example is as follows.

L 1-E 1) L 3-E 2+ L 4←E
3. Le←L7″E5.L3″Eε, L1)″Ev l
r, t a←E8 Also, the direction of the contour is classified into four types: right, left, bottom, and top.

Right...El, Ea, ET Left...El1 Bottom...Ea, E4 Top...Ell, Elf Then, the process moves to the line group determining unit 14.

<5tepff) In order to find the contour paired with contour E1, E+ and Ek
The following two quantities, M (degree of overlap) and D (distance), are calculated between (k=1.2..., 13. and #i). However, among the bending points that make up the contour E1, the starting point is ps
i, and the starting point is PEi (see Figure 4).

Tl) When the direction of the contour Ei is to the right, the direction of Ek is to the left, and the position of Ek is below Ei (2) Contour E1
The direction of is on the left, the direction of Ek is on the right, and the position of Ek is El.
If it is above min (XEk - Xsk, Xs r - XEI) (
3) Ek where the direction of contour E+ is down and the direction of Ek is up
If the position of is to the left of El (4) The direction of contour E1 is up, the direction of Ek is down, and E
If the position of k is to the right of El, cases other than (1) to (4) cannot form a pair.

After calculating each of the above-mentioned M and D corresponding to each condition, the calculated M and D satisfy M≧Th2 D≦Ttl+ and the one with the minimum D is determined as the pair of El.

However, TE01. Th3 is an appropriate darkness value. In the case of the third example, the following pairs are determined.

E,...None Ea...E3 E2...Ea EG...None Ea ・
・ ・Es E7 ・ ・ ・E6E4・
...None Ea...Ea A line group is determined based on such processing results.

The stages shown in FIG. 3 will be explained.

(If the pairs are equal, such as Ea and Ea, they are unconditionally treated as one line group.

(b) When there are multiple pairs such as Es and ET and Ea and Ea, first find the minimum value D min of D among them. Next, find the difference between D and Dmin for each pair, and find the threshold Th at which the difference occurs.
If the number is 4 or less, these contour line segments are treated as one line group.

In terms of the stages in Figure 3, the line groups there are line group numbers E 2 , E B −=(:, IE a , E
a + E T-G2 (S t e p I [) Based on the processing results of 5 step I [, a temporary attribute table as shown in Fig. 5 is created for the bending points included in the contour line segments constituting the line group. Create. What this table means is that, for example, in the case of P4, it is the right point of line group G1 and line group G
This indicates that the point is above 2.

(Step IV) Next, the process of the decoration recognition unit 15 begins. The processing here consists of processing for adding information regarding the decoration to FIG.

There are two types of decorations:

■ Decorations connected to the same line group (see Figure 6 (a)) Pz
, Ps belong to line group G1. Figure 6 (like bending points P2, P3, and P4 of al, points within the distance of the darkness value consisting of the end points of the line group consisting of are regarded as decorations, and the following attribute information is given to Pz + Pl + P4 do.

Pz, Pl... Decoration above the line group G1 P4... Decoration below the line group G1 The determination of whether this is up or down is made based on whether it is above or below the center line L1 of G1.

■ Decorations connected to different line groups that are orthogonal to each other (see Figure 6)) P+, Ps belong to line group G, and P, s, P
It is assumed that s belongs to line group G2. Points within a threshold distance from the end points of the group of orthogonal lines, such as the bending point P 2 + P 3 in FIG. 6(b), are regarded as decorations, and the following attribute information is given to Pz and Pl. .

Pz... Decoration Pl above line group G and to the left of G2
...The verticality of the decoration G1 below the line group G1 and to the right of G2 is determined by whether it is above or below the center line L1, and the left and right direction of G2 is determined by whether it is to the left or right of the center line L2.

When this process is applied to the character pattern in Fig. 3, Pl... Decoration on the left of line group G, Pz... Decoration on the right of line group G, Pε+PtO... Decoration above line group G2. Pl... Information about the decoration below the line group G2 is obtained.

The attribute table creation unit 16 then adds the information obtained by the decoration recognition unit 15 to the temporary attribute table obtained by the line group determination unit 14, resulting in an attribute table as shown in FIG. is obtained. This attribute table is stored in the attribute table storage section 17.

After creating and storing this attribute table, the line width control value determination process (2), which is a characteristic part of the present invention, begins.4 This determination is performed by the line width control value determining section 18.

The line width control value is determined for the line segment of the character pattern. It would be too redundant to show all of them, so I will just show some examples here.

Inflection point p4. The coordinate value of PT + Pi 2 is P4=(
57,80), Pv'' (100,87), Pz
An example of determining the line width control value will be described for an example in which 2=(50,80).

From the attribute table (FIG. 7), P4 is a point to the right of G and a point above G2. Therefore, write 57 in the "top or right coordinate" column of G1 in the line width determination table (Figure 8), and
Write 80 in the "Top or right coordinate" column. Similarly, Pl is a point below G2, so write 87 in the "Bottom or left coordinate" column of G2, and Pl2 is a point to the left of G, so write 87 in the "Bottom or left coordinate" column. Write 50 to . From the table thus completed, the line widths of Gl and G2 before conversion have the following values.

G1- (57-50)+1=8 G2 = (8780)+t=a In this case, when the size of the character pattern is reduced to 275, the line width is al, G2 = 8 x 215 = 3.2-3 (
This value is stored in the line width determination table storage unit 19, and is used in the next line width control process (■).
p■〉 is used as a line width control value.

After the attribute table is created in this way and the line width control value is determined, the line width control process (2) begins.

(Stapl>) The coordinates of the bending point extracted in the bending point extraction process (2) from the outline of the character pattern are converted in the coordinate conversion unit 20 according to the following equation.

i=1. 2. . . . , 13 However, in the above equation, 5xIXSY1 is the size of the pattern before conversion, and SX2 X5Y2 is the size of the pattern after conversion.

<5tep II> Using the coordinates of the bending point of the attribute table created in attribute information generation process (See Figure 9).

This process is performed by the temporary line width control table creation section 21.

For example, in the step of FIG. 3, P4.
P7. Suppose that the coordinate values of PI2 are determined to be P,s (23,32) P7 (40,35) PI2 (20,32). It can be seen from the attribute table that P4 is a point to the right of G1 and a point above G2. Therefore,
23 in the “Top or right coordinate” column of 01 in the temporary line width control table.
and write 32 in the "Top or right coordinate" column of G2. Similarly, since P7 is a point below G2, G
Write 35 in the “Bottom or left coordinate” column in step 2, and press
is the left point of G1, so enter 2 in the "Bottom or left coordinate" column.
Write 0. In this way, Figure 9 is completed.

The completed temporary line width control table is stored in the line width control table storage section 22.

<5 tep III> The line width control table creation unit 23 performs the following processing on the temporary line width control table to rewrite the temporary line width control table and create a line whose pattern line width is the given line width. Create a width control table. However, although the width of the vertical line is WX and the width of the horizontal line is Wy, these values are the line width control values determined in the line width control value determination process (2).

If we decide to control the line width based on the upper or right contour, +8) When the line group is horizontal lines, the target lower coordinate value = “upper or right coordinate” + Wy (b)
When the line group is vertical lines, the coordinate values of the target vehicle are determined in each case as follows: ``Top or right coordinates'' - WX+1. At this time, the control amount C is determined by the target value minus the "lower or left coordinate value."

However, if this control amount is too large, the shape of the pattern will be distorted, so both upper or right and lower or left sides are controlled, and the control amount is determined by the following equation.

G2 = C + CI these C1, C
A line width control table (see FIG. 10) is created by adding the "upward or rightward movement amount" and "downward or leftward movement amount" to the table in FIG. 9, respectively.

This process is performed by the line width control table creation section 23.

The above CI and C2 are used to rewrite the line width control table as follows.

“Top or right coordinate value” = “Top or right coordinate value” + C1 “Bottom or left coordinate value” = “Bottom or left coordinate value” can be rewritten. This process is performed by the bending point coordinate rewriting unit 22.

An example of this will be explained with respect to bending points P12 and P3 of the character pattern in FIG. 3.

From the attribute table (Figure 5), it can be seen that PI2 is not a decoration because of the large left bracket of G and the point above G2. Next, when the left coordinate of G1 and the upper coordinate of 02 are checked from the line width control table (FIG. 10), they are 21 and 32.

Therefore, the coordinates of PI2 are from (20,32) to (21,3
3) can be rewritten.

It can be seen from the attribute table (Fig. 7) that P9 is a decoration at the point below G2. Then, 02 in the line width control table (Figure 10)
If you check the movement amount under , it is -1. Therefore,
If the coordinates of P3 are (15, 35), change the Y coordinate to -
1 and rewritten as (15, 34).

Filling processing is performed inside the curved point sequence whose line width has been controlled, which is obtained from the line width control process (2) described above.

Incidentally, if we show a comparative example between the case where the process of the present invention is applied and the case where it is not, as shown in Fig. 1) (a) (with line width control) and Fig. 1) (without line width control). It is. The character pattern in these figures is a 512x512 character pattern with 4 vertical lines. 60 made by controlling the horizontal line width to 2 and reducing it
This is an X60 character pattern. Further, the threshold values T h t to Th4 for the processing of the present invention are as follows.

Th,=10. Th2=0.5. Th3=50°T
h4=3° Note that in the above embodiment, the explanation was given by taking a character pattern as an example, but the present invention can be practiced with other patterns as well.

〔Effect of the invention〕

As explained above, according to the present invention, the pattern line width is determined from the line width control information given to a windowed bending point, the extracted bending point, and the line width control information, and the line width is When enlarging or reducing a pattern, the line width control value obtained by multiplying the width by the similarity conversion rate is referenced and the line width is controlled to enlarge or reduce the pattern, so the line width control value is used. A high-quality pattern that is enlarged or reduced from one original pattern can be obtained without any manual intervention, compared to the case where there is no manual pattern.

[Brief explanation of drawings]

Figure 1 is a block diagram of the principle of the present invention. 213! ! 3 is a diagram showing an example of a pattern, FIG. 4 is a diagram showing an example of a contour segment, FIG. 5 is a diagram showing a temporary attribute table, and FIG. 6 is a diagram showing an example of the present invention. Figure 7 shows the pattern decoration, Figure 7 shows the attribute table, Figure 8 shows the line width determination table, Figure 9 shows the temporary line width control table, Figure 10 shows the line width. Figure 1) shows a control table; Figure 1) is a diagram showing a comparative example. In FIG. 1, 1 is an extraction means, 2 is an addition means, 3 is a line width control value generation means, and 4 is a line width control means.

Claims (3)

[Claims] (1) In the pattern similarity transformation method, extraction means for extracting inflection points from the contour of the pattern (1)
and additional means (2) for adding line width control information to a bend point that is significant for line width control among the extracted bend points, and an additional means (2) for adding line width control information to a bend point that is significant for line width control among the extracted bend points; line width control value generating means (3) for generating a line width control value by multiplying the pattern line width by a similarity conversion rate; Line width control means (4
). (2) The pattern similarity conversion method according to claim 1, wherein the bending points that are significant for the line width control are bending points forming vertical lines and horizontal lines of the pattern. (3) Similarity of the pattern according to claim 1, characterized in that the bending points significant for the line width control are bending points forming vertical lines and horizontal lines of the pattern and decorations connected thereto. Conversion method.