JPS62189727A - Apparatus for thermal decomposition vapor growth of organic metal - Google Patents

Apparatus for thermal decomposition vapor growth of organic metal

Info

Publication number
JPS62189727A
JPS62189727A JP61032315A JP3231586A JPS62189727A JP S62189727 A JPS62189727 A JP S62189727A JP 61032315 A JP61032315 A JP 61032315A JP 3231586 A JP3231586 A JP 3231586A JP S62189727 A JPS62189727 A JP S62189727A
Authority
JP
Japan
Prior art keywords
substrate
chamber
crystal
preliminary chamber
reaction tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61032315A
Other languages
Japanese (ja)
Inventor
Toshiya Yokogawa
俊哉 横川
Mototsugu Ogura
基次 小倉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP61032315A priority Critical patent/JPS62189727A/en
Publication of JPS62189727A publication Critical patent/JPS62189727A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To grow a crystal of high quality with good reproducibility by providing a preliminary chamber separated by a gate valve from a reaction tube for reacting to vapor grow a crystal to suppress the influence of oxygen and moisture to the growth. CONSTITUTION:A sufficiently N2-purged preliminary chamber 4 is opened, and a substrate crystal 2 is placed on a substrate base 8 in the chamber 4. Then, the chamber 4 is closed, purified N2 purging and evacuating are repeated sufficiently, and the chamber is evacuating in high vacuum by an evacuating unit 9 while heating the chamber 4 by a preliminary chamber heater 7, and purified N2 purging is executed. Thereafter, a carbon susceptor 3 disposed in a reaction tube 1 is conveyed into the chamber 4, a gate valve 5 is closed to stop conveying, a cover is removed, the crystal 2 is slid on the susceptor 3 and placed. The valve 5 is again opened, and the susceptor 3 for placing the crystal 2 is conveyed by a substrate heating base conveying arm 6 into the tube 1. After the above steps are finished, a growth is started.

Description

【発明の詳細な説明】 産業上の利用分野 本発明はカーボンサセプターを外気に接触させることな
く基板結晶試料を加熱装置上に設置して、高品質な半導
体結晶成長膜を形成する有機金属熱分解気相成長装置に
関するものである。
Detailed Description of the Invention: Industrial Application Field The present invention is an organometallic pyrolysis method in which a substrate crystal sample is placed on a heating device without exposing a carbon susceptor to outside air to form a high-quality semiconductor crystal growth film. The present invention relates to a vapor phase growth apparatus.

従来の技術 近年、化合物半導体を用いた可視光半導体レーザー、超
高速デバイスの研究開発が盛んに行われている。薄膜の
エピタキシャル成長法としては、従来の液相成長法にか
わり、超薄膜多層構造の形成が容易なこと及びペテロ界
面の急峻性がすぐれている点で、分子線エピタキシー法
(MBE)や気相成長法(ハイドライドVPEやMOC
VD )が主流を占めている。このうちMOCVD法は
有機金属熱分解法のことで特に注目を集めている。
BACKGROUND OF THE INVENTION In recent years, research and development of visible light semiconductor lasers and ultrahigh-speed devices using compound semiconductors has been actively conducted. As an epitaxial growth method for thin films, molecular beam epitaxy (MBE) and vapor phase epitaxy are used instead of the conventional liquid phase growth method because they are easy to form an ultra-thin multilayer structure and have excellent steepness of the Peter interface. (Hydride VPE and MOC)
(VD) is the mainstream. Among these, the MOCVD method is attracting particular attention as an organometallic thermal decomposition method.

現在、上述の様なデバイスへの応用を目的として関心を
集めている化合物半導体は、アルミニウムを含む混晶系
が多い。しかしながら有機金属熱分解法においてこのア
ルミニウムは、非常に強い化学反応性を有するため、こ
の成長法の大きな問題点の1つとなっている。
Currently, many of the compound semiconductors that are attracting attention for the purpose of application to the above-mentioned devices are mixed crystal systems containing aluminum. However, in organometallic pyrolysis, aluminum has very strong chemical reactivity, which is one of the major problems with this growth method.

例えば、基板結晶を反応炉内に設置するために炉内を大
気に接触させた場合、得られるエピタキシャル結晶の表
面モホロジー等の結晶性は極めて悪くなり、再現性もと
れなくなる0これは、基板結晶導入時に反応炉とサセプ
ターに吸着した水分あるいは酸素が、得られるエピタキ
シャル成長膜の品質に大きく影響を及ぼしていると考え
られる。
For example, if the inside of the reactor is brought into contact with the atmosphere in order to place the substrate crystal in the reactor, the crystallinity such as the surface morphology of the resulting epitaxial crystal will be extremely poor, and reproducibility will be lost. It is thought that the moisture or oxygen adsorbed in the reactor and susceptor during introduction greatly affects the quality of the epitaxially grown film obtained.

この問題を解決するために反応炉内を大気に接触させる
ことなく基板結晶が搭載されたサセプターを炉内に配置
可能な一ロードロック機構が用いられている。
In order to solve this problem, a load lock mechanism is used that allows a susceptor on which a substrate crystal is mounted to be placed inside the reactor without exposing the inside of the reactor to the atmosphere.

第3図に従来のMOCVD装置のりアクタ−付近の概略
図を示す。1は石英反応管、2は半導体基板結晶、3は
基板加熱台、4は半導体基板結晶2を基板加熱台3上に
搭載するための予備室、5は石英反応管1と予備室4を
隔てるゲートパルプ、6は基板加熱台3を石英反応管1
内に配置するための搬送アームである。
FIG. 3 shows a schematic diagram of the vicinity of the glue actor in a conventional MOCVD apparatus. 1 is a quartz reaction tube, 2 is a semiconductor substrate crystal, 3 is a substrate heating table, 4 is a preliminary chamber for mounting the semiconductor substrate crystal 2 on the substrate heating table 3, and 5 is a separating chamber between the quartz reaction tube 1 and the preliminary chamber 4. Gate pulp, 6, substrate heating table 3, quartz reaction tube 1
This is a transport arm for placing the device inside.

まず、搬送アーム6により基板加熱台3を予備室4iで
引き出し、ゲートパルプ6を閉じて石英反応管1と予備
室4を遮断する。その後、予備室4をブレークして基板
加熱台3上に基板結晶2を載置する。そして予備室4内
の真空引きと純化N2パージを充分繰返した後、再びゲ
ートパルプ5を開けて、搬送アーム6により基板加熱台
3を石英反応管1内に配置する。以上の行程が終わると
成長を開始する。
First, the substrate heating table 3 is pulled out from the preliminary chamber 4i by the transfer arm 6, and the gate pulp 6 is closed to shut off the quartz reaction tube 1 and the preliminary chamber 4. Thereafter, the preliminary chamber 4 is broken and the substrate crystal 2 is placed on the substrate heating table 3. After evacuation of the preliminary chamber 4 and purging of purified N2 are repeated sufficiently, the gate pulp 5 is opened again, and the substrate heating table 3 is placed in the quartz reaction tube 1 by the transfer arm 6. Once the above steps are completed, growth begins.

発明が解決しようとする問題点 しかしながら、この従来の方法では極めて水分及び酸素
等の吸着性の強いカーボンサセプターが外気と接触する
ため、この水分及び酸素による成長への影響は完全には
除けなかった。また予備室を複数個有したロードロック
機構も用いられているが、装置が大がかりになるという
欠点を有していた。したがって特にアルミニウムを含む
良質のエピタキシャル成長膜を再現性よく得ることは非
常に困難であった。
Problems to be Solved by the Invention However, in this conventional method, the carbon susceptor, which has an extremely strong adsorption capacity for moisture and oxygen, comes into contact with the outside air, so the influence of moisture and oxygen on growth could not be completely eliminated. . A load lock mechanism having a plurality of preliminary chambers has also been used, but it has the disadvantage that the device becomes bulky. Therefore, it has been extremely difficult to obtain a high-quality epitaxially grown film containing aluminum with good reproducibility.

問題点を解決するための手段 上記問題点を解決する本発明の技術的手段は、半導体基
板上に気相成長させる有機金属熱分解気相成長装置であ
って、上記気相成長反応が行われる反応管とゲートパル
プにより隔てられた予備室を備えており、上記反応管と
予備室間で基板加熱台を移動できる搬送機構話上記予備
室内に有する基板台に搭載された基板を基板加熱台に移
動できる搬送機構、及び上記予備室を加熱できる加熱機
構と、上記予備室または反応管を高真空にできる真空機
構を備えているものである。
Means for Solving the Problems The technical means of the present invention for solving the above problems is an organometallic pyrolysis vapor phase growth apparatus for vapor phase growth on a semiconductor substrate, in which the above vapor growth reaction is performed. The reaction tube is equipped with a preliminary chamber separated by a gate pulp, and the transfer mechanism allows the substrate heating table to be moved between the reaction tube and the preliminary chamber. It is equipped with a movable transport mechanism, a heating mechanism that can heat the preparatory chamber, and a vacuum mechanism that can make the preparatory chamber or reaction tube a high vacuum.

作  用 この技術的手段による作用は次のとうりである。For production The effect of this technical means is as follows.

サセプターを予備室に移動する前、予備室は加熱状態で
高真空になされるため、予備室中の水分及び酸素は充分
除云される。その後、サセプターを予備室内に配置し、
基板結晶をサセプター上に搭載するため、サセプターへ
の水分及び酸素の吸着は極めて抑制される。
Before moving the susceptor to the preliminary chamber, the preliminary chamber is heated and brought to a high vacuum, so that moisture and oxygen in the preliminary chamber are sufficiently removed. After that, place the susceptor in the spare room,
Since the substrate crystal is mounted on the susceptor, adsorption of moisture and oxygen to the susceptor is extremely suppressed.

実施例 以下、本発明の一実施例を第1図〜第2図にもとづいて
説明する。第1図〜第2図において、第3図と同一構成
部分には同一番号を付して詳細な説明を省略する。基板
加熱法は高周波加熱、赤外線加熱、抵抗加熱等があるが
本実砲例では昇温速度が速い高周波加熱を用いる0  
 ゛第1図及び第2図に示すゲートパルプ6に上り隔て
られた予備室4を有する反応炉において基板結晶2のセ
ツティングは次の様に行われる0まず、充分にN2パー
ジされた予備室4を開け、予備室4内の基板台8上に基
板結晶2を載置する。
EXAMPLE Hereinafter, an example of the present invention will be described based on FIGS. 1 and 2. In FIGS. 1 and 2, the same components as those in FIG. 3 are given the same numbers and detailed explanations are omitted. Substrate heating methods include high-frequency heating, infrared heating, and resistance heating, but in this actual gun example, high-frequency heating, which has a fast temperature rise rate, is used.
゛In a reactor having a preliminary chamber 4 separated by a gate pulp 6 shown in Figs. 1 and 2, setting of the substrate crystal 2 is carried out as follows. 4 is opened and the substrate crystal 2 is placed on the substrate stand 8 in the preliminary chamber 4.

その後予備室4を閉じ、純化N2 /’−ジと真空引き
を繰返し充分行う。さらに予備室加熱ヒーター7により
予備室4を100℃程度に加熱しながらターボ分子ポン
プ等の真空装置9で高真空状態にする。尚、この時基板
−面上に付着物が着かないように、基板上にはカバーを
しておくOまたこのカバーはシャッターのような機械式
のものでもよいが、本実施例では基板結晶2と同じG 
a A sウェハーを基板結晶2上に重ねて置くことと
した0これにより予備室4内を充分窓らした後予備室4
内の加熱と真空引きを終え、純化N2 /’−ジを行う
Thereafter, the preparatory chamber 4 is closed, and vacuuming with purified N2/'-di is repeated sufficiently. Furthermore, while the preliminary chamber 4 is heated to about 100° C. by the preliminary chamber heating heater 7, it is brought into a high vacuum state using a vacuum device 9 such as a turbo molecular pump. At this time, a cover is placed over the substrate to prevent deposits from forming on the substrate surface.Although this cover may be a mechanical type such as a shutter, in this example, the substrate crystal 2 same as G
It was decided to place the aA s wafers on top of the substrate crystal 2.0 After this, the interior of the preliminary chamber 4 was sufficiently exposed.
After heating and evacuation of the inside, purification with N2/'-di is carried out.

その後、第2図に示すように反応管1内に配置されてい
るカーボンサセフリ−3を予備室4内に搬送しゲートパ
ルプ6を閉じる。カーボンサセプター3が基板台8とな
らんだ所で搬送を停止し、基板結晶スライド用アーム1
oでカッ(−を取り除いだ後、基板結晶2をカーボンサ
セプター3上にスライドさせ載置する。そして、再びゲ
ートバルブ6を開き基板結晶2を搭載するカーボンサセ
プター3を基板加熱台搬送用アーム6により反応管1内
に搬送する。以上の行程が終了した後成長を開始する。
Thereafter, as shown in FIG. 2, the carbon susceptor 3 placed in the reaction tube 1 is transported into the preliminary chamber 4 and the gate pulp 6 is closed. The conveyance is stopped when the carbon susceptor 3 is lined up with the substrate stand 8, and the arm 1 for sliding the substrate crystal is moved.
After removing the cut (-) with o, slide the substrate crystal 2 onto the carbon susceptor 3 and place it. Then, open the gate valve 6 again and move the carbon susceptor 3 on which the substrate crystal 2 is mounted onto the substrate heating table transfer arm 6. is transported into the reaction tube 1. After the above steps are completed, growth is started.

尚、本実施例では加熱ヒーター7は予備室4の壁内に埋
め込んだものとなっているが、他に基板台8を加熱する
方法でもよいし例えば予備室4自体を加熱するとともに
基板結晶2をプリベークすることも狙う場合、基板台8
内にも加熱ヒーターを埋め込み基板結晶2を高温に加熱
できるようにする方法を用いてもよい。
In this embodiment, the heater 7 is embedded in the wall of the preliminary chamber 4, but other methods may also be used to heat the substrate table 8, such as heating the preliminary chamber 4 itself and heating the substrate crystal 2. If you also aim to pre-bake the board, use the board stand 8.
A method may also be used in which a heater is embedded inside the substrate so that the substrate crystal 2 can be heated to a high temperature.

成長は原料ガスの流量及び基板温度に依存するが、例え
ば、AIo、3Ga0.7As を成長させる際、TM
G()リメチルガリウム)= 1occ/i、TMA(
トリメチルアルミニウム) =10 CC:/mJA 
、 AsHs=16CC/rruR,H2ガス=21/
min、基板温度=7800Cで、G a A s基板
上にAI G aAsエピタキシャル薄膜を成長した。
Growth depends on the flow rate of source gas and substrate temperature, but for example, when growing AIo, 3Ga0.7As, TM
G()limethylgallium) = 1occ/i, TMA(
trimethylaluminum) = 10 CC:/mJA
, AsHs=16CC/rruR, H2 gas=21/
An AI GaAs epitaxial thin film was grown on a GaAs substrate at a substrate temperature of 7800C.

この方法を用いて27回のrunを行ったが、組成のバ
ラツキは極めて少なかった0組成のバラツキはx=o、
7±0.01で、表面モホロジーの良好な結晶が再現性
よく得られた。
I performed 27 runs using this method, and the variation in the composition was extremely small.The variation in the 0 composition is x=o,
7±0.01, crystals with good surface morphology were obtained with good reproducibility.

発明の効果 以上述べてきたように、本発明によれば試料を気密状態
下で載置できるため、有機金属熱分解気相装置の問題点
の一つであった酸素及び水分の成長への影響を抑えるこ
とができ、再現性のよい高品質な結晶を育成できる。ゆ
えに化合物半導体の開発に極めて重要なものである。
Effects of the Invention As described above, according to the present invention, the sample can be placed in an airtight condition, which eliminates the influence of oxygen and moisture on growth, which was one of the problems with metal-organic pyrolysis vapor phase apparatuses. This makes it possible to grow high-quality crystals with good reproducibility. Therefore, it is extremely important for the development of compound semiconductors.

【図面の簡単な説明】[Brief explanation of drawings]

第1図及び第2図は本発明の一実施例における気相成長
装置反応管付近の側面図及び上面図、第3図は従来の気
相成長装置反応管付近の側面図である。 4・・・・・・予備室、5・・・・・・ゲートパルプ、
6・・・・・・基板加熱台搬送用アーム、7・・・・・
・加熱ヒーター、8・・・・・・基板台、9・・・・・
・真空装置。
1 and 2 are a side view and a top view of the vicinity of a reaction tube of a vapor phase growth apparatus according to an embodiment of the present invention, and FIG. 3 is a side view of the vicinity of a reaction tube of a conventional vapor phase growth apparatus. 4...Preliminary room, 5...Gate pulp,
6...Arm for transporting substrate heating table, 7...
・Heating heater, 8... Board stand, 9...
・Vacuum equipment.

Claims (1)

【特許請求の範囲】[Claims] 半導体基板上に薄膜を気相成長させる有機金属熱分解気
相成長装置において、前記成長反応が行われる反応管と
ゲートバルブにより隔てられた予備室と、前記反応管と
前記予備室間で基板加熱台を移動ならしめる搬送機構と
、前記予備室内に有する基板台に搭載された前記基板を
前記基板加熱台に移動ならしめる搬送機構と、前記予備
室を加熱ならしめる加熱機構と、前記予備室または前記
反応管を高真空にならしめる真空機構を具備してなるこ
とを特徴とする有機金属熱分解気相成長装置。
In an organometallic pyrolysis vapor phase growth apparatus for vapor phase growth of a thin film on a semiconductor substrate, a reaction tube in which the growth reaction is performed is separated from a preliminary chamber by a gate valve, and a substrate is heated between the reaction tube and the preliminary chamber. a transport mechanism for moving a table; a transport mechanism for transporting the substrate mounted on a substrate stand in the preliminary chamber to the substrate heating table; a heating mechanism for heating the preliminary chamber; An organometallic pyrolysis vapor phase growth apparatus comprising a vacuum mechanism for making the reaction tube a high vacuum.
JP61032315A 1986-02-17 1986-02-17 Apparatus for thermal decomposition vapor growth of organic metal Pending JPS62189727A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61032315A JPS62189727A (en) 1986-02-17 1986-02-17 Apparatus for thermal decomposition vapor growth of organic metal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61032315A JPS62189727A (en) 1986-02-17 1986-02-17 Apparatus for thermal decomposition vapor growth of organic metal

Publications (1)

Publication Number Publication Date
JPS62189727A true JPS62189727A (en) 1987-08-19

Family

ID=12355504

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61032315A Pending JPS62189727A (en) 1986-02-17 1986-02-17 Apparatus for thermal decomposition vapor growth of organic metal

Country Status (1)

Country Link
JP (1) JPS62189727A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003087430A1 (en) * 2002-04-16 2003-10-23 Tokyo Electron Limited Processing system, processing method and mounting member

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003087430A1 (en) * 2002-04-16 2003-10-23 Tokyo Electron Limited Processing system, processing method and mounting member
CN1314834C (en) * 2002-04-16 2007-05-09 东京毅力科创株式会社 Processing device, processing method, and mounting member

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