JPS6232665A - Light emitting element - Google Patents

Light emitting element

Info

Publication number
JPS6232665A
JPS6232665A JP60171247A JP17124785A JPS6232665A JP S6232665 A JPS6232665 A JP S6232665A JP 60171247 A JP60171247 A JP 60171247A JP 17124785 A JP17124785 A JP 17124785A JP S6232665 A JPS6232665 A JP S6232665A
Authority
JP
Japan
Prior art keywords
crystal
substrate
gaas
zn5e
thin film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60171247A
Other languages
Japanese (ja)
Inventor
Shintaro Miyazawa
宮澤 信太郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP60171247A priority Critical patent/JPS6232665A/en
Publication of JPS6232665A publication Critical patent/JPS6232665A/en
Pending legal-status Critical Current

Links

Landscapes

  • Led Devices (AREA)

Abstract

PURPOSE:To implement a blue light emitting element having excellent characteristics, by using a GaAs crystal, to which In is added, thereby growing a high quality ZnSe epitaxial single crystal thin film. CONSTITUTION:The grating constant of ZnSe is 5.6676-5.6687Angstrom at a room temperature. Meanwhile, that of GaAs of a III-V group semiconductor is 5.653Angstrom , and that of InAs is 6.058Angstrom . The GaAs and the InAs have a so-called homogeneous fusing form, which is capable of single crystallization at any rate. Therefore, the grating constant can take values between 5.653Angstrom and 6.058Angstrom depending on the rate between Ga and In. The crystals of In0.034Ga0.966As and In0.04Ga0.96As are used for a substrate, and a ZnSe single crystal thin film is epitaxially grown. As a result, the gratings are aligned and no dislocation is found in the substrate. Therefore the excellent thin film, whose crystal defect is very few, is obtained. In this way, a P-N junction is formed in the ZnSe epitaxial film, and the excellent light emitting element is obtained.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、青色発光に適したII−VI族化合物半導体
Zn5eの良質なエピタキシャル薄膜を形成して青色発
光’ex■能な発光素子を製造する上で不可欠な、Zn
5eと格子整合のとれた良質な基板結晶を用いた発光素
子に関するものでめろ。
Detailed Description of the Invention (Industrial Application Field) The present invention is directed to manufacturing a light-emitting element capable of emitting blue light by forming a high-quality epitaxial thin film of II-VI compound semiconductor Zn5e suitable for blue light emission. Zn is essential for
This is about a light-emitting device that uses a high-quality substrate crystal that is lattice-matched to 5e.

(発明の概要) 本発明は発光素子において、周期律表で■族に属する元
素と■族に属する元素とからなるII−VI化合物半導
体の薄laヲ結晶基板上にエピタキシャル成長させた特
に青色の発光素子において、該結晶基板にInk添加、
あるいは合金化した■−■族化合物半導体結晶のGaA
s ’に用いることによって、高特性の青色発光素子を
うることにある。
(Summary of the Invention) The present invention provides a light-emitting device that emits particularly blue light, which is epitaxially grown on a thin lao crystal substrate of a II-VI compound semiconductor consisting of elements belonging to group 1 and group 2 of the periodic table. In the element, Ink is added to the crystal substrate,
Or alloyed ■-■ group compound semiconductor crystal GaA
The purpose is to obtain a blue light-emitting element with high characteristics by using it in s'.

(従来技術及び発明が解決しようとする問題点)化合物
半導体を用いた発光ダイオード素子は■−v族化合物半
導体を用いたものが実用化されているが、発光波長は帆
8μmから0.48μmまでで、いわゆる青色発光(0
,45〜0.3μm帯)の素子はできない。これら■−
■化合物半導体材料に代ってII−VI族化合物半導体
が知られている。
(Prior art and problems to be solved by the invention) Light emitting diode elements using compound semiconductors have been put into practical use using ■-V group compound semiconductors, but the emission wavelength ranges from 8 μm to 0.48 μm. So-called blue light emission (0
, 45-0.3 μm band) cannot be produced. These ■−
(2) Group II-VI compound semiconductors are known in place of compound semiconductor materials.

青色発光にはZn5eがよく知られている。これを発光
素子にするには、基板結晶上にZn5eo薄iiエピタ
キシヤルに成長させる必要があるが、この際Zn5e薄
膜の格子定数と一致し九基板が必要である。そのために
は、f4)ZnSeの単結晶を用いる、(ロ)格子定数
が同じ異種の結晶を用いる、の2通りが考えられる。前
者の場合は、ブリッジマン法やチョクラルスキー法で育
成されたZn5e単結晶を用いるが、これらの手法で育
成され几単結晶は転位という結晶欠陥が極めて多く存在
し、この上にエピタキシャル成長させたZn5e薄膜に
もこの結晶欠陥が伝播してゆく几めに、良質なZn5e
薄換は得られず、従って発光素子としての特性も悪くな
ってしまり。後者に関しては■−■族化合物半導体のG
aAsの格子定数が5.653入で、Zn5eの格子定
数5.6676〜5.6687入に近いのでGaAs 
f基板として用いることが研究されている。しかし、こ
のZn5e / GaAsの組合せにおいても格子定数
の違いが帆3%もあり、この丸めにZnS eエピタキ
シャル膜に結晶欠陥転位が入る(第2図参照)0 第2図は従来の素子の一例を示すもので、図において1
はGaAs基板、2はZn5e薄膜、3はGaAs基板
中の転位、4はZn5e中に伝播した転位、5はZn5
eとGaAsとの格子不整合で生じ友欠陥を示す。
Zn5e is well known for blue light emission. In order to make this into a light emitting device, it is necessary to grow Zn5eo thin II epitaxially on a substrate crystal, but in this case, nine substrates are required to match the lattice constant of the Zn5e thin film. For this purpose, two methods can be considered: f4) using a ZnSe single crystal, and (b) using different types of crystals having the same lattice constant. In the former case, a Zn5e single crystal grown by the Bridgman method or Czochralski method is used, but the Zn5e single crystal grown by these methods has an extremely large number of crystal defects called dislocations, so epitaxial growth is performed on top of the Zn5e single crystal. In order for these crystal defects to propagate to the Zn5e thin film, high-quality Zn5e
A thin film cannot be obtained, and the characteristics as a light emitting element are therefore deteriorated. Regarding the latter, G of the ■-■ group compound semiconductor
The lattice constant of aAs is 5.653, which is close to the lattice constant of Zn5e, 5.6676 to 5.6687, so GaAs
Research is being conducted on its use as an f-substrate. However, even in this combination of Zn5e/GaAs, the difference in lattice constant is as much as 3%, and this rounding causes crystal defect dislocations to occur in the ZnS e epitaxial film (see Figure 2). Figure 2 shows an example of a conventional element. 1 in the figure.
is a GaAs substrate, 2 is a Zn5e thin film, 3 is a dislocation in the GaAs substrate, 4 is a dislocation propagated into Zn5e, and 5 is a Zn5
This shows a friend defect caused by lattice mismatch between e and GaAs.

このために基板GaAsの格子定数と一致させる目的で
Zn5eとZnSの三元混晶Zn5e□−エS工の膜を
つければよいが、組成工の制御は難かしく、良質な膜は
得にくい。また、基板のGaAs結晶に゛も結晶欠陥(
転位)が101〜10’ctn−’もちるために、 Z
n5eエピタキシヤル嗅へ伝播する。この定めに、やは
り良質なZn5e膜は得られず、青色発光素子として高
特性化が難かしい。
For this purpose, a film of a ternary mixed crystal Zn5e□-S film of Zn5e and ZnS may be formed in order to match the lattice constant of the GaAs substrate, but it is difficult to control the composition and it is difficult to obtain a high-quality film. In addition, crystal defects (
Z
n5e epitaxial propagation to the olfactory. Under these conditions, it is still impossible to obtain a Zn5e film of good quality, and it is difficult to obtain high characteristics as a blue light emitting element.

(問題点を解決する友めの手段) 本発明は、良質なZn5eエピタキシヤル膜を形成させ
るに不可欠な、格子定数がZn5eと同じで、かつ結晶
欠陥の無い結晶基板?提供することを目的とするもので
、高特性の青色発光素子を実現することにある。
(Friendly Means for Solving Problems) The present invention provides a crystal substrate having the same lattice constant as Zn5e and free from crystal defects, which is essential for forming a high-quality Zn5e epitaxial film. The purpose of this invention is to realize a blue light emitting device with high characteristics.

本発明は、 Zn5eエピタキシヤル喚の格子定数に完
全に一致し、かつ結晶欠陥の無い結晶基板として、In
i添加または合金化しfc GaAsすなわちIn工G
a1−エAs三元混晶を基板とすることを最も主要な特
徴とする。
The present invention uses In as a crystal substrate that completely matches the lattice constant of Zn5e epitaxial layer and has no crystal defects.
i-added or alloyed fc GaAs i.e. In-G
The most important feature is that the substrate is an a1-air As ternary mixed crystal.

従来の素子でh GaAs二元結晶を基板として用いて
いることから、全く発光素子の構成が異なるものである
The structure of the light emitting device is completely different from that of the conventional device, which uses an hGaAs binary crystal as a substrate.

第1図は本発明の最も基本的な実施例を示すもので、図
において6はIn□Gaニー□As三元混晶基板、7は
Zn5e薄膜単結晶である。
FIG. 1 shows the most basic embodiment of the present invention. In the figure, 6 is an In□Ga knee□As ternary mixed crystal substrate, and 7 is a Zn5e thin film single crystal.

前述しtように、Zn5eの格子定数は室温で5.66
76〜5.6687 A f 6る。一方、m−v族化
合物半導体のGaAsは同じ< 5.653 Aであり
、InAsは6.058 Aである、このGaAsと 
InAsはどんな比率にしても単結晶化ができる、いわ
ゆる全率溶形であるから、GaとInの比率によって格
子定数は5.653 Aから6.058^の間の値をと
り得る。従って、よく知られているペガード(Vega
rds )の法則によりIn/Ga比を0.03410
.966〜0.038 / 0.962にすることで”
0.Q3!G’0.966 ” 〜工n0.038Ga
O,962A8三元混晶の格子定数は5.6676〜5
.6687人となる。
As mentioned above, the lattice constant of Zn5e is 5.66 at room temperature.
76-5.6687 A f 6 Ru. On the other hand, GaAs of the m-v group compound semiconductor has the same < 5.653 A, and InAs has 6.058 A.
Since InAs is a so-called totally dissolved form that can be single crystallized at any ratio, the lattice constant can take a value between 5.653 A and 6.058^ depending on the ratio of Ga and In. Therefore, the well-known Vega
rds), the In/Ga ratio is set to 0.03410.
.. By setting it to 966~0.038/0.962”
0. Q3! G'0.966 ” ~ Engineering n0.038Ga
The lattice constant of O,962A8 ternary mixed crystal is 5.6676~5
.. That's 6,687 people.

このような三元混晶の単結晶はGaAs融液にInを約
8 、6 X 10”crn−”になるよう添加して引
上げ法(チョクラルスキー法)等で育成できる。
Such a ternary mixed single crystal can be grown by adding In to a GaAs melt to a concentration of about 8.6 x 10"crn-" and by a pulling method (Czochralski method) or the like.

しかし、結晶中のIn濃度は結晶の長手方向(成長方向
)に沿って漸次増加してゆくことから、GaAs融液に
は少なくともI X 10”CM−’添加して引上げ育
成すると、結晶本体には8.6 X 10”+ 10 
tscm ’の結晶が得られる。このようにして得た結
晶は、In添加(父は全率固溶体であるので合金比と称
してもよい)により固溶体硬化効果が生じて結晶中には
転位の発生が極めて抑制される効果もある。事実、直径
δ〜(資)閣φのIn、Ga1−、AB (Z = 0
.01−0.04 )の結晶でに結晶欠陥である転位は
ほとんど無いことが確認できた。
However, since the In concentration in the crystal gradually increases along the longitudinal direction (growth direction) of the crystal, if at least I x 10"CM-' is added to the GaAs melt and the crystal is pulled and grown, the In concentration in the crystal body increases. is 8.6 x 10”+10
tscm' crystals are obtained. The crystal obtained in this way has a solid solution hardening effect due to the addition of In (which can also be referred to as an alloy ratio since it is a total solid solution), which has the effect of extremely suppressing the generation of dislocations in the crystal. . In fact, In, Ga1-, AB (Z = 0
.. It was confirmed that there were almost no dislocations, which are crystal defects, in the crystal of 01-0.04).

この”0.034GaO,965AS及び■no、o4
Gao+96A8の結晶を基板として、気相成長法によ
りZn5e単結晶薄換をエピタキシャル成長させ几結果
、格子の整合がとれており、かつ基板中の転位がないこ
とから、結晶欠陥の極めて少い良質な薄映であることが
X線解析により認められた。この構造により、 Zn5
eエピタキシヤル換にpn接合全形成し、良好な発光素
子が得られることになる0 なお、第1表にZn5e 、 GaAs 、 InAs
、 InGaAsの三元物質などの格子定数を示す。
This “0.034GaO, 965AS and ■no, o4
Using a Gao+96A8 crystal as a substrate, we epitaxially grow a thin Zn5e single crystal using the vapor phase growth method.As a result, the lattice is well matched and there are no dislocations in the substrate, resulting in a high-quality thin film with extremely few crystal defects. This was confirmed by X-ray analysis. This structure allows Zn5
A good light-emitting device can be obtained by completely forming a p-n junction instead of an e-epitaxial layer.
, indicates the lattice constant of a ternary material such as InGaAs.

第1表 なお、この実施例ではIn濃度sc = 0.034 
ト0−04について述べたが、Zn5e?I膜の成長の
手法によっては格子定数は僅かに変化するので5の値は
0.03〜0.045の間÷もよいことは明らかであり
、要はInを添加あるいは合金化しfc−GaAaの無
転位三元基板がよいことである。
Table 1 Note that in this example, In concentration sc = 0.034
I mentioned Zn5e? Since the lattice constant changes slightly depending on the growth method of the I film, it is clear that the value of 5 can be divided between 0.03 and 0.045. A dislocation-free ternary substrate is good.

ま2.Inを添加あるいは合金化したGaAsのIn工
Ga1−エAs混晶単結晶は、工く知られている水平ブ
リッジマン法でも育成されるが、本発明ではこの混晶結
晶の製造方法によって制約されるものではない。
Ma2. An In-Ga-Air-As mixed crystal single crystal of GaAs added or alloyed with In can be grown by the well-known horizontal Bridgman method, but in the present invention, it is not limited by the manufacturing method of this mixed crystal. It's not something you can do.

(発明の効果〕 以上説明したように、本発明のInを添加し九GaAs
結晶によれば (イ)ZnSeと格子整合がとれる (口)結晶欠陥である転位がない の特徴を有することから、高品質なZn5eエピタキシ
ヤル単結晶薄膜が成長できる利点があり、高特性の實色
発光素子が実現できる効果を有するものである。
(Effects of the invention) As explained above, by adding In of the present invention, nine GaAs
According to the crystal, (a) it has the characteristics of lattice matching with ZnSe and (c) there are no dislocations, which are crystal defects, so it has the advantage of being able to grow high-quality Zn5e epitaxial single crystal thin films, and has high properties. This has the effect that a color light emitting element can achieve.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の特徴金量もよく表わしている実施例の
1つの断面図、第2図は従来検討されている素子構造を
示す。 1・・・・・・GaAs基板 2・・・・・・Zn5e薄膜 3・・・・・・GaA s基板中の転位4・・・・・・
Zn5e中に伝播し几転位5・・・・・・Zn5e (
!: GaAsとの格子不整合で生じ几欠陥 6−− In、Ga1−xAs混晶基板(g=0.03
8±IO%〕7・・・・・・Zn5e薄襖 特許出願人  日本電信電話株式会社 第1図 第2図
FIG. 1 is a sectional view of an embodiment that clearly shows the feature of the present invention, including the amount of metal, and FIG. 2 shows a device structure that has been considered in the past. 1...GaAs substrate 2...Zn5e thin film 3...Dislocations in GaAs substrate 4...
Propagates into Zn5e and dislocation 5...Zn5e (
! : In, Ga1-xAs mixed crystal substrate (g=0.03
8±IO%] 7...Zn5e thin fusuma patent applicant Nippon Telegraph and Telephone Corporation Figure 1 Figure 2

Claims (2)

【特許請求の範囲】[Claims] (1)周期律表でII族に属する元素とVI族に属する元素
とからなるII−VI化合物半導体の薄膜を結晶基板上にエ
ピタキシャル成長させた特に青色の発光素子において、
該結晶基板にInを添加、あるいは合金化したIII−V
族化合物半導体結晶のGaAsを用いることを特徴とす
る発光素子。
(1) In a particularly blue light-emitting device in which a thin film of a II-VI compound semiconductor consisting of an element belonging to Group II and an element belonging to Group VI in the periodic table is epitaxially grown on a crystal substrate,
III-V in which In is added or alloyed to the crystal substrate
A light-emitting device characterized by using GaAs, a group compound semiconductor crystal.
(2)In_xGa_1_−_xAs混晶の組成xが0
.030〜0.045である基板を用いることを特徴と
する特許請求の範囲第1項記載の発光素子。
(2) The composition x of the In_xGa_1_-_xAs mixed crystal is 0
.. The light emitting device according to claim 1, characterized in that a substrate having a molecular weight of 0.030 to 0.045 is used.
JP60171247A 1985-08-05 1985-08-05 Light emitting element Pending JPS6232665A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60171247A JPS6232665A (en) 1985-08-05 1985-08-05 Light emitting element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60171247A JPS6232665A (en) 1985-08-05 1985-08-05 Light emitting element

Publications (1)

Publication Number Publication Date
JPS6232665A true JPS6232665A (en) 1987-02-12

Family

ID=15919776

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60171247A Pending JPS6232665A (en) 1985-08-05 1985-08-05 Light emitting element

Country Status (1)

Country Link
JP (1) JPS6232665A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60143680A (en) * 1983-12-29 1985-07-29 Sanyo Electric Co Ltd MIS type light emitting diode

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60143680A (en) * 1983-12-29 1985-07-29 Sanyo Electric Co Ltd MIS type light emitting diode

Similar Documents

Publication Publication Date Title
DE69738008T2 (en) Semiconductor component
DE69425328T2 (en) CRYSTALLINE MULTI-LAYERED STRUCTURE AND METHOD FOR THE PRODUCTION THEREOF
Halsall et al. Growth and assessment of CdS and CdSe layers produced on GaAs by metalorganic chemical vapour deposition
JPH01232732A (en) Semiconductor crystal manufacturing process
JPS6232665A (en) Light emitting element
US5423284A (en) Method for growing crystals of N-type II-VI compound semiconductors
Hartmann Vapour phase epitaxy of II–VI compounds: A review
JPH0463040B2 (en)
JPS58156598A (en) Method for crystal growth
Singh et al. Growth of InGaN films by MBE at the growth temperature of GaN
Wright et al. Interdiffusion characteristics of constituent atoms during the MOCVD growth of wide band gap II–VI multilayer structures
Poole et al. MOVPE growth of magnesium cadmium sulphide: rocksalt or sphalerite?
JPS60214524A (en) Growing method of gallium phosphide arsenide epitaxial film
JP3116415B2 (en) Semiconductor wafer and method of manufacturing the same
JPH02141498A (en) Method for growing ingap crystal
JP2003188105A (en) Boron-phosphide based element and its manufacturing method
JPS58194329A (en) Liquid phase epitaxial growth of 3-5 mixed crystal semiconductor
JPH07232999A (en) Znse single crystal and its production
JP2646841B2 (en) Crystal growth method
Shang et al. Optical properties of highly disordered InGaP by solid-source molecular beam epitaxy with a GaP decomposition source
JPS60195011A (en) Purification of indium solution in indium solvent and liquid-phase epitaxial growth using the purified product
Kim et al. Phase stability and single phase compositional ranges in the In1− xGaxP epitaxial layers grown on GaAs (100) substrates
JPS6158971B2 (en)
JPS61222222A (en) Inxga1-xasyp1-y crystal containing large ga content
Vilisova et al. Structure and properties of epitaxial layers of InxGa1− xAs grown from the gas phase