JPS6239375B2 - - Google Patents

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Publication number
JPS6239375B2
JPS6239375B2 JP54071444A JP7144479A JPS6239375B2 JP S6239375 B2 JPS6239375 B2 JP S6239375B2 JP 54071444 A JP54071444 A JP 54071444A JP 7144479 A JP7144479 A JP 7144479A JP S6239375 B2 JPS6239375 B2 JP S6239375B2
Authority
JP
Japan
Prior art keywords
particles
particle
input
circuit
particle size
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54071444A
Other languages
Japanese (ja)
Other versions
JPS55163433A (en
Inventor
Masayoshi Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
Original Assignee
Sysmex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sysmex Corp filed Critical Sysmex Corp
Priority to JP7144479A priority Critical patent/JPS55163433A/en
Publication of JPS55163433A publication Critical patent/JPS55163433A/en
Publication of JPS6239375B2 publication Critical patent/JPS6239375B2/ja
Granted legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/1031Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/131Details
    • G01N15/132Circuits

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  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Biological Materials (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

〔産業上の利用分野〕 本発明は、血球などの粒子の粒度分布曲線を統
計的に処理する粒子分析方法に関するものであ
る。 〔従来の技術〕 従来、液体に浮懸する血球などの粒子を微細孔
を通過させ、液と粒子との電気インピーダンスの
差異に基づいて検出する形式の粒子分析方法にお
いては、微細孔を通過する際に生ずる粒子信号の
大きさが、粒子の大きさに比例することから、粒
子の大きさに関する種々の統計的な処理がなさ
れ、たとえば臨床医学的な方面でその情報が活用
されている。通常、血球などの分析においては、
血液1mm当り500万個程度の血球が含まれてお
り、血液を5万倍程度に生理食塩水などを用いて
希釈して100個/mm程度の濃度とし、さらに
25000個程度の血球について1個づつ測定を行つ
ている。この場合、一連の測定終了までの時間は
約10秒程度である。したがつて単純平均の一個当
りの測定時間は0.4ミリ程度である。 〔発明が解決しようとする問題点〕 この程度の所要時間であれば、近年多方面にお
いて用いられるようになつたマイクロコンピユー
タなどの技術を活用して分析処理は非常に簡単に
行うことができるが、液体に浮懸する粒子は必ず
しも均一に分散しているとは限らず、むしろ通常
の血球計数器などにおいても連続して2個以上の
粒子が通過する同時通過という現象が問題となつ
ている。したがつて、むしろ粒子が通過する検出
用の微細孔の形状や粒子の通過速度が問題となつ
てくる。 通常、10ミクロン程度の血球などの粒子を検出
する場合、検出孔の径を100ミクロン程度とし、
粒子の通過速度を数メートル/秒とするのが一般
的である。このときに得られる粒子信号の時間幅
は数マイクロ秒〜数十マイクロ秒である。したが
つて粒子の大きさのふるい分けに高速A−Dコン
バータを用いてデイジタル信号に変換するとして
も、一連の処理を数マイクロ秒で行い、つぎの信
号のために待機するような装置は、高速である必
要があり、このため高価で平均的な粒子密度から
考えるときわめて不経済である。また一方、比較
的簡単に構成される粒子計数装置において、その
測定の閾値を少しづつ変えて共通の検出器で粒子
を検出し、夫々の分類計数の形で計数処理し、計
数終了後あらためて分析処理を行う方法が用いら
れているが、並列に設けられた夫々の計数回路の
許容計数値を大きく取る必要があり、装置が大が
かりとなりあまり有効な方法とは言えない。とく
に分析精度を上げるためには、上記の並列個数を
さらに増設する必要があり、装置がきわめて高価
なものとなつてしまうという欠点があつた。 上記の欠点を解消するために、懸濁液中の粒子
を液と粒子とのインピーダンスの差異により検出
する検出装置で検出し、検出装置の検出回路で電
気パルス信号に変換し、このパルス信号を適当な
分周比を有する分周回路により、パルス間隔を広
くするように構成することにより、高精度で分析
を行うことができ、かつ後続の処理を集積化され
たマイクロコンピユータなどにより低コストで行
うことができるようにした粒子分析方法を本発明
者は既に開発し特願昭54―43442号(特開昭55―
135731号)として特許出願している。本発明はさ
らに一歩進めて、粒度分布曲線の測定結果を統計
的に処理し、新たな粒度分布曲線を作成したり、
あるいは2種の粒子の混合された結果から、必要
な粒子の粒度分布曲線を求めたり、あるいは曲線
の一部から残りの分布曲線を予想して求めること
などを可能とした粒子分析方法を提供せんとする
ものである。 〔問題点を解決するための手段および作用〕 本発明の粒子分析方法は、懸濁液中の粒子を検
出装置の微細孔に通過させ、液と粒子とのインピ
ーダンスの差異により検出し、検出した粒子信号
により粒子の分析を行う方法において、粒子信号
を複数個の比較回路に送つて粒子信号の大きさを
弁別し、ついで比較回路に夫々接続された複数個
の分周回路で分周した後、分周回路からのパルス
信号を入出力回路に並列に入力し、この入出力回
路に演算回路、読出専用メモリ、読出書込メモリ
および入力装置を接続し、この入力装置に外部か
らの設定、分析粒度範囲の設定などの条件設定を
入力し、前記演算回路により、累積粒度分布曲線
から統計処理された粒度分布曲線を得ることを特
徴としている。 〔実施例〕 以下、本発明の実施例を図面に基づいて説明す
る。第1図は本発明の粒子分析方法を実施する装
置の一例を示す系統的説明図である。1は液体に
浮懸する血球などの粒子を微細孔を通過させ、液
と粒子との電気インピーダンスの差異に基づいて
検出する形式の粒子検出装置で、この粒子検出装
置1に並列に複数個の比較回路2が接続される。
これらの比較回路2には複数個の分周回路3が
夫々接続され、これらの分周回路3には分周回路
の出力を並列に入力するための入出力回路4が接
続される。この入出力回路4には外部からの設
定、分析粒度範囲の設定などの条件設定を入力す
るための入力装置5が接続され、また入出力回路
4には演算回路6、読出専用メモリ7、読出書込
メモリ8および出力回路10が接続される。さら
にこの出力回路10には記録装置11が接続さ
れ、必要に応じてデイスプレイ装置(表示装置)
12が接続される。比較回路2には基準電圧発生
回路13,14からの電圧を、各比較回路2に比
較電圧を与えるための分圧抵抗15,16が夫々
設けられている。 上記のように構成された粒子分析装置におい
て、粒子の体積に比例する電気信号を発する粒子
検出装置1の出力信号は、複数個の比較回路2に
送られる。比較回路2は通常、50乃至100程度並
列に並べて用い、したがつて比較電圧は階段状に
50乃至100程度の電圧に分割されたものとなる。
通常、粒子信号は平均すれば100μsecのパルス間
隔のものが粒子検出装置から与えられるが、必ず
しも間隔が一定とは限らず連続に近い形で信号が
送られることもあり、夫々のパルスを直接分析す
るには、数マイクロオーダの演算速度を持つ演算
回路を必要とするので、これらの欠点を補うため
に10進〜100進の間の適当な分周比を有する分周
回路3を比較回路2の数だけ並列に用い、比較回
路2に接続してつぎの入出力回路4に並列に入力
させる。分周回路3からの並列のパルス信号は、
適当に平均化されかつ分周された、累積型の粒度
分布曲線を構成するためのグラフ曲線下の面積部
分の各点に相当し、これらの各点を累積したもの
が累積分布曲線となる。入出力回路4には粒子の
累積粒度分布に関する信号のほかに、粒子を浮懸
する液体試料の定量に関する信号17が入力され
る。これは測定を粒子の浮懸液の所定量の分析と
するか、所定の時間単位でするか、あるいはトー
タルの粒子数で行うかによつて定まる。しかし通
常、たとえば血液の赤血球数などの情報をも並行
して求めることが一般化しているため、1回の測
定を所定体積中の粒子の分析とし、数秒〜十数秒
の間に行われるように所定量の粒子の浮懸液の吸
引分析が多く用いられる。ただし単位体積当りの
粒子数が希薄な場合、あるいは工業分野のように
粒子数が不均一な場合などは、むしろ所定の粒子
数に達したときに分析の終了とする方が、より正
確な情報をつかめるので望ましい。また繰返しの
測定によつて分布曲線の経時変化を求めたい場合
などにおいては、むしろ短時間毎に時間単位に区
切つて測定することが望ましい。たとえば血球が
サポニンの添加によつて溶血する過程を観測する
場合などがこれに相当する。さらに入出力回路4
には、外部からの設定、たとえば上記設定方法の
設定、あるいは分析粒度範囲の設定などの条件設
定を入力するための入力装置5の信号が入力され
る。入出力回路4には前述のように演算回路6、
読出専用メモモリ7、読出書込メモリ8および出
力回路10に電気的に接続され、種々の統計処
理、演算などが行われる。出力回路10には記録
装置11が接続され、必要に応じデイスプレイ装
置12が接続されて記録内容やその他の情報が表
示される。 第2図は累積の粒度分布曲線の一例を示してい
る。この曲線はつぎのようにして得られる。すな
わち入出力回路4に各分周回路3から分周比毎の
パルス、たとえば100個の粒子に対応するパルス
に1個の割合でパルスが入ると、演算回路6は各
番地毎に対応する読出書込メモリ8に記憶されて
いる数を呼出し、1個分を加え再び書き込むとい
う動作を繰り返し、所定の測定(前述したように
体積、時間あるいは粒子数による)が終了するま
で続けられる。第1表に示す例のように、各番地
には夫々の番地に対応する粒子数(累積値)が記
憶される。
[Industrial Application Field] The present invention relates to a particle analysis method for statistically processing particle size distribution curves of particles such as blood cells. [Prior Art] Conventionally, in a particle analysis method in which particles such as blood cells suspended in a liquid are passed through micropores and detected based on the difference in electrical impedance between the liquid and the particles, Since the size of the generated particle signal is proportional to the size of the particle, various statistical processes regarding the size of the particle are performed, and the information is utilized, for example, in clinical medicine. Normally, when analyzing blood cells, etc.
Blood contains approximately 5 million blood cells per mm3 , and blood is diluted approximately 50,000 times with physiological saline to a concentration of approximately 100 cells/ mm3 .
Approximately 25,000 blood cells are measured one by one. In this case, it takes about 10 seconds to complete a series of measurements. Therefore, the simple average measurement time per piece is about 0.4 mm. [Problem to be solved by the invention] If this amount of time is required, analysis processing can be performed very easily using technology such as microcomputers that have come into use in many fields in recent years. Particles suspended in a liquid are not necessarily uniformly dispersed, and even in ordinary blood cell counters, the phenomenon of simultaneous passage, where two or more particles pass in succession, has become a problem. . Therefore, the problem is rather the shape of the detection micropores through which the particles pass and the speed at which the particles pass. Normally, when detecting particles such as blood cells of about 10 microns, the diameter of the detection hole is about 100 microns.
It is common for the particles to pass through at a speed of several meters/second. The time width of the particle signal obtained at this time is several microseconds to several tens of microseconds. Therefore, even if a high-speed A-D converter is used to screen the particle size and convert it into a digital signal, a device that performs a series of processing in a few microseconds and waits for the next signal will not be able to process the high-speed signal. Therefore, it is expensive and extremely uneconomical considering the average particle density. On the other hand, in a relatively easily constructed particle counting device, particles are detected by a common detector by changing the measurement threshold little by little, and the particles are counted in the form of a classification count for each, and then analyzed again after counting is completed. Although a method of processing is used, it is necessary to increase the permissible count value of each counting circuit provided in parallel, and the device becomes large-scale, so it cannot be said to be a very effective method. In particular, in order to improve the analysis accuracy, it is necessary to further increase the number of parallel devices, which has the drawback of making the device extremely expensive. In order to eliminate the above drawbacks, particles in a suspension are detected by a detection device that detects the difference in impedance between the liquid and the particles, and the detection circuit of the detection device converts the particles into an electrical pulse signal. By configuring a frequency divider circuit with an appropriate frequency division ratio to widen the pulse interval, analysis can be performed with high precision, and subsequent processing can be performed at low cost using an integrated microcomputer. The present inventor has already developed a particle analysis method that enables the
A patent application has been filed as (No. 135731). The present invention goes one step further and statistically processes the measurement results of the particle size distribution curve to create a new particle size distribution curve.
Alternatively, we provide a particle analysis method that makes it possible to obtain the particle size distribution curve of the required particle from the results of a mixture of two types of particles, or to predict and obtain the remaining distribution curve from a part of the curve. That is. [Means and effects for solving the problem] The particle analysis method of the present invention allows particles in a suspension to pass through the micropores of a detection device, detects them based on the difference in impedance between the liquid and the particles, and detects the particles. In a method of analyzing particles using particle signals, the particle signal is sent to multiple comparison circuits to discriminate the size of the particle signal, and then frequency-divided by multiple frequency divider circuits connected to each comparison circuit. , the pulse signal from the frequency dividing circuit is input in parallel to the input/output circuit, and the arithmetic circuit, read-only memory, read/write memory, and input device are connected to this input/output circuit, and the settings from the outside are connected to this input device. The method is characterized in that condition settings such as the setting of the analysis particle size range are input, and the arithmetic circuit obtains a statistically processed particle size distribution curve from the cumulative particle size distribution curve. [Example] Hereinafter, an example of the present invention will be described based on the drawings. FIG. 1 is a systematic explanatory diagram showing an example of an apparatus for implementing the particle analysis method of the present invention. Reference numeral 1 denotes a particle detection device that detects particles such as blood cells suspended in a liquid by passing through micropores based on the difference in electrical impedance between the liquid and the particles. Comparison circuit 2 is connected.
A plurality of frequency dividing circuits 3 are connected to each of these comparison circuits 2, and an input/output circuit 4 for inputting the outputs of the frequency dividing circuits in parallel is connected to these frequency dividing circuits 3. An input device 5 is connected to this input/output circuit 4 for inputting external settings and condition settings such as analysis particle size range settings. Write memory 8 and output circuit 10 are connected. Furthermore, a recording device 11 is connected to this output circuit 10, and a display device (display device) is connected as necessary.
12 are connected. The comparator circuit 2 is provided with voltage dividing resistors 15 and 16 for supplying voltages from the reference voltage generating circuits 13 and 14 and comparison voltages to each comparator circuit 2, respectively. In the particle analysis device configured as described above, the output signal of the particle detection device 1, which emits an electric signal proportional to the volume of the particle, is sent to a plurality of comparison circuits 2. Normally, about 50 to 100 comparison circuits 2 are used in parallel, so the comparison voltage is stepped.
It is divided into about 50 to 100 voltages.
Normally, a particle signal is given by a particle detection device with a pulse interval of 100 μsec on average, but the interval is not necessarily constant and the signal may be sent in a nearly continuous manner, so each pulse can be directly analyzed. To do this, an arithmetic circuit with an arithmetic speed on the order of several micrometers is required. To compensate for these drawbacks, the comparator circuit 2 is replaced with a frequency divider circuit 3 having an appropriate frequency division ratio between decimal and 100 decimal. They are connected to the comparator circuit 2 and input to the next input/output circuit 4 in parallel. The parallel pulse signals from the frequency divider circuit 3 are
This corresponds to each point in the area under the graph curve to construct a cumulative particle size distribution curve that has been appropriately averaged and frequency-divided, and the cumulative distribution curve is obtained by accumulating these points. In addition to signals related to the cumulative particle size distribution of particles, the input/output circuit 4 receives a signal 17 related to the quantitative determination of a liquid sample in which particles are suspended. This depends on whether the measurement is performed by analyzing a predetermined amount of suspended particles, by a predetermined time unit, or by measuring the total number of particles. However, since it has become common to obtain information such as the number of red blood cells in parallel, each measurement is an analysis of particles in a predetermined volume, and is performed over a period of several seconds to more than ten seconds. Suction analysis of a suspension of a predetermined amount of particles is often used. However, in cases where the number of particles per unit volume is rare, or where the number of particles is uneven as in the industrial field, it is better to end the analysis when a predetermined number of particles is reached to obtain more accurate information. This is desirable because you can grasp it. Furthermore, in cases where it is desired to determine changes over time in the distribution curve by repeated measurements, it is preferable to divide the measurement into short time units. For example, this is the case when observing the process of hemolysis of blood cells due to the addition of saponin. Furthermore, input/output circuit 4
A signal from the input device 5 for inputting external settings, for example, setting of the above-mentioned setting method or setting of conditions such as setting of analysis particle size range, is inputted to the input device 5 . As mentioned above, the input/output circuit 4 includes the arithmetic circuit 6,
It is electrically connected to the read-only memory 7, the read/write memory 8, and the output circuit 10, and performs various statistical processing, calculations, and the like. A recording device 11 is connected to the output circuit 10, and a display device 12 is connected as necessary to display recorded contents and other information. FIG. 2 shows an example of a cumulative particle size distribution curve. This curve is obtained as follows. That is, when the input/output circuit 4 receives a pulse for each frequency division ratio from each frequency dividing circuit 3, for example, one pulse for each pulse corresponding to 100 particles, the arithmetic circuit 6 receives a corresponding readout signal for each address. The operation of calling up the number stored in the write memory 8, adding one value, and writing it again is repeated until a predetermined measurement (based on volume, time, or number of particles as described above) is completed. As in the example shown in Table 1, each address stores the number of particles (cumulative value) corresponding to the respective address.

【表】 第1表において、たとえば1番地には1454、10
番地には596、55番地には66という粒子数が示さ
れている。演算回路6により各番地を順次呼び出
し、出力回路10を通じて記録装置11で記録す
ると、第2図に示すような累積粒度分布曲線が得
られる。つぎに各番地間の粒子数の差を求める
と、第2表のようになる。
[Table] In Table 1, for example, address 1 is 1454, 10
The number of particles is shown at address 596 and 66 at address 55. When each address is sequentially called by the arithmetic circuit 6 and recorded by the recording device 11 through the output circuit 10, a cumulative particle size distribution curve as shown in FIG. 2 is obtained. Next, when the difference in the number of particles between each address is calculated, the result is as shown in Table 2.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明の粒子分析方法
は、最小自乗法により粒度分布曲線から回帰曲線
を算出し種々のデータを得ることができる。また
すべてのデータが第2図の累積の粒度分布曲線か
ら出発しているため、第3図の一般の粒度分布の
曲線からは得られなかつた情報、たとえば第2図
の平坦部104を水平にレベル零まで延長するこ
とによつて、簡単に単一粒子の粒子数を求めるな
どの処理が可能であり、これはとくに平均の粒子
の体積を求める際などに有効である。また本発明
の方法を実施する装置の構成そのものも累積の粒
度分布を求めることから始めているため、単純化
されかつ演算装置6の演算処理能力に合わせ、処
理パルスの時間間隔を平均化させかつ分周比によ
つて低速化させているために、低速のマイクロコ
ンピユータ化などが可能であるなど、低コスト化
に役立つており、従来の粒子計数装置に内蔵する
ことも可能であるなど、種々の優れた特徴を有し
ている。
As explained above, the particle analysis method of the present invention can calculate a regression curve from a particle size distribution curve using the least squares method and obtain various data. In addition, since all the data originates from the cumulative particle size distribution curve in Figure 2, information that cannot be obtained from the general particle size distribution curve in Figure 3, for example, when flat part 104 in Figure 2 is horizontally By extending to level zero, it is possible to easily calculate the number of single particles, and this is particularly effective when calculating the average particle volume. Furthermore, since the configuration of the apparatus for carrying out the method of the present invention starts from obtaining the cumulative particle size distribution, it is simplified and the time intervals of the processing pulses are averaged and separated in accordance with the calculation processing capacity of the calculation unit 6. Since the speed is reduced by the circumferential ratio, it is possible to use a low-speed microcomputer, which helps reduce costs, and it can be built into a conventional particle counting device. It has excellent characteristics.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の粒子分析方法を実施する装置
の一例を示す系統的説明図、第2図〜第8図は処
理例の曲線図で、第2図は累積粒度分布曲線の一
例を示す図、第3図は第2図における各番地間の
粒子数の差を求めて図示した曲線図、第4図は第
3図におけるピーク点の左右の部分に分けて統計
的に整理して得た分布曲線図、第5図はノイズな
どの影響により粒度分布の大きい粒度の情報しか
得られなかつた場合の曲線図、第6図は第5図に
おいて実際には測定できなかつた曲線部を推定し
て描いた曲線図、第7図は2種以上の粒度の明ら
かに異なる粒子の分布曲線図、第8図は第7図に
おけるピークから左側の部分を推定演算して得た
曲線図である。 1……粒子検出装置、2……比較回路、3……
分周回路、4……入出力回路、5……入力装置、
6……演算回路、7……読出専用メモリ、8……
読出書込メモリ、10……出力回路、11……記
録装置、12……デイスプレイ装置、13,14
……基準電圧発生回路、15,16……分圧抵
抗、17……信号。
Fig. 1 is a systematic explanatory diagram showing an example of an apparatus for carrying out the particle analysis method of the present invention, Figs. 2 to 8 are curve diagrams of processing examples, and Fig. 2 shows an example of a cumulative particle size distribution curve. Figure 3 is a curve diagram obtained by calculating the difference in the number of particles between each address in Figure 2, and Figure 4 is a curve diagram obtained by dividing and statistically organizing the left and right parts of the peak point in Figure 3. Fig. 5 is a curve diagram when only information on large particle sizes in the particle size distribution can be obtained due to the influence of noise, etc., and Fig. 6 is an estimation of the curve part that could not actually be measured in Fig. 5. Figure 7 is a distribution curve diagram of two or more types of particles with clearly different particle sizes, and Figure 8 is a curve diagram obtained by estimating the left side of the peak in Figure 7. . 1... Particle detection device, 2... Comparison circuit, 3...
Frequency dividing circuit, 4...Input/output circuit, 5...Input device,
6... Arithmetic circuit, 7... Read-only memory, 8...
Read/write memory, 10... Output circuit, 11... Recording device, 12... Display device, 13, 14
...Reference voltage generation circuit, 15, 16...Voltage dividing resistor, 17...Signal.

Claims (1)

【特許請求の範囲】 1 懸濁液中の粒子を検出装置の微細孔に通過さ
せ、液と粒子とのインピーダンスの差異により検
出し、検出した粒子信号により粒子の分析を行う
方法において、 粒子信号を複数個の比較回路に送つて粒子信号
の大きさを弁別し、ついで比較回路に夫々接続さ
れた複数個の分周回路で分周した後、分周回路か
らのパルス信号を入出力回路に並列に入力し、こ
の入出力回路に演算回路、読出専用メモリ、読出
書込メモリおよび入力装置を接続し、この入力装
置に外部からの設定、分析粒度範囲の設定などの
条件設定を入力し、前記演算回路により、累積粒
度分布曲線から統計処理された粒度分布曲線を得
ることを特徴とする粒子分析方法。
[Scope of Claims] 1. A method in which particles in a suspension are passed through micropores of a detection device, detected based on the difference in impedance between the liquid and the particles, and analyzed based on the detected particle signals, comprising: is sent to multiple comparison circuits to discriminate the size of the particle signal, and then frequency-divided by multiple frequency divider circuits connected to each comparison circuit, and then the pulse signal from the frequency divider circuit is sent to an input/output circuit. input in parallel, connect the arithmetic circuit, read-only memory, read/write memory, and input device to this input/output circuit, and input condition settings such as external settings and analysis granularity range settings to this input device. A particle analysis method characterized in that the arithmetic circuit obtains a statistically processed particle size distribution curve from the cumulative particle size distribution curve.
JP7144479A 1979-06-06 1979-06-06 Particle analysing device Granted JPS55163433A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7144479A JPS55163433A (en) 1979-06-06 1979-06-06 Particle analysing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7144479A JPS55163433A (en) 1979-06-06 1979-06-06 Particle analysing device

Publications (2)

Publication Number Publication Date
JPS55163433A JPS55163433A (en) 1980-12-19
JPS6239375B2 true JPS6239375B2 (en) 1987-08-22

Family

ID=13460714

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7144479A Granted JPS55163433A (en) 1979-06-06 1979-06-06 Particle analysing device

Country Status (1)

Country Link
JP (1) JPS55163433A (en)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55135731A (en) * 1979-04-09 1980-10-22 Toa Medical Electronics Co Ltd Particle analyzer

Also Published As

Publication number Publication date
JPS55163433A (en) 1980-12-19

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