JPS6251432B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a measuring device used when testing a large number of samples.

Generally, when testing a large number of samples,
As shown in FIG. ₁ , _samples T _{1 to T}
As shown in Fig. 2, the signals from one signal generator Go are sequentially switched by a switch SA to produce samples T ₁ to _{T o .} The output is sequentially switched by a switch SB synchronized with SA to output one measuring device Do.
A device that measures this is used. Although the apparatus shown in FIG. 1 allows continuous measurement, it requires a signal generator and a measuring device equal to the number of samples, making it uneconomical and requiring a large space factor. On the other hand, the second
In the device shown in the figure, input is not given at times other than the measurement target time, so when measuring, for example, hysteresis characteristics with respect to sample input, characteristics in increasing and decreasing directions of input, etc., normal measurements may not be possible.

The present invention realizes a device that can measure the characteristics of a large number of samples in the same way as when using individual signal generators, even though the signal from the signal generator is switched and given to a large number of samples. This is what I did.

FIG. 3 is a connection diagram showing an embodiment of the measuring device of the present invention. The difference in FIG. 3 from the conventional example shown in FIG. 2 is that signal holders H ₁ to _{H o} are provided, and the signal from the signal generator Go is transferred to the signal holders H ₁ to _{H o} via a changeover switch SC. Sequentially given, signal holders H ₁ to H _o
Sample T ₁ through the switch SD to switch the output of
This is the addition of a circuit that provides each to T _o .
Note that the switch SC has a contact S ₁ that is turned on by a signal from the control circuit TC, similar to switches SA and SB.
→S ₂ →...→S _o , whereas in SD, the contact that turns off switches as S ₁ →S ₂ →...→S _o .

In the device of the present invention configured in this manner, when each contact S ₁ of the switches SA, SB, and SC is turned on and the contact S ₁ of the SD is turned off in response to a command from the control circuit TC, the signal from the signal generator Go is The signal is given a sample T ₁ and its output is measured by the measuring instrument Do.
At this time, a signal is also given to the signal holder _H1 from the signal generator Go. Further, signals held by signal holders _H2 to _H0 are applied to samples _T2 to _T0 , respectively. When the measurement of sample _T1 is completed, the changeover switch SA,
The contacts that turn on SB and SC move to _S2 , and the contacts that turn SD off also move to _S2 . The resulting signal generator Go
The signal from is given to sample T ₂ and signal holder H ₂ , and measurements of the characteristics of sample T ₂ are made. At this time, the signal holder H ₁ has Go at the end of the measurement of T ₁ .
The signal is held and this signal is given to _T1 . That is, the input signal at the end of the measurement continues to be applied to sample _T1 . Also sample
The signals held in the signal holders H ₃ to _{H o} are also continuously applied to T ₃ to _{T o} . In this way, the characteristics of the samples T ₁ to _{T o} are sequentially measured according to the commands of the control circuit TC. Since signals are continuously applied to each sample by the signal holder at times other than the measurement target time, for example, when measuring the hysteresis characteristics of the sample input, the characteristics of the increasing direction and decreasing direction of the input, etc. Normal measurements can be made. Moreover, since each signal holder H ₁ to _Ho holds only the signal from the signal generator Go at the time of measuring the corresponding sample, it is not affected by the characteristics of other samples and there is no mutual interference.

Note that the signal holders H ₁ to _{H o} are measured by sequentially switching the samples T ₁ to _{T o} , so there is no need for such strict hold characteristics; for example, the signal generator Go
If the signal from the
A simple structure consisting of a combination with a buffer can be used. Further, although the above explanation has been given by exemplifying an electric signal system, the present invention can also be applied to an air signal system. In this case, components that are compatible with the air signal system are used, such as changeover switches SA, SB,
A switching valve is used as the SD. Furthermore, although the above example uses one measuring device Do,
A measuring device may be provided corresponding to each sample.

As explained above, in the present invention, although the signal from the signal generator is switched and given to a large number of samples, each sample is A device is obtained that allows properties to be measured individually.

[Brief explanation of the drawing]

Figures 1 and 2 are connection diagrams of conventional equipment;
The figure is a connection diagram showing an embodiment of the device of the present invention, and FIG. 4 is a connection diagram showing an example of a signal holder used in the device of the present invention. Go...signal generator, Do...measuring device, T ₁ ~ _{T o} ...
…sample, H ₁ ~H _o …signal holder, SA,
SB, SC, SD...changeover switch, TC...control circuit.

Claims (1)

[Claims] 1 In a device that switches and applies signals from a signal generator to a large number of samples and measures the characteristics of the large number of samples individually, a signal holder is provided for each sample, and when the corresponding sample is in the measurement state. A measuring device characterized in that a signal from a signal generator is applied only to the sample, and a held signal is applied to the sample when the corresponding sample is not in a measurement state.