JPS628123B2 - - Google Patents

Info

Publication number
JPS628123B2
JPS628123B2 JP2457880A JP2457880A JPS628123B2 JP S628123 B2 JPS628123 B2 JP S628123B2 JP 2457880 A JP2457880 A JP 2457880A JP 2457880 A JP2457880 A JP 2457880A JP S628123 B2 JPS628123 B2 JP S628123B2
Authority
JP
Japan
Prior art keywords
measured
hole
hole edge
image sensor
bits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP2457880A
Other languages
Japanese (ja)
Other versions
JPS56120901A (en
Inventor
Kazumi Kagami
Akira Isobe
Koji Tsucha
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyoda Koki KK
Original Assignee
Toyoda Koki KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyoda Koki KK filed Critical Toyoda Koki KK
Priority to JP2457880A priority Critical patent/JPS56120901A/en
Publication of JPS56120901A publication Critical patent/JPS56120901A/en
Publication of JPS628123B2 publication Critical patent/JPS628123B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【発明の詳細な説明】 本発明は被測定物の軸方向基準面に対し軸線と
直交する貫通穴のホールエツジの位置を測定する
測定装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a measuring device for measuring the position of a hole edge of a through hole perpendicular to an axis of an object to be measured with respect to an axial reference plane.

本発明の目的は、被測定物を一定角度位置に割
出すことなく連続回転させたままで前記ホールエ
ツジの位置を正確に測定することと、測定時間の
短縮化を図ることである。
An object of the present invention is to accurately measure the position of the hole edge while continuously rotating the object to be measured without indexing it to a fixed angular position, and to shorten the measurement time.

従来において、軸線に直交する貫通穴のホール
エツジの位置を自動的に測定するものは存在しな
かつた。このため、被測定物を両センタにて回転
軸承し、貫通穴のホールエツジを顕微鏡で見なが
ら被測定物を手で回わし顕微鏡視野内に設けた目
盛線とのずれを続み取つてホールエツジの位置の
測定が行われていたが、このような測定は非能率
的であるばかりでなく、生産管理自動化の障害と
なつていた。
Conventionally, there has been no device that automatically measures the position of the hole edge of a through hole perpendicular to the axis. Therefore, the object to be measured is rotatably supported at both centers, and the hole edge of the through hole is rotated by hand while observing the hole edge of the through hole. However, such measurements were not only inefficient, but also hindered production management automation.

かかる測定を自動化するための一つの試みとし
て接触方式のものが考えられたが、変位検出器の
接触子を貫通穴内周囲に接触させるためには、被
測定物を一定角度位置に正確に割出さなければな
らないし、わずかな割出し誤差でもあると正確な
測定はできない。その上穴径が小さい場合には接
触子の挿入が困難であり、測定誤差の介入を助長
するばかりでなく、接触子をホールエツジ部に接
触させることは極めて困難であり、エツジ部から
はなれた穴内面に接触させざるを得ない。このた
め貫通穴内面の真円度、面粗度が悪いとこれらの
影響を受けホールエツジの正確な測定は期待でき
ない。しかも貫通穴を一定の角度位置に正確に割
出すには時間がかかるため計測時間が長くなりこ
のような接触方式はあまり実用的でないことがわ
かつた。
A contact method has been considered as an attempt to automate such measurements, but in order to bring the contact of the displacement detector into contact with the inside of the through hole, it is necessary to accurately index the object to be measured at a fixed angle position. If there is even a slight indexing error, accurate measurements cannot be made. Moreover, if the diameter of the hole is small, it is difficult to insert the contact, which not only promotes measurement errors, but also makes it extremely difficult to bring the contact into contact with the edge of the hole. It has no choice but to make contact with the inner world. Therefore, if the roundness and surface roughness of the inner surface of the through hole are poor, accurate measurement of the hole edge cannot be expected due to the influence of these factors. Moreover, it took a long time to accurately locate the through hole at a certain angular position, which resulted in a long measurement time, and it was found that such a contact method was not very practical.

本発明はこのような試みを経た後、無接触でし
かも被測定物の角度位置決めをしないでもホール
エツジ位置の測定を可能にしたものである。
After undergoing such trials, the present invention has made it possible to measure hole edge positions without contact and without angular positioning of the object to be measured.

以下本発明の実施例を図面に基いて説明する。 Embodiments of the present invention will be described below based on the drawings.

被測定物Wの一例を第1図に示すが、これはバ
ルブの一種であり軸線に直交する貫通穴hが穿設
され、軸方向基準面としてのセンタ穴cに対する
貫通穴の基準面寄りのホールエツジeまでの寸法
を測定するものとする。第2図はその測定原理
図であり、被測定物Wの基準面側の一端は固定の
基準センサ1にて支持され、他端は進退可能でか
つ回転駆動される可動センタ2にて支持されてい
る。被測定物Wの軸線をはさんで一方の側には平
行光線を投光する投光器3が配置され、他方の側
には貫通穴hの中心線が光線と平行になつた時貫
通穴hを通して投光器側のホールエツジ像をイメ
ージセンサ5上に結像せしめるビデオカメラ4が
配置されている。イメージセンサ5は微少間隔で
多数のフオトダイオードが組込まれており、イメ
ージセンサ5上に結像されるホールエツジ像
e′(明暗像)に各フオトダイオードが感応し、電
気的信号を出力する。このイメージセンサ5は第
3図に示すようにホールエツジ像e′の中心を通り
被測定物Wの軸線と平行な方向に配置されている
ので、各フオトダイオードの信号出力を順次走査
すると第3図bに示すパルス信号として得られ、
基準レベルV1を越すパルス信号数を入光ビツト
数として計数する。
An example of the object to be measured W is shown in Fig. 1. This is a type of valve, and a through hole h is bored perpendicular to the axis, and the through hole is located closer to the reference plane with respect to the center hole c, which serves as the axial reference plane. The dimension up to hole edge e shall be measured. FIG. 2 is a diagram showing the measurement principle. One end of the object W on the reference surface side is supported by a fixed reference sensor 1, and the other end is supported by a movable center 2 that can move forward and backward and is rotationally driven. ing. A projector 3 that emits a parallel beam of light is arranged on one side of the axis of the object to be measured W, and a projector 3 that emits a parallel beam of light is placed on the other side, and a beam that passes through the through hole h when the center line of the through hole h becomes parallel to the beam is placed on the other side. A video camera 4 is arranged to form a Hall Edge image from the projector side onto an image sensor 5. The image sensor 5 has a large number of photodiodes installed at minute intervals, and a Hall Edge image formed on the image sensor 5
Each photodiode is sensitive to e' (bright and dark image) and outputs an electrical signal. As shown in FIG. 3, this image sensor 5 is arranged in a direction passing through the center of the Hall edge image e' and parallel to the axis of the object to be measured W, so if the signal output of each photodiode is sequentially scanned, the image sensor 5 shown in FIG. Obtained as a pulse signal shown in b,
The number of pulse signals exceeding the reference level V1 is counted as the number of incident light bits.

このイメージセンサ5上に結像されるホールエ
ツジの入光領域は被測定物の回転に伴い増減し、
光軸と貫通穴中心線が平行になつたときホールエ
ツジの入光領域は最大となる。よつてイメージセ
ンサ出力信号を走査して入光ビツト数を計数し、
半回転する間に得られる一走査当りの計数値の最
大値をもつてホールエツジの位置検測データとす
る。この検測データと基準値と比較しホールエツ
ジの位置ずれ量を判別する。尚ビデオカメラ4の
光軸は貫通穴hの直角度がくるつていても投光器
側のホールエツジがみとおせる角度θだけ軸線に
直交する直交軸Sに対して傾けられている。
The light incident area of the hole edge that is imaged on the image sensor 5 increases and decreases as the object to be measured rotates.
When the optical axis and the center line of the through hole become parallel, the light incident area of the hole edge becomes maximum. Therefore, the image sensor output signal is scanned and the number of incident light bits is counted.
The maximum value of the count value per scan obtained during half a rotation is taken as hole edge position detection data. This measurement data is compared with a reference value to determine the amount of positional deviation of the hole edge. The optical axis of the video camera 4 is tilted with respect to the orthogonal axis S, which is perpendicular to the axis, by an angle θ that allows the hole edge on the projector side to be seen through even if the perpendicularity of the through hole h is twisted.

第4図、第5図によりかかる測定原理を応用し
たホールエツジ位置測定装置の構成を説明する。
20はベース、21,22,23はベース20上
に載置された中間ベース、中間ベース21上に
は、基準センタ24を装架したセンタ支持台25
と、可動センタ26を装架し回転及び軸方向運動
可能なスピンドル27を軸承した主軸台28と、
スピンドル駆動モータ29が載置されている。尚
主軸台28内にはスピンドル進退駆動装置が内蔵
されている。中間ベース22上には、被測定物W
の軸線をはさむ一方の側に位置して投光器30が
載置され、中間ベース23上には、軸線をはさむ
他方の側に位置してビデオカメラ31が載置され
ている。32は被測定物Wを収納するホツパ、3
3は被測定物Wの姿勢を揃えてホツパ32から送
り出すパーツフイーダ、34は搬送シユート、3
5は搬送シユート34の先端部に設けられ被測定
物Wを1個ずつ分離して受渡すエスケープ装置、
36はエスケープ装置35から受渡された被測定
物Wを両センタ支持位置に搬入する回動可能な搬
入アーム、37は搬入アーム36を旋回させる旋
回駆動装置、38は搬出シユート、39はホール
エツジ位置の検測データによつて選択的に開閉さ
れる選択ゲートで、ホールエツジの位置ずれ量に
応じた複数のランクにランク分けをする。40は
ランク分けされた被測定物Wを各ランク毎に収納
する収納箱である。41はビデオカメラ31から
の出力信号を処理してホールエツジ位置を判別す
る制御装置である。
The structure of a hole edge position measuring device to which this measurement principle is applied will be explained with reference to FIGS. 4 and 5.
20 is a base; 21, 22, and 23 are intermediate bases placed on the base 20; and on the intermediate base 21 is a center support stand 25 on which a reference center 24 is mounted.
and a headstock 28 bearing a spindle 27 on which a movable center 26 is mounted and capable of rotation and axial movement;
A spindle drive motor 29 is mounted. A spindle advance/retreat drive device is built in the headstock 28. On the intermediate base 22, the object to be measured W
A projector 30 is placed on one side of the intermediate base 23, and a video camera 31 is placed on the other side of the axis. 32 is a hopper for storing the object W to be measured;
3 is a parts feeder that aligns the posture of the object W to be measured and sends it out from the hopper 32; 34 is a conveyance chute; 3
Reference numeral 5 denotes an escape device installed at the tip of the transport chute 34 to separate and deliver the objects to be measured W one by one;
Reference numeral 36 denotes a rotatable carry-in arm that carries the workpiece W delivered from the escape device 35 to both center support positions, 37 a swing drive device that turns the carry-in arm 36, 38 a carry-out chute, and 39 a hole edge position A selection gate that is selectively opened and closed based on measurement data divides the holes into multiple ranks according to the amount of positional deviation of the hole edge. Reference numeral 40 denotes a storage box that stores the ranked objects W to be measured for each rank. 41 is a control device that processes the output signal from the video camera 31 and determines the hole edge position.

この制御装置41の構成を第6図より説明す
る。
The configuration of this control device 41 will be explained with reference to FIG.

50はクロツク発生回路、51は走査回路で、
クロツク発生回路50から発せられるクロツクパ
ルスによりイメージセンサ5の各入光ビツトを検
出するための走査信号を出力する。52はイメー
ジセンサ5から出力されるビデオパルスの増幅
器、53はカウンタで、入光ビツトに対応して出
力されるビデオパルスを計数し、入光ビツト数を
検出する。このカウンタ53は走査回路51から
のスタートパルスにて毎回リセツトされ、その後
与えられる入光ビツトビデオパルスを計数するの
で、走査完了時には各走査毎の入光ビツト数の値
となる。54,57はインターフエース、55は
マイクロコンピユータ、56はメモリ、58は検
測値の表示装置である。走査回路51の各走査終
了信号が与えられる度にカウンタ53の入光ビツ
ト数計数値がコンピユータ55に読込まれる。読
込まれた計数値は第7図に示す流れ図に沿つてコ
ンピユータ55内で処理される。ステツプ(i)、(ii)
で読込まれた計数他はステツプ(iii)でメモリ56の
特定番地に記憶された記憶値と比較され、大きい
方の値をその特定番地に記憶する。被測定物Wの
半回転信号が得られるまでこれを繰り返すと、計
数値の最大値が検出されることになる。ステツプ
(iv)、(v)にて半回転信号が検出されるとかかる特定
番地の記憶値を最大値としてメモリに記憶する。
これらのステツプは繰返し実行され、最大値が4
回記憶されるとステツプ(vi)より(vii)に進み、最大値
の平均値が演算され、平均値は基準値と比較され
偏差に応じて複数のランクにランク分けされる。
ランク分け信号は選別ゲート39に出力され、ゲ
ートの開閉を制御し、検測完了により搬出シユー
ト38に送出される被測定物をランク分けする。
50 is a clock generation circuit, 51 is a scanning circuit,
A clock pulse generated from the clock generation circuit 50 outputs a scanning signal for detecting each bit of light incident on the image sensor 5. Reference numeral 52 denotes an amplifier for video pulses output from the image sensor 5, and 53 a counter, which counts video pulses output in correspondence with incident light bits and detects the number of incident light bits. This counter 53 is reset each time by a start pulse from the scanning circuit 51, and counts the incident light bit video pulses given thereafter, so that when scanning is completed, the value becomes the number of incident light bits for each scan. 54 and 57 are interfaces, 55 is a microcomputer, 56 is a memory, and 58 is a measured value display device. Each time the scan circuit 51 receives each scan end signal, the count value of the number of incident light bits of the counter 53 is read into the computer 55. The read count values are processed within the computer 55 according to the flowchart shown in FIG. Steps (i), (ii)
The count read in step (iii) is compared with the stored value stored at a specific address in the memory 56, and the larger value is stored at the specific address. If this is repeated until a half-rotation signal of the object W to be measured is obtained, the maximum value of the count value will be detected. step
When the half-rotation signal is detected in (iv) and (v), the stored value at the specific address is stored in the memory as the maximum value.
These steps are executed repeatedly until the maximum value is 4.
Once the data have been stored, the process proceeds from step (vi) to step (vii), where the average value of the maximum values is calculated, the average value is compared with the reference value, and the data is ranked into a plurality of ranks according to the deviation.
The ranking signal is output to the sorting gate 39, controls opening and closing of the gate, and ranks the objects to be measured to be sent to the carry-out chute 38 upon completion of the inspection.

次にかかる構成にもとづく計測動作を説明す
る。
Next, a measurement operation based on this configuration will be explained.

ホツパ32内の被測定物Wはパーツフイーダ3
3によつて姿勢が揃えられて搬送シユート34に
供給され、エスケープ装置35にて1個ずつ分離
されて搬入アーム36に受渡される。搬入アーム
36が旋回して第4図2点鎖線に示す状態となる
スピンドル27がが前進し基準センタ24と可動
センタ26にて被測定物Wを両端支持する。搬入
アーム36は旋回復帰して待機する。スピンドル
27が回転されると可動センタ27の接触面との
摩擦力で被測定物Wは回転される。この場合基準
センタ24のセンタ軸線に対する接触点よりも可
動センタ26の接触点の半径位置の方が大きいた
め、摩擦トルクは可動センタ側が大きい。よつて
基準センタ側の接触面では滑りが生じ被測定物W
は回転される。
The object to be measured W in the hopper 32 is the parts feeder 3
3, the materials are aligned in attitude and supplied to the transport chute 34, separated one by one by the escape device 35, and delivered to the carry-in arm 36. The carry-in arm 36 rotates and the spindle 27 reaches the state shown by the two-dot chain line in FIG. 4. The spindle 27 moves forward and supports the object W at both ends with the reference center 24 and the movable center 26. The carry-in arm 36 rotates back and waits. When the spindle 27 is rotated, the object W to be measured is rotated by the frictional force with the contact surface of the movable center 27. In this case, since the radial position of the contact point of the movable center 26 is larger than the contact point of the reference center 24 with respect to the center axis, the friction torque is larger on the movable center side. Therefore, slippage occurs on the contact surface on the reference center side, causing the object to be measured W
is rotated.

被測定物の回転に伴い投光器30から投光され
る光は半回転毎に貫通穴hを通じてビデオカメラ
31に受光され、イメージセンサ5上にホールエ
ツジ像を結像する。イメージセンサに組込まれた
各フオトダイオードの出力信号は高速で走査さ
れ、入光領域に対応した入光ビツト数がカウンタ
で計数され、計数値はコンピユータ55に読込ま
れ、前述の如くデータ処理されランク分け信号を
発する。ランク分けされた選別信号は選択ゲート
39を作動し、所定のゲートを開閉する。ホール
エツジ位置の計測が完了すればスピンドル27は
後退され、被測定物Wは搬出シユート38に落下
し、選択ゲート39を通つて同一ランク毎に選別
され、収納箱40に収納される。スピンドル27
の後退によつて再び搬入アーム36の搬入動作が
開始され、次の被測定物Wのホールエツジ位置の
測定が行われる。このようにして全自動で連続的
にホールエツジ位置の測定、選別が行われる。
Light projected from the light projector 30 as the object to be measured rotates is received by the video camera 31 through the through hole h every half rotation, and forms a Hall-edge image on the image sensor 5. The output signal of each photodiode incorporated in the image sensor is scanned at high speed, the number of incident light bits corresponding to the incident area is counted by a counter, the counted value is read into the computer 55, and the data is processed as described above and ranked. Issue a separation signal. The ranked selection signal operates the selection gate 39 to open or close a predetermined gate. When the measurement of the hole edge position is completed, the spindle 27 is retracted, and the objects to be measured W are dropped into the carry-out chute 38, passed through the selection gate 39, sorted into the same rank, and stored in the storage box 40. spindle 27
When the carry-in arm 36 moves backward, the carry-in operation of the carry-in arm 36 is started again, and the hole edge position of the next object W to be measured is measured. In this way, hole edge positions are continuously measured and sorted in a fully automatic manner.

上記実施例によれば、イメージセンサを走査し
て入光ビツト数を検出する手段として、ビデオパ
ルスの増幅器52から出力される入光ビツトビデ
オパルスをカウンタ53にて計数しているが、イ
メージセンサ5の全ビツト数は一定であるため、
非入光ビツト数を検出して(全ビツト数)―(非
入光ビツト数)を演算すれば入光ビツト数を求め
ることもできる。
According to the above embodiment, as a means for scanning the image sensor and detecting the number of incident light bits, the incident light bit video pulses output from the video pulse amplifier 52 are counted by the counter 53. Since the total number of bits of 5 is constant,
The number of light incident bits can also be determined by detecting the number of light incident bits and calculating (total number of bits) - (light non incident bit number).

かかる非入光ビツト数の検出は、第8図に示す
ように走査開始信号によつてリセツトされ最初の
入光ビツトビデオパルスにてセツトされるフリツ
プフロツプ60のリセツト側出力によつて制御さ
れるゲート61を介してクロツクパルス発生回路
50より与えられるクロツクパルスをカウンタ5
3aにて計数すれば良い。この場合のカウンタ5
3aは加算カウンタで走査開始信号によりリセツ
トされるようになつている。またこのカウンタ5
3aを減算カウンタとして走査開始信号によつて
イメージセンサの全ビツト数に相当する初期値を
プリセツトし前記ゲート61から与えられるクロ
ツクパルスで減算すれば入光ビツト数を検出する
ことができ、入光ビツト数検出手段としてはいず
れの構成であつても有効である。
Detection of the number of non-light-incident bits is carried out by a gate controlled by the reset side output of the flip-flop 60, which is reset by the scan start signal and set by the first light-incident bit video pulse, as shown in FIG. The clock pulses supplied from the clock pulse generation circuit 50 via the counter 5
It is sufficient to count at 3a. Counter 5 in this case
Reference numeral 3a denotes an addition counter which is reset by a scan start signal. Also this counter 5
By using 3a as a subtraction counter, the number of incident light bits can be detected by presetting an initial value corresponding to the total number of bits of the image sensor using the scanning start signal and subtracting it with the clock pulse given from the gate 61. Any configuration is effective as a number detection means.

本発明によれば、被測定物の軸線をはさんで一
方の側に投光器を、他方の側に貫通穴を通じて投
光器側のホールエツジをイメージセンサ上に結像
するビデオカメラを配置し、イメージセンサを高
速で走査し入光ビツト数を検出するようにしたの
で、被測定物を連続回転させたままで基準面側の
ホールエツジの位置を正確に測定することができ
る。また貫通穴の透過光を受光しホールエツジ像
をイメージセンサ上に結像するようにしたので、
ホールエツジ像の明暗コントラストを強くするこ
とができ、入光ビツトと非入光ビツトとの境界に
おける信号レベル変化が大きくとれるため、入光
ビツト位置の区別が明確にでき測定誤差の介入を
防止し精度を上げることができる効果を有する。
According to the present invention, the projector is placed on one side of the object to be measured, and the video camera that images the hole edge of the projector on the image sensor through a through hole is arranged on the other side. Since the number of incident light bits is detected by scanning at high speed, the position of the hole edge on the reference surface side can be accurately measured while the object to be measured is continuously rotated. In addition, since the light transmitted through the through hole is received and a hole edge image is formed on the image sensor,
The brightness contrast of the hole edge image can be strengthened, and the signal level change can be large at the boundary between the light-incident bit and the non-light-incident bit, so the light-incident bit position can be clearly distinguished, preventing measurement errors from intervening, and improving accuracy. It has the effect of increasing

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明の実施例を示すもので、第1図は
被測定物の一形状例を示す図、第2図はホールエ
ツジ測定原理図、第3図はホールエツジ像とイメ
ージセンサの関係を示す図、第4図は測定装置全
体の正面図、第5図はその左側面図、第6図は制
御装置のブロツク線図、第7図は計測データ処理
の流れ図、第8図は入光ビツト数検出手段の他の
実施例を示す図である。 3,30……投光器、4,31……ビデオカメ
ラ、5……イメージセンサ、24……基準セン
タ、26……可動センタ、28……主軸台、51
……走査回路、53……カウンタ、55……マイ
クロコンピユータ、56……メモリ。
The drawings show embodiments of the present invention; FIG. 1 shows an example of the shape of an object to be measured, FIG. 2 shows the principle of Hall Edge measurement, and FIG. 3 shows the relationship between the Hall Edge image and the image sensor. , Figure 4 is a front view of the entire measuring device, Figure 5 is its left side view, Figure 6 is a block diagram of the control device, Figure 7 is a flowchart of measurement data processing, and Figure 8 is the number of incident light bits. It is a figure which shows another Example of a detection means. 3, 30... Floodlight, 4, 31... Video camera, 5... Image sensor, 24... Reference center, 26... Movable center, 28... Headstock, 51
... Scanning circuit, 53 ... Counter, 55 ... Microcomputer, 56 ... Memory.

Claims (1)

【特許請求の範囲】[Claims] 1 被測定物の軸方向基準面に対し軸線と直交す
る貫通穴のホールエツジの位置を回転中に測定す
る測定装置であつて、前記被測定物の基準面を一
定位置に位置決めしかつ前記軸線を中心にして回
転可能に支持する被測定物支持装置と、この被測
定物支持装置にて支持された被測定物を回転せし
める駆動装置と、前記被測定物の軸線をはさんで
一方の側に配置され光を投光する投光器と、軸線
をはさんで他方の側に配置され前記貫通穴を通じ
て投光器側のホールエツジに焦点を合せたレンズ
によりイメージセンサ上にホールエツジの明暗像
を結像せしめるビデオカメラと、前記イメージセ
ンサを高速で繰返し走査して入光ビツト数を検出
する入光ビツト数検出手段と、少くとも被測定物
が半回転する間にこの入光ビツト数検出手段によ
り検出された入光ビツト数の最大値を基準値と比
較して前記ホールエツジの基準面に対する位置を
判定する位置判定手段とを備えたホールエツジの
位置測定装置。
1 A measuring device that measures the position of a hole edge of a through hole perpendicular to an axis with respect to an axial reference plane of a measured object while rotating, the reference plane of the measured object being positioned at a fixed position and the axis line A device for supporting an object to be measured rotatably supported at the center, a drive device for rotating the object to be measured supported by the device supporting the object to be measured, and a drive device for rotating the object to be measured supported by the object supporting device; A video camera that forms a bright and dark image of the hole edge on an image sensor using a projector arranged to project light and a lens arranged on the other side across the axis and focused on the hole edge on the projector side through the through hole. and an incident light bit number detection means for detecting the number of incident light bits by repeatedly scanning the image sensor at high speed; 1. A hole edge position measuring device comprising: position determination means for comparing the maximum value of the number of optical bits with a reference value to determine the position of the hole edge with respect to a reference plane.
JP2457880A 1980-02-28 1980-02-28 Measuring device for position of hole edge Granted JPS56120901A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2457880A JPS56120901A (en) 1980-02-28 1980-02-28 Measuring device for position of hole edge

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2457880A JPS56120901A (en) 1980-02-28 1980-02-28 Measuring device for position of hole edge

Publications (2)

Publication Number Publication Date
JPS56120901A JPS56120901A (en) 1981-09-22
JPS628123B2 true JPS628123B2 (en) 1987-02-20

Family

ID=12142041

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2457880A Granted JPS56120901A (en) 1980-02-28 1980-02-28 Measuring device for position of hole edge

Country Status (1)

Country Link
JP (1) JPS56120901A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59155703A (en) * 1983-02-25 1984-09-04 Nisshin Steel Co Ltd Gap position detection device using transmitted light
JP4812624B2 (en) 2004-06-23 2011-11-09 株式会社ブリヂストン Tire wear detection system and pneumatic tire

Also Published As

Publication number Publication date
JPS56120901A (en) 1981-09-22

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