JPS6281715A - Semiconductor manufacturing equipment - Google Patents

Semiconductor manufacturing equipment

Info

Publication number
JPS6281715A
JPS6281715A JP60222953A JP22295385A JPS6281715A JP S6281715 A JPS6281715 A JP S6281715A JP 60222953 A JP60222953 A JP 60222953A JP 22295385 A JP22295385 A JP 22295385A JP S6281715 A JPS6281715 A JP S6281715A
Authority
JP
Japan
Prior art keywords
semiconductor substrate
chemical agent
nozzle
semiconductor
edge plane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60222953A
Other languages
Japanese (ja)
Other versions
JPH0350410B2 (en
Inventor
Kazutaka Ikeyama
池山 一孝
Takashige Nagamatsu
永松 隆重
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Kyushu Ltd
Original Assignee
NEC Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Kyushu Ltd filed Critical NEC Kyushu Ltd
Priority to JP60222953A priority Critical patent/JPS6281715A/en
Publication of JPS6281715A publication Critical patent/JPS6281715A/en
Publication of JPH0350410B2 publication Critical patent/JPH0350410B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Coating Apparatus (AREA)
  • Weting (AREA)

Abstract

PURPOSE:To improve the expanding condition and fitting condition of a solvent over a semiconductor substrate by forming an area of the edge plane of a nozzle as a circular area which is nearly the same as of a semiconductor substrate to be processed and providing plural solvent ejection holes on the edge plane. CONSTITUTION:The titled equipment is composed of a base 3 for vacuum- attracting a semiconductor it by a pulse motor 2, a lower lid 5 having an outlet 4 and an upper lid 8 having a nozzle 8 for dropping a chemical agent 6. An area of the edge plane 7a of the nozzle 7 for dripping a chemical agent 6 is a circular area which is nearly the same as of the semiconductor substrate 1. The edge plane 7a has plural solvent ejection holes 9, thereby dripping and expanding the chemical agent 6 over the semiconductor substrate 1 uniformly. Furthermore, after dripping the chemical agent 6, the base 3 carrying the semiconductor substrate 1 is rotated 10 through the pulse motor 2 by utilizing the surface tension of the chemical agent 6 without moving the position of the nozzle 7 and with the chemical agent 6 kept on the semiconductor substrate 1. As a result, the fall of the chemical agent 6 from the semiconductor substrate 1 is reduced and a pattern forming accuracy is improved.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体製造装置に関し、特に半導体基板の表面
に種々の薬剤を滴下あるいは噴霧して、半導体基板の表
面に所望の・ぐターンを形成するのに使用される半導体
製造装置に関するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to semiconductor manufacturing equipment, and in particular, to forming desired patterns on the surface of a semiconductor substrate by dropping or spraying various chemicals onto the surface of the semiconductor substrate. The present invention relates to semiconductor manufacturing equipment used for manufacturing.

〔従来の技術〕[Conventional technology]

従来、半導体基板表面に所望の感光性樹脂・ぐターンを
形成する場合、半導体基板表面に感光性樹脂を薄く塗り
(塗布工程)、その後フォトマスク・ぐターンを介して
焼き付は転写を行ない(百合・露光工程)、この焼き付
は転写によって分離された部分の感光性樹脂膜を分離し
て(現像工程)所望の感光性樹脂・母ターンを得る訳で
あるが、この現像工程において半導体基板表面に各種溶
剤を滴下あるいは噴霧するノズル7は第4,5図に示す
ように装置の真上あるいは側面方向からの管を通して半
導体基板1の表面へと薬剤6を滴下又は噴霧する構造と
なっている。2は、?ルスモーター、3は基体、4は排
液口、5は下蓋、8は上蓋である。
Conventionally, when forming a desired photosensitive resin pattern on the surface of a semiconductor substrate, a thin layer of photosensitive resin is applied to the surface of the semiconductor substrate (coating process), and then printing is performed using a photomask or pattern. This printing separates the photosensitive resin film in the areas separated by transfer (development process) to obtain the desired photosensitive resin/mother turn, but in this development process, the semiconductor substrate The nozzle 7 for dropping or spraying various solvents onto the surface has a structure that drops or sprays the chemical 6 onto the surface of the semiconductor substrate 1 through a pipe from directly above or from the side of the device, as shown in FIGS. There is. 2 is? 3 is a base, 4 is a drain port, 5 is a lower lid, and 8 is an upper lid.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上述した従来の現像処理工程における装置のノズル形状
では、半導体基板表面への溶剤の載り具合が兜蟹ではな
く、噴霧圧、滴下圧の変動により半導体基板表面の溶剤
吸が少なかったり、又、半導体基板の大型化により半導
体基板表面の周辺部へ十分に溶剤が廻り込まなかったり
して、部分的に感光性樹脂膜の残りを誘発させ、半導体
製造装置に於ける歩留低下をもたらしていた。又、半導
体基板の大型化は今後更に進むと思われ、この問題も深
刻化して来ている。溶剤滴下量あるいは噴出量を増やせ
ば、この問題も低減はされるが、コスト面から適切な処
置ではない。
With the nozzle shape of the equipment used in the conventional development processing process described above, the amount of solvent applied to the surface of the semiconductor substrate is not uniform, and due to fluctuations in the spray pressure and dropping pressure, the absorption of the solvent on the surface of the semiconductor substrate is small. As the size of the substrate increases, the solvent does not penetrate sufficiently to the periphery of the surface of the semiconductor substrate, causing the photosensitive resin film to remain partially, resulting in a decrease in yield in semiconductor manufacturing equipment. Furthermore, it is expected that the size of semiconductor substrates will further increase in the future, and this problem will become more serious. Although this problem can be reduced by increasing the amount of solvent dripped or spouted, this is not an appropriate measure from a cost standpoint.

本発明の目的は、半導体基板表面への溶剤の拡がり状態
、溶剤の載り具合を良くした現像処理装置を提供するこ
とにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a development processing apparatus that improves the spread and coverage of a solvent on the surface of a semiconductor substrate.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は半導体基板を真空吸着し、これを回転させる基
体と、半導体基板の表面に種々の溶剤を滴下あるいは噴
霧するノズルとを有する半導体製造装置において、ノズ
ルの端面の面積を処理する半導体基板と同程度の円形面
積とし、該端面に複数の溶剤吸き出し孔を設けたことを
特徴とする半導体製造装置である。
The present invention relates to semiconductor manufacturing equipment that includes a substrate that vacuum-chucks a semiconductor substrate and rotates it, and a nozzle that drops or sprays various solvents onto the surface of the semiconductor substrate. This semiconductor manufacturing apparatus is characterized in that the circular areas are approximately the same and that a plurality of solvent suction holes are provided on the end face.

〔実施例〕〔Example〕

次;・ζ本発明の一実施例につき図面を用いて説明する
。
Next;・ζ An embodiment of the present invention will be described with reference to the drawings.

第1図において、本発明の装置は搬送部−7)1tら送
られた半導体基板1を真空吸着してこれをパルスモータ
−2にて回転させる基体3と、排出口4を有する下蓋5
と、薬剤6を滴下するノズル7を有する上蓋8とから構
成され、第2図に示すように薬剤6を滴下するノズル7
の端面7aの面積は半導体基板1とほぼ同程度の大きさ
の円形面積となっており、端面7aに複数の溶剤吹き出
し孔9を設けたものである。
In FIG. 1, the apparatus of the present invention includes a base body 3 that vacuum-chucks a semiconductor substrate 1 sent from a transport section 7) and rotates it by a pulse motor 2, and a lower lid 5 having an ejection port 4.
and an upper lid 8 having a nozzle 7 for dropping the medicine 6, as shown in FIG.
The end face 7a has a circular area approximately the same size as the semiconductor substrate 1, and a plurality of solvent blowing holes 9 are provided in the end face 7a.

以上のように薬剤6を滴下するノズル7が処理する半導
体基板1と同等の大きさを持ち、溶剤吸き出し孔9が無
数にある為、半導体基板1上にムラなく薬剤6を滴下し
広げることができる。更に、第3図に示すように薬剤6
を滴下させた後、ノズル7の位置を動さず、薬剤6を半
導体基板1へと載せたまま薬剤60表面張力を利用し、
半導体基板1を載せた基体3をパルスモータ−2を介し
て回転運動10をさせることによシ、半導体基板1上に
載った薬剤6の落下も少なくなり、ノ9ターン形成精度
が向上し、半導体装置の歩留向上にも貢献できる。
As described above, since the nozzle 7 that drops the chemical 6 has the same size as the semiconductor substrate 1 to be processed and has countless solvent suction holes 9, the chemical 6 is evenly dropped and spread over the semiconductor substrate 1. be able to. Furthermore, as shown in FIG.
After dropping the nozzle 7, the chemical 60 is placed on the semiconductor substrate 1 without moving, and the surface tension of the chemical 60 is utilized.
By rotating the base 3 on which the semiconductor substrate 1 is placed through the pulse motor 2, the drop of the chemical 6 placed on the semiconductor substrate 1 is reduced, and the accuracy of turn formation is improved. It can also contribute to improving the yield of semiconductor devices.

尚、上述の実施例においては、半導体装置製造工程の現
像処理工程に例をあげて説明したが、本発明は半導体基
板上へ薬剤を滴下し広げる工程、たとえば塗布工程及び
エツチング処理工程における半導体製造装置にも同様に
利用できるのは言う捷でもない。
In the above-mentioned embodiments, the development process in the semiconductor device manufacturing process was used as an example. It is no wonder that it can also be used for equipment as well.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明によれば、半導体基板への溶
剤の拡がり状態、溶剤の載り具合を良くできる効果を有
するものである。
As explained above, according to the present invention, it is possible to improve the spread state of the solvent on the semiconductor substrate and the state in which the solvent is placed on the semiconductor substrate.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示す半導体製造装置の断面
図、第2図は本発明におけるノズルを示す斜視図、第3
図は本発明における動作を説明する図、第4図、第5図
は従来装置を示す断面図である。 1・・半導体基板、2・・・・!ルスモータ、3・・・
基体、4、・・・排液口、5・・・下蓋、6・・・薬剤
、7・・・ノズル、7a・・・端面、8・・・上蓋、9
・・・浴剤吹き出し孔。 第5図
FIG. 1 is a sectional view of a semiconductor manufacturing apparatus showing one embodiment of the present invention, FIG. 2 is a perspective view showing a nozzle in the present invention, and FIG.
The figure is a diagram for explaining the operation of the present invention, and FIGS. 4 and 5 are cross-sectional views showing a conventional device. 1...Semiconductor substrate, 2...! Ruth motor, 3...
Base, 4... Drain port, 5... Lower lid, 6... Drug, 7... Nozzle, 7a... End surface, 8... Upper lid, 9
...Bath salt outlet. Figure 5

Claims (1)

【特許請求の範囲】[Claims] (1)半導体基板を真空吸着し、これを回転させる基体
と、半導体基板の表面に種々の薬剤を滴下あるいは噴霧
するノズルとを有する半導体製造装置において、前記ノ
ズルの端面の面積を処理する半導体基板と同程度の円形
面積とし、該端面に複数の溶剤吸き出し孔を設けたこと
を特徴とする半導体製造装置。
(1) In a semiconductor manufacturing device that has a base body that vacuum-chucks a semiconductor substrate and rotates it, and a nozzle that drops or sprays various chemicals onto the surface of the semiconductor substrate, the semiconductor substrate that processes the area of the end face of the nozzle. What is claimed is: 1. A semiconductor manufacturing device characterized in that the end face is provided with a plurality of solvent suction holes.
JP60222953A 1985-10-07 1985-10-07 Semiconductor manufacturing equipment Granted JPS6281715A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60222953A JPS6281715A (en) 1985-10-07 1985-10-07 Semiconductor manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60222953A JPS6281715A (en) 1985-10-07 1985-10-07 Semiconductor manufacturing equipment

Publications (2)

Publication Number Publication Date
JPS6281715A true JPS6281715A (en) 1987-04-15
JPH0350410B2 JPH0350410B2 (en) 1991-08-01

Family

ID=16790462

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60222953A Granted JPS6281715A (en) 1985-10-07 1985-10-07 Semiconductor manufacturing equipment

Country Status (1)

Country Link
JP (1) JPS6281715A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63269533A (en) * 1987-04-27 1988-11-07 Nec Corp Developing device of semiconductor substrate
US6938629B2 (en) * 2002-11-13 2005-09-06 Taiwan Semiconductor Manufacturing Co., Ltd Rinsing lid for wet bench
WO2011145440A1 (en) * 2010-05-19 2011-11-24 東京エレクトロン株式会社 Method for supplying treatment liquid, and computer storage medium
WO2011145439A1 (en) * 2010-05-19 2011-11-24 東京エレクトロン株式会社 Substrate etching method and computer recording medium

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5252568A (en) * 1975-10-27 1977-04-27 Nec Corp Production of semiconductor element
JPS5633834A (en) * 1979-08-29 1981-04-04 Toshiba Corp Manufacturing device of semiconductor
JPS60198818A (en) * 1984-03-23 1985-10-08 Nec Corp Photoresist developing device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5252568A (en) * 1975-10-27 1977-04-27 Nec Corp Production of semiconductor element
JPS5633834A (en) * 1979-08-29 1981-04-04 Toshiba Corp Manufacturing device of semiconductor
JPS60198818A (en) * 1984-03-23 1985-10-08 Nec Corp Photoresist developing device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63269533A (en) * 1987-04-27 1988-11-07 Nec Corp Developing device of semiconductor substrate
US6938629B2 (en) * 2002-11-13 2005-09-06 Taiwan Semiconductor Manufacturing Co., Ltd Rinsing lid for wet bench
WO2011145440A1 (en) * 2010-05-19 2011-11-24 東京エレクトロン株式会社 Method for supplying treatment liquid, and computer storage medium
WO2011145439A1 (en) * 2010-05-19 2011-11-24 東京エレクトロン株式会社 Substrate etching method and computer recording medium

Also Published As

Publication number Publication date
JPH0350410B2 (en) 1991-08-01

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Legal Events

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