JPS6295409A - External appearance inspecting instrument - Google Patents
External appearance inspecting instrumentInfo
- Publication number
- JPS6295409A JPS6295409A JP23540885A JP23540885A JPS6295409A JP S6295409 A JPS6295409 A JP S6295409A JP 23540885 A JP23540885 A JP 23540885A JP 23540885 A JP23540885 A JP 23540885A JP S6295409 A JPS6295409 A JP S6295409A
- Authority
- JP
- Japan
- Prior art keywords
- appearance
- rotary table
- inspected
- external appearance
- turntable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
【発明の詳細な説明】
[発明の技術分野]
この発明は、搬送ガイドによって搬送されてくる例えば
IC等の電子部品の外観を検査する外観検査装置に関す
る。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an appearance inspection apparatus for inspecting the appearance of electronic components, such as ICs, that are conveyed by a conveyance guide.
[発明の技術的背景およびその問題点]搬送ガイドによ
って製造ラインから順次搬送されてくるIC等の電子部
品は従来第5図に示すように搬送ガイド23の両側に設
けられているITVカメラ25.27等により外観を搬
像され、この躍像した外観情報を例えばコンビューク笠
により正常なものと比較し、その外観検査を行なってい
る。[Technical Background of the Invention and Problems Therewith] Electronic components such as ICs that are sequentially transported from a production line by a transport guide are conventionally transported by ITV cameras 25. 27 or the like, and this improved appearance information is compared with a normal one using, for example, a Conbuque hat, and the appearance is inspected.
ところで、このような従来の電子部品の外観検査におい
ては、搬送ガイド23の両側にそれぞれITVカメラを
必要とするため、高画であるとともに、搬送ガイド23
に沿った電子部品21の両側面の外観のみしか検査でき
ず、電子部品21の搬送ガイド23に直角な方向の前1
9面の外観は検査することができないという問題がある
。By the way, in such conventional visual inspection of electronic components, since ITV cameras are required on both sides of the transport guide 23, the images are high and the transport guide 23 is
It is possible to inspect only the appearance of both sides of the electronic component 21 along
There is a problem in that the appearance of the nine surfaces cannot be inspected.
[発明の目的]
この発明は、上記に鑑みてなされたもので、その目的と
するところは、経済的かつ簡単に被検査体の全外観を検
査することができる外観検査装置を提供することにある
。[Object of the Invention] This invention has been made in view of the above, and its purpose is to provide an appearance inspection device that can economically and easily inspect the entire appearance of an object to be inspected. be.
[発明の概要]
上記目的を達成するため、搬送ガイドによって搬送され
てくる被検査体の外観を検査する外観検査装置であって
、この発明は、第1図に示すように、搬送ガイドの途中
に設けられた回転台1と、該回転台1に対向して設けら
れた少なくとも1台のl+1@手段3と、前記回転台1
上に搬送されてきた被検査体の外観を前記画像手段3に
より所望の方向から搬像し1qるように回転台1を回転
させる回転駆動手段5と、前記顕像手段3″c囮像した
被検査体の外観情報から被検査体の外観の良否を判定す
る判定手段7とを有することを要旨とする。[Summary of the Invention] In order to achieve the above object, the present invention provides an appearance inspection apparatus for inspecting the appearance of an object to be inspected being transported by a transport guide, and as shown in FIG. a turntable 1 provided at
a rotary drive means 5 for rotating the rotary table 1 so that the external appearance of the object to be inspected that has been conveyed upward is conveyed from a desired direction by the image means 3; The gist of the present invention is to include a determining means 7 for determining whether the appearance of the object to be inspected is good or bad based on the appearance information of the object to be inspected.
[発明の実施例] 以下、図面を用いてこの発明の詳細な説明する。[Embodiments of the invention] Hereinafter, the present invention will be explained in detail using the drawings.
第2図はこの発明の一実施例を示すもので、この実施例
においては搬送ガイド23によって矢印31で示づ方向
から搬送されてくるIC等の電子部品21は、搬送ガイ
ド23の途中に設けられている回転テーブル33上で停
止して自在に回転し1qるようになっている。この回転
テーブル33が設けられている所には、回転テーブル3
3に対向して撮像手段である[TVカメラ35が配設さ
れ、回転テーブル33上で回転する電子部品21の外観
を画像し1!?るようになっている。図では電子部品2
1は搬送ガイド23の搬送方向に対して90°回転して
、その後部の外観をITVカメラ35が画像している場
合を示している。また、このように電子部品21が90
°回転した方向には、すなわら搬送ガイド23の搬送方
向に対して直角な方向には別の搬送ガイド29が設けら
れているが、電子部品21が外観検査の結果不良品と判
定された場合にはこの搬送ガイド29に治って矢印37
で示す方向に搬送され、良品と区別されるようになって
いる。回転テーブル33における外観検査の結果、良品
となった電子部品21は更に+m送ガイド23に沿って
矢印39で示す方向に搬送されるようになっている。FIG. 2 shows an embodiment of the present invention. In this embodiment, an electronic component 21 such as an IC, which is transported from the direction indicated by an arrow 31 by a transport guide 23, is installed in the middle of the transport guide 23. It is designed to stop on a rotary table 33 which is mounted on a rotary table 33 and freely rotate 1q. Where this rotary table 33 is installed, the rotary table 3
A TV camera 35, which is an imaging means, is disposed opposite to 1! ? It has become so. In the diagram, electronic component 2
1 shows a case where the conveyance guide 23 is rotated by 90 degrees with respect to the conveyance direction, and the ITV camera 35 images the appearance of the rear thereof. Moreover, in this way, the electronic component 21 is
°Another transport guide 29 is provided in the rotated direction, that is, in a direction perpendicular to the transport direction of the transport guide 23, but the electronic component 21 is determined to be defective as a result of the visual inspection. In this case, this transport guide 29 is used as shown by the arrow 37.
The products are transported in the direction shown by and are distinguished from non-defective products. Electronic components 21 that are found to be non-defective as a result of the visual inspection on the rotary table 33 are further transported along the +m transport guide 23 in the direction indicated by an arrow 39 .
第3図は第2図に示す外観検査装置の制御部の構成図で
ある。ITVカメラ35で搬像された電子部品21の外
観情報はインターフェース回路41を介してA/Dコン
バータ43でディジタル信号に変換され、パターンメモ
リ45に記憶され、更に二値化回路47を介して画像処
理プロセッサ4つで処理されている。また、画像処理プ
ロセッサ49は機構制御用プロセッサ51に接続され、
この機構制御用プロセッサ51は更に回転テーブル駆動
部53に接続されている。この回転テーブル駆動部53
は面記回転テーブル33を回転制御するためのちのであ
る。FIG. 3 is a configuration diagram of a control section of the visual inspection apparatus shown in FIG. 2. Appearance information of the electronic component 21 imaged by the ITV camera 35 is converted into a digital signal by the A/D converter 43 via the interface circuit 41, stored in the pattern memory 45, and then converted into an image via the binarization circuit 47. It is processed by four processors. Further, the image processing processor 49 is connected to the mechanism control processor 51,
This mechanism control processor 51 is further connected to a rotary table drive section 53. This rotary table drive section 53
is for controlling the rotation of the surface rotary table 33.
以上のように構成される外観検査装置においては搬送ガ
イド23によって回転テーブル33の上を搬送されてき
た電子部品21を回転テーブル駆動部53で例えば90
°ずっ順次に回転してITVカメラ35により電子部品
21の全外観を画像し、この搬像した外観情報を画像処
理プロセッサ4つで処理して電子部品21の外観の良否
を判定するものであるが、その詳細な作用を次に第4図
のフローヂャートを参照して説明する。In the visual inspection apparatus configured as described above, the electronic component 21 transported on the rotary table 33 by the transport guide 23 is moved by the rotary table drive unit 53 to a
The ITV camera 35 images the entire external appearance of the electronic component 21 by rotating in sequence, and the imaged external appearance information is processed by four image processing processors to determine whether the external appearance of the electronic component 21 is good or bad. However, its detailed operation will be explained next with reference to the flowchart of FIG.
まず、搬送ガイド23に沿って矢印31の方向から搬送
されたきた電子部品21は回転テーブル33の上で停止
させられ、rTVカメラ35によって第1の側面の外観
の画像が搬像されて入力される(ステップ110)。入
力された第1の側面の外観情報は画像処理プロセッサ4
つにおいて良否判定処理が行なわれる(ステップ120
)。First, the electronic component 21 that has been conveyed from the direction of the arrow 31 along the conveyance guide 23 is stopped on the rotary table 33, and an image of the external appearance of the first side is conveyed and inputted by the rTV camera 35. (step 110). The input appearance information of the first side is sent to the image processing processor 4.
In step 120, a pass/fail judgment process is performed.
).
良否判定処理の結果、不良の場合には電子部品21は第
2図に示すように90’回転させられて不良品用の搬送
ガイド29によって矢印37で示す方向に良品と区別さ
れて搬出される(ステップ130)。If the result of the pass/fail judgment process is that the electronic component 21 is defective, the electronic component 21 is rotated 90' as shown in FIG. (Step 130).
第1の側面の外観検査の結果、該側面が■常の場合には
、次のステップ140において4つの側面の外観検査が
完了したか否かがチェックされる。If the result of the visual inspection of the first side surface is that the side surface is normal, then in the next step 140 it is checked whether the visual inspection of the four side surfaces has been completed.
すなわち、電子部品21には第1乃至第4の4つの側面
があるので、これらのすべての側面の検査が完了したか
をチェックしている。4つの…り面の検査が完了してい
ない場合には、回転テーブル33を90°回転して次の
側面の両像をITVカメラ35で撮像して入ツノする(
ステップ150,160>。そして、このように入力し
た別の側面の画像情報について同様にステップ120に
おいて良否判定処理を行なう。以下、同様にして電子部
品21の4つのすべての側面についての外観検査を行な
うのである。That is, since the electronic component 21 has four sides, first to fourth, it is checked whether inspection of all these sides has been completed. If the inspection of the four side surfaces has not been completed, the rotary table 33 is rotated 90 degrees and both images of the next side surface are captured by the ITV camera 35 and the inspection is carried out.
Steps 150, 160>. Then, in step 120, the image information of the other side inputted in this way is similarly subjected to the quality determination process. Thereafter, all four sides of the electronic component 21 are visually inspected in the same manner.
なお、上記実施例においては、電子部品21、特にIC
の外観検査を行なう場合について説明したが、これに限
定されるものでない。また、側面の外観検査について説
明したが、回転テーブル33を平面的でなく、更に別の
方向に回転させたりすることにより上下面等の外ih
ら検査できるものである。また、不良品m送用のガイド
を不良検査項目1Gに複数設けてもよい。Note that in the above embodiment, the electronic component 21, especially the IC
Although the case where the external appearance inspection is performed has been described, the present invention is not limited to this. In addition, although the external appearance inspection of the side surface has been explained, by rotating the rotary table 33 not in a plane but in another direction, the outer surface inspection of the upper and lower surfaces, etc.
It can be inspected from Further, a plurality of guides for sending defective products m may be provided in the defective inspection item 1G.
[発明の効果]
以上説明したように、この発明によれば、被検査体は回
転台上で回転駆動手段により回転させられるようになっ
ているので、1台の1層像手段でも所望の方向からの外
観、すなわち必要により全外観を簡単に検査することが
できるため、従来のように複数のITVカメラ等を必要
とせず、極めて経済的であり、また外観検査の結果、不
良品を検出した場合には回転台により被検査体を良品と
区分した方向に搬送することができる。[Effects of the Invention] As explained above, according to the present invention, the object to be inspected is rotated by the rotary drive means on the rotary table, so even one single-layer imaging means can move the object in the desired direction. Since the entire appearance can be easily inspected if necessary, there is no need for multiple ITV cameras as in the past, making it extremely economical. In some cases, the object to be inspected can be transported by a rotary table in the direction that separates it from non-defective items.
第1図はこの発明のクレーム対応図、第2図はこの発明
の一実施例を示す外観検査装置の部分構成を示す斜視図
、第3図は第2図の外観検査装置の制御部のブロック図
、第4図は第1図の外観検査装置の作用を示すフローチ
ャート、第5図は従来の外観検査装置の構成図である。
1・・・回転台、3・・・擾象手段、5・・・回転駆動
手段、7・・・判定手段。
第1図
第4図FIG. 1 is a diagram corresponding to the claims of the present invention, FIG. 2 is a perspective view showing a partial configuration of a visual inspection device showing an embodiment of the present invention, and FIG. 3 is a block diagram of the control section of the visual inspection device shown in FIG. 4 is a flowchart showing the operation of the visual inspection device shown in FIG. 1, and FIG. 5 is a block diagram of a conventional visual inspection device. DESCRIPTION OF SYMBOLS 1... Turntable, 3... Imager means, 5... Rotation drive means, 7... Judgment means. Figure 1 Figure 4
Claims (1)
査する外観検査装置であって、搬送ガイドの途中に設け
られた回転台と、該回転台に対向して設けられた少なく
とも1台の撮像手段と、前記回転台上に搬送されてきた
被検査体の外観を前記撮像手段により所望の方向から撮
像し得るように回転台を回転させる回転駆動手段と、前
記撮像手段で撮像した被検査体の外観情報から被検査体
の外観の良否を判定する判定手段とを有することを特徴
とする外観検査装置。An appearance inspection apparatus for inspecting the appearance of an object to be inspected that is transported by a transport guide, the apparatus comprising: a rotary table provided in the middle of the transport guide; and at least one imaging means provided opposite the rotary table. a rotary drive means for rotating the rotary table so that the appearance of the object to be inspected that has been transported onto the rotary table can be imaged from a desired direction by the image pickup means; 1. A visual inspection apparatus comprising: a determining means for determining whether the external appearance of an object to be inspected is good or bad based on external appearance information.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23540885A JPS6295409A (en) | 1985-10-23 | 1985-10-23 | External appearance inspecting instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23540885A JPS6295409A (en) | 1985-10-23 | 1985-10-23 | External appearance inspecting instrument |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6295409A true JPS6295409A (en) | 1987-05-01 |
Family
ID=16985650
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP23540885A Pending JPS6295409A (en) | 1985-10-23 | 1985-10-23 | External appearance inspecting instrument |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6295409A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0298614A (en) * | 1988-10-04 | 1990-04-11 | Kokusai Syst Sci Kk | Pin photographing method in case of pin bend inspection for fp type semiconductor |
-
1985
- 1985-10-23 JP JP23540885A patent/JPS6295409A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0298614A (en) * | 1988-10-04 | 1990-04-11 | Kokusai Syst Sci Kk | Pin photographing method in case of pin bend inspection for fp type semiconductor |
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