JPS63124591A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS63124591A JPS63124591A JP61269649A JP26964986A JPS63124591A JP S63124591 A JPS63124591 A JP S63124591A JP 61269649 A JP61269649 A JP 61269649A JP 26964986 A JP26964986 A JP 26964986A JP S63124591 A JPS63124591 A JP S63124591A
- Authority
- JP
- Japan
- Prior art keywords
- laser
- quantum
- active layer
- layer
- photodetector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/026—Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers
- H01S5/0262—Photo-diodes, e.g. transceiver devices, bidirectional devices
- H01S5/0264—Photo-diodes, e.g. transceiver devices, bidirectional devices for monitoring the laser-output
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Semiconductor Lasers (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、モノリシックに集積化された半導体レーザと
受光器に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a monolithically integrated semiconductor laser and photoreceiver.
モニタ付半導体レーザをモノリシックに集積すルコトは
、素子のコンパクト化のみ々らず、製造過程を簡略化す
る上で重要なテーマである。従来この様な素子について
、昭和58年度電子通信学会・半導体・材料部門全国大
会 83−6pp−420−421において論じられて
いる。Monolithically integrating a semiconductor laser with a monitor is an important theme not only for making the device more compact but also for simplifying the manufacturing process. Conventionally, such elements have been discussed at the 1983 National Conference of the Semiconductor and Materials Division of the Institute of Electronics and Communication Engineers, pp. 420-421, 83-6.
上記従来技術におけるレーザと受光器の構造は。 The structure of the laser and photodetector in the above conventional technology is as follows.
素子長以外は同一の構造をしており、バイアス電圧のみ
逆に印加している。第1図はその模式図である。GaA
s /GaAtAs系レーザで説明する。They have the same structure except for the element length, and only the bias voltage is applied in the opposite way. FIG. 1 is a schematic diagram thereof. GaA
This will be explained using a s/GaAtAs laser.
レーザ活性層10をはさんでp−GaAtAsクラッド
層4.n−GaAtASクラッド層2によりダブルへテ
ロ構造が形成されている。1はn型基板又はコンタクト
層でn側電極9に接続されている。A p-GaAtAs cladding layer 4 sandwiching the laser active layer 10. A double heterostructure is formed by the n-GaAtAS cladding layer 2. 1 is an n-type substrate or contact layer connected to the n-side electrode 9.
5はp側コンタクト層で通常p−GaAs層が用いられ
、素子分離用溝7を用いて2分割された電極6及び8が
つけられている。8.9間に順バイアスをかけ、レーザ
発振させ、6,9間に逆バイアスをかけることでp −
i −n型受光器となる。受光器の1層11は通常レー
ザ活性層1oと同一のエピタキシ層を用いる之め、プロ
セス上簡素化できる。Reference numeral 5 denotes a p-side contact layer, which is usually made of a p-GaAs layer, and has electrodes 6 and 8 divided into two using an element isolation groove 7. By applying a forward bias between 8 and 9 to cause laser oscillation, and applying a reverse bias between 6 and 9, p −
It becomes an i-n type photoreceiver. Since one layer 11 of the photoreceiver normally uses the same epitaxial layer as the laser active layer 1o, the process can be simplified.
V−f(iり活性層及び受光器のダブルへテロ構造の狭
バンドギヤツプ半導体がバルクのQaAsの場合には、
バルクの吸収12に対し、レーザの発振波長がA1であ
り受光器は、充分な感度を有する。V-f (i) When the double heterostructure narrow bandgap semiconductor of the active layer and photodetector is bulk QaAs,
With respect to bulk absorption 12, the oscillation wavelength of the laser is A1, and the photodetector has sufficient sensitivity.
しかしながらレーザ活性層が超格子の場合は。However, if the laser active layer is a superlattice.
第′2図に示す様に超格子を用いたレーザの発振波長λ
2は、超格子の吸収13が大幅に減少した所であるため
、モニタ用受光器の超格子11がレーザ活性層用超格子
10と同じ場合、著しく受光感度が低下する。As shown in Figure '2, the oscillation wavelength λ of a laser using a superlattice is
2 is where the absorption 13 of the superlattice is significantly reduced, so if the superlattice 11 of the monitoring light receiver is the same as the superlattice 10 for the laser active layer, the light receiving sensitivity will be significantly reduced.
本発明の目的は、レーザの性能を向上させる活性層の超
格子化(−次元方向の量子閉じ込め)や。An object of the present invention is to create a superlattice in an active layer (quantum confinement in the -dimensional direction) to improve the performance of a laser.
量子細線化(二次元方向の量子閉じ込め)に際し問題と
なるモニタ感度の低下を防いだ、高性能の光集積化素子
を提供することにある。The object of the present invention is to provide a high-performance optical integrated device that prevents a decrease in monitor sensitivity, which is a problem when making quantum wires thinner (quantum confinement in two-dimensional directions).
上記目的は、同一のエピタキシ結晶をレーザの活性層と
受光素子に用いて、プロセスを簡略化しつつ、レーザの
活性層の量子閉じ込めの次元を受光素子の量子閉じ込め
の次元よシ高めることで達成される。The above objective can be achieved by using the same epitaxial crystal for the laser active layer and the photodetector, simplifying the process, and increasing the quantum confinement level of the laser active layer to a level higher than that of the photodetector. Ru.
一次元の量子閉じ込めを行った場合の量子準位は、二次
元の場合と比べて低エネルギー側にあるため、後者で作
られた半導体レーザ光は、−次元の量子閉じ込めをした
超格子において強い吸収をうける。二次元及び三次元閉
じ込めを行った場合も同様の関係である。The quantum level in the case of one-dimensional quantum confinement is on the lower energy side compared to the two-dimensional case, so the semiconductor laser light produced in the latter case is stronger in the superlattice with -dimensional quantum confinement. be absorbed. A similar relationship holds when two-dimensional and three-dimensional confinement is performed.
又、量子細線において閉じ込める幅をレーザ部と受光器
部で変えることでも上記目的を達することができる。こ
の場合、量子細線の幅が狭い方が短波長側の光学遷移と
なる。The above objective can also be achieved by changing the width of the quantum wire to be confined between the laser section and the light receiver section. In this case, the narrower the width of the quantum wire, the shorter the wavelength of the optical transition.
以下1本発明の詳細な説明する。 The present invention will be explained in detail below.
実施例1
n−GaAs基板1上にn−Ga(1,5ALO,5A
sクラッド層2 (2μm)、アンドープQaAS(1
00人)/ ()a +18 At(L2A35OA超
格子活性層10を成長する。Example 1 n-Ga (1,5ALO, 5A
s cladding layer 2 (2 μm), undoped QaAS (1
00 people)/()a +18 At(L2A35OA superlattice active layer 10 is grown.
電子線リングラフィ法を用いて、レーザの活性層に相当
する部分のみ、200人のライン及スペースのレジスト
パターンを共振器方向に作成し、ドライエツチング法を
用いてパターンを超格子に転写し量子細線を作る。Using the electron beam phosphorography method, a resist pattern of 200 lines and spaces was created in the direction of the resonator only in the part corresponding to the active layer of the laser, and the pattern was transferred to the superlattice using the dry etching method. Create a thin line.
レジストを除去後、GaαsAtα2 A Sで、超格
子の量子細線を埋め込み、さらにp −Gaα5Ato
、sASクラッド層4. p−GaA3キャップ層5を
成長する。After removing the resist, superlattice quantum wires are embedded with GaαsAtα2A S, and then p-Gaα5Ato
, sAS cladding layer 4. Grow a p-GaA3 cap layer 5.
電極形成後、ドライエツチング法で、レーザ部と受光器
部を電気的に分離する溝7を作る。After forming the electrodes, a groove 7 is formed by dry etching to electrically separate the laser section and the photodetector section.
レーザ部分の活性層10は量子細線で、レーザ発振の波
長は845nmで、受光器の光吸収層11は、超格子で
、850nmに量子準位があシ。The active layer 10 of the laser part is a quantum wire, and the wavelength of laser oscillation is 845 nm, and the light absorption layer 11 of the photodetector is a superlattice, with a quantum level at 850 nm.
845 rumのレーザ光に対し、充分な光吸収を示し
た。It exhibited sufficient light absorption for 845 rum laser light.
実施例2 実施例1と同じく、超格子まで結晶成長した後。Example 2 After crystal growth to superlattice as in Example 1.
レーザ部分は1幅100A、受光器部分は幅300人の
量子細線を作製する。この時の遷移の波長の関係を第3
図を用いて説明する。A quantum wire with a width of 100 A for the laser part and a width of 300 A for the receiver part is fabricated. The relationship between the wavelengths of the transition at this time can be expressed as
This will be explained using figures.
図は、()a 、BAt、2Asのバリアではさまれた
厚さ100人のGaAS量子井戸をLyで示す幅の量子
細線に加工した場合の光学遷移の波長変化17を示して
いる。量子井戸ままの場合の遷移の波長を15で示す。The figure shows the wavelength change 17 of the optical transition when a 100-layer GaAS quantum well sandwiched between barriers of ()a, BAt, and 2As is processed into a quantum wire with a width indicated by Ly. The transition wavelength when the quantum well remains as it is is indicated by 15.
バリアの高さを閃とした場合の同様の関係を16と14
で示す。16 and 14 show similar relationships when the height of the barrier is taken as flash.
Indicated by
したがって、100Aの量子細線の遷移は8271m、
300Aの量子細線の遷移は845nmで。Therefore, the transition of a 100A quantum wire is 8271m,
The transition of a 300A quantum wire is at 845nm.
レーザ光は、受光器で充分な吸収を受ける。The laser beam is sufficiently absorbed by the receiver.
なお本発明の実施例ではQaAs系の場合についてのべ
たがInP系等他の化合物半導体の場合についても同様
である。In the embodiments of the present invention, the case of QaAs-based semiconductors has been described, but the same applies to other compound semiconductors such as InP-based semiconductors.
本発明によれば、f1子細線レーザの発振強度を高感度
でモニタできるモノリシック集積化素子を実現できる。According to the present invention, it is possible to realize a monolithically integrated element that can monitor the oscillation intensity of an f1 wire laser with high sensitivity.
この方法を用いることで、受光器の感度をレーザと受光
器とが同一構造のものと比べ20〜100倍増加させる
ことができた。By using this method, it was possible to increase the sensitivity of the photodetector by 20 to 100 times compared to a case where the laser and photodetector have the same structure.
第1図は、レーザと受光器をモノリシックに集積化した
素子の断面図、第2図は、層3の吸収係数とレーザ発振
波長の関係を示す図、および第3図は、量子細線におけ
る光学遷移の細線の幅による変化を示す図である。
1はn−QaAs基板、2はn−GaAtASクラッド
、3は超格子、4はp GaAtAsクラッド、5はp
−GaASキャップ層、6は受光器の電極、7はアイソ
レーション用溝、8はレーザ電ff1.ilは受光器の
光吸収領域%10はレーザ活性層、9はn側電極、12
はバルクGaAsの吸収スペクトル、13は超格子の吸
収スペクトル、14.15は超格子の光学遷移、16.
17は量子細線の光学遷移の細線幅依存性を示す。
、−1、茅1因
弄2図
1長 (VすFig. 1 is a cross-sectional view of a device in which a laser and a photoreceiver are monolithically integrated, Fig. 2 is a diagram showing the relationship between the absorption coefficient of layer 3 and the laser oscillation wavelength, and Fig. 3 is an optical diagram of a quantum wire. FIG. 7 is a diagram showing changes depending on the width of a thin transition line. 1 is n-QaAs substrate, 2 is n-GaAtAS cladding, 3 is superlattice, 4 is p GaAtAs cladding, 5 is p
-GaAS cap layer, 6 is the electrode of the photoreceiver, 7 is the isolation groove, 8 is the laser electrode ff1. il is the light absorption area of the receiver, %10 is the laser active layer, 9 is the n-side electrode, 12
is the absorption spectrum of bulk GaAs, 13 is the absorption spectrum of the superlattice, 14.15 is the optical transition of the superlattice, 16.
17 shows the dependence of the optical transition of a quantum wire on the wire width.
, -1, Kaya 1 cause 2 figure 1 length (Vsu
Claims (1)
集積化光素子において、半導体レーザの活性層の吸収端
が、受光器の光吸収層の吸収端よりも高エネルギー側に
存在する様に、量子閉じ込めの次元and/OR量子細
線や量子箱の寸法を選択したことを特徴とする半導体装
置。 2、上記レーザ活性層と、受光器の光吸収層とが、同一
の超格子でできており、半導体レーザの活性層領域のみ
量子細線あるいは量子箱としたことを特徴とする特許請
求の範囲第1項記載の半導体装置。[Claims] 1. In an integrated optical device having at least one semiconductor laser and a light receiving element, the absorption edge of the active layer of the semiconductor laser is on a higher energy side than the absorption edge of the light absorption layer of the light receiver. A semiconductor device characterized in that dimensions of quantum confinement and/or dimensions of a quantum wire or a quantum box are selected so as to exist. 2. The above-mentioned laser active layer and the light absorption layer of the light receiver are made of the same superlattice, and only the active layer region of the semiconductor laser is made of quantum wires or quantum boxes. The semiconductor device according to item 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61269649A JPS63124591A (en) | 1986-11-14 | 1986-11-14 | Semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61269649A JPS63124591A (en) | 1986-11-14 | 1986-11-14 | Semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63124591A true JPS63124591A (en) | 1988-05-28 |
Family
ID=17475288
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61269649A Pending JPS63124591A (en) | 1986-11-14 | 1986-11-14 | Semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63124591A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0602811A1 (en) * | 1992-12-14 | 1994-06-22 | Xerox Corporation | Independently addressable semiconductor diode lasers with integral low loss passive waveguides |
-
1986
- 1986-11-14 JP JP61269649A patent/JPS63124591A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0602811A1 (en) * | 1992-12-14 | 1994-06-22 | Xerox Corporation | Independently addressable semiconductor diode lasers with integral low loss passive waveguides |
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