JPS6314876A - Amorphous thin film forming device - Google Patents
Amorphous thin film forming deviceInfo
- Publication number
- JPS6314876A JPS6314876A JP61160127A JP16012786A JPS6314876A JP S6314876 A JPS6314876 A JP S6314876A JP 61160127 A JP61160127 A JP 61160127A JP 16012786 A JP16012786 A JP 16012786A JP S6314876 A JPS6314876 A JP S6314876A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- electrodes
- magnetic field
- electrode plates
- electric field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000010409 thin film Substances 0.000 title claims abstract description 19
- 239000000758 substrate Substances 0.000 claims abstract description 36
- 230000005684 electric field Effects 0.000 claims abstract description 16
- 239000007789 gas Substances 0.000 claims abstract description 13
- 239000012495 reaction gas Substances 0.000 claims description 9
- 239000002245 particle Substances 0.000 abstract description 15
- 230000007935 neutral effect Effects 0.000 abstract description 3
- 239000010408 film Substances 0.000 abstract description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 6
- 150000002500 ions Chemical class 0.000 description 6
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 5
- 229910052786 argon Inorganic materials 0.000 description 4
- 238000007599 discharging Methods 0.000 description 4
- 241000255925 Diptera Species 0.000 description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- -1 argon ions Chemical class 0.000 description 2
- 239000000446 fuel Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 108091008695 photoreceptors Proteins 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 241000252233 Cyprinus carpio Species 0.000 description 1
- 241001136824 Pyrgotidae Species 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/517—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using a combination of discharges covered by two or more of groups C23C16/503 - C23C16/515
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Photoreceptors In Electrophotography (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、太陽電池、燃料電池、薄膜半導体。[Detailed description of the invention] [Industrial application field] The present invention relates to solar cells, fuel cells, and thin film semiconductors.
電子写真感光体や光センサなどの、各種電子デバイスに
使用される非晶質薄膜の←會≠÷会4eへ
ゲ嗜咄装置に関するものである。This invention relates to an apparatus for dispensing amorphous thin films used in various electronic devices such as electrophotographic photoreceptors and optical sensors.
第2図には、従来より用いられている半導体薄膜の製造
装置を示してあり、たとえば、特開昭57−47710
号公報などに記載されている公知の技術である。FIG. 2 shows a conventionally used semiconductor thin film manufacturing apparatus.
This is a well-known technique described in publications such as No.
図において、気密の反応容器01内に放電空間を形成す
るための電極02,0.9がト下方向に設けてあり、こ
の電極02,03は高周波電源04に電気的に接続され
ている。上記反応容器01の外周には、J:記放電空間
内の電界方向と平行な磁界を発生させるためのコイル0
5が水平に配置されており、交流電源06と電気的に接
続されている。排気孔07は図示しない真空ポンプに連
通しており9反応ガス導入管08は、モノシラン(S
3H4)と水素ガス(H2)のボンベにそれぞれ連通し
ている。なお、 09はヒータで、基板010を加熱す
るものである。In the figure, electrodes 02 and 0.9 for forming a discharge space in an airtight reaction vessel 01 are provided downward, and these electrodes 02 and 03 are electrically connected to a high frequency power source 04. On the outer periphery of the reaction vessel 01, J: a coil 0 for generating a magnetic field parallel to the electric field direction in the discharge space.
5 is arranged horizontally and is electrically connected to an AC power source 06. The exhaust hole 07 is connected to a vacuum pump (not shown), and the reaction gas introduction pipe 08 is connected to a vacuum pump (not shown).
3H4) and hydrogen gas (H2) cylinders. Note that 09 is a heater that heats the substrate 010.
さて、電極03.1Hに基板010を載せ1反応容器0
1内を1 mm Hg程度に減圧した後、モノシランと
水素ガスとの混合ガスを反応ガス導入管08より供給し
ツツ、電i02.O3間に13.5 MHzの高周波電
圧を印加する。Now, place the substrate 010 on the electrode 03.1H, 1 reaction vessel 0.
After reducing the pressure inside 1 to about 1 mm Hg, a mixed gas of monosilane and hydrogen gas was supplied from the reaction gas inlet pipe 08, and then the electric current 102. A high frequency voltage of 13.5 MHz is applied between O3.
一方、コイル05には、50あるいは6QHzの商業用
交流電圧を印加し、電極02,03間に約io。On the other hand, a commercial AC voltage of 50 or 6 QHz is applied to the coil 05, and about io is applied between the electrodes 02 and 03.
ガウヌの磁界を発生させる。なお、基板010は。Generates a magnetic field for Gaunu. Note that the substrate 010 is.
ヒータ09により300°C程度に加熱しておく。It is heated to about 300°C using heater 09.
反応ガス導入管08より導入されたモノシラン等のガス
は、 電fi02. 03間の放電空間で分解され、コ
イル05により発生された変動する磁界により攪拌され
つつ基板010の表面に付着し。The gas such as monosilane introduced from the reaction gas introduction pipe 08 is transferred to the electric fi02. It is decomposed in the discharge space between the coils 03 and attached to the surface of the substrate 010 while being agitated by the fluctuating magnetic field generated by the coil 05.
非晶質薄膜を形成する。Forms an amorphous thin film.
上記した従来の装置では、2枚の電極02.03間に発
生する電界の方向と平行にコイル05で発生させた変動
磁界を印加するので、賞嘆02,03間の放電空間に存
在するシリコン等のイオンが攪拌され、基板010丑に
比較的均一な非晶質薄膜が形成される。In the conventional device described above, since the variable magnetic field generated by the coil 05 is applied parallel to the direction of the electric field generated between the two electrodes 02 and 03, the silicon existing in the discharge space between the electrodes 02 and 03 is ions are stirred, and a relatively uniform amorphous thin film is formed on the substrate 010.
しかし。but.
■ 基板010が置かれる場所は、電極03の北であり
、電1i02.08間の放電空間内に位置することにな
る。このため、基本的に高エネルギーをもつイオンの直
撃を受けることになる。(2) The location where the substrate 010 is placed is to the north of the electrode 03, and is located within the discharge space between the electrodes 1i02.08. As a result, they are basically directly hit by high-energy ions.
すなわち、電極02.O3間の電界Eによシミ荷qのイ
オンにはクーロン力F、=qEが働き。That is, electrode 02. Due to the electric field E between O3, a Coulomb force F, = qE acts on the ions of the stain charge q.
イオン粒子が基板O1Oを直撃して形成されつつある非
晶質薄膜に損傷を与えることになる。The ion particles will directly hit the substrate O1O and damage the amorphous thin film that is being formed.
■ コイル05により発生される変動磁界Bの方向が、
放電空間に発生した電界Eに平行なため、放電空間内に
あるイオン、および電子はLa rmo r運動によシ
旋回運動を引き起こされるが、その旋回運動による攪拌
作用は余9大きくなく極めて大きな電力を必要とする。■ The direction of the fluctuating magnetic field B generated by coil 05 is
Since it is parallel to the electric field E generated in the discharge space, the ions and electrons in the discharge space are caused to swirl by Larmor motion, but the stirring effect due to the swirling motion is not very large and requires extremely large electric power. Requires.
■ 基板010が一方の1極03のとに載せられるので
、一度に処理される基板010の大きさも限定されるこ
とになり、電@03より面積の大きな基板に非晶質薄膜
を形成することができないし、一度に基板010の両面
へ非晶質薄膜を形成することもできない。■ Since the substrate 010 is placed on one pole 03, the size of the substrate 010 that can be processed at one time is limited, and it is difficult to form an amorphous thin film on a substrate with a larger area than the electrode 03. It is not possible to form an amorphous thin film on both sides of the substrate 010 at the same time.
■ 基板010が一方の電極03のLに載せられるので
、放電持続に必要な二次電子の供給が木質的となる直流
放電や低周波放電では大面積j、τ基板上に均一な成膜
を行うことが困難である。■ Since the substrate 010 is placed on the L of one electrode 03, a uniform film can be formed on a large area j, τ substrate in DC discharge or low frequency discharge where the supply of secondary electrons necessary for sustaining the discharge is woody. Difficult to do.
従って、高価な高周波電源がどうしても必要となる。Therefore, an expensive high frequency power source is absolutely necessary.
本発明は、グロー放電プラズマを用いて基板に非晶質薄
膜を形成する装置において、非晶質薄膜を形成する基板
を収納する反応容器と、同反応谷器内に複数枚の電極板
を平行にかっ端縁が上記基板の一表面に臨むように配置
される第1の放電用電極と、上記反応容器内に複数枚の
電極板を平行にかつ端縁が上記基板の低表面に臨むよう
に配置される第2の放電用電極と、これら第1と第2の
放電用電極の電極板間に放電用電圧を供給する電源と2
.)、記反応容器を囲繞し上記一対の放電用電極板間に
発生された電界と直交する向きの磁界を発生させるコイ
ルおよび交流電源と、上記反応容器内を減圧すると共に
反応ガスを供給するガス供給装置とを有するものである
。The present invention is an apparatus for forming an amorphous thin film on a substrate using glow discharge plasma. A first discharge electrode is arranged such that its edge faces one surface of the substrate, and a plurality of electrode plates are arranged in parallel in the reaction vessel so that their edges face the lower surface of the substrate. a second discharging electrode disposed in the second discharging electrode; a power supply supplying a discharging voltage between the electrode plates of the first and second discharging electrodes;
.. ), a coil and an AC power supply that surround the reaction vessel and generate a magnetic field orthogonal to the electric field generated between the pair of discharge electrode plates, and a gas that reduces the pressure inside the reaction vessel and supplies a reaction gas. It has a supply device.
本発明では、平行に配置される複数枚の電極板で構成さ
れるグロー放電プラズマ発生用の電極を2Mi準備し、
基板を挾みその電極板の端縁を臨ませてそれぞれ配置さ
せている。In the present invention, 2Mi electrodes for glow discharge plasma generation consisting of a plurality of electrode plates arranged in parallel are prepared,
The substrates are sandwiched and the electrode plates are arranged with their edges facing each other.
また、各組の電極板間に発生する放電用電界と直交する
方向にコイルおよび交流電源により磁界を発生させた。Further, a magnetic field was generated by a coil and an AC power source in a direction perpendicular to the electric discharge field generated between each set of electrode plates.
荷電粒子は、電極板間の放電電界より与えられたクーロ
ン力と磁界によシ与えられたローレンツカとに初速を与
えられた形で電界と直交する方向にドリフトするが、電
界を出た所、すなわち、電極板の端縁から基板の表面に
向かう所でクーロン力が弱まりローレンツ力によるサイ
クロトロン運動によりLa rmo r軌道を描いて飛
んでいく。Charged particles drift in a direction perpendicular to the electric field with an initial velocity given by the Coulomb force given by the discharge electric field between the electrode plates and the Lorentz force given by the magnetic field, but when they leave the electric field, That is, the Coulomb force weakens from the edge of the electrode plate toward the surface of the substrate, and the light flies off in a Larmor trajectory due to cyclotron motion due to the Lorentz force.
一方、電気的に中性であるラジカル粒子は荷電粒子群の
軌道からそれて直進しようとするが。On the other hand, electrically neutral radical particles deviate from the orbit of the charged particles and try to travel straight.
荷電粒子(特にイオン)と衝突しその進路を修正させら
れる。しかも、この磁界は変動しており、ラジカル粒子
は均一に飛散する。They collide with charged particles (especially ions) and are forced to modify their course. Moreover, this magnetic field is fluctuating, and the radical particles are scattered uniformly.
従って、放電電界空間外に支持された基板の両面には、
均一な非晶質薄膜が形成されることになる。Therefore, on both sides of the substrate supported outside the discharge electric field space,
A uniform amorphous thin film will be formed.
以下7本発明を第1図に示す一実施例の装置に基づき説
明する。The present invention will be explained below based on an embodiment of the apparatus shown in FIG.
lは反応容Hで、その中にグロー放電プラズマを発生さ
せるための第1と第2の電極、2・3が対向して収納さ
れている。これらの電極2(あるいは3)は、長尺な電
極板を複数枚平行に並べたもので後述の低周波電源4へ
隣合うもの同士の極を変えてそれぞれ接続されている。1 is a reaction volume H, in which first and second electrodes 2 and 3 for generating glow discharge plasma are housed facing each other. These electrodes 2 (or 3) are a plurality of long electrode plates arranged in parallel, and are connected to a low frequency power source 4, which will be described later, with adjacent electrodes having different poles.
低周波電源4ば2例えば、 60Hzの商用周波数を用
いL記電極2と3の各々の電極板に接続されている。コ
イ/I15は、):記反応容器1を囲繞するもので、交
流電源6に接続されている。7は反応ガス導入管で1図
示しないボンベに連通シ、モノシランとアルゴンの混合
ガスを上記反応容器1に供給するものである。排気孔8
は。A low frequency power source 4 and 2 is connected to each electrode plate of the L electrodes 2 and 3 using a commercial frequency of 60 Hz, for example. The carp/I 15 surrounds the reaction vessel 1 and is connected to the AC power source 6. Reference numeral 7 denotes a reaction gas introduction pipe which communicates with a cylinder (not shown) and supplies a mixed gas of monosilane and argon to the reaction vessel 1. Exhaust hole 8
teeth.
真空ポンプ9に連通しており7反応容器1内のガスを排
気するものである。It communicates with a vacuum pump 9 to exhaust the gas in the reaction vessel 1.
さて、基板10を図示のように電極2と3の間であって
、その端縁2A、3Aが基板10のそれぞれの面に臨み
間隙が等しくなるように適宜手段で支持する。真空ポン
プ9を駆動して反応容器1内を排気した後1反応ガス導
入管7からモノシランとアルゴンの混合ガスを供給する
。上記混合ガスを反応容器1内に充満させて圧力を0.
05ないしく15 Torrに保ち、低周波電源4から
電極2・3に電圧を印加するとグロー放電プラズマが電
極2・3の各電極板間に発生する。Now, as shown in the figure, the substrate 10 is supported by appropriate means between the electrodes 2 and 3 so that the edges 2A and 3A face each surface of the substrate 10 and the gaps are equal. After evacuating the inside of the reaction vessel 1 by driving the vacuum pump 9, a mixed gas of monosilane and argon is supplied from the reaction gas introduction pipe 7. The reaction vessel 1 is filled with the above mixed gas and the pressure is reduced to 0.
When the voltage is maintained at 0.05 to 15 Torr and a voltage is applied to the electrodes 2 and 3 from the low frequency power source 4, glow discharge plasma is generated between each electrode plate of the electrodes 2 and 3.
一方、コイ/L15には1例えば100Hzの交流電圧
を印加し、電極2・3のそれぞれの電極板間に発生する
電界Eと直交する方向の磁界Bを発生させる。なお、そ
の磁束密度は10ガウス程度で良い。On the other hand, an AC voltage of, for example, 100 Hz is applied to the coil/L 15 to generate a magnetic field B in a direction perpendicular to the electric field E generated between the electrode plates of the electrodes 2 and 3. Note that the magnetic flux density may be about 10 Gauss.
反応ガス導入管7から供給されたガスのうちモノシラン
ガスは、電極2・3それぞれの電極板の間に生じるグロ
ー放電プラズマでラジカルSiに分解され、基板10の
表面に付着し薄膜を形成する。Among the gases supplied from the reaction gas introduction pipe 7, monosilane gas is decomposed into radical Si by glow discharge plasma generated between the electrode plates of the electrodes 2 and 3, and adheres to the surface of the substrate 10 to form a thin film.
このとき、アルゴンイオン等の荷電粒子は。At this time, charged particles such as argon ions.
電極2あるいは8の各電極板間で電界Eによるり−o
ンカF、=qEとローレンツ力F2=q(VXB)によ
っていわゆるExBドリフトの運動を起こす。Due to the electric field E between each electrode plate of electrode 2 or 8 -o
The so-called ExB drift movement is caused by the linker F, = qE and the Lorentz force F2 = q (VXB).
なお、■は荷電粒子の速度である。Note that ■ is the speed of charged particles.
すなわち、EXBドリフトにより初速を与えられた形で
、電極2・8と直交する方向に飛び出し、基板10に向
けて飛んでいく。しかし、電極2・8それぞれの電極板
の間に生じる電界の影響が小さい放電空間の外側では、
コイル6により生じた磁界Bによるサイクロトロン運動
によりLa rmo r軌道を描いて飛んでいく。That is, it flies out in a direction perpendicular to the electrodes 2 and 8 and flies toward the substrate 10 with an initial velocity given by the EXB drift. However, outside the discharge space where the influence of the electric field generated between the electrode plates of electrodes 2 and 8 is small,
Due to the cyclotron movement caused by the magnetic field B generated by the coil 6, it flies in a Larmor orbit.
従って、アルゴンイオン等の荷電粒子が基板10を直撃
することはなくなる。Therefore, charged particles such as argon ions will not directly hit the substrate 10.
一方、電気的に中性であるラジカルSiは磁界Bの影響
を受けず、上記荷電粒子群の軌道よりそれて基板10に
至り、その表面に非晶質薄膜を形成する。この時、ラジ
カルSiはLarmor 軌道を飛んでゆく荷電粒子と
衝突するため、電極2や3の前方だけでなく左あるいは
右に広がった形で非晶質薄膜が形成される。しかも、磁
界Bを変動させているので、基板10の両面に均一に非
晶質薄膜を形成させることが可能となる。On the other hand, the electrically neutral radicals Si are not affected by the magnetic field B, deviate from the trajectory of the charged particle group, reach the substrate 10, and form an amorphous thin film on its surface. At this time, the radical Si collides with the charged particles traveling in the Larmor orbit, so that an amorphous thin film is formed not only in front of the electrodes 2 and 3 but also spread to the left or right. Moreover, since the magnetic field B is varied, it is possible to uniformly form an amorphous thin film on both sides of the substrate 10.
また、この実施例では、基板10を垂直に配置しである
ので2反応容器gxoや電極2や3の内面などに付着し
た非晶質のカヌなどが落ちてその表面を汚すことが少な
くなる。Furthermore, in this embodiment, since the substrate 10 is arranged vertically, amorphous canals adhering to the inner surfaces of the two reaction vessels gxo and the electrodes 2 and 3 are less likely to fall and contaminate the surfaces thereof.
本発明によれば、太陽電池・燃料電池・電子写真感光体
などの各種ディバイスの製造において、基板の両面に均
一な非晶質薄膜が、しかも。According to the present invention, uniform amorphous thin films can be formed on both sides of a substrate in the production of various devices such as solar cells, fuel cells, and electrophotographic photoreceptors.
大面積のものが形成されることになるので、産業ときわ
めて価値がある。Since large areas will be formed, it is extremely valuable for industry.
第1図は本発明に係る一実施例を示す装置の横断面図で
ある。第2図は従来の装置を示す縦断面図である。
1・・・反応容器、2,3・・・電極、4・・・低周波
電源、5・・・コイル、6・・・交流電源、7・・・反
応ガス導入管、8・・・排気孔、9・・・真空ポンプ、
10・・・基板。FIG. 1 is a cross-sectional view of an apparatus showing one embodiment of the present invention. FIG. 2 is a longitudinal sectional view showing a conventional device. DESCRIPTION OF SYMBOLS 1... Reaction container, 2, 3... Electrode, 4... Low frequency power supply, 5... Coil, 6... AC power supply, 7... Reaction gas introduction pipe, 8... Exhaust Hole, 9...vacuum pump,
10...Substrate.
Claims (1)
応容器内に複数枚の電極板を平行にかつ端縁が上記基板
の一表面に臨むように配置される第1の放電用電極と、
上記反応容器内に複数枚の電極板を平行にかつ端縁が上
記基板の他表面に臨むように配置される第2の放電用電
極と、これら第1と第2の放電用電極の電極板間に放電
用電圧を供給する電源と、上記反応容器を囲繞し上記一
対の放電用電極板間に発生された電界と直交する向きの
磁界を発生させるコイルおよび交流電源と、上記反応容
器内を減圧して反応ガスを供給するガス供給装置とを具
備することを特徴とする非晶質薄膜形成装置。A reaction container that houses a substrate on which an amorphous thin film is to be formed, and a first discharge electrode in which a plurality of electrode plates are arranged in parallel with each other in such a manner that an edge thereof faces one surface of the substrate. and,
a second discharge electrode in which a plurality of electrode plates are arranged in parallel in the reaction vessel so that their edges face the other surface of the substrate; and electrode plates of the first and second discharge electrodes. a power source that supplies a discharge voltage between the two; a coil and AC power source that surround the reaction vessel and generate a magnetic field orthogonal to the electric field generated between the pair of discharge electrode plates; An amorphous thin film forming apparatus comprising: a gas supply device that supplies a reaction gas under reduced pressure.
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61160127A JPS6314876A (en) | 1986-07-08 | 1986-07-08 | Amorphous thin film forming device |
| DE3750349T DE3750349T2 (en) | 1986-05-09 | 1987-05-06 | Arrangement for the production of thin layers. |
| EP87106535A EP0244842B1 (en) | 1986-05-09 | 1987-05-06 | Apparatus for forming thin film |
| KR1019870004508A KR910002819B1 (en) | 1986-05-09 | 1987-05-08 | Forming method and device of amorphous thin film |
| CA000536654A CA1279411C (en) | 1986-05-09 | 1987-05-08 | Method and apparatus for forming thin film |
| US07/047,328 US4901669A (en) | 1986-05-09 | 1987-05-08 | Method and apparatus for forming thin film |
| KR1019900021941A KR910010168B1 (en) | 1986-05-09 | 1990-12-27 | Amorphous thin film manufacturing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61160127A JPS6314876A (en) | 1986-07-08 | 1986-07-08 | Amorphous thin film forming device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6314876A true JPS6314876A (en) | 1988-01-22 |
| JPH0576549B2 JPH0576549B2 (en) | 1993-10-22 |
Family
ID=15708451
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61160127A Granted JPS6314876A (en) | 1986-05-09 | 1986-07-08 | Amorphous thin film forming device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6314876A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01215025A (en) * | 1988-02-24 | 1989-08-29 | Tel Sagami Ltd | Plasma cvd device |
| WO1996027690A1 (en) * | 1995-03-07 | 1996-09-12 | Essilor International | Method and apparatus for plasma deposition on a double-sided substrate |
-
1986
- 1986-07-08 JP JP61160127A patent/JPS6314876A/en active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01215025A (en) * | 1988-02-24 | 1989-08-29 | Tel Sagami Ltd | Plasma cvd device |
| WO1996027690A1 (en) * | 1995-03-07 | 1996-09-12 | Essilor International | Method and apparatus for plasma deposition on a double-sided substrate |
| FR2731370A1 (en) * | 1995-03-07 | 1996-09-13 | Cie Generale D Optique Essilor | PROCESS FOR THE PLASMA ASSISTED DEPOSITION OF AT LEAST ONE THIN FILM ON A TWO-SIDED SUBSTRATE, AND CORRESPONDING REACTOR |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0576549B2 (en) | 1993-10-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |