JPS63201749A - Testing system for peripheral equipment subsystem - Google Patents

Abstract

PURPOSE:To efficiently execute a function test in a short time by executing an overall test by linking all commands which a peripheral equipment has, analyzing an error command, when an error has been generated, and executing a single function test by its command. CONSTITUTION:The titled system is provided with an overall function testing part 11 which is provided with an overall function test command 50 for linking plural commands and operates a peripheral equipment subsystem 7, and an error command analyzing part 12 for analyzing and extracting a command 51 which has generated an error. Also, said system is provided with a single function testing part 13 for analyzing the cause of generation of an error by allowing the peripheral equipment subsystem 7 to execute the extracted command 51. In such a way, at the time of an overall function test which has been brought to a command chain, it will suffice that an initialization and a post- processing are executed before and after a series of commands, the initialization and the post-processing which have been performed each time can be curtailed remarkably, and also, a part where an error has been generated can be confirmed quickly, and the test can be executed efficiently and in a short time.

Description

[Detailed Description of the Invention] [Summary] When testing a peripheral device subsystem in a computer system, a comprehensive test is performed by linking all the commands possessed by the peripheral device, and when an error occurs, the command ( We provide a test method that analyzes a command (hereinafter referred to as an error command) and performs a single function test using that command.

[Industrial application field]

The present invention relates to an improved method for testing peripheral subsystems.

A functional test of a peripheral device subsystem consisting of a peripheral device and an input/output control device is performed by confirming the normality of the function based on the execution result of a command.

Therefore, in order to thoroughly test all functions of peripheral devices, we conduct single function tests using individual commands, followed by complex tests that combine multiple commands.
There is a problem in that it takes time to test peripheral devices having a wide variety of functions.

In particular, testing when a failure occurs is required to be performed in a short period of time, and therefore there is a need for a testing method for peripheral device subsystems that solves the above-mentioned problems.

[Conventional technology]

FIG. 6 is a diagram showing the positioning of peripheral devices in a computer system, FIG. 7 is a diagram showing the functions of a peripheral device subsystem, and FIG. 8 is a diagram explaining a conventional test method.

In FIG. 6, 1 is a central processing unit CPU, 2 is a memory, 3 is a channel device, 5 is an input/output control device that controls a plurality of peripheral devices, 6 is a peripheral device, and the input/output control device 5
and the peripheral device 6 constitute a peripheral device subsystem 4.

As is well known, input/output control for the peripheral device subsystem 4 is performed through the channel device 3 using the channel command word CCW. In other words, the CPUI sends input/output commands to C
Write in CW and store in memory 2, start 10. (S
IO) The channel device 3 is activated by the command.

The channel device 3 reads the CCW and instructs the input/output control device 5 to input/output predetermined data based on the command written in the CCW.

The above cccw consists of a command, a data address, and a data length, but the command includes multiple commands, for example, in a magnetic tape device, WRITE,
In addition to READ (reading), READ BACK 慝RD (reverse reading), C0NTR0L (
REWTND (rewind) as a control) command,
There are commands such as BACKSPAGE, and these commands cause the peripheral device subsystem 4 to function.

FIG. 7 shows that the peripheral device subsystem 4 functions according to a plurality of commands.

When testing the above peripheral device subsystem 4, as shown in Figure 8, function A is tested by command A (single function test A), function B is tested by command B (single function test B), etc. Implemented for all functions,
If the single function test is normal, multiple related commands are linked to perform a compound test.

Each of the above single function tests and compound tests include initial settings (for example, magnetic tape rewind, etc.), command execution (WR
ITE, etc.), data check (R[!AD) command issue, W/R data collation, CSW check), post-processing (rewind), etc. If the execution result is normal, the next single function test is performed. This is done successively.

[Problem to be Solved by the Invention 3] As explained above, in the conventional functional test of a peripheral device subsystem, a single function test is performed using individual commands, and then a composite test is performed using a combination of related commands. However, the initial settings and post-processing required for each test take up a large proportion of the time, which is especially problematic for tests that require an emergency, such as when a failure occurs.

SUMMARY OF THE INVENTION In view of the above-mentioned problems, it is an object of the present invention to provide a test method for a peripheral device subsystem that performs a functional test efficiently and in a short time.

[Means for solving problems]

For the above purpose, the peripheral device subsystem test method of the present invention is a comprehensive function test command (50
) to operate the peripheral device subsystem (7), and an error command analysis unit (11) that analyzes and extracts the command (51) that caused the error.
12), and a single function test section (13) that causes the peripheral device subsystem (7) to execute the extracted command (51) and analyzes the cause of the error occurrence.

[Operation] The comprehensive function test command 50 is composed of all commands possessed by the relevant peripheral device, and links related commands (command chain), such as by combining operations that are mechanically prone to errors.

This command chain executes input/output control continuously, but if an error occurs during execution, the error command is analyzed and a single function test is performed on that command to trace the location of the failure.

The error command is analyzed by comparing, for example, the channel status language (C3W) and input/output data.

An example of the analysis procedure using CSW is shown below.

When an error condition occurs, the status of the peripheral subsystem and channel device is stored in the C8W and then notified.

(The command being executed is determined based on the error information and command address specified by the IIC3W, and a single function test is performed on that command.

(2) If the command is normal, a previously executed command is used as the suspect command, and an analysis command is generated in which the above command is chained, and the command is executed.

If an error occurs, a single function test is performed on the suspect command.

(3) If normal, chain the previous command and execute it.

In the single function test, the error status record held by the peripheral device subsystem is read using the 5ENSE command to obtain the cause of the error occurrence.

In the above command-chained general function test, initial settings and post-processing can be performed before and after a series of commands.
The initial settings and post-processing that are conventionally performed each time can be significantly reduced, and the location where an error has occurred can be quickly confirmed, making it possible to perform tests efficiently and in a short time.

〔Example〕

Embodiments of the present invention will be described with reference to FIGS. 2 to 5.

This embodiment takes the test of a magnetic tape device subsystem as an example, and Figure 2 shows the peripheral device subsystem test section of the embodiment.
□Block diagram, Figure 3 is a test operation flowchart, Figure 4 is a diagram showing an example of CSW contents, Figure 5 is an analysis C
It is a CW generation explanatory diagram.

In FIG. 2, IO is a peripheral device subsystem test section, which is composed of a comprehensive function test section 11, an error command analysis section 12, and a single function test section 13.

Reference numeral 2 denotes a memory, which has a data area 2a for storing input/output data, as well as a channel address word CAW specifying the storage address of CCW, a channel command word CCW,
A channel status word C8W representing the status of the channel device and peripheral subsystem is stored at a predetermined address.

In addition, 3 is a channel device, and 17 is a peripheral device subsystem under test, which is a magnetic tape device subsystem consisting of nine magnetic tape device output control devices.

The comprehensive function test section 11 that constitutes the peripheral device subsystem test section 10 includes a command section 15 that includes a comprehensive function test command 50, a data section 16 that includes a plurality of records corresponding to magnetic tape devices, and a test control section 14. The general function test command 50 is stored in the memory 2.
The data section 16 is stored in the CCW area of , and the data area 2a is stored in the data area 2a to perform and control the comprehensive test.

The error command analysis unit 12 analyzes error commands, and when an error occurs, the CC (not shown)
(condition code, indicating the execution status of the SIO command), analyzes C8W, generates and executes an analysis command (55.56 in Figure 5) in which the suspect command is chained, and is transferred back by the WRITE and READ commands. Analyze the error command by checking the data.

The single function test section 13 includes a conventional single function test section for each command.

The test operation will be explained below based on FIG.

Commands provided by the magnetic tape include the ridge trE command,
In addition to the READ command and READ BACKWARD command, there are C0NTR0L commands related to REGAIND, BACK 5PACE, etc., and the comprehensive function test command 50 is a combination of these commands and a command chain, as shown in FIG. a.

Ru.

[Comprehensive function test]

(1) Store the comprehensive function test command 50 in the CCWv4 area and start the channel device 3 (S I O command).

As a result of executing the +213IO command, CC is checked, and when CG=O (normal), channel device 3
The CW is read and the command is executed, and if CC≠0, an error is analyzed.

(3) After the channel device 3 starts executing CCW and performs initial settings such as rewind processing using the C0NTR0L command, first the first command (for example, the fifth
WRITE command 52) is executed to read predetermined data from the data section 16 stored in the memory 2 and transfer it to the magnetic tape device subsystem 17.

Following the execution of the WRITE command 52, the next command chained command (CONTROL command 53,
For example, rewind), then l? EAD BACK
The data area 2a is read by the WARD command 54.
Transfer to.

As described above, if no error occurs, commands are executed successively based on the command chain, and the process ends after execution of the last command.

When an error occurs in a certain command and an input/output interrupt is output from the magnetic tape device subsystem 17, C8W
The status of the peripheral device subsystem is stored in , the peripheral device subsystem is stopped, and the error command analysis unit 12 analyzes the error command.

[Error command analysis and single function test] (IICC
Analyze W and verify the relevant bit.

Figure 4 shows an example of C8W, which shows a unit check (which indicates that an error has occurred in the peripheral device subsystem).
UNIT CIIECK) bit 60, or UNIT EXCEPTION bit 6, which indicates that a special circumstance has been detected in the peripheral device.
If the bit is set to 1, the command being executed is identified based on the command address section 62.

(2) The identified command (e.g. READ BA
When the CK (CK) ARD 54) is extracted, a single function test regarding the READBACKWARD 54 is performed again by the SIO command.

When an error occurs in this single function test, 5EN
The details of the abnormal condition are detected by the SE command.

(31READ BACK) When the single function test of ARD54 is normal, the command executed before command 52 (
CONTROL command 53) as the suspect command,
C0NTR0L command 53 and READ BACKWA
Analysis command 5 with command chain with RD 54
5 is generated and executed.

(4) When an error occurs, perform a single function test of the suspect command, that is, CON T ROL command 53, and if it is normal, then chain the previously executed command (WRITE command 52) and use it for analysis. Generate command 56.

The error command 51 is analyzed through the above process, and the details of the abnormal state are retrieved through a single function test.

Note that if WRITE and READ commands for the same data have already been executed, the error command 51 is analyzed by comparing the W/R data.

As described above, if the magnetic tape device subsystem 17 is normal, the test can be quickly completed through a comprehensive test with significantly reduced initial settings and post-processing, and at the same time, the location where the error has occurred can be quickly traced.

〔Effect of the invention〕

Since the present invention provides a test method for a peripheral device subsystem that quickly traces error commands through a comprehensive test using a series of commands, the effect of efficiently and shortening the test time is extremely large.

[Brief explanation of the drawing]

Fig. 1 is an explanatory diagram of the principle of the present invention, Fig. 2 is a block diagram of the peripheral device subsystem test section of the embodiment, Fig. 3 is a test operation flowchart, and Fig. 4 is C! Figure 5 is a diagram showing an example of the contents of W. Figure 5 is a diagram explaining command generation for analysis. Figure 6 is a diagram showing the positioning of peripheral devices in a computer system. Figure 7 is a diagram showing the functions of the peripheral device subsystem. The figure is an explanatory diagram of the conventional test method. In the figure, ■ is the central processing unit CPU, 2 is the memory, 2a is the data area, 3 is the channel device, 4 is the peripheral device subsystem, 5 is the input/output control device, 6 is the peripheral device, and 10 is the peripheral device subsystem test 11 is a general function test section, 12 is an error command analysis section, 13 is a single function test section, 14 is a test control section, 15 is a command section, 16 is a data section, 17 is a magnetic tape device subsystem, 50 is a general Function test command, 51 is the command that caused the error (error command), 60 is the UNIT CHECK bit, 61 is the IINIT EXCEPTION hit, and 62 is the command address part.

Claims (1)

[Claims] A test method for a peripheral device subsystem (7) consisting of a peripheral device and an input/output control device and operated by commands, comprising a comprehensive function test command (5) that links a plurality of the commands.
0) and operates the peripheral device subsystem (7); an error command analysis section (12) that analyzes and extracts the command (51) that caused the error; A single function test section (13) is provided which causes the peripheral device subsystem (7) to execute the command (51) to analyze the cause of the error, and performs a comprehensive function test based on a series of linked commands. A test method for a peripheral device subsystem, characterized in that a single function test is performed by analyzing the command that caused the error.