JPS63258081A - Method for producing superconducting materials - Google Patents
Method for producing superconducting materialsInfo
- Publication number
- JPS63258081A JPS63258081A JP62093732A JP9373287A JPS63258081A JP S63258081 A JPS63258081 A JP S63258081A JP 62093732 A JP62093732 A JP 62093732A JP 9373287 A JP9373287 A JP 9373287A JP S63258081 A JPS63258081 A JP S63258081A
- Authority
- JP
- Japan
- Prior art keywords
- region
- temperature
- substrate
- superconducting
- tco
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000463 material Substances 0.000 title claims abstract description 38
- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 239000012535 impurity Substances 0.000 claims abstract description 21
- 239000000758 substrate Substances 0.000 claims abstract description 17
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 6
- 239000010703 silicon Substances 0.000 claims abstract description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 5
- 239000011777 magnesium Substances 0.000 claims description 4
- 239000007858 starting material Substances 0.000 claims description 4
- 239000010936 titanium Substances 0.000 claims description 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 3
- 229910052732 germanium Inorganic materials 0.000 claims description 3
- 229910052698 phosphorus Inorganic materials 0.000 claims description 3
- 239000011574 phosphorus Substances 0.000 claims description 3
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 2
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 2
- 229910052782 aluminium Inorganic materials 0.000 claims description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 2
- 229910052796 boron Inorganic materials 0.000 claims description 2
- 239000010941 cobalt Substances 0.000 claims description 2
- 229910017052 cobalt Inorganic materials 0.000 claims description 2
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims description 2
- 229910052733 gallium Inorganic materials 0.000 claims description 2
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 2
- 229910052749 magnesium Inorganic materials 0.000 claims description 2
- VSZWPYCFIRKVQL-UHFFFAOYSA-N selanylidenegallium;selenium Chemical compound [Se].[Se]=[Ga].[Se]=[Ga] VSZWPYCFIRKVQL-UHFFFAOYSA-N 0.000 claims description 2
- 229910052719 titanium Inorganic materials 0.000 claims description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims 3
- 229910052759 nickel Inorganic materials 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 11
- 239000013078 crystal Substances 0.000 abstract description 10
- 239000002887 superconductor Substances 0.000 abstract description 7
- 238000005468 ion implantation Methods 0.000 abstract description 6
- 230000001590 oxidative effect Effects 0.000 abstract description 5
- 238000004544 sputter deposition Methods 0.000 abstract description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 abstract description 3
- 238000010438 heat treatment Methods 0.000 abstract description 3
- 239000001301 oxygen Substances 0.000 abstract description 3
- 229910052760 oxygen Inorganic materials 0.000 abstract description 3
- 229920002120 photoresistant polymer Polymers 0.000 abstract description 2
- 229910002370 SrTiO3 Inorganic materials 0.000 abstract 1
- 230000015572 biosynthetic process Effects 0.000 abstract 1
- 238000001354 calcination Methods 0.000 abstract 1
- 238000009877 rendering Methods 0.000 abstract 1
- 239000000919 ceramic Substances 0.000 description 7
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- 239000010409 thin film Substances 0.000 description 5
- 239000010408 film Substances 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 239000011224 oxide ceramic Substances 0.000 description 3
- 229910052574 oxide ceramic Inorganic materials 0.000 description 3
- 238000000206 photolithography Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- 238000000137 annealing Methods 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229910002367 SrTiO Inorganic materials 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910052747 lanthanoid Inorganic materials 0.000 description 1
- 150000002602 lanthanoids Chemical class 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- VEALVRVVWBQVSL-UHFFFAOYSA-N strontium titanate Chemical compound [Sr+2].[O-][Ti]([O-])=O VEALVRVVWBQVSL-UHFFFAOYSA-N 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N60/00—Superconducting devices
- H10N60/80—Constructional details
- H10N60/85—Superconducting active materials
- H10N60/855—Ceramic superconductors
- H10N60/857—Ceramic superconductors comprising copper oxide
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N60/00—Superconducting devices
- H10N60/01—Manufacture or treatment
- H10N60/0268—Manufacture or treatment of devices comprising copper oxide
- H10N60/0296—Processes for depositing or forming copper oxide superconductor layers
- H10N60/0408—Processes for depositing or forming copper oxide superconductor layers by sputtering
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N60/00—Superconducting devices
- H10N60/01—Manufacture or treatment
- H10N60/0268—Manufacture or treatment of devices comprising copper oxide
- H10N60/0661—Processes performed after copper oxide formation, e.g. patterning
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N60/00—Superconducting devices
- H10N60/01—Manufacture or treatment
- H10N60/0884—Treatment of superconductor layers by irradiation, e.g. ion-beam, electron-beam, laser beam or X-rays
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Compositions Of Oxide Ceramics (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Semiconductor Integrated Circuits (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
Abstract
Description
【発明の詳細な説明】
「発明の利用分野」
本発明は、超電導セラミックスを用いて機能素子を作製
するため、選択的にTco(tlE抗が零となる温度)
の異なる領域を作製する方法に関する。DETAILED DESCRIPTION OF THE INVENTION Field of Application of the Invention The present invention provides a method for manufacturing functional elements using superconducting ceramics by selectively reducing Tco (the temperature at which the tlE resistance becomes zero).
The present invention relates to a method for producing different regions of the invention.
本発明は超電導セラミックスを用いた機能素子を同一基
板上に集積化せしめんとする際し、1つの素子における
活性領域または抵抗素子を作製せんとするものである。The present invention aims to fabricate an active region or a resistance element in one element when functional elements using superconducting ceramics are integrated on the same substrate.
「従来の技術」
従来、超電導材料はNb、Ge等の金属材料が用いられ
てきた。しかしこれらのTco (抵抗が零となる温度
)は23にと低く、実用化には高価な維持台用が必要で
あった。"Prior Art" Conventionally, metal materials such as Nb and Ge have been used as superconducting materials. However, their Tco (temperature at which resistance becomes zero) is as low as 23, and an expensive maintenance stand is required for practical use.
これに対し、近年セラミック系の超電導材料が注目され
ている。この材料は最初IBMのチューリッヒ研究所よ
りBa−La−Cu−0(バラク式)系酸化物超電導体
として報告されている。In contrast, ceramic-based superconducting materials have attracted attention in recent years. This material was first reported by IBM's Zurich Research Institute as a Ba-La-Cu-0 (barak type) oxide superconductor.
しかし、これらの酸化物セラミック超電導体はバルクの
タブレットを構成せしめたのみであった。However, these oxide ceramic superconductors were only made into bulk tablets.
また従来より知られていた金属超電導体に関しては、金
属材料であるため、たとえ基板上に薄膜構成せしめ得て
も、ジョセフソン素子等の機能素子を複数ケ作らんとし
た時、その機能素子の活性領域または抵抗素子等のシス
テム全体を一定温度(例えば液体窒素温度)で動作させ
る際に、それぞれの素子にもっとも必要なTcoまたは
Tcオンセットを人為的に制御せんとする試みはまった
くなかった。Furthermore, since conventionally known metal superconductors are metal materials, even if they can be formed into thin films on a substrate, when trying to fabricate multiple functional elements such as Josephson elements, it is difficult to When operating the entire system, such as the active region or resistive elements, at a constant temperature (e.g., liquid nitrogen temperature), there was no attempt to artificially control the most necessary Tco or Tc onset for each element.
「従来の問題点」
かかる従来技術においては、基板上に薄膜形成をさせ、
所定の動作温度で抵抗零となる超電導体をリードとして
用いるに加えて、系全体としては抵抗、アクティブ素子
を作らなければならない。"Conventional Problems" In such conventional technology, a thin film is formed on a substrate,
In addition to using a superconductor that has zero resistance at a given operating temperature as a lead, resistors and active elements must be made for the entire system.
しかしこれまでは単にTcoを高くさせればそれだけで
すべてが解決されるかの如き研究のみがなされている。However, until now, only research has been conducted that seems to solve everything by simply increasing Tco.
本発明人は特に酸化物超電導材料にあっては、従来より
知られた金属超電導材料とはまったく異なる方式をさせ
る可能性を見出した。The inventors of the present invention have discovered the possibility of using oxide superconducting materials in a manner completely different from that of conventionally known metal superconducting materials.
本発明はかかる目的を満たすものである。The present invention satisfies these objectives.
「問題を解決すべき手段」
本発明は酸化物超電導材料(単結晶または多結晶)に対
して、特に有効である。この酸化物は酸化せしめること
により超電導を呈する条件を有するもので、さらにこの
酸化物条件下において、Tc。"Means to Solve the Problem" The present invention is particularly effective for oxide superconducting materials (single crystal or polycrystal). This oxide has conditions that exhibit superconductivity when oxidized, and furthermore, under this oxide condition, Tc.
を変化(一般にはTcオンセットはあまり変わらず、T
coは下がる傾向を有する)せしめ得ることを実験的に
見出した。このTcoの変化量は超電導材料またはその
出発材料に対し、不純物を選択的に添加することにより
この添加された領域のみのTc。(Generally, Tc onset does not change much, and T
It has been experimentally found that the co. The amount of change in Tco can be determined by selectively adding impurities to the superconducting material or its starting material, thereby increasing the Tc only in the added region.
を下げることができることを見出した。found that it is possible to lower the
この領域はTcオンセントとTcoとの間の温度範囲を
もつ、いわゆる有限の抵抗を持つ超電導領域(遷移領域
ともいう)を多くさせることができる。This region can have a large number of superconducting regions (also called transition regions) with so-called finite resistance, which have a temperature range between Tc oncent and Tco.
さらにTcオンセントよりも高い温度領域である非超電
導領域をも人為的に制御し得た。Furthermore, it was also possible to artificially control the non-superconducting region, which is a temperature region higher than Tc oncent.
本発明は、単結晶または多結晶(セラミックス)の超電
導材料であって、その分子式は、例えば、(Al−X
Bx)ycuzOw x = O〜L y = 2〜4
好ましくは2.5〜3.5. z =1.0〜4.0好
ましくは1.5〜3.5゜W−4,0〜10.0好まし
くは6〜8の式で一般に示し得るものを用いた。この式
において、Aは元素周期表のma族における1種類また
は複数種類の元素であり、例えばイットリューム(Y)
またはランタノイドである。Bは元素周期表IIa族の
1種類または複数種類の元素よりなり、例えばバリュー
ム(Ba)である。The present invention relates to a single-crystal or polycrystalline (ceramic) superconducting material, the molecular formula of which is, for example, (Al-X
Bx) ycuzOw x = O~L y = 2~4
Preferably 2.5 to 3.5. z = 1.0 to 4.0, preferably 1.5 to 3.5 degrees, W-4, 0 to 10.0, preferably 6 to 8. In this formula, A is one or more elements in the ma group of the periodic table of elements, such as yttrium (Y).
Or lanthanoids. B is composed of one or more elements of Group IIa of the Periodic Table of Elements, and is, for example, barium (Ba).
本発明はかかる一般式で示される単結晶または多結晶の
薄膜(一般的には0.1〜30μ閑の厚さを有する)を
絶縁表面を有する基板上に形成する。In the present invention, a monocrystalline or polycrystalline thin film (generally having a thickness of 0.1 to 30 μm) represented by the general formula is formed on a substrate having an insulating surface.
そしてジョセフソン素子等の能動(アクティブ)素子、
抵抗等の受動(パッシブ)素子とするところ以外の不要
部分を公知のフォトリソグラフィ法により除去した。さ
らにこの残された超電導材料またはその出発材料のうち
の電極・リードとなる部分に対してはそのままマスクを
残し、または新たなマスクを配設し、有限抵抗とすべき
領域のみに対し、マスクを除去した。そしてこのマスク
のない領域のみイオン注入法により不純物を添加した。and active elements such as Josephson elements,
Unnecessary parts other than passive elements such as resistors were removed by a known photolithography method. Furthermore, for the parts of the remaining superconducting material or its starting material that will become electrodes and leads, leave the mask as it is, or place a new mask, and apply the mask only to the area that should have finite resistance. Removed. Then, impurities were added to only the region without this mask by ion implantation.
このイオン注入法により結晶構造に損傷を受けるため、
この後酸化性雰囲気で熱処理を施した。Because this ion implantation method damages the crystal structure,
After this, heat treatment was performed in an oxidizing atmosphere.
不純物としてはアルミニューム(At)、マグネシュー
ム(Mg)、ガリューム(Ga) 、珪素(Si)、ゲ
ルマニューム(Ge) 、チタン(Ti)、ジルコニュ
ーム(Zr)。Impurities include aluminum (At), magnesium (Mg), gallium (Ga), silicon (Si), germanium (Ge), titanium (Ti), and zirconium (Zr).
鉄(Fe)、 ニアケル(Ni)、コバルト(Co)、
ホウ素(B)。Iron (Fe), Niackel (Ni), Cobalt (Co),
Boron (B).
リン(P)をその代表例とし、うち1種類または複数種
類を用いている。Phosphorus (P) is a typical example thereof, and one or more types thereof are used.
またこの不純物は5×lO1′〜1×102′ケ/cm
’の量を注入添加した。In addition, this impurity is 5×1O1' to 1×102'/cm
'The amount of injection was added.
さらにこの後マスク材料を除去した後、700〜100
0℃の温度で酸化せしめ、この不純物の酸化物を添加領
域でアニールにより構成せしめ、Tcoの可変制御を行
った。その結果、かかる不純物が添加されていない領域
は、電極、リードとし、添加された領域を活性領域また
は抵抗領域とすることが可能となった。Furthermore, after removing the mask material, 700 to 100
Oxidation was carried out at a temperature of 0° C., and an oxide of this impurity was formed in the added region by annealing to perform variable control of Tco. As a result, it has become possible to use the regions to which such impurities are not added as electrodes and leads, and the regions to which such impurities are added to serve as active regions or resistance regions.
特にこのイオン注入後の酸化物雰囲気でのアニールは、
添加された不純物の酸化により理論的に超電導特性の妨
害をし、不純物の絶縁化と、添加による超電導抵抗の有
限領域および非超電導領域とを形成させた。In particular, annealing in an oxide atmosphere after ion implantation
The oxidation of the added impurity theoretically interferes with the superconducting properties, and the impurity insulates and forms a finite region of superconducting resistance and a non-superconducting region due to the addition.
「作用」
かくして絶縁性表面を有する基板上に設けられた単結晶
または多結晶の酸化物超電導体の上面と概略同一の高さ
を有する有限抵抗領域をこの超電導領域に隣接して設け
ることが可能となった。"Function" Thus, it is possible to provide a finite resistance region adjacent to the superconducting region having approximately the same height as the top surface of a single-crystal or polycrystalline oxide superconductor provided on a substrate having an insulating surface. It became.
またこの基板を絶縁表面を有するシリコン半導体とした
場合、その相互配線用のリード、電極を超電導材料で行
い、それに連結して抵抗を作ることが可能となった。Furthermore, when this substrate is made of a silicon semiconductor with an insulating surface, it has become possible to make the interconnection leads and electrodes of a superconducting material and connect them to create a resistor.
以下に実施例に従い本発明を説明する。The present invention will be described below with reference to Examples.
「実施例1」
本発明の実施例として、単結晶の酸化物超電導体を用い
た。即ち、絶縁性単結晶基板例えばチタン酸ストロンチ
ューム(SrTiO+)上にスパッタ法による成膜方法
を利用して単結晶薄膜を形成した。"Example 1" As an example of the present invention, a single crystal oxide superconductor was used. That is, a single crystal thin film was formed on an insulating single crystal substrate, such as strontium titanate (SrTiO+), using a sputtering method.
低周波のスバフタ装置のターゲットに成膜後で例えば(
YBaz)Cu30h=sとなる材料を設けた。この基
板上を700〜1000℃例えば850℃に加熱した。For example, (
A material was provided where YBaz)Cu30h=s. The top of this substrate was heated to 700 to 1000°C, for example 850°C.
そしてこのターゲットをスパッタして基板上に酸化物セ
ラミックスを成長させた。雰囲気はアルゴン−酸素の混
合ガスを用いた。This target was then sputtered to grow oxide ceramics on the substrate. The atmosphere used was a mixed gas of argon and oxygen.
かくして基板上に0.1〜1μmの膜厚の酸化物材料を
作製した。かくして超電導材料の出発材料を形成せしめ
た。In this way, an oxide material having a thickness of 0.1 to 1 μm was formed on the substrate. The starting material for the superconducting material was thus formed.
これを酸素中に800〜1000℃にて5〜50時間ア
ニールした。するとこの薄膜を単結晶の超電導材料とし
て変成することができた。This was annealed in oxygen at 800-1000°C for 5-50 hours. They were then able to transform this thin film into a single-crystal superconducting material.
第3図における曲線(20)はかかるセラミックスの温
度−比抵抗特性である。図面において、Tc。Curve (20) in FIG. 3 is the temperature-resistivity characteristic of such ceramics. In the drawings, Tc.
(22)、Tcオンセソl−(21)、遷移領域(超電
導をしつつも有限抵抗をもつ領域) (23)よりなる
。(22), Tc ONSEL-(21), and a transition region (a region that is superconducting but has finite resistance) (23).
かくして第1図(A)に示すように、基板(1)上に酸
化物超電導材料(2)を作製した。この後この上面にフ
ォトレジスト(3)を選択的にコーティングをした。Thus, as shown in FIG. 1(A), an oxide superconducting material (2) was produced on the substrate (1). Thereafter, a photoresist (3) was selectively coated on the upper surface.
第1図(B)に示す如く、このレジストの形成されてい
ない領域(5)に対し、珪素を5X10”〜1xlQZ
Iケ/cm”、例えば5X10”ケ/cmffの濃度で
イオン注入法(4)により添加した。As shown in FIG. 1(B), silicon is applied to the region (5) where the resist is not formed by 5×10” to 1×1QZ.
It was added by ion implantation method (4) at a concentration of 1 cm/cm, for example, 5 x 10" cm/cmff.
この後これら全体を再び酸化性雰囲気で700〜100
0℃の温度で加熱焼成した。するとレジスト(3)も炭
酸ガス、水等となり気化して除去させてしまうに加えて
、イオン注入をした領域(11)では注入された珪素が
酸化物(SiO□またはその変成物)の約0.1χ添加
され、その主成分を抵抗零の超電導を呈する領域(10
) (特性は第3図(24))と同一とさせることがで
きた。After this, the whole was heated again to 700 to 100 in an oxidizing atmosphere.
It was heated and baked at a temperature of 0°C. Then, the resist (3) also becomes carbon dioxide gas, water, etc. and is vaporized and removed. In addition, in the ion-implanted region (11), the implanted silicon becomes about 0% of the oxide (SiO□ or its modified product). .1χ is added to the region (10
) (The characteristics could be made the same as those shown in FIG. 3 (24)).
この不純物が添加された酸化物セラミックスの温度−比
抵抗の特性は第3図(20°)となっている。The temperature-resistivity characteristic of the oxide ceramic to which this impurity has been added is shown in FIG. 3 (20°).
即ち不純物の添加によりTco (22)はTco’
(22°)へとより低温側に移っていることがわかる。That is, due to the addition of impurities, Tco (22) becomes Tco'
It can be seen that the temperature has shifted to the lower temperature side (22°).
さらにこの低温側への移動はイオン注入法により添加さ
れた不純物の量により制御し得る。Furthermore, this movement to the lower temperature side can be controlled by the amount of impurities added by ion implantation.
この不純物添加領域(11)は以後の760〜1000
℃の高温処理工程等においても初期の超電導セラミック
スのTcoに比べて引き続き低いTco’を保持してい
た。This impurity doped region (11) is 760 to 1000 below.
Even in high-temperature treatment steps at .degree. C., Tco' continued to be lower than the Tco of early superconducting ceramics.
「実施例2」 第2図に本発明の実施例を示す。"Example 2" FIG. 2 shows an embodiment of the present invention.
図面において、基板(1)はトランジスタ等が設けられ
、半導体基板である。その一部表面は電極用の開穴(7
)を有し、他の表面は絶縁膜、例えば窒化珪素(9)を
その上表面に有する絶縁膜(6)である。半導体(1)
と窒化珪素(9)との間の絶縁膜(8)は酸化珪素であ
る。In the drawings, a substrate (1) is provided with transistors and the like and is a semiconductor substrate. Part of its surface has holes for electrodes (7
), and the other surface is an insulating film (6) having an insulating film, for example silicon nitride (9), on its upper surface. Semiconductor (1)
The insulating film (8) between the and silicon nitride (9) is silicon oxide.
これらの上面に実施例1と同様のスパッタ法により酸化
物超電導材料を形成した。公知のフォトリソグラフィ技
術により電極、リードおよび抵抗とする部分のパターニ
ングを行った。さらに選択的に不純物をイオン添加、注
入し、有限の抵抗領域(11)を実施例1に従って作製
した。これに連結した抵抗零の超電導領域(10) 、
(10’)によりこの領域は電気的に他と連結されて
いる。かくして液体窒素温度(77K)において抵抗が
零のリード、電極領域(10)と、有限の抵抗を有する
領域(11)とを構成させた。An oxide superconducting material was formed on these upper surfaces by the same sputtering method as in Example 1. Patterning of electrodes, leads, and portions to be resistors was performed using a known photolithography technique. Furthermore, impurity ions were selectively added and implanted to produce a finite resistance region (11) according to Example 1. A superconducting region (10) with zero resistance connected to this,
(10') electrically connects this region to others. In this way, a lead/electrode region (10) with zero resistance at liquid nitrogen temperature (77 K) and a region (11) with finite resistance were constructed.
この酸化物超電導材料は多結晶(セラミックス)であっ
た。This oxide superconducting material was polycrystalline (ceramic).
この実施例は、さらにこの上面に第2の絶縁膜(9°)
を窒化珪素により形成し、凹部を他の絶縁物(12)で
埋置した。そして開穴(7″)を形成した後、再び実施
例1と同様に超電導材料を形成し、フォトリソグラフィ
技術を用いてパターニングをし、電極、リード(13)
を構成せしめた。This embodiment further includes a second insulating film (9°) on this upper surface.
was formed of silicon nitride, and the recess was filled with another insulator (12). After forming an opening (7″), a superconducting material is formed again in the same manner as in Example 1, and patterned using photolithography to form electrodes and leads (13).
was constructed.
かくして多層配線を半導体集積回路基板上に形成するこ
とができた。In this way, multilayer wiring could be formed on the semiconductor integrated circuit board.
「効果」
本発明は、これまで超電導材料を単に抵抗が零のリード
としてのみ用いられていたことに対し、かかる強電導材
料に対し不純物を添加し、Tcoを初期状態より移し、
所望の動作温度(例えば液体窒素温度)にて所望の有限
の抵抗を有すべく制御した。"Effects" In contrast to the conventional use of superconducting materials only as leads with zero resistance, the present invention adds impurities to such strong conductive materials to shift Tco from its initial state.
It was controlled to have the desired finite resistance at the desired operating temperature (eg, liquid nitrogen temperature).
かくしてこの応用としてアクティブ素子の活性領域また
抵抗等を同一主成分材料で作ることが可能となり、それ
ぞれの領域の上面を概略同一表面を構成させ得、多層配
線が可能となった。In this way, as an application of this method, it became possible to make the active region of an active element, a resistor, etc. from the same main component material, and the upper surface of each region could be configured to be approximately the same surface, making multilayer wiring possible.
本発明において、酸化物超電導材料の作製方法としてス
パッタ法のみならず、印刷法、MBε(分子エピタキシ
ャル成長)法、気相法を用いることも可能である。In the present invention, it is possible to use not only the sputtering method but also the printing method, the MBε (molecular epitaxial growth) method, and the vapor phase method as a method for producing the oxide superconducting material.
第1図は本発明の不純物の添加方法の作製工程を示す。 第2図は本発明の実施例を示す。 第3図は本発明で得られた超電導材料の特性を示す。 FIG. 1 shows the manufacturing steps of the impurity addition method of the present invention. FIG. 2 shows an embodiment of the invention. FIG. 3 shows the characteristics of the superconducting material obtained by the present invention.
Claims (1)
に対し、選択された領域に不純物を添加した後、酸化雰
囲気にて加熱処理することにより超電導材料のTco(
抵抗が零となる温度)を低くすることを特徴とする超電
導材料の作製方法。 2、特許請求の範囲第1項において、不純物元素はアル
ミニューム(Al)、マグネシューム(Mg)、ガリュ
ーム(Ga)、珪素(Si)、ゲルマニューム(Ge)
、チタン(Ti)、ジルコニューム(Zr)、鉄(Fe
)、ニッケル(Ni)、コバルト(Co)、ホウ素(B
)、リン(P)より選ばれた1種類または複数種類より
なることを特徴とする超電導材料の作製方法。 3、特許請求の範囲第1項において、不純物は5×10
^1^5〜1×10^2^1ケ/cm^3の濃度に添加
されたことを特徴とする超電導材料の作製方法。[Claims] 1. After adding impurities to a selected region of a superconducting material formed on a substrate or its starting material, the Tco of the superconducting material (
A method for producing a superconducting material characterized by lowering the temperature at which the resistance becomes zero. 2. In claim 1, the impurity elements are aluminum (Al), magnesium (Mg), gallium (Ga), silicon (Si), germanium (Ge).
, titanium (Ti), zirconium (Zr), iron (Fe
), nickel (Ni), cobalt (Co), boron (B
), phosphorus (P), and phosphorus (P). 3. In claim 1, the impurity is 5×10
A method for producing a superconducting material, characterized in that it is added at a concentration of ^1^5 to 1x10^2^1/cm^3.
Priority Applications (10)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62093732A JP2670554B2 (en) | 1987-04-15 | 1987-04-15 | Method for producing oxide superconducting material |
| AU14573/88A AU599223B2 (en) | 1987-04-15 | 1988-04-13 | Superconducting ceramic pattern and its manufacturing method |
| DE3879536T DE3879536T3 (en) | 1987-04-15 | 1988-04-15 | Superconducting ceramic film and process for its production. |
| KR1019880004307A KR910004994B1 (en) | 1987-04-15 | 1988-04-15 | Superconducting ceramic pattern and its manufacturing method |
| EP88303404A EP0287383B2 (en) | 1987-04-15 | 1988-04-15 | Superconducting ceramic film and a method of manufacturing the same |
| CN88102320A CN1018115B (en) | 1987-04-15 | 1988-04-15 | Superconducting ceramic pattern and manufacturing method thereof |
| US07/488,252 US5098884A (en) | 1987-04-15 | 1990-03-05 | Method for producing a superconducting pattern by doping impurities |
| US07/829,531 US5401716A (en) | 1987-04-15 | 1992-02-03 | Method for manufacturing superconducting patterns |
| US08/323,088 US5512540A (en) | 1987-04-15 | 1994-10-14 | Method of manufacturing superconducting patterns |
| US08/443,170 US5877124A (en) | 1987-04-15 | 1995-05-17 | Superconducting ceramic pattern and its manufacturing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62093732A JP2670554B2 (en) | 1987-04-15 | 1987-04-15 | Method for producing oxide superconducting material |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63258081A true JPS63258081A (en) | 1988-10-25 |
| JP2670554B2 JP2670554B2 (en) | 1997-10-29 |
Family
ID=14090583
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62093732A Expired - Fee Related JP2670554B2 (en) | 1987-04-15 | 1987-04-15 | Method for producing oxide superconducting material |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2670554B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02298086A (en) * | 1989-05-12 | 1990-12-10 | Matsushita Electric Ind Co Ltd | Manufacture of superconductive device |
| CN116322281A (en) * | 2023-03-21 | 2023-06-23 | 核工业西南物理研究院 | A processing method beneficial to improving superconducting current-carrying performance, superconducting layer, and superconducting material |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5873712A (en) * | 1981-10-27 | 1983-05-04 | Nippon Steel Corp | Recovering method for waste gas of top and bottom blown converter without combustion |
-
1987
- 1987-04-15 JP JP62093732A patent/JP2670554B2/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5873712A (en) * | 1981-10-27 | 1983-05-04 | Nippon Steel Corp | Recovering method for waste gas of top and bottom blown converter without combustion |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02298086A (en) * | 1989-05-12 | 1990-12-10 | Matsushita Electric Ind Co Ltd | Manufacture of superconductive device |
| CN116322281A (en) * | 2023-03-21 | 2023-06-23 | 核工业西南物理研究院 | A processing method beneficial to improving superconducting current-carrying performance, superconducting layer, and superconducting material |
| CN116322281B (en) * | 2023-03-21 | 2026-02-03 | 核工业西南物理研究院 | Treatment method beneficial to improving superconducting current carrying performance, superconducting layer and superconducting material |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2670554B2 (en) | 1997-10-29 |
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