JPS6333182B2 - - Google Patents

Info

Publication number
JPS6333182B2
JPS6333182B2 JP58020156A JP2015683A JPS6333182B2 JP S6333182 B2 JPS6333182 B2 JP S6333182B2 JP 58020156 A JP58020156 A JP 58020156A JP 2015683 A JP2015683 A JP 2015683A JP S6333182 B2 JPS6333182 B2 JP S6333182B2
Authority
JP
Japan
Prior art keywords
flip
scan loop
scan
data pattern
flop
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58020156A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59146351A (ja
Inventor
Osamu Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58020156A priority Critical patent/JPS59146351A/ja
Publication of JPS59146351A publication Critical patent/JPS59146351A/ja
Publication of JPS6333182B2 publication Critical patent/JPS6333182B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318566—Comparators; Diagnosing the device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP58020156A 1983-02-09 1983-02-09 スキヤンル−プに於けるエラ−発生方式 Granted JPS59146351A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58020156A JPS59146351A (ja) 1983-02-09 1983-02-09 スキヤンル−プに於けるエラ−発生方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58020156A JPS59146351A (ja) 1983-02-09 1983-02-09 スキヤンル−プに於けるエラ−発生方式

Publications (2)

Publication Number Publication Date
JPS59146351A JPS59146351A (ja) 1984-08-22
JPS6333182B2 true JPS6333182B2 (de) 1988-07-04

Family

ID=12019291

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58020156A Granted JPS59146351A (ja) 1983-02-09 1983-02-09 スキヤンル−プに於けるエラ−発生方式

Country Status (1)

Country Link
JP (1) JPS59146351A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0545211U (ja) * 1991-11-22 1993-06-18 大建プラスチツクス株式会社 表示用文字体

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5833579B2 (ja) * 1977-05-31 1983-07-20 株式会社日立製作所 情報処理装置
JPS5676855A (en) * 1979-11-29 1981-06-24 Hitachi Ltd Pseudo fault generating system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0545211U (ja) * 1991-11-22 1993-06-18 大建プラスチツクス株式会社 表示用文字体

Also Published As

Publication number Publication date
JPS59146351A (ja) 1984-08-22

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