JPS6355351B2 - - Google Patents
Info
- Publication number
- JPS6355351B2 JPS6355351B2 JP56188746A JP18874681A JPS6355351B2 JP S6355351 B2 JPS6355351 B2 JP S6355351B2 JP 56188746 A JP56188746 A JP 56188746A JP 18874681 A JP18874681 A JP 18874681A JP S6355351 B2 JPS6355351 B2 JP S6355351B2
- Authority
- JP
- Japan
- Prior art keywords
- ampoule
- cutter
- semi
- neck
- microphone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000003708 ampul Substances 0.000 claims description 30
- 238000005520 cutting process Methods 0.000 claims description 13
- 238000000034 method Methods 0.000 claims description 13
- 239000011265 semifinished product Substances 0.000 claims description 11
- 230000002950 deficient Effects 0.000 claims description 5
- 210000003739 neck Anatomy 0.000 description 18
- 239000000047 product Substances 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 3
- 239000011324 bead Substances 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/045—Analysing solids by imparting shocks to the workpiece and detecting the vibrations or the acoustic waves caused by the shocks
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Medical Preparation Storing Or Oral Administration Devices (AREA)
Description
【発明の詳細な説明】
本発明はアンプルの頸部に切削する浅い疵線の
有無を音響的に探知する方法の関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for acoustically detecting the presence or absence of shallow flaw lines cut into the neck of an ampoule.
最近はアンプルの頸部に浅い疵線を切削し、カ
ツト石を用いないで枝管を切断できるようにした
サンプルが使用されている。このアンプルには頸
部の全周に浅い疵線を切つてイージ液を塗つたニ
ユーイージ付きアンプルと、頸部に極く短くかつ
浅い疵線を切削してその直ぐ上の玉部に目印用の
マークをつけたワンポイントアンプルがある。い
ずれのアンプルも疵線が切削されているかどうか
を調べる必要があり、その探知方法としてカツタ
ーの昇降を光電的に探知するとか、疵線を微細な
針先でさぐつてその有無をセンサーに感知させる
方法が考えられる。しかし前者は何らかの原因で
カツターがアンプルの頸部に触れなくても良品の
判定が出るし、後者は疵線が極めて短くかつ浅い
から精度が低い欠点がある。又カツターが疵線を
切削する際の切削音をマイクで直接とらえる方法
も考えられるが、この方法は微弱な切削音が周囲
の雑音に包込まれてしまうから、疵線の探知方法
として不適格である。 Recently, samples have been used in which a shallow flaw line is cut into the neck of the ampoule, making it possible to cut the branch pipe without using a cutting stone. This ampoule includes an ampoule with a New Ease, in which a shallow flaw line is cut all around the neck and an easy liquid is applied, and an extremely short and shallow flaw line is cut in the neck area, and a mark is placed on the bead immediately above the flaw line. There is a one-point ampoule with a mark on it. In each ampoule, it is necessary to check whether or not the flaw line has been cut, and this can be detected by photoelectrically detecting the rise and fall of the cutter, or by probing the flaw line with a fine needle tip and using a sensor to detect the presence or absence of the flaw line. There are ways to do this. However, with the former, for some reason the cutter does not touch the neck of the ampoule, it is judged as being good, and with the latter, the flaw line is extremely short and shallow, resulting in low accuracy. Another possibility is to use a microphone to directly capture the cutting sound when the cutter cuts the flaw line, but this method is not suitable as a method for detecting flaw lines because the weak cutting sound is enveloped by surrounding noise. It is.
本発明は円板状のカツターを回転させつつアン
プル半製品の頸部に接触させると、その切削音に
共鳴して胴部に共鳴音が発生することを利用する
もので、カツターの接触と同期してアンプル半製
品の胴部にマイクを当て、胴部の共鳴音をマイク
でとらえて周囲の雑音に関係なく疵線の有無を音
響的に探知し、これによりアンプルの頸部に切削
される浅い疵線を確実にか自動的に探知すること
に成功したのである。 The present invention utilizes the fact that when a disc-shaped cutter is rotated and brought into contact with the neck of a semi-finished ampoule product, the cutting sound resonates and a resonance sound is generated in the body, which is synchronized with the contact of the cutter. Then, a microphone is applied to the body of the ampoule semi-finished product, and the resonance sound of the body is captured by the microphone to acoustically detect the presence or absence of flaws regardless of surrounding noise. They succeeded in reliably and automatically detecting shallow flaw lines.
図面に示す実施態様において、1はアンプルの
半製品で、アンプル2本分の胴部2の両端に細長
い枝管3,3が連なり、枝管の根元を絞つて頸部
4が設けられている。このアンプル半製品はアン
プル製造機械の疵線工程にあり、前工程で枝管
3,3を一定長に切断したものが供給され、次の
胴切り工程へ送込まれてアンプルの完成品とな
る。疵線工程は断面U字形又」形をなす多数のキ
ヤタピラを相接して取付けたコンベヤを備え、ア
ンプル半製品を1本ずつキヤタピラに納めてコン
ベヤを間欠的に進行させる。5,15は薄い円板
状のカツターで、コンベヤの手前側と向う側にそ
の進行方向にアンプル半製品数本の間隔をずらし
てその頸部4,4の直下に配置し、適時に揺動す
る小形のモータ6,16に装着して常時回転さ
せ、モータの起上りにより頸部4に下から軽るく
接触して極めて短かくかつ浅い疵線を切削する。 In the embodiment shown in the drawings, 1 is a semi-finished ampoule product, in which a body 2 of two ampoules has elongated branch pipes 3, 3 connected to both ends, and a neck 4 is provided by constricting the base of the branch pipe. . This ampoule semi-finished product is in the flawing process of the ampoule manufacturing machine, and the branch pipes 3, 3 cut to a certain length in the previous process are supplied and sent to the next body cutting process to form the finished ampoule. The flaw line process is equipped with a conveyor in which a large number of caterpillars each having a U-shaped cross section are mounted adjacent to each other, and semi-finished ampoules are placed one by one in the caterpillars, and the conveyor is moved intermittently. Reference numerals 5 and 15 indicate thin disk-shaped cutters, which are placed directly below the necks 4, 4 of several semi-finished ampoule products at different intervals in the direction of movement on the front side and the opposite side of the conveyor, and are swung at appropriate times. It is attached to a small motor 6, 16 and rotated constantly, and as the motor rises, it lightly contacts the neck 4 from below to cut an extremely short and shallow flaw line.
7,17は2つのマイクで、それぞれカツター
5,15の接触と同期してアンプル半製品の胴部
2に当接し、カツターに切削音に共鳴して胴部に
発生する共鳴音をとらえる。8,18はそれぞれ
モータ6,16を揺動させるカムで、頸部4に対
してカツター5,15の離接動作の運動源とな
り、カツターが接触するとスイツチ9,19によ
り切削信号を送出す。10はマイク7,17と制
御箱20との間に設ける中継箱で、マイクの信号
はこの中継箱を経て制御箱20へ送られる。制御
箱20は各マイク毎にフイルター21,31、比
較器22,32、整形器23,33、増巾器2
4,34、積分器25,35及び判定器26,3
6が直列に接続され、スイツチ9,19からくる
切削信号は積分器25,35に加えられる。なお
整形器23,33は再トリガ形単安定マルチバイ
ブレータである。 Reference numerals 7 and 17 denote two microphones, which contact the body 2 of the ampoule semi-finished product in synchronization with the contact of the cutters 5 and 15, respectively, and capture the resonance sound generated in the body by resonating with the cutting sound of the cutter. Cams 8 and 18 swing the motors 6 and 16, respectively, and serve as a source of motion for moving the cutters 5 and 15 toward and away from the neck 4, and when the cutters come into contact, switches 9 and 19 send cutting signals. Reference numeral 10 denotes a relay box provided between the microphones 7, 17 and the control box 20, and signals from the microphones are sent to the control box 20 via this relay box. The control box 20 includes filters 21 and 31, comparators 22 and 32, shapers 23 and 33, and amplifier 2 for each microphone.
4, 34, integrator 25, 35 and determiner 26, 3
6 are connected in series, and the cutting signals coming from switches 9 and 19 are applied to integrators 25 and 35. Note that the shapers 23 and 33 are retrigger type monostable multivibrators.
本発明に係る疵線探知方法の一実施態様を具体
的に説明すると次の通りである。 An embodiment of the flaw line detection method according to the present invention will be specifically described as follows.
アンプル製造機械が作動すると、枝管3,3を
一定長に切断したアンプル半製品が前工程から疵
線工程へ供給され、疵線工程のモータ6,16が
付勢されてカツター5,15を常時回転させ、コ
ンベヤはキヤタピラにアンプル半製品を1本ずつ
納めて間欠的に進行する。コンベヤの一時停止中
にカム8によりカツター5がアンプル半製品の手
前側の頸部4に軽るく接触して極めて浅くかつ短
い疵線を切削し、カツターの接触と同期して集音
マイク7が胴部2の手前寄りに当接し、カツター
の切削音に共鳴して胴部に発生する共鳴をとらえ
る。カツター5とマイク7は直ちに頸部4及び胴
部2から離れ、このアンプル半製品がコンベヤの
間欠進行に伴つて数本分を移動して停止すると、
向う側のカツター15がカム18により頸部に軽
るく接触して極めて短くかつ浅い疵線を切削し、
これに同期してマイク17が胴部に当接して共鳴
音をとらえ、カツター15とマイク17は直ちに
頸部4と胴部2から離れる。 When the ampoule manufacturing machine operates, the ampoule semi-finished product obtained by cutting the branch pipes 3 and 3 into a certain length is supplied from the previous process to the scoring process, and the motors 6 and 16 in the scoring process are energized to drive the cutters 5 and 15. The conveyor is constantly rotating, and the conveyor feeds semi-finished ampoules one by one onto the caterpillar and moves intermittently. While the conveyor is temporarily stopped, the cutter 5 is brought into light contact with the neck 4 on the front side of the ampoule semi-finished product by the cam 8 to cut an extremely shallow and short flaw line, and the sound collecting microphone 7 is synchronized with the contact of the cutter. comes into contact with the front side of the body 2 and captures the resonance generated in the body due to the cutting sound of the cutter. The cutter 5 and microphone 7 immediately separate from the neck 4 and body 2, and when the ampoule semi-finished product moves several lengths and stops as the conveyor moves intermittently,
The cutter 15 on the other side lightly contacts the neck with the cam 18 and cuts an extremely short and shallow flaw line,
In synchronization with this, the microphone 17 comes into contact with the torso and captures the resonance sound, and the cutter 15 and the microphone 17 immediately separate from the neck 4 and the torso 2.
マイク7,17の信号は中継箱10を経て制御
箱20に入り、制御箱はこの信号をフイルター2
1,31に通して有効成分のみを抽出し、これを
比較器22,32に入れて設定値を越えたものを
信号有りと認める。比較器22,32の単発出力
は整形器23,33に入つて所定巾のパルスに整
形され、これに増巾器24,34で増巾したのち
積分器25,35に加える。積分器は整形器2
3,33からくるパルス列の時間積分を行うの
で、パルス数に対する比例性が得られ、この積分
器にスイツチ9,19からくる切削信号も加えら
れる。こゝに整形器23,33が再トリガ形単安
定マルチバイブレータであるから、マイク17が
過大な共鳴音をとらえ、飽和信号がフイルター2
1,31を通つて比較器22,32に入つても、
整形器23,33の応答は一度しか出力せず、従
つて積分器25,35の時間積分に影響しない。
続いて判定器26,36が積分器25,35の出
力が設定値を越えたかどうか、即ち有効信号が所
定時間続いたかどうかを判定して良品信号と不良
信号を送出し、良品信号はカウンタに入つて良品
を計数し、不良信号は記憶器(図示なし)に入つ
て不良品がコンベヤの終端に達する時期に次工程
への渡り板(図示なし)を開き、不良のアンプル
半製品を収納箱(図示なし)へ落下させてアンプ
ル製造機械から除去する。 The signals from the microphones 7 and 17 enter the control box 20 via the relay box 10, and the control box passes this signal to the filter 2.
1 and 31 to extract only the effective components, which are input to comparators 22 and 32, and if the value exceeds the set value, it is recognized as a signal. The single outputs of the comparators 22 and 32 enter the shapers 23 and 33 and are shaped into pulses of a predetermined width, amplified by the amplifiers 24 and 34, and then applied to the integrators 25 and 35. Integrator is shaper 2
Since the pulse train coming from switches 3 and 33 is time-integrated, proportionality to the number of pulses can be obtained, and the cutting signals coming from switches 9 and 19 are also added to this integrator. Since the shapers 23 and 33 are retrigger type monostable multivibrators, the microphone 17 captures excessive resonance sound, and the saturated signal is transmitted to the filter 2.
Even if it passes through 1 and 31 and enters the comparators 22 and 32,
The responses of the shapers 23, 33 are output only once and therefore do not affect the time integration of the integrators 25, 35.
Next, the determiners 26 and 36 determine whether the outputs of the integrators 25 and 35 have exceeded the set value, that is, whether the valid signal has continued for a predetermined period of time, and send out a good signal and a bad signal, and the good signal is sent to the counter. Good products are counted, and a defective signal is sent to a storage device (not shown). When the defective products reach the end of the conveyor, the connecting plate (not shown) to the next process is opened, and the defective ampoule semi-finished products are transferred to a storage box (not shown). (not shown) and removed from the ampoule making machine.
以上は本発明の一実施態様を説明したもので、
本発明はこの実施態様に限定されることなく、発
明の要旨内において設計変更できる。例えば本発
明はアンプル半製品を回転させつつその頸部にカ
ツターを接触させ、頸部の全周に浅い疵線を切削
してイージ液を塗るニユーイージ付きアンプルに
そのまゝ使用できるし、アンプル以外のガラス管
の加工品にも応用できる。又この実施態様におい
ては疵線の直ぐ上の玉部に目印用のマークをつけ
るが、これは本発明に関係がないから省略した。 The above describes one embodiment of the present invention.
The present invention is not limited to this embodiment, but can be modified within the spirit of the invention. For example, the present invention can be used as is in an ampoule with a new easer, in which a cutter is brought into contact with the neck of a semi-finished ampoule product while rotating it, and a shallow flaw line is cut all around the neck and the easer is applied. It can also be applied to processed glass tube products. Further, in this embodiment, a mark is provided on the bead immediately above the flaw line, but this is omitted because it is not related to the present invention.
本発明においては円板状の回転カツターでアン
プル半製品の頸部に疵線を切削する際その切削音
に共鳴して胴部に共鳴音が発生することを利用
し、カツターの接触と同期してアンプル半製品の
胴部にマイクを当てるから、胴部の共鳴音をマイ
クでとらえて周囲の雑音に関係なく疵線の有無を
音響的に探知することができ、これによりアンプ
ルの頸部に切削される浅い疵線を確実にかつ自動
的に探知することが可能となり、ワンポイントア
ンプルやニユーイージ付きアンプルの製造工程に
おける不良品の混入ミスを皆無となしうる効果を
有する。 In the present invention, when a flaw wire is cut into the neck of a semi-finished ampoule with a disc-shaped rotary cutter, the cutting sound resonates and a resonance sound is generated in the body, which is synchronized with the contact of the cutter. Since a microphone is placed on the body of the ampoule semi-finished product, the resonance sound of the body can be captured by the microphone and the presence or absence of flaws can be acoustically detected regardless of surrounding noise. It becomes possible to reliably and automatically detect shallow flaw lines to be cut, and has the effect of completely eliminating errors in the mixing of defective products in the manufacturing process of one-point ampoules and ampoules with New Easy.
図面は本発明方法の一実施態様を示す疵線工程
及び制御回路の系統図である。
なお1はアンプル半製品、4は頸部、5と15
はカツター、7と17はマイク、26と36は判
定器である。
The drawing is a system diagram of a flaw line process and a control circuit showing one embodiment of the method of the present invention. Note that 1 is the ampoule semi-finished product, 4 is the neck, 5 and 15
is a cutter, 7 and 17 are microphones, and 26 and 36 are judgers.
Claims (1)
部に接触させて疵線を切り、カツターの接触と同
期してアンプル半製品の胴部にマイクを当て、カ
ツターの切削音に共鳴して胴部に発生する共鳴音
をマイクでとらえ、これの信号を判定して所定の
レベル以下の場合に不良信号を送出すことを特徴
とするアンプルの疵線探知方法。1 A disc-shaped rotary cutter is brought into contact with the neck of the ampoule semi-finished product to cut the flaw line, and in synchronization with the contact of the cutter, a microphone is applied to the body of the ampoule semi-finished product, and the body resonates with the cutting sound of the cutter. 1. A method for detecting flaws in an ampoule, characterized by capturing resonance sound generated in the ampoule with a microphone, determining the signal thereof, and transmitting a defective signal if the resonance sound is below a predetermined level.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56188746A JPS5888655A (en) | 1981-11-24 | 1981-11-24 | Detecting method for flaw line of ampule |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56188746A JPS5888655A (en) | 1981-11-24 | 1981-11-24 | Detecting method for flaw line of ampule |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5888655A JPS5888655A (en) | 1983-05-26 |
| JPS6355351B2 true JPS6355351B2 (en) | 1988-11-02 |
Family
ID=16229042
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56188746A Granted JPS5888655A (en) | 1981-11-24 | 1981-11-24 | Detecting method for flaw line of ampule |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5888655A (en) |
-
1981
- 1981-11-24 JP JP56188746A patent/JPS5888655A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5888655A (en) | 1983-05-26 |
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