JPS6360332B2 - - Google Patents
Info
- Publication number
- JPS6360332B2 JPS6360332B2 JP19612682A JP19612682A JPS6360332B2 JP S6360332 B2 JPS6360332 B2 JP S6360332B2 JP 19612682 A JP19612682 A JP 19612682A JP 19612682 A JP19612682 A JP 19612682A JP S6360332 B2 JPS6360332 B2 JP S6360332B2
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- measured
- temperature
- point
- induced voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 17
- 230000005284 excitation Effects 0.000 claims description 14
- 230000035699 permeability Effects 0.000 claims description 14
- 238000009529 body temperature measurement Methods 0.000 claims description 11
- 238000000034 method Methods 0.000 claims description 7
- 238000005259 measurement Methods 0.000 claims description 5
- 230000001360 synchronised effect Effects 0.000 description 7
- 238000005096 rolling process Methods 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 239000000696 magnetic material Substances 0.000 description 4
- 230000010355 oscillation Effects 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000005098 hot rolling Methods 0.000 description 3
- 230000010363 phase shift Effects 0.000 description 3
- 238000012937 correction Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/36—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using magnetic elements, e.g. magnets, coils
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Description
【発明の詳細な説明】
本発明は、プローブ型渦流検出コイルを用いる
温度測定方法に関し、とくに検出コイルの寸法に
対して厚さが無限大とみなされる厚さを持つた磁
性体の表面及び表面近傍の温度を測定する方法に
関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a temperature measurement method using a probe-type eddy current detection coil, and in particular to a method for measuring temperature using a probe-type eddy current detection coil, and in particular, the surface of a magnetic material whose thickness is considered to be infinite with respect to the dimensions of the detection coil. It relates to a method of measuring nearby temperature.
たとえば熱間圧延作業において、圧延ロールの
表面及び表面近傍の温度は、圧延製品の品質及び
ロール自身の寿命に大きな影響を与えるため、そ
の温度変化を知ることは圧延作業管理上極めて重
要なことである。しかし圧延中は、ロールは高速
で回転しているので、直接感温素子をロールに接
触して温度を測定することは出来ず、さらには冷
却水による水膜が存在しかつ水蒸気が充満してい
る雰囲気であるので、放射温度計を用いたとして
も所望の測定精度を得ることは難しい。また渦流
式温度計を用いる測温法もあるが、従来の渦流式
温度計は、測定温度範囲が低温部に限られてお
り、熱間圧延時のロールのようにその表面温度が
600℃付近まで上るものに対しては、被測定物の
透磁率変化による出力の変化が複雑になるため、
適用不能であつた。 For example, in hot rolling operations, the temperature at and near the surface of a rolling roll has a major impact on the quality of rolled products and the life of the roll itself, so knowing the temperature changes is extremely important for managing rolling operations. be. However, during rolling, the rolls are rotating at high speed, so it is not possible to measure the temperature by directly contacting the temperature sensor with the rolls, and furthermore, there is a water film caused by cooling water and the rolls are filled with water vapor. Even if a radiation thermometer is used, it is difficult to obtain the desired measurement accuracy. There is also a temperature measurement method that uses an eddy current thermometer, but with conventional eddy current thermometers, the measurement temperature range is limited to low temperature areas, and the surface temperature of the rolls during hot rolling is limited.
For objects that heat up to around 600℃, changes in output due to changes in magnetic permeability of the object to be measured become complicated.
It was not applicable.
本発明は、水膜が存在しかつ水蒸気が充満した
雰囲気における圧延ロールのような物体の表面及
び表面近傍の温度を、広い温度範囲にわたつて非
接触で測定する温度測定方法を提供するものであ
る。 The present invention provides a temperature measurement method that non-contactly measures the temperature at and near the surface of an object such as a rolling roll in an atmosphere where a water film exists and is filled with water vapor over a wide temperature range. be.
以下本発明を詳しく説明する。 The present invention will be explained in detail below.
圧延ロールのような磁性体の透磁率、導電率な
ど電気特性、磁気特性は温度によつて変化するの
で、被測定物表面に近接して設けた検出コイルの
1次コイルに高周波の励磁電流を流した場合に、
被測定物の表面近傍に生ずる渦電流は、被測定物
の温度変化によつて変化する。この渦電流の変化
は、1次コイルの内側に同軸上に配置された2次
コイルの出力電圧の変化となつて現われ、この出
力電圧の変化により被測定物の温度変化を測定す
ることができる。 Electrical and magnetic properties such as magnetic permeability and conductivity of magnetic materials such as rolling rolls change with temperature, so it is necessary to apply a high-frequency excitation current to the primary coil of a detection coil installed close to the surface of the object to be measured. If it flows,
Eddy currents generated near the surface of the object to be measured change depending on changes in the temperature of the object to be measured. Changes in this eddy current appear as changes in the output voltage of the secondary coil coaxially arranged inside the primary coil, and changes in the temperature of the object to be measured can be measured by changes in the output voltage. .
いま、第1図に示したような1次コイル1と2
次コイル2を同軸に配置した検出コイル構成にお
いて、コイルの大きさ、形状、巻数、電流および
被測定物の厚さを一定としたとき、2次コイル2
に誘起される電圧V2は、被測定物Sの透磁率μ、
導電率σ、被測定物と検出コイルとの間の距離
(以下リフトオフという)d、1次コイル1に流
す励磁電流の周波数fによつて決まる。ここで2
次コイル誘起電圧V2を複素電圧平面上に示すと
つぎのようになる。 Now, primary coils 1 and 2 as shown in Fig.
In a detection coil configuration in which the secondary coil 2 is arranged coaxially, when the coil size, shape, number of turns, current, and thickness of the object to be measured are constant, the secondary coil 2
The voltage V 2 induced in is the magnetic permeability μ of the object to be measured S,
It is determined by the conductivity σ, the distance d between the object to be measured and the detection coil (hereinafter referred to as lift-off), and the frequency f of the excitation current flowing through the primary coil 1. Here 2
The next coil induced voltage V 2 is shown on the complex voltage plane as follows.
透磁率μ、導電率σ、リフトオフd、周波数
fの一定の値の組合せに対して、誘起電圧V2
の値が一つ定まり、これは複素電圧平面内の1
点Aで表わされる。すなわち
V2=func.(μ、σ、d、f) …(1)
と表わされる。 For a combination of fixed values of magnetic permeability μ, conductivity σ, liftoff d, and frequency f, the induced voltage V 2
One value is determined, which is 1 in the complex voltage plane.
It is represented by point A. That is, it is expressed as V 2 =func.(μ, σ, d, f) (1).
導電率σと周波数fのいずれか一方あるいは
両方が変化すると点Aはある一定のカーブを描
く。これをカーブCnとすると、点Aは導電率
σと周波数fの積(σ×f)が増加(減少)す
ると、カーブCn上を右まわり(左まわり)に
動く。すなわち
V2=func.(σ×f、μ、d) …(2)
と表わされる。 When either or both of conductivity σ and frequency f changes, point A draws a certain curve. Assuming that this is a curve Cn, the point A moves clockwise (counterclockwise) on the curve Cn as the product (σ×f) of conductivity σ and frequency f increases (decreases). That is, it is expressed as V 2 =func.(σ×f, μ, d) (2).
これを図で示すと第2図のようになる。第2
図において横軸は誘起電圧V2の実数成分であ
り、縦軸は誘起電圧V2の虚数成分である。た
だしここで誘起電圧V2の実数部VReおよび虚
数部VImを被測定物がない場合の誘起電圧Vo
の絶対値をもつて規準化してある。 This is illustrated in Figure 2. Second
In the figure, the horizontal axis is the real component of the induced voltage V 2 , and the vertical axis is the imaginary component of the induced voltage V 2 . However, here, the real part V R e and the imaginary part V I m of the induced voltage V 2 are the induced voltage Vo when there is no object to be measured.
It is normalized by the absolute value of .
図において、μ、σ、d、fのある一定の組
合せに対応する点Aは、(σ×f)が増加(減
少)するとカーブCn上を右まわり(左まわり)
に動く。 In the figure, point A corresponding to a certain combination of μ, σ, d, f rotates clockwise (counterclockwise) on curve Cn as (σ×f) increases (decreases).
move to.
透磁率μが増加(減少)すると、第2図のカ
ーブCnが同図のカーブCM(カーブCo)の方向
に変化する。ここでカーブCoは被測定物が非
磁性体すなわち透磁率μがμ=1.0×4π×10-7
〔H/m〕の場合のカーブである。透磁率μが
大きくなるに従いカーブはCoから上方にふく
らんでいくが、カーブのふくらみは一定の大き
さに飽和し図中CMとして示すカーブに漸次に
接近し、透磁率μが検出コイルの寸法と被測定
物の厚みとによつて定まるある一定の透磁率の
値(これをμmとする)以上になると、点Aは
カーブCM上をK=μ/σ×fをパラメータとして
動く様にする。すなわち
V2=func.(μ/σ×f′d) …(3)
ただし(μ≧μm)
と表わされる。なお上記においてカーブの上方
へのふくらみが飽和する透磁率μの値μ=μm
は、被測定物の厚みが大きく(小さく)なる
と、小さな(大きな)値となる。 When the magnetic permeability μ increases (decreases), the curve Cn in FIG. 2 changes in the direction of the curve C M (curve Co) in the same diagram. Here, the curve Co indicates that the object to be measured is a non-magnetic material, that is, the magnetic permeability μ is μ=1.0×4π×10 -7
This is a curve for [H/m]. As the magnetic permeability μ increases, the curve swells upward from Co, but the bulge of the curve saturates to a certain size and gradually approaches the curve shown as C M in the figure, and the magnetic permeability μ increases as the size of the detection coil increases. When the magnetic permeability exceeds a certain value (which is defined as μm ) determined by do. That is, V 2 =func.(μ/σ×f′d) (3) where (μ≧μm). In addition, in the above, the value of magnetic permeability μ at which the upward bulge of the curve is saturated μ = μm
becomes a smaller (larger) value as the thickness of the object to be measured becomes larger (smaller).
さらに、周波数fが検出コイルの寸法によつ
て定まるある一定周波数の値(これをfmとす
る)以上になると、透磁率μがμmより大きく
ても小さくても点AはカーブCM(カーブCnを含
めて)の下部をK=μ/σ×fをパラメータとし
て動くようになる。すなわち
V2=func.(μ/σ×f′、d) …(4)
ただし(f≧fm)
リフトオフdを大きくすると、点Aは第2図
の縦軸の目盛1.0の点Bに向つて動く。 Furthermore, when the frequency f exceeds a certain frequency value determined by the dimensions of the detection coil (this is called fm), point A will curve C M (curve Cn ) with K=μ/σ×f as a parameter. That is, V 2 = func. (μ/σ×f′, d) …(4) However, (f≧fm) When lift-off d is increased, point A moves toward point B on the scale of 1.0 on the vertical axis in Figure 2. Move.
本発明は、上述の様な誘起電圧V2の複素電圧
平面上での挙動についての知見にもとづいて創案
されたものである。 The present invention was created based on the knowledge about the behavior of the induced voltage V 2 on the complex voltage plane as described above.
上述のことから、複素電圧平面上での誘起電圧
V2を示す点AがカーブCM上を動く様な条件で測
温を行なうならば、広い温度範囲にわたつて同一
検出コイルで測温が可能となることがわかる。こ
のような条件の1つとして、温度囲の高次にかか
わらず周波数fを前記したfm以上の周波数にし
て、点AがカーブCMないしCnの下部にくるよう
にすることが考えられるが、温度の低い領域で
は、周波数fを高くすると従来法の場合よりも測
温感度が低下するので好ましくない。そこで本発
明では、被測定物の透磁率μが、複素電圧平面上
で誘起電圧V2を示す点AがカーブCM上を動くよ
うになるような前記μmと同じになる温度を境界
として、この境界温度以下の温度域(以下これを
低温域という)では、第3図のように誘起電圧
V2を示す点がカーブCM上で実数成分がほぼ最大
になる点Xを設定し、この点Xに対応した周波数
fxを基準励磁周波数とし、測温中に誘起電圧V2
がつねに点Xに対応した値となるように周波数を
可変制御し、前記境界温度より高い温度域(以下
これを高温域という)では、誘起電圧V2を示す
点がカーブCMの下部になる点X′に対応した周波
数fx′(≧fm)を基準励磁周波数とし、測温中に
誘起電圧V2がつねに点X′に対応した値となるよ
うに周波数を可変制御するものである。このよう
にすることにより被測定物の温度変化は、励磁周
波数の変化としてとらえられることになる。 From the above, the induced voltage on the complex voltage plane
It can be seen that if the temperature is measured under conditions such that the point A indicating V 2 moves on the curve C M , it is possible to measure the temperature over a wide temperature range with the same detection coil. One such condition may be to set the frequency f to be higher than the above-mentioned fm regardless of the high order of the temperature range so that the point A is at the bottom of the curve C M or Cn. In a low temperature region, increasing the frequency f is not preferable because the temperature measurement sensitivity will be lower than in the conventional method. Therefore, in the present invention, the temperature at which the magnetic permeability μ of the object to be measured becomes the same as μm at which the point A showing the induced voltage V 2 on the complex voltage plane moves on the curve C M is set as a boundary. In the temperature range below this boundary temperature (hereinafter referred to as the low temperature range), the induced voltage is as shown in Figure 3.
Set the point X where the point indicating V 2 is almost the maximum of the real component on the curve C M , and calculate the frequency corresponding to this point
fx is the reference excitation frequency, and the induced voltage V 2 during temperature measurement
The frequency is variably controlled so that the value always corresponds to point The frequency fx' (≧fm) corresponding to point X' is set as the reference excitation frequency, and the frequency is variably controlled so that the induced voltage V 2 always has a value corresponding to point X' during temperature measurement. By doing this, changes in the temperature of the object to be measured can be understood as changes in the excitation frequency.
なお上記において、低温域と高温域の境界は、
被測定物の透磁率μが前述のμmと等しくなる温
度であるので、この境界温度は被測定物の材質
(成分)と厚み、及び検出コイルの寸法によつて
異つた温度となる。 In the above, the boundary between the low temperature region and the high temperature region is
Since this is the temperature at which the magnetic permeability μ of the object to be measured is equal to the aforementioned μm, this boundary temperature varies depending on the material (component) and thickness of the object to be measured and the dimensions of the detection coil.
第4図に本発明の実施例における装置の回路構
成を示す。18は基準励磁周波数の高周波電圧を
発生するための高周波発振器、6,7はこの高周
波発振電圧波形の位相を所定の位相差1、2だ
け移す移相器である。20は検出コイルで、高周
波発振器18の出力は検出コイル20の1次コイ
ル1に加えられる。この1次コイル1は第1図に
示したように被測定物に近接して設置されてお
り、その内部に同軸上の2次コイル2が設置され
ている。2次コイル2の出力は増巾器3を経て同
期検波器4に入力される。移相器6の移相角1
は、第3図の複素電圧平面上の点Xあるいは点
X′におけるリフトオフdの変化による誘起電圧
V2の変化ベクトルの方向とカーブCMのなす角に
対応した角であり、したがつて同期検波器4の出
力は誘起電圧V2のリフトオフdによる変化分で
ある。第3図の複素電圧平面上での点Xあるいは
点X′の位置を設定すると、基準位相差演算器1
9で点Xあるいは点X′の位相角が演算され、、移
送器7の移相角2が設定される。移相器7の出
力は同期検波器8で誘起電圧V2との検波に用い
られるとともに、90゜移相器10にも加えられる。
90゜移相器10の出力は同期検波器11で誘起電
圧V2との検波がなされる。すなわち同期検波器
8の出力は誘起電圧V2の2位相成分V2 2であり、
同期検波器11の出力は誘起電圧V2の(2+90゜)
位相成分V2(2+90゜)となるため、位相差演算器
13でtan-1の演算を行なうことにより、その出
力は誘起電圧V2の位相角の基準位相角2からの
偏差、すなわち第3図の点XあるいはX′からの
偏差を位相角で表わしたものとなる。位相差演算
器13の出力は積分器5の出力とともにリフトオ
フ変動補正演算器14に加えられ、積分器5の出
力が0でない場合には、リフトオフdの変化によ
る誘起電圧V2の変化分の除去がなされたのち、
周波数コンバータ15に加えられ、位相差演算器
13の出力を0にするために必要な1次コイル励
磁電流の周波数の変化分Δfに変換され、周波数
−温度変換演算器16と発振周波数制御回路17
に加えられる。発振周波数制御回路17では、高
周波発振器18の周波数をΔfだけ変化させるよ
うに発振器定数の変更がなされる。周波数−温度
変換演算器16では、周波数変化分Δfは、
Ko・fo=μ/σ
Ko・(fo+Δf)=μ/σ+Δ(μ/σ) …(5)
より
Δ(μ/σ)=Ko・(fo+Δf)−μ/σ=Ko・(fo+
Δf)−Ko・fo=Ko・Δf…(6)
なる関係を用いてΔ(μ/σ)に変換され、温度
変化として出力される。なおここでKoは点Xあ
るいは点X′でのK=μ/σ×fの値、foは現時
点での高周波発振器18の周波数である。 FIG. 4 shows a circuit configuration of a device in an embodiment of the present invention. 18 is a high frequency oscillator for generating a high frequency voltage of a reference excitation frequency, and 6 and 7 are phase shifters for shifting the phase of this high frequency oscillation voltage waveform by a predetermined phase difference of 1 and 2 . 20 is a detection coil, and the output of the high frequency oscillator 18 is applied to the primary coil 1 of the detection coil 20. As shown in FIG. 1, this primary coil 1 is installed close to the object to be measured, and a coaxial secondary coil 2 is installed inside it. The output of the secondary coil 2 is input to a synchronous detector 4 via an amplifier 3. Phase shift angle 1 of phase shifter 6
is the point X or the point on the complex voltage plane in Figure 3.
Induced voltage due to change in lift-off d at X′
This angle corresponds to the angle formed by the direction of the change vector of V 2 and the curve CM , and therefore the output of the synchronous detector 4 is the change due to the lift-off d of the induced voltage V 2 . When the position of point X or point X' on the complex voltage plane in Fig. 3 is set, the reference phase difference calculator 1
At step 9, the phase angle of point X or point X' is calculated, and the phase shift angle 2 of the transfer device 7 is set. The output of the phase shifter 7 is used by the synchronous detector 8 to detect the induced voltage V 2 and is also applied to the 90° phase shifter 10 .
The output of the 90° phase shifter 10 is detected by a synchronous detector 11 against the induced voltage V 2 . In other words, the output of the synchronous detector 8 is a two -phase component V 2 2 of the induced voltage V 2 ,
The output of the synchronous detector 11 is the induced voltage V 2 ( 2 +90°)
Since the phase component is V 2 ( 2 +90°), by calculating tan -1 in the phase difference calculator 13, the output is the deviation of the phase angle of the induced voltage V 2 from the reference phase angle 2 , that is, the phase difference calculation unit 13 calculates tan -1. The deviation from point X or X' in Figure 3 is expressed as a phase angle. The output of the phase difference calculator 13 is added to the lift-off fluctuation correction calculator 14 together with the output of the integrator 5, and if the output of the integrator 5 is not 0, the change in induced voltage V 2 due to the change in lift-off d is removed. After the
It is added to the frequency converter 15 and converted into a change in frequency Δf of the primary coil excitation current necessary to make the output of the phase difference calculator 13 0, and is converted into a frequency change Δf, which is applied to the frequency-temperature conversion calculator 16 and the oscillation frequency control circuit 17.
added to. In the oscillation frequency control circuit 17, the oscillator constant is changed so as to change the frequency of the high frequency oscillator 18 by Δf. In the frequency-temperature conversion calculator 16, the frequency change Δf is calculated as follows: Ko・fo=μ/σ Ko・(fo+Δf)=μ/σ+Δ(μ/σ) ...(5), Δ(μ/σ)=Ko・(fo+Δf)−μ/σ=Ko・(fo+
It is converted into Δ(μ/σ) using the following relationship and output as a temperature change. Here, Ko is the value of K=μ/σ×f at point X or point X', and fo is the current frequency of the high-frequency oscillator 18.
このように、被測定物の温度変化に伴なう2次
コイルの誘起電圧の変化は現時点の周波数からの
変位として検出されるので、測定する温度域及び
被測定物の材質(成分)に合せて複素電圧平面上
の点及びこれに対応した励磁周波数を予じめ設定
することにより、広い温度範囲にわたつて高精度
で温度測定が可能となる。 In this way, changes in the induced voltage in the secondary coil due to changes in the temperature of the object to be measured are detected as deviations from the current frequency, so it is possible to By setting in advance the points on the complex voltage plane and the corresponding excitation frequencies, it is possible to measure temperature with high precision over a wide temperature range.
本発明を熱間圧延用ワークロールの測温に適用
した実施例を次に示す。使用した検出コイルの構
成は
1次コイル内半径:25×10-3〔m〕
1次コイル外半径:30×10-3〔m〕
2次コイル内半径:10×10-3〔m〕
2次コイル外半径:15×10-3〔m〕
コイル長さ:10×10-3〔m〕
1次コイル巻数:40〔Turn〕
2次コイル巻数:100〔Turn〕
1次電流:0.25〔A〕
であり、この場合のμm、fμの値はそれぞれ
μm≒120×4π×10-7〔H/m〕
fm≒115〔KHz〕
である。上記コイル構成でワークロールの温度範
囲20〜300℃に対しては基準励磁周波数を50KHz、
温度範囲300℃〜600℃に対しては、基準励磁周波
数を175〔KHz〕として測定した結果充分な精度で
測定が可能であつた。 An example in which the present invention is applied to temperature measurement of a work roll for hot rolling will be shown below. The configuration of the detection coil used was: Primary coil inner radius: 25×10 -3 [m] Primary coil outer radius: 30×10 -3 [m] Secondary coil inner radius: 10×10 -3 [m] 2 Primary coil outer radius: 15×10 -3 [m] Coil length: 10×10 -3 [m] Number of turns of primary coil: 40 [Turn] Number of turns of secondary coil: 100 [Turn] Primary current: 0.25 [A] ], and the values of μm and fμ in this case are μm≒120×4π×10 -7 [H/m] and fm≒115 [KHz], respectively. With the above coil configuration, the standard excitation frequency is 50KHz for the work roll temperature range of 20 to 300℃.
For a temperature range of 300 DEG C. to 600 DEG C., the reference excitation frequency was set to 175 [KHz], and as a result, measurement was possible with sufficient accuracy.
以上述べたごとく本発明によれば、たとえば圧
延ロールなど検出コイルの寸法に比べて大きい厚
さをもつ磁性体の表面及び表面近傍の温度を広い
温度範囲にわたつて非接触かつ高精度に測定する
ことができ、かつ被測定物表面に油膜、水膜など
が存在しても、又被測定物が高速で移動していて
も影響を受けず安定した測温が可能であり、従来
温度測定が困難であつた部分での測温の可能性を
拡大するものである。 As described above, according to the present invention, the temperature at and near the surface of a magnetic material having a thickness larger than the dimensions of a detection coil, such as a rolling roll, can be measured non-contact and with high precision over a wide temperature range. Even if there is an oil film or water film on the surface of the object to be measured, or even if the object is moving at high speed, stable temperature measurement is possible without being affected. This expands the possibility of temperature measurement in areas where it has been difficult.
第1図は渦流検出コイルの構成を示す正面図、
第2図は2次コイル誘起電圧の複素電圧平面上に
おける挙動を説明するための図表、第3図は本発
明における2次コイル誘起電圧の複素電圧平面上
での特定点の設定を説明するための図表、第4図
は本発明の実施例における装置の回路構成を示す
ブロツク図である。
20:検出コイル、1:1次コイル、2:2次
コイル、4,8,11:同期検波器、6,7,1
0:移相器、5,9,12:積分器、13:移相
差演算器、14:リフト・オフ変動補正演算器、
15:周波数コンバータ、16:周波数−温度変
換演算器、17:発振周波数制御回路、18:高
周波発振器、19:基準位相差演算器。
Figure 1 is a front view showing the configuration of the eddy current detection coil;
Fig. 2 is a diagram for explaining the behavior of the secondary coil induced voltage on the complex voltage plane, and Fig. 3 is a diagram for explaining the setting of a specific point on the complex voltage plane of the secondary coil induced voltage in the present invention. FIG. 4 is a block diagram showing the circuit configuration of an apparatus in an embodiment of the present invention. 20: Detection coil, 1: Primary coil, 2: Secondary coil, 4, 8, 11: Synchronous detector, 6, 7, 1
0: Phase shifter, 5, 9, 12: Integrator, 13: Phase shift difference calculator, 14: Lift-off fluctuation correction calculator,
15: Frequency converter, 16: Frequency-temperature conversion calculator, 17: Oscillation frequency control circuit, 18: High frequency oscillator, 19: Reference phase difference calculator.
Claims (1)
たプローブ型渦流検出コイルを用いる温度測定方
法において、2次コイル誘起電圧を複素電圧平面
上に示したときの該誘起電圧が下記のパラメータ
Kによつて、複素平面上の一点に決定される測定
条件となるところの被測定物の透磁率又は1次コ
イルの励磁周波数の特定範囲のもとで、予じめ誘
起電圧が複素電圧平面上の特定の点になる1次コ
イル励磁周波数を設定し、測定中に実際の誘起電
圧の前記特定点からのずれをなくすのに必要な励
磁周波数の変化量を求め、この周波数変化量から
被測定物の温度変化量を求めることを特徴とする
渦流式温度測定方法。 パラメータK=(被測定物の透磁率)/(被
測定物の導電率)×(励磁周波数)[Claims] 1. In a temperature measurement method using a probe-type eddy current detection coil in which a secondary coil is coaxially arranged inside a primary coil, the induced voltage in the secondary coil is expressed on a complex voltage plane. is determined at one point on the complex plane by the following parameter K. Under a specific range of the magnetic permeability of the measured object or the excitation frequency of the primary coil, which is the measurement condition, the induced voltage is determined in advance at one point on the complex plane. Set the primary coil excitation frequency at which is a specific point on the complex voltage plane, find the amount of change in the excitation frequency necessary to eliminate the deviation of the actual induced voltage from the specific point during measurement, and calculate this frequency. An eddy current temperature measurement method characterized by determining the amount of change in temperature of an object to be measured from the amount of change. Parameter K = (magnetic permeability of the object to be measured) / (electrical conductivity of the object to be measured) x (excitation frequency)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19612682A JPS5987330A (en) | 1982-11-10 | 1982-11-10 | Temperature measuring method of eddy current type |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19612682A JPS5987330A (en) | 1982-11-10 | 1982-11-10 | Temperature measuring method of eddy current type |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5987330A JPS5987330A (en) | 1984-05-19 |
| JPS6360332B2 true JPS6360332B2 (en) | 1988-11-24 |
Family
ID=16352673
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19612682A Granted JPS5987330A (en) | 1982-11-10 | 1982-11-10 | Temperature measuring method of eddy current type |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5987330A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4699797B2 (en) * | 2005-04-20 | 2011-06-15 | 株式会社リベックス | Measuring method and apparatus |
| CN113660746B (en) * | 2020-05-12 | 2022-11-01 | 佛山市顺德区美的电热电器制造有限公司 | Heating circuit and cooking device |
-
1982
- 1982-11-10 JP JP19612682A patent/JPS5987330A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5987330A (en) | 1984-05-19 |
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