JPS641282A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS641282A
JPS641282A JP15706087A JP15706087A JPS641282A JP S641282 A JPS641282 A JP S641282A JP 15706087 A JP15706087 A JP 15706087A JP 15706087 A JP15706087 A JP 15706087A JP S641282 A JPS641282 A JP S641282A
Authority
JP
Japan
Prior art keywords
forming
gate
gate recess
etching
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15706087A
Other languages
Japanese (ja)
Other versions
JPH011282A (en
Inventor
Takahide Ishikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP15706087A priority Critical patent/JPS641282A/en
Publication of JPH011282A publication Critical patent/JPH011282A/en
Publication of JPS641282A publication Critical patent/JPS641282A/en
Pending legal-status Critical Current

Links

Landscapes

  • Drying Of Semiconductors (AREA)
  • Junction Field-Effect Transistors (AREA)

Abstract

PURPOSE: To realize high performance through reduction of FET parasitic resistance and parasitic capacitance by forming the right and left asymmetrical gate recess.
CONSTITUTION: After forming an ohmic electrode 2 which will become a source drain electrode on a GaAs substrate 1, a resist pattern 3 to form a gate electrode is formed. Thereafter, the etching of gate recess is carried out, for example, by reactive ion etching or ion milling. In this case, irradiation of ion beam 4 with the predetermined gradient of irradiation angle realizes formation of gate recess 5 having a gradient in accordance with the inclination of ion beam 4 on the GaAs substrate 1. Namely, this etching method is the anisotropic etching method and therefore the gate recess 5 is formed asymmetrically to the right and left. Next, after forming the Schottky metal 6a for gate electrode to the entire part of wafer by the evaporation method, the gate electrode 6 is formed by the lift-off method. Such shape realizes low parasitic capacitance, low parasitic resistance, high breakdown strength, and high mutual conductance and thereby a high performance FET can also be realized.
COPYRIGHT: (C)1989,JPO&Japio
JP15706087A 1987-06-23 1987-06-23 Manufacture of semiconductor device Pending JPS641282A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15706087A JPS641282A (en) 1987-06-23 1987-06-23 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15706087A JPS641282A (en) 1987-06-23 1987-06-23 Manufacture of semiconductor device

Publications (2)

Publication Number Publication Date
JPH011282A JPH011282A (en) 1989-01-05
JPS641282A true JPS641282A (en) 1989-01-05

Family

ID=15641334

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15706087A Pending JPS641282A (en) 1987-06-23 1987-06-23 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS641282A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2685418C (en) * 2007-04-27 2015-06-16 Georgia-Pacific Consumer Products Lp Sheet product dispenser

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