JPS6418247A - Plastic sealed semiconductor device - Google Patents
Plastic sealed semiconductor deviceInfo
- Publication number
- JPS6418247A JPS6418247A JP62175335A JP17533587A JPS6418247A JP S6418247 A JPS6418247 A JP S6418247A JP 62175335 A JP62175335 A JP 62175335A JP 17533587 A JP17533587 A JP 17533587A JP S6418247 A JPS6418247 A JP S6418247A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor chip
- resin
- reduced
- container
- amount
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Abstract
PURPOSE:To prevent a characteristic from deteriorating by a method wherein the amount of a resin near a semiconductor chip is reduced partially so that a stress to be exerted on the semiconductor chip due to the resin can be reduced even when the chip is subjected to a heat cycle of a repeated heating and cooling operation. CONSTITUTION:A semiconductor chip 4 is supported on a base plate 1 of a container; external extraction terminals 6, 7 connected to the semiconductor chip 4 are extracted to an upper part of the container; this assembly is sealed by a resin 9 injected into the container 8. During this process, an amount of the resin near the semiconductor chip 4 is reduced partially. By this setup, even when a plastic-packaged semiconductor device is subjected to a heat cycle and the sealing resin 9 is expanded and contracted repeatedly, a stress to be exerted on the semiconductor chip 4 due to the resin 9 is reduced because the amount of the resin near the semiconductor chip 4 is little; accordingly, it is possible to prevent its characteristic from deteriorating.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62175335A JPS6418247A (en) | 1987-07-14 | 1987-07-14 | Plastic sealed semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62175335A JPS6418247A (en) | 1987-07-14 | 1987-07-14 | Plastic sealed semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6418247A true JPS6418247A (en) | 1989-01-23 |
Family
ID=15994270
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62175335A Pending JPS6418247A (en) | 1987-07-14 | 1987-07-14 | Plastic sealed semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6418247A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009059923A (en) * | 2007-08-31 | 2009-03-19 | Mitsubishi Electric Corp | Semiconductor device |
| CN102157400A (en) * | 2011-01-30 | 2011-08-17 | 南通富士通微电子股份有限公司 | Method for encapsulating high-integration wafer fan-out |
| US9324583B2 (en) | 2011-01-30 | 2016-04-26 | Nantong Fujitsu Microelectronics Co., Ltd. | Packaging method |
| US20190229031A1 (en) * | 2018-01-23 | 2019-07-25 | Mitsubishi Electric Corporation | Semiconductor device and method of manufacturing thereof |
| JP2023156715A (en) * | 2022-04-13 | 2023-10-25 | 富士電機株式会社 | Semiconductor device and semiconductor device manufacturing method |
-
1987
- 1987-07-14 JP JP62175335A patent/JPS6418247A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009059923A (en) * | 2007-08-31 | 2009-03-19 | Mitsubishi Electric Corp | Semiconductor device |
| CN102157400A (en) * | 2011-01-30 | 2011-08-17 | 南通富士通微电子股份有限公司 | Method for encapsulating high-integration wafer fan-out |
| US9324583B2 (en) | 2011-01-30 | 2016-04-26 | Nantong Fujitsu Microelectronics Co., Ltd. | Packaging method |
| US20190229031A1 (en) * | 2018-01-23 | 2019-07-25 | Mitsubishi Electric Corporation | Semiconductor device and method of manufacturing thereof |
| CN110071071A (en) * | 2018-01-23 | 2019-07-30 | 三菱电机株式会社 | The manufacturing method of semiconductor device and semiconductor device |
| JP2019129201A (en) * | 2018-01-23 | 2019-08-01 | 三菱電機株式会社 | Semiconductor device and method for manufacturing semiconductor device |
| DE102019200271B4 (en) | 2018-01-23 | 2022-09-29 | Mitsubishi Electric Corporation | Semiconductor device and method of manufacturing the same |
| JP2023156715A (en) * | 2022-04-13 | 2023-10-25 | 富士電機株式会社 | Semiconductor device and semiconductor device manufacturing method |
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