JPS642320A - Formation of electrode - Google Patents

Formation of electrode

Info

Publication number
JPS642320A
JPS642320A JP15717087A JP15717087A JPS642320A JP S642320 A JPS642320 A JP S642320A JP 15717087 A JP15717087 A JP 15717087A JP 15717087 A JP15717087 A JP 15717087A JP S642320 A JPS642320 A JP S642320A
Authority
JP
Japan
Prior art keywords
substrate
deposited
gate electrode
sintering
resist
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15717087A
Other languages
Japanese (ja)
Other versions
JPH012320A (en
Inventor
Naoya Miyano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP62-157170A priority Critical patent/JPH012320A/en
Priority claimed from JP62-157170A external-priority patent/JPH012320A/en
Publication of JPS642320A publication Critical patent/JPS642320A/en
Publication of JPH012320A publication Critical patent/JPH012320A/en
Pending legal-status Critical Current

Links

Landscapes

  • Electrodes Of Semiconductors (AREA)
  • Junction Field-Effect Transistors (AREA)

Abstract

PURPOSE: To prevent the deterioration and degeneration of a device and to obtain excellent Schottky characteristics by a method wherein a sintering operation is conducted when a sintering material only is deposited on a substrate.
CONSTITUTION: An insulating layer 11 is formed on a GaAs substrate 10, the insulating layer 11 located on the position where a gate electrode part was formed is removed, and a gate pattern 12 is formed. A sintering material 14 consisting of Ti and the like is deposited on and adhered to the substrate 10, and when the substrate is heated up from the side of the material 14 using an electron beam, the material 14 is sintered in the substrate 10. Then, an electrode surface material 15 is deposited on and adhered to the substrate 10 on which the material 14 is deposited. Subsequently, for the substrate 10, the part corresponding to the gate electrode part is covered by a photoresist 16, an Ar ion beam 17 is made to irradiate from the side of the resist 16, unnecessary materials 14 and 15 are removed, the resist 16 is also removed, and a gate electrode 18 is formed.
COPYRIGHT: (C)1989,JPO&Japio
JP62-157170A 1987-06-24 How to make electrodes Pending JPH012320A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62-157170A JPH012320A (en) 1987-06-24 How to make electrodes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62-157170A JPH012320A (en) 1987-06-24 How to make electrodes

Publications (2)

Publication Number Publication Date
JPS642320A true JPS642320A (en) 1989-01-06
JPH012320A JPH012320A (en) 1989-01-06

Family

ID=

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5387548A (en) * 1992-06-22 1995-02-07 Motorola, Inc. Method of forming an etched ohmic contact

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5387548A (en) * 1992-06-22 1995-02-07 Motorola, Inc. Method of forming an etched ohmic contact

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